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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 2 occurrences of 2 keywords
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Results
Found 7 publication records. Showing 7 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 110 | Erik Larsson, Julien Pouget, Zebo Peng |
Abort-on-Fail Based Test Scheduling.  |
J. Electron. Test.  |
2005 |
DBLP DOI BibTeX RDF |
abort-on-fail, defect probability, test scheduling, SoC testing |
| 84 | Erik Larsson, Jon Persson |
An Architecture for Combined Test Data Compression and Abort-on-Fail Test. |
ASP-DAC |
2007 |
DBLP DOI BibTeX RDF |
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| 35 | Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen |
Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption. |
IEEE Trans. Computers |
2015 |
DBLP DOI BibTeX RDF |
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| 35 | Erik Larsson |
Architecture for integrated test data compression and abort-on-fail testing in a multi-site environment. |
IET Comput. Digit. Tech. |
2008 |
DBLP DOI BibTeX RDF |
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| 35 | Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen |
Test scheduling for modular SOCs in an abort-on-fail environment. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
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| 33 | Zhiyuan He 0002, Gert Jervan, Zebo Peng, Petru Eles |
Hybrid BIST Test Scheduling Based on Defect Probabilities. |
Asian Test Symposium |
2004 |
DBLP DOI BibTeX RDF |
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| 16 | Sandeep Kumar Goel, Erik Jan Marinissen |
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips. |
DATE |
2005 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #7 of 7 (100 per page; Change: )
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