The FacetedDBLP logo    Search for: in:

Disable automatic phrases ?     Syntactic query expansion: ?

Searching for SCOAP with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1980-2022 (15) 2023 (1)
Publication types (Num. hits)
article(5) inproceedings(11)
Venues (Conferences, Journals, ...)
GrowBag graphs for keyword ? (Num. hits/coverage)

Group by:
The graphs summarize 38 occurrences of 34 keywords

Results
Found 16 publication records. Showing 16 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
200C. P. Ravikumar, Hemant Joshi HISCOAP: a hierarchical testability analysis tool. Search on Bibsonomy VLSI Design The full citation details ... 1995 DBLP  DOI  BibTeX  RDF HISCOAP, hierarchical testability analysis tool, SCOAP measure, gate-level netlist, SCOAP expression diagrams, VLSI, logic testing, controllability, controllability, sequential circuits, sequential circuits, combinational circuits, combinational circuits, observability, observability, circuit analysis computing, integrated logic circuits, VLSI circuits, functional modules, stuck at fault model
53Waleed K. Al-Assadi, Sindhu Kakarla Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF NULL convention logic (NCL), SCOAP, ATPG, Asynchronous circuits, Design for test (DFT)
53C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal A STAFAN-like functional testability measure for register-level circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 1995 DBLP  DOI  BibTeX  RDF functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model
35Richa Sharma, G. K. Sharma 0001, Manisha Pattanaik, V. S. S. Prashant Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model. Search on Bibsonomy J. Electron. Test. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
35Chi-Wei Chen, Pei-Yu Lo, Wei-Ting Hsu, Chih-Wei Chen, Chin-Wei Tien, Sy-Yen Kuo A Hardware Trojan Insertion Framework against Gate-Level Netlist Structural Feature-based and SCOAP-based Detection. Search on Bibsonomy MWSCAS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
35Pei-Yu Lo, Chi-Wei Chen, Wei-Ting Hsu, Chih-Wei Chen, Chin-Wei Tien, Sy-Yen Kuo Semi-supervised Trojan Nets Classification Using Anomaly Detection Based on SCOAP Features. Search on Bibsonomy ISCAS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
35Seyyede Maryam Ghasemy, Maryam Rajabalipanah, Saeideh Sarmadi, Zainalabedin Navabi SCOAP-based Directed Random Test Generation for Combinational Circuits. Search on Bibsonomy EWDTS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
35Chee Hoo Kok, Chia Yee Ooi, Mehrdad Moghbel, Nordinah Ismail, Hau Sim Choo, Michiko Inoue Classification of Trojan Nets Based on SCOAP Values using Supervised Learning. Search on Bibsonomy ISCAS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
35Nam Ky Giang, Minkeun Ha, Daeyoung Kim 0001 SCoAP: An integration of CoAP protocol with web-based application. Search on Bibsonomy GLOBECOM The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
35C. P. Ravikumar, Hemant Joshi SCOAP-based Testability Analysis from Hierarchical Netlists. Search on Bibsonomy VLSI Design The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
35Lawrence H. Goldstein, Evelyn L. Thigpen SCOAP: Sandia controllability/observability analysis program. Search on Bibsonomy DAC The full citation details ... 1980 DBLP  DOI  BibTeX  RDF
23Shih-Chieh Chang, Wen-Ben Jone, Shi-Sen Chang TAIR: testability analysis by implication reasoning. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
23M. H. Konijnenburg, Hans van der Linden, Ad J. van de Goor Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. Search on Bibsonomy Asian Test Symposium The full citation details ... 1999 DBLP  DOI  BibTeX  RDF sequential circuit TPG, back-jumping, conflict-directed backtrack, three-state (tri-state) circuit TPG, ATPG, cost estimates
23Kim T. Le, Kewal K. Saluja A Heuristic Measure to Maximize Detected Faults per Test. Search on Bibsonomy J. Electron. Test. The full citation details ... 1998 DBLP  DOI  BibTeX  RDF combinational circuit testing, dynamic test compaction, fault selection, test generation, testability measures, backtrace
23Marie-Lise Flottes, R. Pires, Bruno Rouzeyre Analyzing testability from behavioral to RT level. Search on Bibsonomy ED&TC The full citation details ... 1997 DBLP  DOI  BibTeX  RDF
23Eric Schell, M. Ray Mercer CADTOOLS: a CAD algorithm development system. Search on Bibsonomy DAC The full citation details ... 1985 DBLP  DOI  BibTeX  RDF software engineering, CAD
Displaying result #1 - #16 of 16 (100 per page; Change: )
Valid XHTML 1.1! Valid CSS! [Valid RSS]
Maintained by L3S.
Previously maintained by Jörg Diederich.
Based upon DBLP by Michael Ley.
open data data released under the ODC-BY 1.0 license