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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 16 occurrences of 10 keywords
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Results
Found 33 publication records. Showing 33 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
37 | Mandeep Singh, Israel Koren |
Incorporating Fault Tolerance in Analog-to-Digital Converters (ADCs). |
ISQED |
2002 |
DBLP DOI BibTeX RDF |
Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters |
29 | Anita J. Crompton, Kelum A. A. Gamage, Alex Jenkins, C. James Taylor |
Alpha Particle Detection Using Alpha-Induced Air Radioluminescence: A Review and Future Prospects for Preliminary Radiological Characterisation for Nuclear Facilities Decommissioning. |
Sensors |
2018 |
DBLP DOI BibTeX RDF |
|
29 | Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee |
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. |
Microelectron. Reliab. |
2017 |
DBLP DOI BibTeX RDF |
|
25 | Martin Omaña 0001, Daniele Rossi 0001, Cecilia Metra |
Model for Transient Fault Susceptibility of Combinational Circuits. |
J. Electron. Test. |
2004 |
DBLP DOI BibTeX RDF |
transient fault modeling, transient fault susceptibility, alpha-particle, soft error, transient fault |
25 | Mandeep Singh, Israel Koren |
Reliability Enhancement of Analog-to-Digital Converters (ADCs). |
DFT |
2001 |
DBLP DOI BibTeX RDF |
Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters |
24 | Mandeep Singh, Israel Koren |
Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters. |
IEEE Trans. Very Large Scale Integr. Syst. |
2003 |
DBLP DOI BibTeX RDF |
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18 | Hadi Shahabinejad, Davorin Sudac, Miltiadis Alamaniotis, Karlo Nad, Jasmina Objodas |
Bulk Sample Analysis Using Associated Alpha Particle Neutron Generator and Artificial Neural Network. |
IISA |
2023 |
DBLP DOI BibTeX RDF |
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18 | Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill |
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
18 | Jesse Tanguay, François Bénard, Anna Celler, Thomas Ruth, Paul Schaffer |
Spatial resolution properties of digital autoradiography systems for pre-clinical alpha particle imaging (Conference Presentation). |
Medical Imaging: Biomedical Applications in Molecular, Structural, and Functional Imaging |
2017 |
DBLP DOI BibTeX RDF |
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18 | Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg |
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. |
IEICE Electron. Express |
2016 |
DBLP DOI BibTeX RDF |
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18 | Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg |
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. |
IEICE Electron. Express |
2016 |
DBLP DOI BibTeX RDF |
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18 | Ezzat G. Bakhoum, Marvin H. M. Cheng, Kevin M. Van Landingham |
Alpha-Particle-Based Icing Detector for Aircraft. |
IEEE Trans. Instrum. Meas. |
2014 |
DBLP DOI BibTeX RDF |
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18 | Mingzhe Liu, Xianguo Tuo, Jun Ren, Zhe Li, Lei Wang, Jianbo Yang |
A PSO-SVM Based Model for Alpha Particle Activity Prediction Inside Decommissioned Channels. |
ISNN (1) |
2012 |
DBLP DOI BibTeX RDF |
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18 | Surendra S. Rathod, Ashok K. Saxena, Sudeb Dasgupta |
Alpha-particle-induced effects in partially depleted silicon on insulator device: With and without body contact. |
IET Circuits Devices Syst. |
2011 |
DBLP DOI BibTeX RDF |
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18 | Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, Pia Loaiza, G. Warot, M. Zampaolo |
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. |
Microelectron. Reliab. |
2010 |
DBLP DOI BibTeX RDF |
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18 | Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt |
Single-event-upset and alpha-particle emission rate measurement techniques. |
IBM J. Res. Dev. |
2008 |
DBLP DOI BibTeX RDF |
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18 | David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang |
Alpha-particle-induced upsets in advanced CMOS circuits and technology. |
IBM J. Res. Dev. |
2008 |
DBLP DOI BibTeX RDF |
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18 | G. E. Zardas, P. H. Yannakopoulos, Chrys I. Symeonides, Marián Veselý, P. C. Euthymiou |
A study of electron transition in the energy gap of SI-GaAs with photoconductivity spectra and under alpha-particle irradiation. |
Microelectron. J. |
2008 |
DBLP DOI BibTeX RDF |
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18 | Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana |
Alpha particle radiation effects in RF MEMS capacitive switches. |
Microelectron. Reliab. |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Tino Heijmen |
Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. |
IOLTS |
2007 |
DBLP DOI BibTeX RDF |
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18 | G. E. Zardas, P. H. Yannakopoulos, M. Ziska, Chrys I. Symeonides, P. C. Euthymiou, O. Csabay |
Dependence of GaAs: Si persistent photoconductivity on temperature and alpha-particle irradiation. |
Microelectron. J. |
2005 |
DBLP DOI BibTeX RDF |
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18 | Hungse Cha, Elizabeth M. Rudnick, Janak H. Patel, Ravishankar K. Iyer, Gwan S. Choi |
A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults. |
IEEE Trans. Computers |
1996 |
DBLP DOI BibTeX RDF |
transient fault injection, transient fault modeling, transient fault simulation, fault-tolerance, Single event upset |
18 | Richard M. King, Robert A. Wagner |
Combining Speed with Alpha-Particle Induced Memory Error Tolerance in a Large Boolean Vector Machine (Extended Abstract). |
ISCA |
1984 |
DBLP DOI BibTeX RDF |
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12 | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh |
Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance. |
IEEE Trans. Very Large Scale Integr. Syst. |
2006 |
DBLP DOI BibTeX RDF |
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12 | Navid Azizi, Farid N. Najm |
A family of cells to reduce the soft-error-rate in ternary-CAM. |
DAC |
2006 |
DBLP DOI BibTeX RDF |
soft-error rate, content-addressable memory |
12 | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee |
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits. |
DATE |
2005 |
DBLP DOI BibTeX RDF |
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12 | Jie S. Hu, Greg M. Link, Johnsy K. John, Shuai Wang 0006, Sotirios G. Ziavras |
Resource-Driven Optimizations for Transient-Fault Detecting SuperScalar Microarchitectures. |
Asia-Pacific Computer Systems Architecture Conference |
2005 |
DBLP DOI BibTeX RDF |
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12 | Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh |
Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance. |
VTS |
2005 |
DBLP DOI BibTeX RDF |
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12 | Arijit Biswas, Paul Racunas, Razvan Cheveresan, Joel S. Emer, Shubhendu S. Mukherjee, Ram Rangan |
Computing Architectural Vulnerability Factors for Address-Based Structures. |
ISCA |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Ketan N. Patel, Igor L. Markov |
Error-correction and crosstalk avoidance in DSM busses. |
IEEE Trans. Very Large Scale Integr. Syst. |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Shubhendu S. Mukherjee, Joel S. Emer, Tryggve Fossum, Steven K. Reinhardt |
Cache Scrubbing in Microprocessors: Myth or Necessity? |
PRDC |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Christopher T. Weaver, Joel S. Emer, Shubhendu S. Mukherjee, Steven K. Reinhardt |
Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor. |
ISCA |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Ketan N. Patel, Igor L. Markov |
Error-correction and crosstalk avoidance in DSM busses. |
SLIP |
2003 |
DBLP DOI BibTeX RDF |
DSM busses, error-correction, crosstalk noise, bus encoding |
Displaying result #1 - #33 of 33 (100 per page; Change: )
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