Search results for "DFM"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
113	Mark Redford, Joseph Sawicki, Prasad Subramaniam, Cliff Hou, Yervant Zorian, Kimon Michaels	DFM: don't care or competitive weapon?	DAC	2009	DBLP DOI BibTeX RDF	RDR, physical verification, sign-off, yield, DFM, design-for-manufacturing, design rules, manufacturing variability, DRC
107	Lionel Riviere-Cazaux, Kevin Lucas, Jon Fitch	Integration Of Design For Manufacturability (DFM) Practices In Design Flows.	ISQED	2005	DBLP DOI BibTeX RDF
93	Vijay Pitchumani	A Hitchhiker's Guide to the DFM Universe.	APCCAS	2006	DBLP DOI BibTeX RDF
84	Juan C. Rey, N. S. Nagaraj, Andrew B. Kahng, Fabian Klass, Rob Aitken, Cliff Hou, Luigi Capodieci, Vivek Singh	DFM in practice: hit or hype?	DAC	2008	DBLP DOI BibTeX RDF	critical area analysis, CMP, yield, DFM, OPC, lithography
84	Shishpal Rawat, Raul Camposano, Andrew B. Kahng, Joseph Sawicki, Mike Gianfagna, Naeem Zafar, Atul Sharan	DFM: where's the proof of value?	DAC	2006	DBLP DOI BibTeX RDF	ROI, DFM, design for manufacture, OPC, RET, yield optimization, design for yield
79	Artur Balasinski	Question: DRC or DfM ? Answer: FMEA and ROI.	ISQED	2006	DBLP DOI BibTeX RDF
70	Shi-Hao Chen, Ke-Cheng Chu, Jiing-Yuan Lin, Cheng-Hong Tsai	DFM/DFY practices during physical designs for timing, signal integrity, and power.	ASP-DAC	2007	DBLP DOI BibTeX RDF	0.13 micron, DFY, dynamic IR drop, process variation, physical designs, DFM, design for manufacturability, signal integrity, timing integrity, yield analysis, design for yield
70	Matt Nowak, Riko Radojcic	Are there economic benefits in DFM?	DAC	2005	DBLP DOI BibTeX RDF	fabless, foundries, DFM, design for manufacturability
65	Marco Casale-Rossi, Andrzej J. Strojwas, Robert C. Aitken, Antun Domic, Carlo Guardiani, Philippe Magarshack, Douglas Pattullo, Joseph Sawicki	DFM/DFY: should you trust the surgeon or the family doctor?	DATE	2007	DBLP DOI BibTeX RDF
65	Xianlong Hong, Yici Cai, Hailong Yao, Duo Li	DFM-aware Routing for Yield Enhancement.	APCCAS	2006	DBLP DOI BibTeX RDF
65	Jingtao Yang, Corina Cîrstea, Peter Henderson 0001	An Operational Semantics for DFM, a Formal Notation for Modelling Asynchronous Web Services Coordination.	QSIC	2005	DBLP DOI BibTeX RDF
65	Michel Houtermans, George E. Apostolakis, Aarnout Brombacher, Dimitrios Karydas	Programmable Electronic System Design & Verification Utilizing DFM.	SAFECOMP	2000	DBLP DOI BibTeX RDF
62	Andrzej J. Strojwas, Tejas Jhaveri, Vyacheslav Rovner, Lawrence T. Pileggi	Creating an affordable 22nm node using design-lithography co-optimization.	DAC	2009	DBLP DOI BibTeX RDF	design technology co-optimization, templates, DFM, regular fabric
62	Qi Lin, Mei Ma, Tony Vo, Jenny Fan, Xin Wu, Richard Li, Xiao-Yu Li	Design-for-Manufacture for Multi Gate Oxide CMOS Process.	ISQED	2007	DBLP DOI BibTeX RDF	multi gate oxide, FPGA, layout, yield, DFM
61	YuHua Cheng	A glance of technology efforts for design-for-manufacturing in nano-scale CMOS processes.	Sci. China Ser. F Inf. Sci.	2008	DBLP DOI BibTeX RDF	nano-CMOS IC design, IC design methodology, CMOS design technology platform, design-for-manufacturing (DFM), design-for-yield
60		Proceedings of the Sixth Workshop on Data-Flow Execution Models for Extreme Scale Computing, DFM@PACT 2016, Haifa, Israel, September 15, 2016	DFM@PACT	2016	DBLP DOI BibTeX RDF
60	Justin M. Wozniak, Michael Wilde, Ian T. Foster	Challenges and Opportunities for Dataflow Processing on Exascale Computers.	DFM@PACT	2016	DBLP DOI BibTeX RDF
60	Zoran Budimlic, Kathleen Knobe	CnC: A Dependence Programming Model.	DFM@PACT	2016	DBLP DOI BibTeX RDF
60	Kumud Bhandari, Vivek Sarkar	Tree-based Read-only Data Chunks for NVRAM Programming.	DFM@PACT	2016	DBLP DOI BibTeX RDF
60	George Matheou, Costas Kyriacou, Paraskevas Evripidou	Data-Driven execution of the Tile LU Decomposition.	DFM@PACT	2016	DBLP DOI BibTeX RDF
57	Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, Saghir A. Shaikh, Manuel d'Abreu	Maximizing Wafer Productivity Through Layout Optimization.	VLSI Design	2000	DBLP DOI BibTeX RDF	wafer productivity, die cost, interconnect cost, manufacturability, yield, design for manufacturability
56	Yin Shen, Yici Cai, Qiang Zhou 0001, Xianlong Hong	DFM Based Detailed Routing Algorithm for ECP and CMP.	ISQED	2008	DBLP DOI BibTeX RDF	ECP, CMP, DFM, detailed routing
56	Jamil Kawa, Charles C. Chiang	DFM issues for 65nm and beyond.	ACM Great Lakes Symposium on VLSI	2007	DBLP DOI BibTeX RDF	DFY, DFM
56	Greg Yeric, Ethan Cohen, John Garcia, Kurt Davis, Esam Salem, Gary Green	Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	systematic yield loss, test structure, BEOL, DFM, process monitoring, silicon debug, infrastructure IP
56	Juan Antonio Carballo, Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John Kibarian, Dennis Wassung, Alex Alexanian, Steve Wigley, Neil Kelly	Guest Editors' Introduction: DFM Drives Changes in Design Flow.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	Design for manufacturability, DFM
56	Kees Veelenturf	The Road to Better Reliability and Yield Embedded DfM Tools.	DATE	2000	DBLP DOI BibTeX RDF	wire spreading, yield prediction, yield improvement, DfM
51	Resve A. Saleh, Pallab K. Chatterjee, Ivan Pesic, Robbert Dobkins, Mike Smayling, Joseph Sawicki	DFM-EDA's Salvation or its Excuse for Being out of Touch with Engineering?	ISQED	2007	DBLP DOI BibTeX RDF
51	Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, Ralf Sommer, Michael Pronath, Andreas Ripp	DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design.	DATE	2006	DBLP DOI BibTeX RDF
51	Robert C. Aitken	DFM Metrics for Standard Cells.	ISQED	2006	DBLP DOI BibTeX RDF
51	Artur Balasinski	DfM for SoC, invited.	IWSOC	2005	DBLP DOI BibTeX RDF
48	Stephen P. Kornachuk, Michael C. Smayling	New strategies for gridded physical design for 32nm technologies and beyond.	ISPD	2009	DBLP DOI BibTeX RDF	28nm, 32nm, 45nm, litho, rdr, placement, layout, physical design, manufacturability, lithography, standard cell, vlsi, drc, dfm
48	C. Tabery, M. Craig, Gert Burbach, B. Wagner, S. McGowan, P. Etter, S. Roling, C. Haidinyak, E. Ehrichs	Process Window and Device Variations Evaluation using Array-Based Characterization Circuits.	ISQED	2006	DBLP DOI BibTeX RDF	transistor array, transistor matching, via yield, DOE ROM, novel test circuits, DFM
47	Musa Alci	New dynamic fuzzy structure and dynamic system identification.	Soft Comput.	2006	DBLP DOI BibTeX RDF	Dynamic fuzzy module (DFM), Non-linear dynamic system, System identification
47	Jay Jahangiri, David Abercrombie	Value-Added Defect Testing Techniques.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	advanced design-for-manufacturability, DFM test methods, defect testing techniques
45	Robert C. Aitken, David Pietromonaco, Brian Cline	DFM is dead - Long live DFM.	ICCD	2014	DBLP DOI BibTeX RDF
45	Wing Chiu Tam, R. D. (Shawn) Blanton	To DFM or not to DFM?	DAC	2011	DBLP DOI BibTeX RDF
45	Tets Maniwa, Pallab K. Chatterjee	Evening Panel Discussion: DFM PDK's: Where Do They Belong To? Are Process Design Kits (PDKs) the Answer for Modern Design for Manufacturing (DFM) Issues?	ISQED	2004	DBLP DOI BibTeX RDF
42	Fadi J. Kurdahi, Nikil D. Dutt, Ahmed M. Eltawil, Sani R. Nassif	Cross-Layer Approaches to Designing Reliable Systems Using Unreliable Chips.	VLSI Design	2008	DBLP DOI BibTeX RDF
42	Gabriel M. Silberman, Ilan Y. Spillinger	Using functional fault simulation and the difference fault model to estimate implementation fault coverage.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
42	Yongchan Ban, Savithri Sundareswaran, David Z. Pan	Total sensitivity based dfm optimization of standard library cells.	ISPD	2010	DBLP DOI BibTeX RDF	optimization, VLSI, sensitivity, DFM, lithography
42	N. Verghese, P. Hurat	DFM reality in sub-nanometer IC design.	ASP-DAC	2007	DBLP DOI BibTeX RDF	EDA solutions, subnanometer IC design, catastrophic failures, systematic manufacturing variations, subnanometer manufacturing variations, DFM, design for manufacturing, parametric failures
42	Carlo Guardiani, Massimo Bertoletti, Nicola Dragone, Marco Malcotti, Patrick McNamara	An effective DFM strategy requires accurate process and IP pre-characterization.	DAC	2005	DBLP DOI BibTeX RDF	test chips, yield, DFM, yield models
37	Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvin Y. Y. Doong, Keh-Jeng Chang	Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM.	ASP-DAC	2007	DBLP DOI BibTeX RDF
37	David Cross, Eric Nequist, Louis Scheffer	A DFM aware, space based router.	ISPD	2007	DBLP DOI BibTeX RDF
37	Anne E. Gattiker	IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM.	ISPD	2006	DBLP DOI BibTeX RDF
37	Yongsik Kim, Taesoo Lim, Dongsoo Kim, Cheol Jung, Honggee Jin	Process-Oriented DFM System for Ubiquitous Devices.	ICCSA (4)	2006	DBLP DOI BibTeX RDF
37	Charles C. Chiang, Jamil Kawa	Three DFM Challenges: Random Defects, Thickness Variation, and Printability Variation.	APCCAS	2006	DBLP DOI BibTeX RDF
37	Naveed A. Sherwani, Susan Lippincott Mack, Alex Alexanian, Premal Buch, Carlo Guardiani, Harold Lehon, Peter Rabkin, Atul Sharan	DFM rules!	DAC	2005	DBLP DOI BibTeX RDF	design for manufacturability, yield optimization
37	Pradiptya Ghosh, Chung-shin Kang, Michael Sanie, David Pinto 0003	New DFM Approach Abstracts AltPSM Lithography Requirements for sub-100nm IC Design Domains.	ISQED	2003	DBLP DOI BibTeX RDF
34	Sachin S. Sapatnekar	Building your yield of dreams.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF	nanoscale, modeling variations, CMOS, yield, design for manufacturability, DFM
34	Young-Gu Kim, Soo-Hwan Kim, Hoon Lim, Sanghoon Lee, Keun-Ho Lee, Young-Kwan Park, Moon-Hyun Yoo	The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era.	ISQED	2008	DBLP DOI BibTeX RDF	Statistical failure analysis, DFM, SRAM
34	Jeng-Liang Tsai, Dong Hyun Baik, Charlie Chung-Ping Chen, Kewal K. Saluja	Yield-Driven, False-Path-Aware Clock Skew Scheduling.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	performance-related circuit yield loss, circuit-level parameters, DFM, clock skew scheduling
33	Kevin Lucas, Chi-Min Yuan, Robert Boone, Karl Wimmer, Kirk Strozewski, Olivier Toublan	Logic Design for Printability Using OPC Methods.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	optical proximity correction (OPC), reticle enhancement technology (RET), design for manufacturability (DFM)
33	Daniel N. Maynard	Productivity Optimization Techniques for the Proactive Semiconductor Manufacturer (invited).	ISQED	2002	DBLP DOI BibTeX RDF	Modeling, Productivity, Design for Manufacturing (DFM), Characterization, Checking
28	David Z. Pan	Synergistic modeling and optimization for nanometer IC design/manufacturing integration.	SBCCI	2008	DBLP DOI BibTeX RDF	design for manufacturing
28	Anne Gattiker	Using test data to improve IC quality and yield.	ICCAD	2008	DBLP DOI BibTeX RDF
28	Nagesh Nagapalli	DFT and Test: Ensuring Product Quality.	ISQED	2007	DBLP DOI BibTeX RDF
28	Vijay Pitchumani	Embedded tutorial I: design for manufacturability.	ASP-DAC	2005	DBLP DOI BibTeX RDF
28	Syed Suhaib, Deepak Mathaikutty, Sandeep K. Shukla, David Berner	Extreme Formal Modeling (XFM) for Hardware Models.	MTV	2004	DBLP DOI BibTeX RDF
28	Sani R. Nassif, Duane S. Boning, Nagib Hakim	The care and feeding of your statistical static timer.	ICCAD	2004	DBLP DOI BibTeX RDF
28	Keh-Jeng Chang	Accurate On-Chip Variation Modeling to Achieve Design for Manufacturability.	IWSOC	2004	DBLP DOI BibTeX RDF
28	Ge Cong, Bahram Parvin	A New Regularized Approach for Contour Morphing.	CVPR	2000	DBLP DOI BibTeX RDF
22	Fabian Walke, Florian Ulmke, Till J. Winkler	Making Digital File Management Successful: A Grounded Model of DFM Adoption in the Public Sector.	HICSS	2024	DBLP BibTeX RDF
22	Vipul Garg, Gopika Vinod, Mahendra Prasad, T. V. Santhosh, N. B. Shrestha, J. Chattopadhyay	Hybrid DFM - Petri net approach for dynamic reliability analysis of smart transmitters.	Qual. Reliab. Eng. Int.	2023	DBLP DOI BibTeX RDF
22	Shunxin Wang, Christoph Brune, Raymond N. J. Veldhuis, Nicola Strisciuglio	DFM-X: Augmentation by Leveraging Prior Knowledge of Shortcut Learning.	CoRR	2023	DBLP DOI BibTeX RDF
22	Chunmian Lin, Daxin Tian, Xuting Duan, Jianshan Zhou, Dezong Zhao, Dongpu Cao	3D-DFM: Anchor-Free Multimodal 3-D Object Detection With Dynamic Fusion Module for Autonomous Driving.	IEEE Trans. Neural Networks Learn. Syst.	2023	DBLP DOI BibTeX RDF
22	Da-Wei Huang, Ying-Jie Jiang, Shao-Yun Fang	Spacing Cost-aware Optimal and Efficient Mixed-Cell-Height Detailed Placement for DFM Considerations.	ICCAD	2023	DBLP DOI BibTeX RDF
22	Shunxin Wang, Christoph Brune, Raymond N. J. Veldhuis, Nicola Strisciuglio	DFM-X: Augmentation by Leveraging Prior Knowledge of Shortcut Learning.	ICCV (Workshops)	2023	DBLP DOI BibTeX RDF
22	Fenfang Zeng, Wei Zheng, Huachang Wang	Research and application of feature-based product process review software DFM.	EITCE	2022	DBLP DOI BibTeX RDF
22	Guangyou Zhou, Zhiwen Xie, Zongfu Yu, Jimmy Xiangji Huang	DFM: A parameter-shared deep fused model for knowledge base question answering.	Inf. Sci.	2021	DBLP DOI BibTeX RDF
22	Ufuk Efe, Kutalmis Gokalp Ince, A. Aydin Alatan	DFM: A Performance Baseline for Deep Feature Matching.	CoRR	2021	DBLP BibTeX RDF
22	Ufuk Efe, Kutalmis Gokalp Ince, A. Aydin Alatan	DFM: A Performance Baseline for Deep Feature Matching.	CVPR Workshops	2021	DBLP BibTeX RDF
22	Mayler G. A. Martins, Samuel N. Pagliarini, Mehmet Meric Isgenc, Lawrence T. Pileggi	From Virtual Characterization to Test-Chips: DFM Analysis Through Pattern Enumeration.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Xin Fang, Rui Min, Zongjie Cao, Yiming Pi	High-order RM and DFM correction method for long-time coherent integration of highly maneuvering target.	Signal Process.	2019	DBLP DOI BibTeX RDF
22	Zeyu Sun, Zhiguo Lv, Yue Hou, Chen Xu, Ben Yan	MR-DFM: A multi-path routing algorithm based on data fusion mechanism in sensor networks.	Comput. Sci. Inf. Syst.	2019	DBLP DOI BibTeX RDF
22	Nikolay Ryzhenko, Steven M. Burns, Anton Sorokin, Mikhail Talalay	Pin Access-Driven Design Rule Clean and DFM Optimized Routing of Standard Cells under Boolean Constraints.	ISPD	2019	DBLP DOI BibTeX RDF
22	Daifeng Guo	Algorithms for DFM in electronic design automation		2019	RDF
22	Ming Chen 0003, Fei Dai 0008, Huibin Wang, Lei Lei	DFM: A Distributed Flocking Model for UAV Swarm Networks.	IEEE Access	2018	DBLP DOI BibTeX RDF
22	Vikas Tripathi, Valerio Perez, Yongfu Li 0003, Zhao Chuan Lee, I-Lun Tseng, Jonathan Ong	Context-Aware DFM Rule Analysis and Scoring Using Machine Learning.	CoRR	2018	DBLP BibTeX RDF
22	Vikas Tripathi, Yongfu Li 0003, Zhao Chuan Lee, I-Lun Tseng, Jason Khaw, Jonathan Ong	In Design DFM Rule Scoring and Fixing Method using ICV.	CoRR	2018	DBLP BibTeX RDF
22	Sebastian B. M. Bosma, Hadi Hajibeygi, Matei Tene, Hamdi A. Tchelepi	Multiscale finite volume method for discrete fracture modeling on unstructured grids (MS-DFM).	J. Comput. Phys.	2017	DBLP DOI BibTeX RDF
22	Ronald Shawn Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li 0001	DFM Evaluation Using IC Diagnosis Data.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2017	DBLP DOI BibTeX RDF
22	Chun-Chen Liu, Oscar Lau, Jason Y. Du	Complete DFM Model for High-Performance Computing SoCs with Guard Ring and Dummy Fill Effect.	CoRR	2017	DBLP BibTeX RDF
22	Samuel Pagliarini, Mayler G. A. Martins, Lawrence T. Pileggi	Virtual characterization for exhaustive DFM evaluation of logic cell libraries.	ISQED	2017	DBLP DOI BibTeX RDF
22	Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz	DFM-aware fault model and ATPG for intra-cell and inter-cell defects.	ITC	2017	DBLP DOI BibTeX RDF
22	Nokhwezi Mjanyelwa, Zaid A. Bello, Willnerie Greaves, Leon D. van Rensburg	Precision and accuracy of DFM soil water capacitance probes to measure temperature.	Comput. Electron. Agric.	2016	DBLP DOI BibTeX RDF
22	Li-Chung Hsu, Yasuhiro Take, Atsutake Kosuge, So Hasegawa, Junichiro Kadamoto, Tadahiro Kuroda	Design and analysis for ThruChip design for manufacturing (DFM).	ASP-DAC	2015	DBLP DOI BibTeX RDF
22	Haitham Eissa, Rami Fathy Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Mohamed Dessouky, David Nairn, Mohab H. Anis	Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow.	IEEE Trans. Very Large Scale Integr. Syst.	2013	DBLP DOI BibTeX RDF
22	Ronald D. Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li 0001	DREAMS: DFM rule EvAluation using manufactured silicon.	ICCAD	2013	DBLP DOI BibTeX RDF
22	Jake Buurma, Robert Sayah, Fred Valente, Cathy Rodgers	OpenDFM Bridging the Gap Between DRC and DFM.	IEEE Des. Test	2012	DBLP DOI BibTeX RDF
22	Srikanth Venkataraman, Nagesh Tamarapalli	Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.	VLSI Design	2012	DBLP DOI BibTeX RDF
22	Olivier Kerbrat, Pascal Mognol, Jean-Yves Hascoët	A new DFM approach to combine machining and additive manufacturing.	Comput. Ind.	2011	DBLP DOI BibTeX RDF
22	Olivier Kerbrat, Pascal Mognol, Jean-Yves Hascoët	A new DFM approach to combine machining and additive manufacturing	CoRR	2011	DBLP BibTeX RDF
22	Rami Fathy Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis	An electrical-aware parametric DFM solution for analog circuits.	IDT	2011	DBLP DOI BibTeX RDF
22	Rami F. Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis	A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow.	SoCC	2011	DBLP DOI BibTeX RDF
22	Savithri Sundareswaran, Robert L. Maziasz, Vladimir Rozenfeld, Mikhail Sotnikov, Mukhanov Konstantin	A sensitivity-aware methodology to improve cell layouts for DFM guidelines.	ISQED	2011	DBLP DOI BibTeX RDF
22	S. M. Stalin, Amit Brahme, Ramakrishnan Venkatraman, Ajoy Mandal	DFM: Impact analysis in a high performance design.	ISQED	2011	DBLP DOI BibTeX RDF
22	Yin Shen, Qiang Zhou 0001, Yici Cai, Xianlong Hong	ECP- and CMP-Aware Detailed Routing Algorithm for DFM.	IEEE Trans. Very Large Scale Integr. Syst.	2010	DBLP DOI BibTeX RDF
22	Jui-Hsiang Liu, Ming-Feng Tsai, Lumdo Chen, Charlie Chung-Ping Chen	Accurate and Analytical Statistical Spatial Correlation Modeling Based on Singular Value Decomposition for VLSI DFM Applications.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2010	DBLP DOI BibTeX RDF
22	Rami F. Salem, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, Mohab H. Anis	A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs.	IDT	2010	DBLP DOI BibTeX RDF