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Publication years (Num. hits)
1994 (1) 1995 (1)
Publication types (Num. hits)
inproceedings(2)
Venues (Conferences, Journals, ...)
VTS(2)
Authors
Ad J. van de Goor(2) J. Th. van der Linden(2) M. H. Konijnenburg(2)
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Found 2 publication records. Showing 2 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
69M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor Compact test sets for industrial circuits. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF compact test sets, industrial circuits, binary logic elements, three-state elements, compaction oriented decision making, heuristics, logic testing, integrated circuit testing, automatic test pattern generation, combinational circuits, automatic testing, multivalued logic circuits, test patterns, bidirectionals, xor gates, or gates, test set size
46J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor Test generation and three-state elements, buses, and bidirectionals. Search on Bibsonomy VTS The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
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