|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 30 occurrences of 25 keywords
|
|
|
Results
Found 10 publication records. Showing 9 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
224 | C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal |
A STAFAN-like functional testability measure for register-level circuits. |
Asian Test Symposium |
1995 |
DBLP DOI BibTeX RDF |
functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model |
58 | Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges |
Statistical estimation of delay fault detectabilities and fault grading. |
Great Lakes Symposium on VLSI |
1995 |
DBLP DOI BibTeX RDF |
delay fault detectabilities, fault grading, STAFAN, transition observabilities, fanout stems, fanout free region, gate line transition controllabilities, VLSI, fault diagnosis, logic testing, logic testing, statistical analysis, fault coverage, benchmark circuits, statistical estimation |
51 | Masahisa Nakazawa, Susumu Nitta, Kanji Hirabayashi |
Probabilistic fault grading based on activation checking and observability analysis. |
J. Electron. Test. |
1990 |
DBLP DOI BibTeX RDF |
activation checking, fault-free simulation, fault grading, statistical fault analysis, controllability, observability, detectability |
51 | Michael Brühan, Reinhold Kröger, Stafan Ruppert |
Monitoring verteilter CORBA-Anwendungen. |
MMB (Kurzbeiträge) |
1997 |
DBLP BibTeX RDF |
|
39 | Joan Villoldo, Prathima Agrawal, Vishwani D. Agrawal |
Stafan Algorithms for MOS Circuits. |
ICCD |
1991 |
DBLP DOI BibTeX RDF |
|
39 | Vishwani D. Agrawal |
STAFAN Takes a Middle Course. |
ITC |
1985 |
DBLP BibTeX RDF |
|
39 | Sunil K. Jain, Vishwani D. Agrawal |
STAFAN: An alternative to fault simulation. |
DAC |
1984 |
DBLP BibTeX RDF |
|
25 | Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges |
Statistical estimation of delay fault detectabilities and fault grading. |
J. Electron. Test. |
1996 |
DBLP DOI BibTeX RDF |
transition delay and path delay faults, statistical delay fault analysis, fault detectabilities, fault coverage, random patterns |
25 | Peter Odryna, Kevin Nazareth, Carl Christensen |
A workstation-mixed model circuit simulator. |
DAC |
1986 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #9 of 9 (100 per page; Change: )
|
|