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GrowBag graphs for keyword ? (Num. hits/coverage)
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Found 177 publication records. Showing 177 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
77 | Martin D. Giles, Duane S. Boning, Goodwin R. Chin, Walter C. Dietrich Jr., Michael S. Karasick, Mark E. Law, Purnendu K. Mozumder, Lee R. Nackman, V. T. Rajan, Duncan M. Hank Walker, Robert H. Wang, Alexander S. Wong |
Semiconductor wafer representation for TCAD. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1994 |
DBLP DOI BibTeX RDF |
|
73 | Georgios Ch. Sirakoulis |
A Cellular Automata Simulation Tool for Modelling and Automatic VLSI Implementation of the Oxidation Process in Integrated Circuit Fabrication. |
ACRI |
2006 |
DBLP DOI BibTeX RDF |
|
73 | Alexander S. Wong, Andrew R. Neureuther |
The intertool profile interchange format: a technology CAD environment approach [semiconductor technology]. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1991 |
DBLP DOI BibTeX RDF |
|
73 | Naoyuki Shigyo, Hirobumi Kawashima, Seiji Yasuda |
Design of ESD Protection Device Using Statistical Methods. |
ISQED |
2002 |
DBLP DOI BibTeX RDF |
ESD, TCAD, Statistical methods, Hypothesis test, DOE |
55 | Robert W. Dutton, Andrzej J. Strojwas |
Perspectives on technology and technology-driven CAD. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2000 |
DBLP DOI BibTeX RDF |
|
43 | Sanghoon Myung, Wonik Jang, Seonghoon Jin, Jae Myung Choe, Changwook Jeong, Daesin Kim |
Restructuring TCAD System: Teaching Traditional TCAD New Tricks. |
CoRR |
2022 |
DBLP DOI BibTeX RDF |
|
37 | Puneet Gupta 0001, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester |
Investigation of diffusion rounding for post-lithography analysis. |
ASP-DAC |
2008 |
DBLP DOI BibTeX RDF |
|
37 | Kuen-Yu Tsai, Meng-Fu You, Yi-Chang Lu, Philip C. W. Ng |
A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects. |
ICCAD |
2008 |
DBLP DOI BibTeX RDF |
|
37 | Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Frank Liu 0001, Sani R. Nassif, Yu Cao 0001 |
Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. |
DAC |
2007 |
DBLP DOI BibTeX RDF |
|
37 | Sridhar Tirumala, Yuri Mahotin, Xiao Lin, Victor Moroz, Lee Smith, S. Krishnamurthy, L. Bomholt, Dipu Pramanik |
Bringing Manufacturing into Design via Process-Dependent SPICE Models. |
ISQED |
2006 |
DBLP DOI BibTeX RDF |
|
37 | Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian |
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
|
37 | Franz Fasching, Walter Tuppa, Siegfried Selberherr |
VISTA-the data level. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1994 |
DBLP DOI BibTeX RDF |
|
22 | Luigi Balestra, Franco Ercolano, Elena Gnani, Susanna Reggiani |
TCAD Modeling of High-Field Electron Transport in Bulk Wurtzite GaN: The Full-Band SHE-BTE. |
IEEE Access |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Jasurbek Gulomov, Oussama Accouche, Rayimjon Aliev, Raymond Ghandour, Irodakhon Gulomova |
Investigation of n-ZnO/p-Si and n-TiO2/p-Si Heterojunction Solar Cells: TCAD + DFT. |
IEEE Access |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Karine Coulié, Hassen Aziza, Wenceslas Rahajandraibe |
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Yibo Lei, Jian Fang, Yingdong Liang, Yisen Zhang, Ling Yan, Lingli Tang, Xihe Yang, Bo Zhang 0027 |
Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations. |
Microelectron. J. |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Xiao Ma, Yongle Huang, Fei Xiao, Yifei Luo, Tongyao Han |
Characterization on the thermal field inside IGBT cells during switching based on TCAD modeling and Thermoreflectance imaging. |
Microelectron. J. |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Guangxi Fan, Kain Lu Low |
Revolutionizing TCAD Simulations with Universal Device Encoding and Graph Attention Networks. |
CoRR |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Jixing Ye, Abderrezak Boughedda, D. M. S. Sultan, Gian-Franco Dalla Betta |
TCAD Analysis of Leakage Current and Breakdown Voltage in Small Pitch 3D Pixel Sensors. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Tom Klauner, Iman Sabri Alirezaei, Nicolas Roisin, Nicolas André, Denis Flandre |
SPICE Model of SPAD Transient Intrinsic Response Validated using Mixed-Mode TCAD Simulations. |
ESSDERC |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Nicolas Roisin, Jean-Pierre Raskin, Denis Flandre |
Near-IR response of highly-strained Si photodetector linking first principles and TCAD. |
ESSDERC |
2023 |
DBLP DOI BibTeX RDF |
|
22 | M. Thesberg, Franz Schanovsky, Zlatan Stanojevic, Oskar Baumgartner, Markus Karner |
A Study of the Variability and Design Considerations of Ferroelectric VNAND Memories With Polycrystalline Films Using An Experimentally Validated TCAD Model. |
ESSDERC |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken |
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli |
TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Zhichao Du, Chuanxue Sun, Xiaoyu Dou, Pengpeng Sang, Xuepeng Zhan, Chengji Jin, Jixuan Wu, Jiezhi Chen |
Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD. |
ICTA |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Lida Kouhalvandi, Eva Catoggio, Simona Donati Guerrieri |
Synergic Exploitation of TCAD and Deep Neural Networks for Nonlinear FinFET Modeling. |
EUROCON |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Eva Catoggio, Simona Donati Guerrieri, Fabrizio Bonani, G. Ghione |
Spatial distribution of microwave device harmonic electrical variables through T-dependent TCAD simulations. |
EUROCON |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Francisco Pasadas, Anibal Pacheco-Sanchez, Nikolaos Mavredakis, David Jiménez |
Graphene field-effect transistor TCAD tool for circuit design under freeware. |
SMACD |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Rodion Novkin, Simon Thomann, Hussam Amrouch |
ML-TCAD: Perspectives and Challenges on Accelerating Transistor Modeling using ML. |
MLCAD |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Xuan Chi, Yubo Wang, Fan Li, Yixiao Huang, Chenruiyuan Yu, Shiqiang Wu, Huiqing Wen, Jiangmin Gu, Ping Zhang, Wen Liu |
The Investigation of Source Field Plate on the Performance of pGaN Gate Device and Dual-Gate Bidirectional Switch using TCAD Simulation. |
ICICDT |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Ran Bi, Baotong Zhang, Jianhuan Wang, Jianjun Zhang, Haixia Li, Ming Li |
TCAD Study on Strain Engineering in Vertical Channel Gate-all-around Transistor. |
ASICON |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Cristian J. Herrera-Rodriguez, Atsushi Shimbori, Timothy A. Grotjohn |
$\alpha$-Ga2O3/Diamond Heterojunction PN Diode: Device Fabrication and TCAD Modelling. |
DRC |
2023 |
DBLP DOI BibTeX RDF |
|
22 | S. Ahmed, A. E. Islam, Daniel Dryden, Kyle J. Liddy, Nolan S. Hendricks, Neil A. Moser, Kelson D. Chabak, Andrew J. Green |
The $R_{\text{ON}}-V_{\text{BK}}$ Relationship in $\beta$-Ga2O3 Lateral MESFETs Determined Using Physics-Based TCAD Simulation. |
DRC |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Tongshan Lu, Chenghua Wang |
TCAD Simulation of Single Event Transient in Si Bulk MOSFET at Cryogenic Temperature. |
IEEE Access |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Yaqiong Duan, Mian Xiang, Bingtao Zhou, Desu Fu, Hongxiao Liu |
TCAD: Unsupervised Anomaly Detection Based on Global Local Representation Differences. |
IEEE Access |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Juan E. Sanchez |
DEVSIM: A TCAD Semiconductor Device Simulator. |
J. Open Source Softw. |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Neha, Vandana Kumari, Mridula Gupta, Manoj Saxena |
Investigation of proton irradiated dual field plate AlGaN/GaN HEMTs: TCAD based assessment. |
Microelectron. J. |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Shalini Chaudhary, Basudha Dewan, Chitrakant Sahu, Menka Yadav |
Steep-subthreshold slope dual gate negative capacitance junction less FET with dead channel: TCAD approach for digital/ RF applications. |
Microelectron. J. |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Albert Lu, Jordan Marshall, Yifan Wang, Ming Xiao, Yuhao Zhang, Hiu Yung Wong |
Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model. |
CoRR |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Laura Zunarelli, Susanna Reggiani, Elena Gnani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli |
TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy |
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Seungju Hwang, Ilgu Yun |
Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation. |
ICEIC |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Sungkyu Kwon, Doohyung Cho, Jongil Won, Dong Yun Jung, Hyun Gyu Jang, Kunsik Park |
TCAD simulation of electrical characteristics dependence on metal work function for Schottky Contact-Super Barrier Rectifier (SC-SBR). |
ICEIC |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Yubo Wang, Fan Li, Xuan Chi, Wen Liu, Guohao Yu, Zhongkai Du, Baoshun Zhang |
TCAD-Based Investigation of the Electrical Characteristics of Normally off p-GaN Passivated GaN HEMTs. |
ICICDT |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Srinivas Varma, Ch Pratyusha Chowdari, D. Jayanthi, Asisa Kumar Panigrahi, K. Jamal |
TCAD Simulation of a 10nm n-Channel Vertical Double Gate Silicon On Insulator MOSFET for Digital Applications. |
ICCCNT |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Mamidala Karthik Ram, Neha Tiwari, Dawit Burusie Abdi, Sneh Saurabh |
Effect of Drain Induced Barrier Enhancement on Subthreshold Swing and OFF-State Current of Short Channel MOSFETs: A TCAD Study. |
IEEE Access |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Lorenzo De Cilladi, Thomas Corradino, Gian-Franco Dalla Betta, Coralie Neubüser, Lucio Pancheri |
Fully Depleted Monolithic Active Microstrip Sensors: TCAD Simulation Study of an Innovative Design Concept. |
Sensors |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Hong Yu, Shentong Ji, Xiangyan Luo, Quan Xie |
Technology CAD (TCAD) Simulations of Mg2Si/Si Heterojunction Photodetector Based on the Thickness Effect. |
Sensors |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Marwa Sayed Salem, Mohammed Elbanna, Mohamed Abouelatta, Ahmed Saeed 0005, Ahmed Shaker |
A Comparative Simulation Study of DG-MOSFETs: PCMS Approach in FETMOSS vs. CMS in Silvaco TCAD. |
NILES |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Yun-Yeong Choi, Ji-Sun Park, Hyung-Soon Shin |
Analysis of hump effect in tensile-stressed a-IGZO TFT using TCAD simulation. |
ICEIC |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Dandan Jiang, Wenying Ma, Jian Tao, Song Ye, Zhongyun Li |
Study on PBL and TCAD Tools in Microelectronics Process Education. |
ICEIT |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Wolfgang Goes, D. Green, Philippe Blaise, Giuseppe Piccolboni, Alessandro Bricalli, Amir Regev, Gabriel Molas, Jean-Francois Nodin |
A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification. |
IMW |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Franz Schanovsky, Devin Verreck, Antonio Arreghini, Gerhard Rzepa, Zlatan Stanojevic, Christian Kernstock, Oskar Baumgartner, Maarten Rosmeulen, Markus Karner |
A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics. |
IMW |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Tapas Dutta, Cristina Medina-Bailon, Ali Rezaei, Daniel Nagy, Fikru Adamu-Lema, Nikolas Xeni, Yassine Abourrig, Naveen Kumar, Vihar P. Georgiev, Asen Asenov |
TCAD Simulation of Novel Semiconductor Devices. |
ASICON |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Masahiro Watanabe |
TCAD simulation of trench-gate IGBTs for prediction of carrier lifetime requirements for future scaled devices. |
ASICON |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Dragan Stamenkovic, Umamaheswara Vemulapati, Thomas Stiasny, Munaf Rahimo, Drazen Dujic |
IGCT Low-Current Switching - TCAD and Experimental Characterization. |
IEEE Trans. Ind. Electron. |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Kashyap Mehta, Sophia Susan Raju, Ming Xiao, Boyan Wang, Yuhao Zhang, Wong Hiu Yung |
Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design. |
IEEE Access |
2020 |
DBLP DOI BibTeX RDF |
|
22 | A. Nisha Justeena, R. Srinivasan |
Reconfigurable FET-Based SRAM and Its Single Event Upset Performance Analysis Using TCAD Simulations. |
Microelectron. J. |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Linjie Fan, Jinshun Bi, Kai Xi, Gangping Yan |
Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations. |
Sensors |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Linjie Fan, Jinshun Bi, Kai Xi, Sandip Majumdar, Bo Li 0051 |
Performance Optimization of FD-SOI Hall Sensors Via 3D TCAD Simulations. |
Sensors |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey Johnson, William Taylor, Myra Boenke, Byoung Min |
Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier 0002 |
Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Hao Yu, Chengxu Wang, Xiangshui Miao, Xingsheng Wang |
A TCAD-based Study of NDR Effect in NC-FinFET. |
ICTA |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Aurelio Mannara |
TCAD modeling of current transport and main reliability issues of polysilicon-channel 3-D NAND Flash strings. |
|
2020 |
RDF |
|
22 | Philip Brisk, Suman Chakraborty, Claudionor Coelho, Abdoulaye Gamatié, Swaroop Ghosh, Xun Jiao |
TCAD EIC Message: February 2019. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Huizhang Luo |
TCAD MLC-STTRAM. |
|
2019 |
DOI RDF |
|
22 | Konstantin O. Petrosyants, Maxim V. Kozhukhov, Dmitry Popov |
Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem. |
DDECS |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Patrick Scharf, Christoph Sohrmann, Steffen Holland, Volkhard Beyer |
Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations. |
ESSDERC |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Federico Giuliano, Riccardo Depetro, Giuseppe Croce, Andrea Natale Tallarico, Susanna Reggiani, Antonio Gnudi, Enrico Sangiorgi, Claudio Fiegna, Mattia Rossetti, Antonio Molfese, Stefano Manzini |
TCAD predictions of hot-electron injection in p-type LDMOS transistors. |
ESSDERC |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Benyuan Zhu, E. M. Bazizi, J. H. M. Tng, Z. Li, E. K. Banghart, M. K. Hassan, Y. Hu, D. Zhou, D. Choi, L. Qin, Xuan Wan |
TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Manoj Kumar Reddy, Jhansi Lakshmi, Atluri Hemanth, Bhajantri Hemanth Kumar, Lavanya Bandi, Gene Sheu, Yu-Lin Song, Po-An Chen, Luh-Maan Chang |
Physics Based TCAD Simulation and Calibration of GaN/AlGaN/GaN HEMT Device. |
ICSAI |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Tomohiro Otsuka, Yutaro Yamaguchi 0002, Shintaro Shinjo, Toshiyuki Oishi |
Study of Self-heating Effect of GaN HEMTs with Buffer Traps by Low Frequency S-parameters Measurements and TCAD Simulation. |
BCICTS |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Soumya Ranjan Panda, Sébastien Fregonese, Anjan Chakravorty, Thomas Zimmer |
TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range. |
BCICTS |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Xueqing Liu 0003, Michael S. Shur |
An Efficient TCAD Model for TeraFET Detectors. |
RWS |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Ning Li, Wen-Yang Jiang, Blacksmith Wu, Kanyu Cao |
Improve DRAM Leakage Issue During RAS Operational Phase Through TCAD Simulation. |
ASICON |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Chien Y. Huang, Sze Ming Fu, Parag Parashar, Chun Han Chen, Chandni Akbar, Albert S. Lin |
Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural Networks. |
IEEE Access |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Alexandre Simionovski, Gilson I. Wirth, Ronald D. Schrimpf, Bharat L. Bhuva |
A TCAD evaluation of a single Bulk-BICS with integrative memory cell. |
Microelectron. J. |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Mohamed Abouelatta-Ebrahim, Ahmed Shaker, Christian Gontrand |
Impact of TSV location in HVIC on CMOS operation: A mixed-mode TCAD simulation study. |
Microelectron. J. |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Paul Pfäffli, Hiu Yung Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma |
TCAD modeling for reliability. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Susanna Reggiani, Mattia Rossetti, Antonio Gnudi, Andrea Natale Tallarico, Antonio Molfese, Stefano Manzini, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna |
TCAD investigation on hot-electron injection in new-generation technologies. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Susanna Reggiani, Luigi Balestra, Antonio Gnudi, Elena Gnani, Giorgio Baccarani, J. Dobrzynska, J. Vobecký, C. Tosi |
TCAD study of DLC coatings for large-area high-power diodes. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Tommaso Cilento, Chan-Su Yun, Arsen Terterian, Chang Hwi Lee, Jung Eon Moon, Si Woo Lee, Hyoungcheol Kwon, Manho Seung, Seokkiu Lee |
Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Hoang T. Nguyen, Axel Rodriguez, Frederic Wrobel, Alain Michez, Francoise Bezerra, Nathalie Chatry, Benjamin Vandevelde |
TCAD simulation of radiation-induced leakage current in 1T1C SDRAM. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
22 | ChengKuei Lee, Sen Yin, Jinyu Zhang, Yan Wang 0023, Zhiping Yu |
Study on scalability of hybrid junctionless FinFET and multi-stacked nanowire FET by TCAD simulation. |
IEICE Electron. Express |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Alfonso Herrera-Moreno, Jose Luis Garcia-Gervacio, Héctor Villacorta-Minaya, Héctor Vázquez-Leal |
TCAD analysis and modeling for NBTI mechanism in FinFET transistors. |
IEICE Electron. Express |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Zlatan Stanojevic, Georg Strof, Franz Schanovsky, Klaus Steiner, Oskar Baumgartner, Christian Kernstock, Markus Karner |
Cell Designer - a Comprehensive TCAD-Based Framework for DTCO of Standard Logic Cells. |
ESSDERC |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Stefania Carapezzi, Sebastian Eberle, Susanna Reggiani, Elena Gnani, Cosmin Roman, Christofer Hierold, Antonio Gnudi |
3D TCAD modeling of NO2CNT FET sensors. |
ESSDERC |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Juan Manuel Lopez-Martinez, Ion Vornicu, Ricardo Carmona-Galán, Ángel Rodríguez-Vázquez |
An Experimentally-Validated Verilog-A SPAD Model Extracted from TCAD Simulation. |
ICECS |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Filip Segmanovic, Frederic Roger, Gerald Meinhardt, Ingrid Jonak-Auer, Tomislav Suligoj |
Impact of TCAD model parameters on optical and electrical characteristics of radiation-hard photodiode in 0.35bm CMOS technology. |
MIPRO |
2018 |
DBLP DOI BibTeX RDF |
|
22 | Xiaoliang Dai, Niraj K. Jha |
Using a Device State Library to Boost the Performance of TCAD Mixed-Mode Simulation. |
IEEE Trans. Very Large Scale Integr. Syst. |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Clément Fleury, Guido Notermans, Hans-Martin Ritter, Dionyz Pogany |
TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs. |
Microelectron. Reliab. |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat |
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices. |
Microelectron. Reliab. |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Michael Schröter, Tommy Rosenbaum, Pascal Chevalier 0002, Bernd Heinemann, Sorin P. Voinigescu, Ed Preisler, Josef Böck, Anindya Mukherjee |
SiGe HBT Technology: Future Trends and TCAD-Based Roadmap. |
Proc. IEEE |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma |
TCAD based Design-Technology Co-Optimisations in advanced technology nodes. |
VLSI-DAT |
2017 |
DBLP DOI BibTeX RDF |
|
22 | Debajit Bhattacharya, Niraj K. Jha |
TCAD-Assisted Capacitance Extraction of FinFET SRAM and Logic Arrays. |
IEEE Trans. Very Large Scale Integr. Syst. |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Quan Chen, Wim Schoenmaker, Shih-Hung Weng, Chung-Kuan Cheng, Guan-Hua Chen, Lijun Jiang, Ngai Wong |
A fast time-domain EM-TCAD coupled simulation framework via matrix exponential with stiffness reduction. |
Int. J. Circuit Theory Appl. |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Ajay Kumar 0004, Neha Gupta 0003, Rishu Chaujar |
TCAD RF performance investigation of Transparent Gate Recessed Channel MOSFET. |
Microelectron. J. |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Maran Ponnambalam, N. Vinodhkumar, R. Srinivasan, Premanand Venkatesh Chandramani |
Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation. |
Microelectron. Reliab. |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Rockey Bhardwaj, Gurinderpal Singh |
TFET simulation using Matlab and sentaraus TCAD. |
ICACCI |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Stefania Carapezzi, Enrico Caruso, Antonio Gnudi, Susanna Reggiani, Elena Gnani |
TCAD low-field mobility model for InGaAs UTB MOSFETs including quasi-ballistic corrections. |
ESSDERC |
2016 |
DBLP DOI BibTeX RDF |
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