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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 571 publication records. Showing 571 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
134 | Seongmoon Wang, Sandeep K. Gupta 0001 |
DS-LFSR: a BIST TPG for low switching activity. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2002 |
DBLP DOI BibTeX RDF |
|
84 | Jovan Dj. Golic, Renato Menicocci |
Statistical distinguishers for irregularly decimated linear recurring sequences. |
IEEE Trans. Inf. Theory |
2006 |
DBLP DOI BibTeX RDF |
|
82 | Jinkyu Lee 0005, Nur A. Touba |
LFSR-Reseeding Scheme Achieving Low-Power Dissipation During Test. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2007 |
DBLP DOI BibTeX RDF |
|
82 | Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang |
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
|
82 | Hong-Sik Kim, Sungho Kang 0001 |
Increasing encoding efficiency of LFSR reseeding-based test compression. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2006 |
DBLP DOI BibTeX RDF |
|
82 | C. V. Krishna, Nur A. Touba |
Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
79 | Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei |
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. |
IEEE Trans. Computers |
2008 |
DBLP DOI BibTeX RDF |
output compaction, temporal compactor, blocking unknown values, LFSR reseeding, Built-in Self-Test, BIST, test data compression, MISR, response compaction |
79 | Richard Putman |
Using reiterative LFSR based X-masking to increase output compression in presence of unknowns. |
ACM Great Lakes Symposium on VLSI |
2008 |
DBLP DOI BibTeX RDF |
reiterative, x-masking, compression, LFSR |
79 | Sarbani Palit, Bimal K. Roy, Arindom De |
A Fast Correlation Attack for LFSR-Based Stream Ciphers. |
ACNS |
2003 |
DBLP DOI BibTeX RDF |
LFSR polynomial, Correlation immune function, Stream cipher, Correlation attack |
73 | Guang Zeng, Yang Yang, Wenbao Han, Shuqin Fan |
Word Oriented Cascade Jump sigma-LFSR. |
AAECC |
2009 |
DBLP DOI BibTeX RDF |
Cascade Jump LFSR, ??LFSR, Fast Software Encryption, Stream Cipher, Linear Feedback Shift Register(LFSR) |
73 | Ming-Der Shieh, Hsin-Fu Lo, Ming-Hwa Sheu |
High-speed generation of LFSR signatures. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
high-speed generation, LFSR signatures, compaction simulation, single-input signature register, equivalent multiple-input implementation, finite field theory, high-speed signature computations, lookahead technique, internal-XOR LFSR, external-XOR LFSR, performance evaluation, logic testing, built-in self test, integrated circuit testing, automatic test pattern generation, BIST, linear feedback shift register, binary sequences, subsequences |
71 | Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek |
Deviation-Based LFSR Reseeding for Test-Data Compression. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2009 |
DBLP DOI BibTeX RDF |
|
71 | C. V. Krishna, Abhijit Jas, Nur A. Touba |
Achieving high encoding efficiency with partial dynamic LFSR reseeding. |
ACM Trans. Design Autom. Electr. Syst. |
2004 |
DBLP DOI BibTeX RDF |
linear finite shift register, compression, Built-in self-test, reseeding |
71 | Jinkyu Lee 0005, Nur A. Touba |
Low Power Test Data Compression Based on LFSR Reseeding. |
ICCD |
2004 |
DBLP DOI BibTeX RDF |
|
71 | Shridhar K. Mukund, Edward J. McCluskey, T. R. N. Rao |
An apparatus for pseudo-deterministic testing. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
pseudo-deterministic testing, deterministic patterns, at-speed BIST, arbitrary length shift register, care bits, tap configurations, test segments, don't care bits, random pattern resistant faults, interconnected logic blocks, logic testing, built-in self test, integrated circuit testing, LFSR, shift registers, computational efficiency, test vector, pseudo-random sequences |
69 | Dimitri Kagaris, Spyros Tragoudas |
LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of Seeds. |
J. Electron. Test. |
2003 |
DBLP DOI BibTeX RDF |
built-in self-test (BIST), Linear Feedback Shift Registers (LFSR), test pattern generation (TPG) |
68 | Santosh Chandrasekhar, Saikat Chakrabarti 0002, Mukesh Singhal |
Efficient Proxy Signatures For Ubiquitous Computing. |
SUTC |
2008 |
DBLP DOI BibTeX RDF |
Schnorr signature, LFSR sequence, cubic LFSR-based cryptosystems, mobile agents, provable security, Proxy signature, ubiquitous systems |
66 | Guang Zeng, Yang Yang, Wenbao Han, Shuqin Fan |
Reducible Polynomial over F2 Constructed by Trinomial sigma-LFSR. |
Inscrypt |
2008 |
DBLP DOI BibTeX RDF |
Stickelberger-Swan Theorem, ??LFSR, Finite Field, Linear Feedback Shift Register(LFSR), Irreducible Polynomial |
63 | Cédric Lauradoux |
From Hardware to Software Synthesis of Linear Feedback Shift Registers. |
IPDPS |
2007 |
DBLP DOI BibTeX RDF |
|
63 | Chien-In Henry Chen, Kiran George |
Automated Synthesis of Configurable Two-dimensional Linear Feedback Shifter Registers for Random/Embedded Test Patterns. |
ISQED |
2003 |
DBLP DOI BibTeX RDF |
|
63 | Wei-Lun Wang, Kuen-Jong Lee |
An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment. |
J. Electron. Test. |
2002 |
DBLP DOI BibTeX RDF |
mixed-mode pattern generation, built-in self-test, power consumption, test application time, scan chain |
61 | Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang |
Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing. |
CSE (2) |
2009 |
DBLP DOI BibTeX RDF |
|
61 | Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek |
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
61 | Patrick Girard 0001, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, João Paulo Teixeira 0001, Marcelino B. Santos |
Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. |
ISCAS (1) |
1999 |
DBLP DOI BibTeX RDF |
|
61 | Dimitrios Kagaris, Spyros Tragoudas |
Cost-effective LFSR synthesis for optimal pseudoexhaustive BIST test sets. |
IEEE Trans. Very Large Scale Integr. Syst. |
1993 |
DBLP DOI BibTeX RDF |
|
60 | Sourav Mukhopadhyay, Palash Sarkar 0001 |
Application of LFSRs in Time/Memory Trade-Off Cryptanalysis. |
WISA |
2005 |
DBLP DOI BibTeX RDF |
Time/memory trade-off, LFSR, rainbow table |
60 | Jin Hong 0001, Dong Hoon Lee 0002, Seongtaek Chee, Palash Sarkar 0001 |
Vulnerability of Nonlinear Filter Generators Based on Linear Finite State Machines. |
FSE |
2004 |
DBLP DOI BibTeX RDF |
nonlinear filter model, Anderson information leakage, Stream cipher, LFSR, CA |
58 | Saikat Chakrabarti 0002, Santosh Chandrasekhar, Mukesh Singhal, Kenneth L. Calvert |
Authenticating Feedback in Multicast Applications Using a Novel Multisignature Scheme Based on Cubic LFSR Sequences. |
AINA Workshops (1) |
2007 |
DBLP DOI BibTeX RDF |
Multicast acknowledgements, authenticated feedback, Ack implosion, generalized El-Gamal signatures, LFSR-based PKCs, multisignatures |
58 | Seongan Lim, Seungjoo Kim, Ikkwon Yie, Jaemoon Kim |
Comments on a Signature Scheme Based on the Third Order LFSR Proposed at ACISP2001. |
INDOCRYPT |
2001 |
DBLP DOI BibTeX RDF |
Trace Projection, LFSR, digital signature scheme, XTR |
58 | Dimitrios Kagaris, Spyros Tragoudas |
Avoiding linear dependencies in LFSR test pattern generators. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
ATPG, BIST, LFSR, characteristic polynomials, pseudo-random testing |
55 | Laung-Terng Wang, Edward J. McCluskey |
Condensed Linear Feedback Shift Register (LFSR) Testing - A Pseudoexhaustive Test Technique. |
IEEE Trans. Computers |
1986 |
DBLP DOI BibTeX RDF |
Autonomous test, condensed LFSR testing, LFSR testing, built-in self-test, test pattern generation, pseudoexhaustive testing |
52 | Benjamin Vigoda, Justin Dauwels, Matthias Frey, Neil Gershenfeld, Tobias Koch 0001, Hans-Andrea Loeliger, Patrick R. Merkli |
Synchronization of Pseudorandom Signals by Forward-Only Message Passing With Application to Electronic Circuits. |
IEEE Trans. Inf. Theory |
2006 |
DBLP DOI BibTeX RDF |
|
52 | Wei-Lun Wang, Kuen-Jong Lee |
Accelerated test pattern generators for mixed-mode BIST environments. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
accelerated test pattern generators, mixed-mode BIST, pseudorandom patterns, deterministic patterns, scan-based built-in self-test, multiple sub-chains, multiple sequence generator, fault diagnosis, logic testing, built-in self test, integrated circuit testing, automatic test pattern generation, fault coverage, linear feedback shift registers, cost, test pattern generator, shift registers, test application time, scan chain, mixed analogue-digital integrated circuits, clock cycle, integrated circuit economics |
52 | Christian Dufaza, Yervant Zorian |
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs. |
ED&TC |
1997 |
DBLP DOI BibTeX RDF |
|
50 | Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang 0001 |
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. |
J. Electron. Test. |
2008 |
DBLP DOI BibTeX RDF |
Built-in self-test, Power consumption, Linear feedback shift register, Reseeding |
50 | Laurent Alaus, Dominique Noguet, Jacques Palicot |
A Reconfigurable LFSR for Tri-standard SDR Transceiver, Architecture and Complexity Analysis. |
DSD |
2008 |
DBLP DOI BibTeX RDF |
|
50 | Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar |
Efficient unknown blocking using LFSR reseeding. |
DATE |
2006 |
DBLP DOI BibTeX RDF |
|
50 | Antoine Joux, Pascal Delaunay |
Galois LFSR, Embedded Devices and Side Channel Weaknesses. |
INDOCRYPT |
2006 |
DBLP DOI BibTeX RDF |
|
50 | Yu-Hsuan Fu, Sying-Jyan Wang |
Test Data Compression with Partial LFSR-Reseeding. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
|
50 | Kenneth J. Giuliani, Guang Gong |
New LFSR-Based Cryptosystems and the Trace Discrete Log Problem (Trace-DLP). |
SETA |
2004 |
DBLP DOI BibTeX RDF |
|
50 | Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota |
Combining dictionary coding and LFSR reseeding for test data compression. |
DAC |
2004 |
DBLP DOI BibTeX RDF |
built-In self test, VLSI test |
50 | Hong-Sik Kim, YongJoon Kim, Sungho Kang 0001 |
Test-decompression mechanism using a variable-length multiple-polynomial LFSR. |
IEEE Trans. Very Large Scale Integr. Syst. |
2003 |
DBLP DOI BibTeX RDF |
|
50 | C. V. Krishna, Nur A. Touba |
Hybrid BIST Using an Incrementally Guided LFSR. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
50 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos |
A ROMless LFSR Reseeding Scheme for Scan-based BIST. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
|
50 | Wen-Ben Jone, Jiann-Chyi Rau, Shih-Chieh Chang, Yu-Liang Wu |
A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
50 | Li-Ren Huang, Jing-Yang Jou, Sy-Yen Kuo |
An Efficient PRPG Strategy By Utilizing Essential Faults. |
Asian Test Symposium |
1996 |
DBLP DOI BibTeX RDF |
PRPG, essential fault, multiple polynomial, Gauss elimination, pseudorandom test pattern, multivariable linear equation, deterministic test set, random pattern resistant circuit, don't care value, intelligent heuristic, ISCAS-85 benchmark, ISCAS-89 benchmark, built-in self test, BIST, fault coverage, LFSR, test length, hardware overhead, multiple seed |
48 | Saikat Chakrabarti 0002, Santosh Chandrasekhar, Mukesh Singhal, Kenneth L. Calvert |
Authenticating DSR Using a Novel Multisignature Scheme Based on Cubic LFSR Sequences. |
ESAS |
2007 |
DBLP DOI BibTeX RDF |
generalized El Gamal signatures, LFSR-based PKCs, DSR, secure routing, multisignatures, small-world graphs, PGP |
48 | Hongjoong Shin, Hak-soo Yu, Jacob A. Abraham |
LFSR-based BIST for analog circuits using slope detection. |
ACM Great Lakes Symposium on VLSI |
2004 |
DBLP DOI BibTeX RDF |
slope detection, BIST, LFSR, analog testing, mixed-signal testing |
48 | Lijian Li, Yinghua Min |
An efficient BIST design using LFSR-ROM architecture. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
read-only storage, BIST design, LFSR-ROM architecture, built-in self test, logic design, automatic test pattern generation, test pattern generation, integrated circuit design, shift registers, hardware overhead, ROM, integrated circuit economics |
42 | Andrzej Hlawiczka, Krzysztof Gucwa, Tomasz Garbolino, Michal Kopec |
Interconnect Faults Identification and Localization Using Modified Ring LFSRs. |
DDECS |
2008 |
DBLP DOI BibTeX RDF |
|
42 | Alexander Maximov |
Cryptanalysis of the "Grain" family of stream ciphers. |
AsiaCCS |
2006 |
DBLP DOI BibTeX RDF |
decoding problem, cryptanalysis, correlation attacks, distinguisher, grain |
42 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos |
Multiphase BIST: a new reseeding technique for high test-data compression. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2004 |
DBLP DOI BibTeX RDF |
|
42 | Huaguo Liang, Cuiyun Jiang |
Sharing BIST with Multiple Cores for System-on-a-Chip. |
Asian Test Symposium |
2003 |
DBLP DOI BibTeX RDF |
|
42 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos |
A highly regular multi-phase reseeding technique for scan-based BIST. |
ACM Great Lakes Symposium on VLSI |
2003 |
DBLP DOI BibTeX RDF |
scan-based schemes, built-in self-test, linear feedback shift registers, reseeding |
42 | Irith Pomeranz, Sudhakar M. Reddy |
On methods to match a test pattern generator to a circuit-under-test. |
IEEE Trans. Very Large Scale Integr. Syst. |
1998 |
DBLP DOI BibTeX RDF |
|
42 | Jovan Dj. Golic |
Towards Fast Correlation Attacks on Irregularly Clocked Shift Registers. |
EUROCRYPT |
1995 |
DBLP DOI BibTeX RDF |
|
42 | Willi Meier, Othmar Staffelbach |
Fast Correlation Attacks on Stream Ciphers (Extended Abstract). |
EUROCRYPT |
1988 |
DBLP DOI BibTeX RDF |
|
40 | Saikat Chakrabarti 0002, Santosh Chandrasekhar, Mukesh Singhal, Kenneth L. Calvert |
An Efficient and Scalable Quasi-Aggregate Signature Scheme Based on LFSR Sequences. |
IEEE Trans. Parallel Distributed Syst. |
2009 |
DBLP DOI BibTeX RDF |
|
40 | Artur Jutman, Anton Tsertov, Raimund Ubar |
Calculation of LFSR Seed and Polynomial Pair for BIST Applications. |
DDECS |
2008 |
DBLP DOI BibTeX RDF |
|
40 | Claudio Mucci, Luca Vanzolini, Ilario Mirimin, Daniele Gazzola, Antonio Deledda, Sebastian Goller, Joachim Knäblein, Axel Schneider, Luca Ciccarelli, Fabio Campi |
Implementation of Parallel LFSR-based Applications on an Adaptive DSP featuring a Pipelined Configurable Gate Array. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
40 | Zheng Gong, Yu Long 0001, Kefei Chen |
Efficient Partially Blind Signature from LFSR. |
SNPD (2) |
2007 |
DBLP DOI BibTeX RDF |
|
40 | Sanjay Burman, Debdeep Mukhopadhyay, Kamakoti Veezhinathan |
LFSR Based Stream Ciphers Are Vulnerable to Power Attacks. |
INDOCRYPT |
2007 |
DBLP DOI BibTeX RDF |
Linear Feed Back Shift Registers, Dynamic Power Dissipation, Side Channel Attacks, Power Analysis, Hamming Distance |
40 | Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed |
Low Transition LFSR for BIST-Based Applications. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
|
40 | Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
40 | Nan-Cheng Li, Sying-Jyan Wang |
A Reseeding Technique for LFSR-Based BIST Applications. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
Reseedling, LFST, BIST, Test Pattern Generator, Pseudo-Random Testing |
40 | Seung-Moon Yoo, Seong-Ook Jung, Sung-Mo Kang |
Low cost and high efficiency BIST scheme with 2-level LFSR and ATPT. |
ISCAS (4) |
2001 |
DBLP DOI BibTeX RDF |
|
40 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
A New Reseeding Technique for LFSR-Based Test Pattern Generation. |
IOLTW |
2001 |
DBLP DOI BibTeX RDF |
|
40 | Li-Ren Huang, Jing-Yang Jou, Sy-Yen Kuo |
Gauss-elimination-based generation of multiple seed-polynomial pairs for LFSR. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1997 |
DBLP DOI BibTeX RDF |
|
40 | Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller |
Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
linear hybrid cellular automata, sequential fault, transition capability, built-in self-test, linear feedback shift register, linear finite state machine |
40 | Hugo Krawczyk |
LFSR-based Hashing and Authentication. |
CRYPTO |
1994 |
DBLP DOI BibTeX RDF |
|
40 | Peizhong Lu, Song Guowen |
Feasible Calculation of the Generator for Combined LFSR Sequences. |
AAECC |
1990 |
DBLP DOI BibTeX RDF |
|
39 | Bin Zhang 0003, Dengguo Feng |
New Guess-and-Determine Attack on the Self-Shrinking Generator. |
ASIACRYPT |
2006 |
DBLP DOI BibTeX RDF |
Self-shrinking, Guess-and-determine, Stream cipher, Linear feedback shift register (LFSR) |
39 | Biplab K. Sikdar, Kolin Paul, Gosta Pada Biswas, Parimal Pal Chaudhuri, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee |
Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator. |
VLSI Design |
2000 |
DBLP DOI BibTeX RDF |
Extension field, BIST structure, Cellular Automata (CA), VLSI design and RTL, Finite field, DFT, Fault coverage, LFSR |
39 | Nadime Zacharia, Janusz Rajski, Jerzy Tyszer |
Decompression of test data using variable-length seed LFSRs. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
test data decompression, variable-length seed LFSRs, deterministic test vectors, scan circuits, multiple polynomial LFSR, encoding efficiency, logic testing, built-in self test, integrated circuit testing, encoding, automatic testing, polynomials, linear feedback shift register, shift registers, modular design, digital integrated circuits |
38 | Mohamed El-Hadedy 0001, Russell Hua, Kazutomo Yoshii, Wen-Mei Hwu, Martin Margala |
RECO-LFSR: Reconfigurable Low-power Cryptographic processor based on LFSR for Trusted IoT platforms. |
ISQED |
2023 |
DBLP DOI BibTeX RDF |
|
38 | Abhishek Chakraborty 0001, Bodhisatwa Mazumdar, Debdeep Mukhopadhyay |
Fibonacci LFSR vs. Galois LFSR: Which is More Vulnerable to Power Attacks? |
SPACE |
2014 |
DBLP DOI BibTeX RDF |
|
37 | Leonard Colavito, Dennis Silage |
Efficient PGA LFSR Implementation Whitens Pseudorandom Numbers. |
ReConFig |
2009 |
DBLP DOI BibTeX RDF |
Whitening, FPGA, LFSR |
37 | Xiaowei Li 0001, Paul Y. S. Cheung, Hideo Fujiwara |
LFSR-Based Deterministic TPG for Two-Pattern Testing. |
J. Electron. Test. |
2000 |
DBLP DOI BibTeX RDF |
configurable LFSR, built-in self-test, path delay faults, two-pattern test |
31 | Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed |
Low-Transition Test Pattern Generation for BIST-Based Applications. |
IEEE Trans. Computers |
2008 |
DBLP DOI BibTeX RDF |
Low power pattern generation, Test generation, Built-in tests, Testing strategies, Random generation |
31 | Hong-Sik Kim, Sungho Kang 0001, Michael S. Hsiao |
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. |
J. Electron. Test. |
2008 |
DBLP DOI BibTeX RDF |
Keyword System on a chip, Test compression, Low power testing, Scan testing |
31 | Debrup Chakraborty, Palash Sarkar 0001 |
A General Construction of Tweakable Block Ciphers and Different Modes of Operations. |
IEEE Trans. Inf. Theory |
2008 |
DBLP DOI BibTeX RDF |
|
31 | Makoto Matsumoto, Mutsuo Saito, Takuji Nishimura, Mariko Hagita |
A Fast Stream Cipher with Huge State Space and Quasigroup Filter for Software. |
Selected Areas in Cryptography |
2007 |
DBLP DOI BibTeX RDF |
combined generator, filter with memory, quasigroup filter, multiplicative filter, CryptMT, distribution, stream cipher, period, eSTREAM |
31 | Petr Fiser |
Pseudo-Random Pattern Generator Design for Column-Matching BIST. |
DSD |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Dong Zheng 0001, Xiangxue Li, Kefei Chen, Jianhua Li |
Linkable Ring Signatures from Linear Feedback Shift Register. |
EUC Workshops |
2007 |
DBLP DOI BibTeX RDF |
Characteristic sequence, Linkabilty, Anonymity, Linear feedback shift register, Ring signatures |
31 | Kedarnath J. Balakrishnan |
Efficient Scan-Based BIST Using Multiple LFSRs and Dictionary Coding. |
VLSI Design |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Malav Shah, Dipankar Nagchoudhuri |
BIST Scheme for Low Heat Dissipation and Reduced Test Application Time. |
VLSI-SoC |
2006 |
DBLP DOI BibTeX RDF |
|
31 | Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar |
PIDISC: Pattern Independent Design Independent Seed Compression Technique. |
VLSI Design |
2006 |
DBLP DOI BibTeX RDF |
|
31 | Frederik Armknecht, Willi Meier |
Fault Attacks on Combiners with Memory. |
Selected Areas in Cryptography |
2005 |
DBLP DOI BibTeX RDF |
|
31 | Bin Zhang 0003, Hongjun Wu 0001, Dengguo Feng, Feng Bao 0001 |
Security Analysis of the Generalized Self-shrinking Generator. |
ICICS |
2004 |
DBLP DOI BibTeX RDF |
Stream cipher, Linear feedback shift register, Fast correlation attack, Clock control, Self-shrinking generator |
31 | Patrik Ekdahl, Willi Meier, Thomas Johansson 0001 |
Predicting the Shrinking Generator with Fixed Connections. |
EUROCRYPT |
2003 |
DBLP DOI BibTeX RDF |
|
31 | Chien-In Henry Chen, Kiran George |
Configurable two-dimensional linear feedback shifter registers for deterministic and random patterns [logic BIST]. |
ISCAS (5) |
2003 |
DBLP DOI BibTeX RDF |
|
31 | Chunsheng Liu, Krishnendu Chakrabarty |
Compact Dictionaries for Fault Diagnosis in BIST. |
ISQED |
2003 |
DBLP DOI BibTeX RDF |
|
31 | Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang 0008 |
Low-Energy BIST Design for Scan-based Logic Circuits. |
VLSI Design |
2003 |
DBLP DOI BibTeX RDF |
|
31 | Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin |
Efficient compression and application of deterministic patterns in a logic BIST architecture. |
DAC |
2003 |
DBLP DOI BibTeX RDF |
test-generation (ATPG), self-test (BIST) |
31 | Srinivas Devadas, Kurt Keutzer |
An algorithmic approach to optimizing fault coverage for BIST logic synthesis. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
31 | Nur A. Touba, Edward J. McCluskey |
Transformed pseudo-random patterns for BIST. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
pseudorandom patterns transformation, onchip test pattern generation, mapping logic, on-chip TPG, logic testing, built-in self test, integrated circuit testing, logic design, BIST, combinational circuits, automatic testing, combinational logic |
31 | Kencheng Zeng, Dah-Yea Wei, T. R. N. Rao |
d-Functions in Vk(F2) and Self-Decimation of m-Sequences. |
AAECC |
1991 |
DBLP DOI BibTeX RDF |
|
31 | Peter D. Hortensius, Robert D. McLeod, Werner Pries, D. Michael Miller, Howard C. Card |
Cellular automata-based pseudorandom number generators for built-in self-test. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1989 |
DBLP DOI BibTeX RDF |
|
31 | Yves Roggeman |
Varying Feedback Shift Registers. |
EUROCRYPT |
1989 |
DBLP DOI BibTeX RDF |
|
31 | Harald Niederreiter |
Keysystem Sequences with a Good Linear Complexity Profile for Every STrating Point. |
EUROCRYPT |
1989 |
DBLP DOI BibTeX RDF |
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