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Publication years (Num. hits)
1989-1999 (15) 2000-2006 (18) 2007-2009 (20) 2010-2013 (17) 2014-2015 (17) 2016-2018 (26) 2019-2020 (20) 2021-2022 (23) 2023 (21)
Publication types (Num. hits)
article(74) data(1) incollection(1) inproceedings(97) phdthesis(4)
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Found 177 publication records. Showing 177 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
77Martin D. Giles, Duane S. Boning, Goodwin R. Chin, Walter C. Dietrich Jr., Michael S. Karasick, Mark E. Law, Purnendu K. Mozumder, Lee R. Nackman, V. T. Rajan, Duncan M. Hank Walker, Robert H. Wang, Alexander S. Wong Semiconductor wafer representation for TCAD. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
73Georgios Ch. Sirakoulis A Cellular Automata Simulation Tool for Modelling and Automatic VLSI Implementation of the Oxidation Process in Integrated Circuit Fabrication. Search on Bibsonomy ACRI The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
73Alexander S. Wong, Andrew R. Neureuther The intertool profile interchange format: a technology CAD environment approach [semiconductor technology]. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1991 DBLP  DOI  BibTeX  RDF
73Naoyuki Shigyo, Hirobumi Kawashima, Seiji Yasuda Design of ESD Protection Device Using Statistical Methods. Search on Bibsonomy ISQED The full citation details ... 2002 DBLP  DOI  BibTeX  RDF ESD, TCAD, Statistical methods, Hypothesis test, DOE
55Robert W. Dutton, Andrzej J. Strojwas Perspectives on technology and technology-driven CAD. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
43Sanghoon Myung, Wonik Jang, Seonghoon Jin, Jae Myung Choe, Changwook Jeong, Daesin Kim Restructuring TCAD System: Teaching Traditional TCAD New Tricks. Search on Bibsonomy CoRR The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
37Puneet Gupta 0001, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester Investigation of diffusion rounding for post-lithography analysis. Search on Bibsonomy ASP-DAC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
37Kuen-Yu Tsai, Meng-Fu You, Yi-Chang Lu, Philip C. W. Ng A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects. Search on Bibsonomy ICCAD The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
37Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Frank Liu 0001, Sani R. Nassif, Yu Cao 0001 Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. Search on Bibsonomy DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
37Sridhar Tirumala, Yuri Mahotin, Xiao Lin, Victor Moroz, Lee Smith, S. Krishnamurthy, L. Bomholt, Dipu Pramanik Bringing Manufacturing into Design via Process-Dependent SPICE Models. Search on Bibsonomy ISQED The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
37Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
37Franz Fasching, Walter Tuppa, Siegfried Selberherr VISTA-the data level. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
22Luigi Balestra, Franco Ercolano, Elena Gnani, Susanna Reggiani TCAD Modeling of High-Field Electron Transport in Bulk Wurtzite GaN: The Full-Band SHE-BTE. Search on Bibsonomy IEEE Access The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Jasurbek Gulomov, Oussama Accouche, Rayimjon Aliev, Raymond Ghandour, Irodakhon Gulomova Investigation of n-ZnO/p-Si and n-TiO2/p-Si Heterojunction Solar Cells: TCAD + DFT. Search on Bibsonomy IEEE Access The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Karine Coulié, Hassen Aziza, Wenceslas Rahajandraibe Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations. Search on Bibsonomy J. Electron. Test. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Yibo Lei, Jian Fang, Yingdong Liang, Yisen Zhang, Ling Yan, Lingli Tang, Xihe Yang, Bo Zhang 0027 Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations. Search on Bibsonomy Microelectron. J. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Xiao Ma, Yongle Huang, Fei Xiao, Yifei Luo, Tongyao Han Characterization on the thermal field inside IGBT cells during switching based on TCAD modeling and Thermoreflectance imaging. Search on Bibsonomy Microelectron. J. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Guangxi Fan, Kain Lu Low Revolutionizing TCAD Simulations with Universal Device Encoding and Graph Attention Networks. Search on Bibsonomy CoRR The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Jixing Ye, Abderrezak Boughedda, D. M. S. Sultan, Gian-Franco Dalla Betta TCAD Analysis of Leakage Current and Breakdown Voltage in Small Pitch 3D Pixel Sensors. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Tom Klauner, Iman Sabri Alirezaei, Nicolas Roisin, Nicolas André, Denis Flandre SPICE Model of SPAD Transient Intrinsic Response Validated using Mixed-Mode TCAD Simulations. Search on Bibsonomy ESSDERC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Nicolas Roisin, Jean-Pierre Raskin, Denis Flandre Near-IR response of highly-strained Si photodetector linking first principles and TCAD. Search on Bibsonomy ESSDERC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22M. Thesberg, Franz Schanovsky, Zlatan Stanojevic, Oskar Baumgartner, Markus Karner A Study of the Variability and Design Considerations of Ferroelectric VNAND Memories With Polycrystalline Films Using An Experimentally Validated TCAD Model. Search on Bibsonomy ESSDERC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. Search on Bibsonomy IRPS The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection. Search on Bibsonomy IRPS The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Zhichao Du, Chuanxue Sun, Xiaoyu Dou, Pengpeng Sang, Xuepeng Zhan, Chengji Jin, Jixuan Wu, Jiezhi Chen Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD. Search on Bibsonomy ICTA The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Lida Kouhalvandi, Eva Catoggio, Simona Donati Guerrieri Synergic Exploitation of TCAD and Deep Neural Networks for Nonlinear FinFET Modeling. Search on Bibsonomy EUROCON The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Eva Catoggio, Simona Donati Guerrieri, Fabrizio Bonani, G. Ghione Spatial distribution of microwave device harmonic electrical variables through T-dependent TCAD simulations. Search on Bibsonomy EUROCON The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Francisco Pasadas, Anibal Pacheco-Sanchez, Nikolaos Mavredakis, David Jiménez Graphene field-effect transistor TCAD tool for circuit design under freeware. Search on Bibsonomy SMACD The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Rodion Novkin, Simon Thomann, Hussam Amrouch ML-TCAD: Perspectives and Challenges on Accelerating Transistor Modeling using ML. Search on Bibsonomy MLCAD The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Xuan Chi, Yubo Wang, Fan Li, Yixiao Huang, Chenruiyuan Yu, Shiqiang Wu, Huiqing Wen, Jiangmin Gu, Ping Zhang, Wen Liu The Investigation of Source Field Plate on the Performance of pGaN Gate Device and Dual-Gate Bidirectional Switch using TCAD Simulation. Search on Bibsonomy ICICDT The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Ran Bi, Baotong Zhang, Jianhuan Wang, Jianjun Zhang, Haixia Li, Ming Li TCAD Study on Strain Engineering in Vertical Channel Gate-all-around Transistor. Search on Bibsonomy ASICON The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Cristian J. Herrera-Rodriguez, Atsushi Shimbori, Timothy A. Grotjohn $\alpha$-Ga2O3/Diamond Heterojunction PN Diode: Device Fabrication and TCAD Modelling. Search on Bibsonomy DRC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22S. Ahmed, A. E. Islam, Daniel Dryden, Kyle J. Liddy, Nolan S. Hendricks, Neil A. Moser, Kelson D. Chabak, Andrew J. Green The $R_{\text{ON}}-V_{\text{BK}}$ Relationship in $\beta$-Ga2O3 Lateral MESFETs Determined Using Physics-Based TCAD Simulation. Search on Bibsonomy DRC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Tongshan Lu, Chenghua Wang TCAD Simulation of Single Event Transient in Si Bulk MOSFET at Cryogenic Temperature. Search on Bibsonomy IEEE Access The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Yaqiong Duan, Mian Xiang, Bingtao Zhou, Desu Fu, Hongxiao Liu TCAD: Unsupervised Anomaly Detection Based on Global Local Representation Differences. Search on Bibsonomy IEEE Access The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Juan E. Sanchez DEVSIM: A TCAD Semiconductor Device Simulator. Search on Bibsonomy J. Open Source Softw. The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Neha, Vandana Kumari, Mridula Gupta, Manoj Saxena Investigation of proton irradiated dual field plate AlGaN/GaN HEMTs: TCAD based assessment. Search on Bibsonomy Microelectron. J. The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Shalini Chaudhary, Basudha Dewan, Chitrakant Sahu, Menka Yadav Steep-subthreshold slope dual gate negative capacitance junction less FET with dead channel: TCAD approach for digital/ RF applications. Search on Bibsonomy Microelectron. J. The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Albert Lu, Jordan Marshall, Yifan Wang, Ming Xiao, Yuhao Zhang, Hiu Yung Wong Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model. Search on Bibsonomy CoRR The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Laura Zunarelli, Susanna Reggiani, Elena Gnani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells. Search on Bibsonomy IRPS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. Search on Bibsonomy IRPS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Seungju Hwang, Ilgu Yun Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation. Search on Bibsonomy ICEIC The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Sungkyu Kwon, Doohyung Cho, Jongil Won, Dong Yun Jung, Hyun Gyu Jang, Kunsik Park TCAD simulation of electrical characteristics dependence on metal work function for Schottky Contact-Super Barrier Rectifier (SC-SBR). Search on Bibsonomy ICEIC The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Yubo Wang, Fan Li, Xuan Chi, Wen Liu, Guohao Yu, Zhongkai Du, Baoshun Zhang TCAD-Based Investigation of the Electrical Characteristics of Normally off p-GaN Passivated GaN HEMTs. Search on Bibsonomy ICICDT The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Srinivas Varma, Ch Pratyusha Chowdari, D. Jayanthi, Asisa Kumar Panigrahi, K. Jamal TCAD Simulation of a 10nm n-Channel Vertical Double Gate Silicon On Insulator MOSFET for Digital Applications. Search on Bibsonomy ICCCNT The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Mamidala Karthik Ram, Neha Tiwari, Dawit Burusie Abdi, Sneh Saurabh Effect of Drain Induced Barrier Enhancement on Subthreshold Swing and OFF-State Current of Short Channel MOSFETs: A TCAD Study. Search on Bibsonomy IEEE Access The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Lorenzo De Cilladi, Thomas Corradino, Gian-Franco Dalla Betta, Coralie Neubüser, Lucio Pancheri Fully Depleted Monolithic Active Microstrip Sensors: TCAD Simulation Study of an Innovative Design Concept. Search on Bibsonomy Sensors The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Hong Yu, Shentong Ji, Xiangyan Luo, Quan Xie Technology CAD (TCAD) Simulations of Mg2Si/Si Heterojunction Photodetector Based on the Thickness Effect. Search on Bibsonomy Sensors The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Marwa Sayed Salem, Mohammed Elbanna, Mohamed Abouelatta, Ahmed Saeed 0005, Ahmed Shaker A Comparative Simulation Study of DG-MOSFETs: PCMS Approach in FETMOSS vs. CMS in Silvaco TCAD. Search on Bibsonomy NILES The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Yun-Yeong Choi, Ji-Sun Park, Hyung-Soon Shin Analysis of hump effect in tensile-stressed a-IGZO TFT using TCAD simulation. Search on Bibsonomy ICEIC The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Dandan Jiang, Wenying Ma, Jian Tao, Song Ye, Zhongyun Li Study on PBL and TCAD Tools in Microelectronics Process Education. Search on Bibsonomy ICEIT The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Wolfgang Goes, D. Green, Philippe Blaise, Giuseppe Piccolboni, Alessandro Bricalli, Amir Regev, Gabriel Molas, Jean-Francois Nodin A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification. Search on Bibsonomy IMW The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Franz Schanovsky, Devin Verreck, Antonio Arreghini, Gerhard Rzepa, Zlatan Stanojevic, Christian Kernstock, Oskar Baumgartner, Maarten Rosmeulen, Markus Karner A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics. Search on Bibsonomy IMW The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Tapas Dutta, Cristina Medina-Bailon, Ali Rezaei, Daniel Nagy, Fikru Adamu-Lema, Nikolas Xeni, Yassine Abourrig, Naveen Kumar, Vihar P. Georgiev, Asen Asenov TCAD Simulation of Novel Semiconductor Devices. Search on Bibsonomy ASICON The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Masahiro Watanabe TCAD simulation of trench-gate IGBTs for prediction of carrier lifetime requirements for future scaled devices. Search on Bibsonomy ASICON The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Dragan Stamenkovic, Umamaheswara Vemulapati, Thomas Stiasny, Munaf Rahimo, Drazen Dujic IGCT Low-Current Switching - TCAD and Experimental Characterization. Search on Bibsonomy IEEE Trans. Ind. Electron. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Kashyap Mehta, Sophia Susan Raju, Ming Xiao, Boyan Wang, Yuhao Zhang, Wong Hiu Yung Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design. Search on Bibsonomy IEEE Access The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22A. Nisha Justeena, R. Srinivasan Reconfigurable FET-Based SRAM and Its Single Event Upset Performance Analysis Using TCAD Simulations. Search on Bibsonomy Microelectron. J. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Linjie Fan, Jinshun Bi, Kai Xi, Gangping Yan Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations. Search on Bibsonomy Sensors The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Linjie Fan, Jinshun Bi, Kai Xi, Sandip Majumdar, Bo Li 0051 Performance Optimization of FD-SOI Hall Sensors Via 3D TCAD Simulations. Search on Bibsonomy Sensors The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey Johnson, William Taylor, Myra Boenke, Byoung Min Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. Search on Bibsonomy IRPS The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier 0002 Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. Search on Bibsonomy IRPS The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Hao Yu, Chengxu Wang, Xiangshui Miao, Xingsheng Wang A TCAD-based Study of NDR Effect in NC-FinFET. Search on Bibsonomy ICTA The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Aurelio Mannara TCAD modeling of current transport and main reliability issues of polysilicon-channel 3-D NAND Flash strings. Search on Bibsonomy 2020   RDF
22Philip Brisk, Suman Chakraborty, Claudionor Coelho, Abdoulaye Gamatié, Swaroop Ghosh, Xun Jiao TCAD EIC Message: February 2019. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Huizhang Luo TCAD MLC-STTRAM. Search on Bibsonomy 2019   DOI  RDF
22Konstantin O. Petrosyants, Maxim V. Kozhukhov, Dmitry Popov Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem. Search on Bibsonomy DDECS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Patrick Scharf, Christoph Sohrmann, Steffen Holland, Volkhard Beyer Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations. Search on Bibsonomy ESSDERC The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Federico Giuliano, Riccardo Depetro, Giuseppe Croce, Andrea Natale Tallarico, Susanna Reggiani, Antonio Gnudi, Enrico Sangiorgi, Claudio Fiegna, Mattia Rossetti, Antonio Molfese, Stefano Manzini TCAD predictions of hot-electron injection in p-type LDMOS transistors. Search on Bibsonomy ESSDERC The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Benyuan Zhu, E. M. Bazizi, J. H. M. Tng, Z. Li, E. K. Banghart, M. K. Hassan, Y. Hu, D. Zhou, D. Choi, L. Qin, Xuan Wan TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement. Search on Bibsonomy IRPS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Manoj Kumar Reddy, Jhansi Lakshmi, Atluri Hemanth, Bhajantri Hemanth Kumar, Lavanya Bandi, Gene Sheu, Yu-Lin Song, Po-An Chen, Luh-Maan Chang Physics Based TCAD Simulation and Calibration of GaN/AlGaN/GaN HEMT Device. Search on Bibsonomy ICSAI The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Tomohiro Otsuka, Yutaro Yamaguchi 0002, Shintaro Shinjo, Toshiyuki Oishi Study of Self-heating Effect of GaN HEMTs with Buffer Traps by Low Frequency S-parameters Measurements and TCAD Simulation. Search on Bibsonomy BCICTS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Soumya Ranjan Panda, Sébastien Fregonese, Anjan Chakravorty, Thomas Zimmer TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range. Search on Bibsonomy BCICTS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Xueqing Liu 0003, Michael S. Shur An Efficient TCAD Model for TeraFET Detectors. Search on Bibsonomy RWS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Ning Li, Wen-Yang Jiang, Blacksmith Wu, Kanyu Cao Improve DRAM Leakage Issue During RAS Operational Phase Through TCAD Simulation. Search on Bibsonomy ASICON The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Chien Y. Huang, Sze Ming Fu, Parag Parashar, Chun Han Chen, Chandni Akbar, Albert S. Lin Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural Networks. Search on Bibsonomy IEEE Access The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Alexandre Simionovski, Gilson I. Wirth, Ronald D. Schrimpf, Bharat L. Bhuva A TCAD evaluation of a single Bulk-BICS with integrative memory cell. Search on Bibsonomy Microelectron. J. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Mohamed Abouelatta-Ebrahim, Ahmed Shaker, Christian Gontrand Impact of TSV location in HVIC on CMOS operation: A mixed-mode TCAD simulation study. Search on Bibsonomy Microelectron. J. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Paul Pfäffli, Hiu Yung Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma TCAD modeling for reliability. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Susanna Reggiani, Mattia Rossetti, Antonio Gnudi, Andrea Natale Tallarico, Antonio Molfese, Stefano Manzini, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna TCAD investigation on hot-electron injection in new-generation technologies. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Susanna Reggiani, Luigi Balestra, Antonio Gnudi, Elena Gnani, Giorgio Baccarani, J. Dobrzynska, J. Vobecký, C. Tosi TCAD study of DLC coatings for large-area high-power diodes. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Tommaso Cilento, Chan-Su Yun, Arsen Terterian, Chang Hwi Lee, Jung Eon Moon, Si Woo Lee, Hyoungcheol Kwon, Manho Seung, Seokkiu Lee Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Hoang T. Nguyen, Axel Rodriguez, Frederic Wrobel, Alain Michez, Francoise Bezerra, Nathalie Chatry, Benjamin Vandevelde TCAD simulation of radiation-induced leakage current in 1T1C SDRAM. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22ChengKuei Lee, Sen Yin, Jinyu Zhang, Yan Wang 0023, Zhiping Yu Study on scalability of hybrid junctionless FinFET and multi-stacked nanowire FET by TCAD simulation. Search on Bibsonomy IEICE Electron. Express The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Alfonso Herrera-Moreno, Jose Luis Garcia-Gervacio, Héctor Villacorta-Minaya, Héctor Vázquez-Leal TCAD analysis and modeling for NBTI mechanism in FinFET transistors. Search on Bibsonomy IEICE Electron. Express The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Zlatan Stanojevic, Georg Strof, Franz Schanovsky, Klaus Steiner, Oskar Baumgartner, Christian Kernstock, Markus Karner Cell Designer - a Comprehensive TCAD-Based Framework for DTCO of Standard Logic Cells. Search on Bibsonomy ESSDERC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Stefania Carapezzi, Sebastian Eberle, Susanna Reggiani, Elena Gnani, Cosmin Roman, Christofer Hierold, Antonio Gnudi 3D TCAD modeling of NO2CNT FET sensors. Search on Bibsonomy ESSDERC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Juan Manuel Lopez-Martinez, Ion Vornicu, Ricardo Carmona-Galán, Ángel Rodríguez-Vázquez An Experimentally-Validated Verilog-A SPAD Model Extracted from TCAD Simulation. Search on Bibsonomy ICECS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Filip Segmanovic, Frederic Roger, Gerald Meinhardt, Ingrid Jonak-Auer, Tomislav Suligoj Impact of TCAD model parameters on optical and electrical characteristics of radiation-hard photodiode in 0.35bm CMOS technology. Search on Bibsonomy MIPRO The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Xiaoliang Dai, Niraj K. Jha Using a Device State Library to Boost the Performance of TCAD Mixed-Mode Simulation. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Clément Fleury, Guido Notermans, Hans-Martin Ritter, Dionyz Pogany TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Michael Schröter, Tommy Rosenbaum, Pascal Chevalier 0002, Bernd Heinemann, Sorin P. Voinigescu, Ed Preisler, Josef Böck, Anindya Mukherjee SiGe HBT Technology: Future Trends and TCAD-Based Roadmap. Search on Bibsonomy Proc. IEEE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma TCAD based Design-Technology Co-Optimisations in advanced technology nodes. Search on Bibsonomy VLSI-DAT The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Debajit Bhattacharya, Niraj K. Jha TCAD-Assisted Capacitance Extraction of FinFET SRAM and Logic Arrays. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Quan Chen, Wim Schoenmaker, Shih-Hung Weng, Chung-Kuan Cheng, Guan-Hua Chen, Lijun Jiang, Ngai Wong A fast time-domain EM-TCAD coupled simulation framework via matrix exponential with stiffness reduction. Search on Bibsonomy Int. J. Circuit Theory Appl. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Ajay Kumar 0004, Neha Gupta 0003, Rishu Chaujar TCAD RF performance investigation of Transparent Gate Recessed Channel MOSFET. Search on Bibsonomy Microelectron. J. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Maran Ponnambalam, N. Vinodhkumar, R. Srinivasan, Premanand Venkatesh Chandramani Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Rockey Bhardwaj, Gurinderpal Singh TFET simulation using Matlab and sentaraus TCAD. Search on Bibsonomy ICACCI The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Stefania Carapezzi, Enrico Caruso, Antonio Gnudi, Susanna Reggiani, Elena Gnani TCAD low-field mobility model for InGaAs UTB MOSFETs including quasi-ballistic corrections. Search on Bibsonomy ESSDERC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
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