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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 16 occurrences of 14 keywords
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Results
Found 12 publication records. Showing 12 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
64 | Xiaowei Li 0001, Toshimitsu Masuzawa, Hideo Fujiwara |
Strong self-testability for data paths high-level synthesis. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
self-testability, testability constraints, interconnection assignment, test resources reusability, high level synthesis, high-level synthesis, design for testability, register transfer level, data flow graphs, data paths, register assignment |
40 | Sami Beydeda |
Self-Metamorphic-Testing Components. |
COMPSAC (2) |
2006 |
DBLP DOI BibTeX RDF |
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28 | Xiaowei Li 0001, Paul Y. S. Cheung |
Data Path Synthesis for BIST with Low Area Overhead. |
ASP-DAC |
1999 |
DBLP DOI BibTeX RDF |
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27 | Sami Beydeda |
Self-Testability in Unit Testing. |
COMPSAC (2) |
2005 |
DBLP DOI BibTeX RDF |
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20 | Andrzej Krasniewski |
Design of Dependable Hardware: What BIST is most Efficient? |
EDCC |
1996 |
DBLP DOI BibTeX RDF |
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17 | Tianjia Sun, Li Guo 0004 |
One New In-Operation Self-Testability Mechanism Designed for SoC Microchips following IEEE STD 1500. |
ICPP Workshops |
2007 |
DBLP DOI BibTeX RDF |
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17 | Manoj Singh Gaur, Mark Zwolinski |
Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique. |
VLSI Design |
2004 |
DBLP DOI BibTeX RDF |
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17 | Ian G. Harris, Alex Orailoglu |
SYNCBIST: SYNthesis for Concurrent Built-In-Self-Testability. |
ICCD |
1994 |
DBLP DOI BibTeX RDF |
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17 | Christos A. Papachristou, Scott Chiu, Haidar Harmanani |
SYNTEST: A Method for High-Level SYNthesis with Self-TESTability. |
ICCD |
1991 |
DBLP DOI BibTeX RDF |
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17 | Sami Beydeda |
STECC: Selbsttestende Software-Komponenten. |
Inform. Forsch. Entwickl. |
2007 |
DBLP DOI BibTeX RDF |
Self-testability, Control flow graph generation, Path-oriented testing, Component-based development |
12 | Steve Hodgson, Len Theobald, W. B. Hughes, Richard Illman |
ASTA: an integrated system for bist analysis & automatic test generation. |
EURO-DAC |
1990 |
DBLP DOI BibTeX RDF |
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10 | Mahsa Vahidi, Alex Orailoglu |
Testability metrics for synthesis of self-testable designs and effective test plans. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
testability metrics, self-testable designs, effective test plans, unified metrics, synthesis phases, VLSI, VLSI, built-in self test, high level synthesis, high level synthesis, design for testability, BIST, DFT, logic CAD, integrated circuit design, benchmark designs |
Displaying result #1 - #12 of 12 (100 per page; Change: )
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