Search results for "Burn-In"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
152	Ji Hwan Cha	On optimal burn-in procedures - a generalized model.	IEEE Trans. Reliab.	2005	DBLP DOI BibTeX RDF
111	Shey-Huei Sheu, Yu-Hung Chien	Minimizing cost-functions related to both burn-in and field-operation under a generalized model.	IEEE Trans. Reliab.	2004	DBLP DOI BibTeX RDF
101	Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko	Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
98	Kyungmee O. Kim, W. Kuo	Some considerations on system burn-in.	IEEE Trans. Reliab.	2005	DBLP DOI BibTeX RDF
98	Thomas S. Barnett, Adit D. Singh	Relating Yield Models to Burn-In Fall-Out in Time.	ITC	2003	DBLP DOI BibTeX RDF
87	Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel	Cyclic stress tests for full scan circuits.	VTS	1995	DBLP DOI BibTeX RDF	cyclic stress tests, fully testable unpackaged dies, burn-in process, cyclic input sequences, stress related problems, ISCAS89 benchmark circuits, monitored burn-in problems, IC reliability, VLSI, VLSI, logic testing, integrated circuit testing, CMOS, CMOS logic circuits, boundary scan testing, MCMs, integrated circuit reliability, full scan circuits
84	Chin-Long Wey, Meng-Yao Liu	Burn-In Stress Test of Analog CMOS ICs.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
84	Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins	Burn-in Temperature Projections for Deep Sub-micron Technologies.	ITC	2003	DBLP DOI BibTeX RDF
81	Sudarshan Bahukudumbi, Krishnendu Chakrabarty	Test-Pattern Ordering for Wafer-Level Test-During-Burn-In.	VTS	2008	DBLP DOI BibTeX RDF	wafer-level, pattern ordering, burn-in
81	Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev	Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment.	ISQED	2005	DBLP DOI BibTeX RDF	Electrostatic discharge (ESD), electrical overstress (EOS), LVTSCR, latch-up, burn-in
74	Mesut Meterelliyoz, Kaushik Roy 0001	Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations.	ASP-DAC	2009	DBLP DOI BibTeX RDF
67	Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko	Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	burn-in reduction, voltage stress, Weibull analysis, integral circuit testing
57	Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz	Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs.	DATE	2008	DBLP DOI BibTeX RDF
57	Ji Hwan Cha	An extended model for optimal burn-in procedures.	IEEE Trans. Reliab.	2006	DBLP DOI BibTeX RDF
57	Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi	Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI.	DFT	2002	DBLP DOI BibTeX RDF
57	Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell	CMOS IC reliability indicators and burn-in economics.	ITC	1998	DBLP DOI BibTeX RDF
54	Vivek De	Leakage-tolerant design techniques for high performance processors.	ISPD	2002	DBLP DOI BibTeX RDF
50	Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko	Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.	DELTA	2008	DBLP DOI BibTeX RDF	wafer testing, reliability, integrated circuits, burn-in, yield modelling
50	Thomas S. Barnett, Adit D. Singh, Victor P. Nelson	Yield-Reliability Modeling for Fault Tolerant Integrated Circuits.	DFT	2001	DBLP DOI BibTeX RDF	infant mortality, negative binomial distribution, clustering, reliability, redundancy, yield, defects, defect tolerance, burn-in
44	Sagar S. Sabade, D. M. H. Walker	Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction.	VTS	2002	DBLP DOI BibTeX RDF
44	Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch	Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.	VTS	2002	DBLP DOI BibTeX RDF
44	Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy	Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction.	VTS	2002	DBLP DOI BibTeX RDF
44	Thomas S. Barnett, Adit D. Singh, Victor P. Nelson	Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model.	VTS	2001	DBLP DOI BibTeX RDF
37	Larry Gilg	Known Good Die.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	known good die, KGD, chip scale (size) package, multi-chip module (MCM), wafer probe, membrane probe card, buckling beam probe card, KGD carrier, CSP, burn-in
30	Shaomin Wu, Min Xie 0001	Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In.	IEEE Trans. Reliab.	2007	DBLP DOI BibTeX RDF
30	Xiaotie Deng, Haodi Feng, Guojun Li, Benyun Shi	A PTAS for Semiconductor Burn-in Scheduling.	J. Comb. Optim.	2005	DBLP DOI BibTeX RDF	geometric rounding, time stretching, approximation algorithm, batch processing, release date
30	Pei-Chann Chang, Yun-Shiow Chen, Hui-Mei Wang	Dynamic Scheduling Problem of Batch Processing Machine in Semiconductor Burn-in Operations.	ICCSA (4)	2005	DBLP DOI BibTeX RDF
30	Atsumu Iseno, Yukihiro Iguchi	A Method for Storing Fail Bit Maps in Burn-in Memory Testers.	DELTA	2002	DBLP DOI BibTeX RDF
30	Kuo-Chan Huang, Chung-Len Lee 0001, Jwu E. Chen	Maximization of power dissipation under random excitation for burn-in testing.	ITC	1998	DBLP DOI BibTeX RDF
27	Diana El Rabih, Nihal Pekergin	Statistical Model Checking Using Perfect Simulation.	ATVA	2009	DBLP DOI BibTeX RDF
27	Jaydeep P. Kulkarni, Kaushik Roy 0001	A High Performance, Scalable Multiplexed Keeper Technique.	ISQED	2007	DBLP DOI BibTeX RDF
27	Eric F. Weglarz, Kewal K. Saluja, T. M. Mak	Testing of Hard Faults in Simultaneous Multithreaded Processors.	IOLTS	2004	DBLP DOI BibTeX RDF
27	Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba	Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement.	ACM Great Lakes Symposium on VLSI	2004	DBLP DOI BibTeX RDF	IC reliability
27	Thomas S. Barnett, Adit D. Singh, Victor P. Nelson	Extending integrated-circuit yield-models to estimate early-life reliability.	IEEE Trans. Reliab.	2003	DBLP DOI BibTeX RDF
27	Mary Kathryn Cowles	MCMC Sampler Convergence Rates for Hierarchical Normal Linear Models: A Simulation Approach.	Stat. Comput.	2002	DBLP DOI BibTeX RDF	agricultural field trials, total variation distance, Bayesian models, Gibbs sampler
27	Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang	A Programmable BIST Core for Embedded DRAM.	IEEE Des. Test Comput.	1999	DBLP DOI BibTeX RDF
23	Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner	Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications.	ETS	2009	DBLP DOI BibTeX RDF	Gate Stress Test, Gate Oxide Reliability, Low Side Switch, Burn-In
23	Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang	A Prevenient Voltage Stress Test Method for High Density Memory.	DELTA	2008	DBLP DOI BibTeX RDF	voltage stress test, acceleration factor, burn-in test, junction temperature, constant voltage stress, voltage ramp stress, reliability
23	Kwang-Ting (Tim) Cheng	Dealing with early life failures.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	latent defects, embedded systems, technology scaling, IDDQ, burn-in
23	Phil Nigh	Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	latent defects, reliability defects, latent-defect screening, defect acceleration, DPPM, burn-in
23	John M. Carulli Jr., Thomas J. Anderson	The Impact of Multiple Failure Modes on Estimating Product Field Reliability.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	early failure rate, DPPM, reliability, burn-in
23	Vinay Dabholkar, Sreejit Chakravarty	Computing Stress Tests for Gate Oxide Shorts.	VLSI Design	1998	DBLP DOI BibTeX RDF	burn-in, stress tests, gate oxide shorts
17	Yuanbo Li, Chu Kin Chan, Chun Yip Yau, Wai Leong Ng, Henry Lam	Burn-in selection in simulating stationary time series.	Comput. Stat. Data Anal.	2024	DBLP DOI BibTeX RDF
17	Qinqin Xu, Yuanguo Zhu	Reliability Optimization of Uncertain Random Systems Combined With Burn-In and Preventive Maintenance.	IEEE Trans. Reliab.	2023	DBLP DOI BibTeX RDF
17	Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli	A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips.	IEEE Access	2023	DBLP DOI BibTeX RDF
17	Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli	A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress.	IEEE Trans. Computers	2023	DBLP DOI BibTeX RDF
17	Xiang Ji, Gen Li	Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time.	CoRR	2023	DBLP DOI BibTeX RDF
17	Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker 0001, Matteo Sonza Reorda	Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing.	ETS	2023	DBLP DOI BibTeX RDF
17	Xiang Ji, Gen Li	Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time.	NeurIPS	2023	DBLP BibTeX RDF
17	Tsuneo Kagawa, Masaya Ikemoto, Satoshi Ohtake	A robust method of IC seating inspection in burn-in sockets using Hough transform.	ICCE-TW	2022	DBLP DOI BibTeX RDF
17	Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli	An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.	ETS	2022	DBLP DOI BibTeX RDF
17	Hong-Kyu Shin, Hea-Bin Yang, Seung-Jin Baek, Sung-Jea Ko	A luminance control method for OLED burn-in prevention using user information.	ICCE	2022	DBLP DOI BibTeX RDF
17	Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara	A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement.	IEEE J. Solid State Circuits	2021	DBLP DOI BibTeX RDF
17	Jeon-Young Kang, Jared Aldstadt	Using Multiple Scale Space-Time Patterns to Determine the Number of Replicates and Burn-In Periods in Spatially Explicit Agent-Based Modeling of Vector-Borne Disease Transmission.	ISPRS Int. J. Geo Inf.	2021	DBLP DOI BibTeX RDF
17	Daniel Kurz, Horst Lewitschnig, Jürgen Pilz	Flexible time reduction method for burn-in of high-quality products.	Qual. Reliab. Eng. Int.	2021	DBLP DOI BibTeX RDF
17	Yue Shi 0004, Yisha Xiang, Ying Liao, Zhicheng Zhu, Yili Hong 0001	Optimal burn-in policies for multiple dependent degradation processes.	IISE Trans.	2021	DBLP DOI BibTeX RDF
17	Seong-Chel Park, Kwan-Ho Park, Joon-Hyuk Chang	Luminance-Degradation Compensation Based on Multistream Self-Attention to Address Thin-Film Transistor-Organic Light Emitting Diode Burn-In.	Sensors	2021	DBLP DOI BibTeX RDF
17	Yuan Chen 0005, Tao Yuan, Suk Joo Bae, Yue Kuo	Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing.	Comput. Ind. Eng.	2021	DBLP DOI BibTeX RDF
17	Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara	36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In.	ISSCC	2021	DBLP DOI BibTeX RDF
17	Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli	Innovative methods for Burn-In related Stress Metrics Computation.	DTIS	2021	DBLP DOI BibTeX RDF
17	Zhen Chen, Ershun Pan, Tangbin Xia, Yanting Li	Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors.	Reliab. Eng. Syst. Saf.	2020	DBLP DOI BibTeX RDF
17	Jeffrey Zhang 0008, Antai Xu, Daniel Gitlin, Desmond Yeo	Dynamic vs Static Burn-in for 16nm Production.	IRPS	2020	DBLP DOI BibTeX RDF
17	Kunyang Liu, Hongliang Pu, Hirofumi Shinohara	A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in.	CICC	2020	DBLP DOI BibTeX RDF
17	Chen He, Yanyao Yu	Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In.	ITC	2020	DBLP DOI BibTeX RDF
17	Xiaopeng Li, Zixian Liu, Yukun Wang, Mei Li	Optimal burn-in strategy for two-dimensional warranted products considering preventive maintenance.	Int. J. Prod. Res.	2019	DBLP DOI BibTeX RDF
17	Yi Lyu, Yun Zhang 0001, Kairui Chen, Ci Chen, Xianxian Zeng	Optimal Multi-Objective Burn-In Policy Based on Time-Transformed Wiener Degradation Process.	IEEE Access	2019	DBLP DOI BibTeX RDF
17	Yi Lyu, Junyan Gao, Ci Chen, Yijie Jiang, Huachuan Li, Kairui Chen, Yun Zhang 0001	Optimal Burn-in Strategy for High Reliable Products Using Convolutional Neural Network.	IEEE Access	2019	DBLP DOI BibTeX RDF
17	F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi	Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test.	DDECS	2019	DBLP DOI BibTeX RDF
17	Chen He	Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers.	ITC	2019	DBLP DOI BibTeX RDF
17	Mohammad Nasim Imtiaz Khan, Anirudh Iyengar, Swaroop Ghosh	Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM.	IEEE Trans. Very Large Scale Integr. Syst.	2018	DBLP DOI BibTeX RDF
17	Goutam Paul 0001, Souvik Ray	Analysis of burn-in period for RC4 state transition.	Cryptogr. Commun.	2018	DBLP DOI BibTeX RDF
17	Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini	Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC.	J. Electron. Test.	2018	DBLP DOI BibTeX RDF
17	Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez 0001, Federico Venini	An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In.	J. Low Power Electron.	2018	DBLP DOI BibTeX RDF
17	Elizabeth Hunter, Brian Mac Namee, John D. Kelleher	Using a Socioeconomic Segregation Burn-in Model to Initialise an Agent-Based Model for Infectious Diseases.	J. Artif. Soc. Soc. Simul.	2018	DBLP DOI BibTeX RDF
17	Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez 0001, Federico Venini	An Optimized Test During Burn-In for Automotive SoC.	IEEE Des. Test	2018	DBLP DOI BibTeX RDF
17	M.-H. Kim, S.-H. Chae, J.-S. Kim	A Burn-in Potential Region Detection Method for the OLED panel displays.	ISM	2018	DBLP DOI BibTeX RDF
17	Alex Kuefler, Mykel J. Kochenderfer	Burn-In Demonstrations for Multi-Modal Imitation Learning.	AAMAS	2018	DBLP BibTeX RDF
17	Yihai He, Linbo Wang, Yi Wei, Zhenzhen He	Optimisation of burn-in time considering the hidden loss of quality deviations in the manufacturing process.	Int. J. Prod. Res.	2017	DBLP DOI BibTeX RDF
17	Danilo M. S. Ribeiro, Paulo R. Aguiar, Luiz F. G. Fabiano, Doriana D'Addona, Fabricio Guimaraes Baptista, Eduardo C. Bianchi	Spectra Measurements Using Piezoelectric Diaphragms to Detect Burn in Grinding Process.	IEEE Trans. Instrum. Meas.	2017	DBLP DOI BibTeX RDF
17	Alex Kuefler, Mykel J. Kochenderfer	Burn-In Demonstrations for Multi-Modal Imitation Learning.	CoRR	2017	DBLP BibTeX RDF
17	Goutam Paul 0001, Souvik Ray	Analysis of Burn-in period for RC4 State Transition.	IACR Cryptol. ePrint Arch.	2017	DBLP BibTeX RDF
17	Sakchai Muangsrinoon, Poonpong Boonbrahm	Burn in Zone: Real time Heart Rate monitoring for physical activity.	JCSSE	2017	DBLP DOI BibTeX RDF
17	Mohammad Nasim Imtiaz Khan, Anirudh Srikant Iyengar, Swaroop Ghosh	Novel magnetic burn-in for retention testing of STTRAM.	DATE	2017	DBLP DOI BibTeX RDF
17	Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez 0001, C. M. Villa, Federico Venini	A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC.	DATE	2017	DBLP DOI BibTeX RDF
17	Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola	Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data.	I2MTC	2017	DBLP DOI BibTeX RDF
17	Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu	A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF.	ISCAS	2017	DBLP DOI BibTeX RDF
17	Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez 0001, Federico Venini, Davide Appello	A DMA and CACHE-based stress schema for burn-in of automotive microcontroller.	LATS	2017	DBLP DOI BibTeX RDF
17	Yong-Goo Shin, Dae-Hong Lee, Mun-Cheon Kang, Jeisung Lee, Sung-Jea Ko	A novel burn-in potential region detection method using image processing technique.	ICCE	2017	DBLP DOI BibTeX RDF
17	Yisha Xiang, David W. Coit, Zhicheng Zhu	A Multi-objective Joint Burn-in and Imperfect Condition-based Maintenance Model for Degradation-based Heterogeneous Populations.	Qual. Reliab. Eng. Int.	2016	DBLP DOI BibTeX RDF
17	Qingqing Zhai, Zhi-Sheng Ye 0001, Jun Yang 0018, Yu Zhao 0003	Measurement errors in degradation-based burn-in.	Reliab. Eng. Syst. Saf.	2016	DBLP DOI BibTeX RDF
17	Tao Yuan, Suk Joo Bae, Xiaoyan Zhu 0002	A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns.	Reliab. Eng. Syst. Saf.	2016	DBLP DOI BibTeX RDF
17	Ji Hwan Cha, Gianpaolo Pulcini	Optimal burn-in procedure for mixed populations based on the device degradation process history.	Eur. J. Oper. Res.	2016	DBLP DOI BibTeX RDF
17	Nima Aghaee, Zebo Peng, Petru Eles	Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs.	IEEE Trans. Very Large Scale Integr. Syst.	2015	DBLP DOI BibTeX RDF
17	Zuolin Cheng, Xiaole Cui, Xiaoxin Cui, Chung Len Lee 0001	Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure.	IET Comput. Digit. Tech.	2015	DBLP DOI BibTeX RDF
17	Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski	Implications of Burn-In Stress on NBTI Degradation.	CoRR	2015	DBLP BibTeX RDF
17	Daniel Kurz, Horst Lewitschnig, Jürgen Pilz	An advanced area scaling approach for semiconductor burn-in.	Microelectron. Reliab.	2015	DBLP DOI BibTeX RDF
17	Zhisheng Ye 0001, Loon-Ching Tang, Min Xie 0001	Bi-objective burn-in modeling and optimization.	Ann. Oper. Res.	2014	DBLP DOI BibTeX RDF
17	Nima Aghaee, Zebo Peng, Petru Eles	An efficient temperature-gradient based burn-in technique for 3D stacked ICs.	DATE	2014	DBLP DOI BibTeX RDF
17	Kenneth M. Zick, Sen Li, Matthew French	High-precision self-characterization for the LUT burn-in information leakage threat.	FPL	2014	DBLP DOI BibTeX RDF
17	Ji Hwan Cha, Maxim Finkelstein	Results for Burn-in of Systems Under External Shocks.	IEEE Trans. Reliab.	2013	DBLP DOI BibTeX RDF