Search results for "KGD"

Found 11 publication records. Showing 11 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
139	Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn	Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	known good die, bare die test, multichip modules
60	Larry Gilg	Known Good Die.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	known good die, KGD, chip scale (size) package, multi-chip module (MCM), wafer probe, membrane probe card, buckling beam probe card, KGD carrier, CSP, burn-in
57	Joel A. Jorgenson, Russell J. Wagner	Design-For-Test in a Multiple Substrate Multichip Module.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	Multichip Module (MCM) Test, Known-Good Die (KGD), Ball Grid Array (BGA), Built-In-Self-Test (BIST), boundary-scan
56	Anne E. Gattiker, Wojciech Maly	Smart Substrate MCMs.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	smart substrate, testing, cost model, MCM
36	Kexin Wang, Zhixu Li, Jiaan Wang, Jianfeng Qu, Ying He 0010, An Liu 0002, Lei Zhao 0001	RT-KGD: Relation Transition Aware Knowledge-Grounded Dialogue Generation.	CoRR	2022	DBLP DOI BibTeX RDF
36	Kexin Wang, Zhixu Li, Jiaan Wang, Jianfeng Qu, Ying He 0010, An Liu 0002, Lei Zhao 0001	RT-KGD: Relation Transition Aware Knowledge-Grounded Dialogue Generation.	ISWC	2022	DBLP DOI BibTeX RDF
36	D. Kasprowicz, Pawel Gluchowski, K. Jaroszewski, Maciej Chrunik, Andrzej Majchrowski	Up-conversion luminescence and µ-Raman investigations of KGd(WO4)2 crystalline powders doped with rare earth ions.	ICTON	2016	DBLP DOI BibTeX RDF
36	Hervé Minoux, Christophe Chipot, David Brown 0001, Bernard Maigret	Structural analysis of the KGD sequence loop of barbourin, an alpha-IIb-beta-3-specific disintegrin.	J. Comput. Aided Mol. Des.	2000	DBLP DOI BibTeX RDF
36	Adit D. Singh, Phil Nigh, C. Mani Krishna 0001	Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study.	ITC	1997	DBLP DOI BibTeX RDF
36	Uwe Höhne	DIAMOND: Der Einsatz von innovativen Informationstechnologien in der Produktion am Beispiel der KGD AG, Köln.	GI Jahrestagung	1993	DBLP DOI BibTeX RDF
30	Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda	System-in-Package Testing: Problems and Solutions.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	IEEE1500 SECT, KGD, System-on-Chip, SoC, test access mechanism, SiP, System-in-Package, System-on-Package