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Publication years (Num. hits)
1981-1992 (17) 1993-1999 (16) 2000-2002 (32) 2003-2004 (18) 2005 (15) 2006-2007 (23) 2008-2009 (21) 2010-2011 (16) 2012-2015 (17) 2016-2017 (15) 2018-2020 (17) 2021-2023 (18) 2024 (1)
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article(106) inproceedings(120)
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Found 227 publication records. Showing 226 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
152Ji Hwan Cha On optimal burn-in procedures - a generalized model. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
111Shey-Huei Sheu, Yu-Hung Chien Minimizing cost-functions related to both burn-in and field-operation under a generalized model. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
101Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
98Kyungmee O. Kim, W. Kuo Some considerations on system burn-in. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
98Thomas S. Barnett, Adit D. Singh Relating Yield Models to Burn-In Fall-Out in Time. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
87Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel Cyclic stress tests for full scan circuits. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF cyclic stress tests, fully testable unpackaged dies, burn-in process, cyclic input sequences, stress related problems, ISCAS89 benchmark circuits, monitored burn-in problems, IC reliability, VLSI, VLSI, logic testing, integrated circuit testing, CMOS, CMOS logic circuits, boundary scan testing, MCMs, integrated circuit reliability, full scan circuits
84Chin-Long Wey, Meng-Yao Liu Burn-In Stress Test of Analog CMOS ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
84Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins Burn-in Temperature Projections for Deep Sub-micron Technologies. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
81Sudarshan Bahukudumbi, Krishnendu Chakrabarty Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. Search on Bibsonomy VTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF wafer-level, pattern ordering, burn-in
81Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. Search on Bibsonomy ISQED The full citation details ... 2005 DBLP  DOI  BibTeX  RDF Electrostatic discharge (ESD), electrical overstress (EOS), LVTSCR, latch-up, burn-in
74Mesut Meterelliyoz, Kaushik Roy 0001 Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations. Search on Bibsonomy ASP-DAC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
67Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF burn-in reduction, voltage stress, Weibull analysis, integral circuit testing
57Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
57Ji Hwan Cha An extended model for optimal burn-in procedures. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
57Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. Search on Bibsonomy DFT The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
57Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell CMOS IC reliability indicators and burn-in economics. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
54Vivek De Leakage-tolerant design techniques for high performance processors. Search on Bibsonomy ISPD The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
50Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. Search on Bibsonomy DELTA The full citation details ... 2008 DBLP  DOI  BibTeX  RDF wafer testing, reliability, integrated circuits, burn-in, yield modelling
50Thomas S. Barnett, Adit D. Singh, Victor P. Nelson Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. Search on Bibsonomy DFT The full citation details ... 2001 DBLP  DOI  BibTeX  RDF infant mortality, negative binomial distribution, clustering, reliability, redundancy, yield, defects, defect tolerance, burn-in
44Sagar S. Sabade, D. M. H. Walker Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
44Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
44Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
44Thomas S. Barnett, Adit D. Singh, Victor P. Nelson Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model. Search on Bibsonomy VTS The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
37Larry Gilg Known Good Die. Search on Bibsonomy J. Electron. Test. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF known good die, KGD, chip scale (size) package, multi-chip module (MCM), wafer probe, membrane probe card, buckling beam probe card, KGD carrier, CSP, burn-in
30Shaomin Wu, Min Xie 0001 Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
30Xiaotie Deng, Haodi Feng, Guojun Li, Benyun Shi A PTAS for Semiconductor Burn-in Scheduling. Search on Bibsonomy J. Comb. Optim. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF geometric rounding, time stretching, approximation algorithm, batch processing, release date
30Pei-Chann Chang, Yun-Shiow Chen, Hui-Mei Wang Dynamic Scheduling Problem of Batch Processing Machine in Semiconductor Burn-in Operations. Search on Bibsonomy ICCSA (4) The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
30Atsumu Iseno, Yukihiro Iguchi A Method for Storing Fail Bit Maps in Burn-in Memory Testers. Search on Bibsonomy DELTA The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
30Kuo-Chan Huang, Chung-Len Lee 0001, Jwu E. Chen Maximization of power dissipation under random excitation for burn-in testing. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
27Diana El Rabih, Nihal Pekergin Statistical Model Checking Using Perfect Simulation. Search on Bibsonomy ATVA The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
27Jaydeep P. Kulkarni, Kaushik Roy 0001 A High Performance, Scalable Multiplexed Keeper Technique. Search on Bibsonomy ISQED The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
27Eric F. Weglarz, Kewal K. Saluja, T. M. Mak Testing of Hard Faults in Simultaneous Multithreaded Processors. Search on Bibsonomy IOLTS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
27Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2004 DBLP  DOI  BibTeX  RDF IC reliability
27Thomas S. Barnett, Adit D. Singh, Victor P. Nelson Extending integrated-circuit yield-models to estimate early-life reliability. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
27Mary Kathryn Cowles MCMC Sampler Convergence Rates for Hierarchical Normal Linear Models: A Simulation Approach. Search on Bibsonomy Stat. Comput. The full citation details ... 2002 DBLP  DOI  BibTeX  RDF agricultural field trials, total variation distance, Bayesian models, Gibbs sampler
27Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang A Programmable BIST Core for Embedded DRAM. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
23Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. Search on Bibsonomy ETS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF Gate Stress Test, Gate Oxide Reliability, Low Side Switch, Burn-In
23Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang A Prevenient Voltage Stress Test Method for High Density Memory. Search on Bibsonomy DELTA The full citation details ... 2008 DBLP  DOI  BibTeX  RDF voltage stress test, acceleration factor, burn-in test, junction temperature, constant voltage stress, voltage ramp stress, reliability
23Kwang-Ting (Tim) Cheng Dealing with early life failures. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF latent defects, embedded systems, technology scaling, IDDQ, burn-in
23Phil Nigh Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF latent defects, reliability defects, latent-defect screening, defect acceleration, DPPM, burn-in
23John M. Carulli Jr., Thomas J. Anderson The Impact of Multiple Failure Modes on Estimating Product Field Reliability. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF early failure rate, DPPM, reliability, burn-in
23Vinay Dabholkar, Sreejit Chakravarty Computing Stress Tests for Gate Oxide Shorts. Search on Bibsonomy VLSI Design The full citation details ... 1998 DBLP  DOI  BibTeX  RDF burn-in, stress tests, gate oxide shorts
17Yuanbo Li, Chu Kin Chan, Chun Yip Yau, Wai Leong Ng, Henry Lam Burn-in selection in simulating stationary time series. Search on Bibsonomy Comput. Stat. Data Anal. The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
17Qinqin Xu, Yuanguo Zhu Reliability Optimization of Uncertain Random Systems Combined With Burn-In and Preventive Maintenance. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
17Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. Search on Bibsonomy IEEE Access The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
17Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
17Xiang Ji, Gen Li Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time. Search on Bibsonomy CoRR The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
17Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker 0001, Matteo Sonza Reorda Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. Search on Bibsonomy ETS The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
17Xiang Ji, Gen Li Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time. Search on Bibsonomy NeurIPS The full citation details ... 2023 DBLP  BibTeX  RDF
17Tsuneo Kagawa, Masaya Ikemoto, Satoshi Ohtake A robust method of IC seating inspection in burn-in sockets using Hough transform. Search on Bibsonomy ICCE-TW The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
17Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. Search on Bibsonomy ETS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
17Hong-Kyu Shin, Hea-Bin Yang, Seung-Jin Baek, Sung-Jea Ko A luminance control method for OLED burn-in prevention using user information. Search on Bibsonomy ICCE The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
17Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement. Search on Bibsonomy IEEE J. Solid State Circuits The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Jeon-Young Kang, Jared Aldstadt Using Multiple Scale Space-Time Patterns to Determine the Number of Replicates and Burn-In Periods in Spatially Explicit Agent-Based Modeling of Vector-Borne Disease Transmission. Search on Bibsonomy ISPRS Int. J. Geo Inf. The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Daniel Kurz, Horst Lewitschnig, Jürgen Pilz Flexible time reduction method for burn-in of high-quality products. Search on Bibsonomy Qual. Reliab. Eng. Int. The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Yue Shi 0004, Yisha Xiang, Ying Liao, Zhicheng Zhu, Yili Hong 0001 Optimal burn-in policies for multiple dependent degradation processes. Search on Bibsonomy IISE Trans. The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Seong-Chel Park, Kwan-Ho Park, Joon-Hyuk Chang Luminance-Degradation Compensation Based on Multistream Self-Attention to Address Thin-Film Transistor-Organic Light Emitting Diode Burn-In. Search on Bibsonomy Sensors The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Yuan Chen 0005, Tao Yuan, Suk Joo Bae, Yue Kuo Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing. Search on Bibsonomy Comput. Ind. Eng. The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara 36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In. Search on Bibsonomy ISSCC The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli Innovative methods for Burn-In related Stress Metrics Computation. Search on Bibsonomy DTIS The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
17Zhen Chen, Ershun Pan, Tangbin Xia, Yanting Li Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors. Search on Bibsonomy Reliab. Eng. Syst. Saf. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
17Jeffrey Zhang 0008, Antai Xu, Daniel Gitlin, Desmond Yeo Dynamic vs Static Burn-in for 16nm Production. Search on Bibsonomy IRPS The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
17Kunyang Liu, Hongliang Pu, Hirofumi Shinohara A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in. Search on Bibsonomy CICC The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
17Chen He, Yanyao Yu Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In. Search on Bibsonomy ITC The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
17Xiaopeng Li, Zixian Liu, Yukun Wang, Mei Li Optimal burn-in strategy for two-dimensional warranted products considering preventive maintenance. Search on Bibsonomy Int. J. Prod. Res. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
17Yi Lyu, Yun Zhang 0001, Kairui Chen, Ci Chen, Xianxian Zeng Optimal Multi-Objective Burn-In Policy Based on Time-Transformed Wiener Degradation Process. Search on Bibsonomy IEEE Access The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
17Yi Lyu, Junyan Gao, Ci Chen, Yijie Jiang, Huachuan Li, Kairui Chen, Yun Zhang 0001 Optimal Burn-in Strategy for High Reliable Products Using Convolutional Neural Network. Search on Bibsonomy IEEE Access The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
17F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. Search on Bibsonomy DDECS The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
17Chen He Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers. Search on Bibsonomy ITC The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
17Mohammad Nasim Imtiaz Khan, Anirudh Iyengar, Swaroop Ghosh Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
17Goutam Paul 0001, Souvik Ray Analysis of burn-in period for RC4 state transition. Search on Bibsonomy Cryptogr. Commun. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
17Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. Search on Bibsonomy J. Electron. Test. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
17Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez 0001, Federico Venini An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. Search on Bibsonomy J. Low Power Electron. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
17Elizabeth Hunter, Brian Mac Namee, John D. Kelleher Using a Socioeconomic Segregation Burn-in Model to Initialise an Agent-Based Model for Infectious Diseases. Search on Bibsonomy J. Artif. Soc. Soc. Simul. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
17Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez 0001, Federico Venini An Optimized Test During Burn-In for Automotive SoC. Search on Bibsonomy IEEE Des. Test The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
17M.-H. Kim, S.-H. Chae, J.-S. Kim A Burn-in Potential Region Detection Method for the OLED panel displays. Search on Bibsonomy ISM The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
17Alex Kuefler, Mykel J. Kochenderfer Burn-In Demonstrations for Multi-Modal Imitation Learning. Search on Bibsonomy AAMAS The full citation details ... 2018 DBLP  BibTeX  RDF
17Yihai He, Linbo Wang, Yi Wei, Zhenzhen He Optimisation of burn-in time considering the hidden loss of quality deviations in the manufacturing process. Search on Bibsonomy Int. J. Prod. Res. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Danilo M. S. Ribeiro, Paulo R. Aguiar, Luiz F. G. Fabiano, Doriana D'Addona, Fabricio Guimaraes Baptista, Eduardo C. Bianchi Spectra Measurements Using Piezoelectric Diaphragms to Detect Burn in Grinding Process. Search on Bibsonomy IEEE Trans. Instrum. Meas. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Alex Kuefler, Mykel J. Kochenderfer Burn-In Demonstrations for Multi-Modal Imitation Learning. Search on Bibsonomy CoRR The full citation details ... 2017 DBLP  BibTeX  RDF
17Goutam Paul 0001, Souvik Ray Analysis of Burn-in period for RC4 State Transition. Search on Bibsonomy IACR Cryptol. ePrint Arch. The full citation details ... 2017 DBLP  BibTeX  RDF
17Sakchai Muangsrinoon, Poonpong Boonbrahm Burn in Zone: Real time Heart Rate monitoring for physical activity. Search on Bibsonomy JCSSE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Mohammad Nasim Imtiaz Khan, Anirudh Srikant Iyengar, Swaroop Ghosh Novel magnetic burn-in for retention testing of STTRAM. Search on Bibsonomy DATE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez 0001, C. M. Villa, Federico Venini A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. Search on Bibsonomy DATE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. Search on Bibsonomy I2MTC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF. Search on Bibsonomy ISCAS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez 0001, Federico Venini, Davide Appello A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. Search on Bibsonomy LATS The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Yong-Goo Shin, Dae-Hong Lee, Mun-Cheon Kang, Jeisung Lee, Sung-Jea Ko A novel burn-in potential region detection method using image processing technique. Search on Bibsonomy ICCE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
17Yisha Xiang, David W. Coit, Zhicheng Zhu A Multi-objective Joint Burn-in and Imperfect Condition-based Maintenance Model for Degradation-based Heterogeneous Populations. Search on Bibsonomy Qual. Reliab. Eng. Int. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
17Qingqing Zhai, Zhi-Sheng Ye 0001, Jun Yang 0018, Yu Zhao 0003 Measurement errors in degradation-based burn-in. Search on Bibsonomy Reliab. Eng. Syst. Saf. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
17Tao Yuan, Suk Joo Bae, Xiaoyan Zhu 0002 A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns. Search on Bibsonomy Reliab. Eng. Syst. Saf. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
17Ji Hwan Cha, Gianpaolo Pulcini Optimal burn-in procedure for mixed populations based on the device degradation process history. Search on Bibsonomy Eur. J. Oper. Res. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
17Nima Aghaee, Zebo Peng, Petru Eles Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
17Zuolin Cheng, Xiaole Cui, Xiaoxin Cui, Chung Len Lee 0001 Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure. Search on Bibsonomy IET Comput. Digit. Tech. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
17Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski Implications of Burn-In Stress on NBTI Degradation. Search on Bibsonomy CoRR The full citation details ... 2015 DBLP  BibTeX  RDF
17Daniel Kurz, Horst Lewitschnig, Jürgen Pilz An advanced area scaling approach for semiconductor burn-in. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
17Zhisheng Ye 0001, Loon-Ching Tang, Min Xie 0001 Bi-objective burn-in modeling and optimization. Search on Bibsonomy Ann. Oper. Res. The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
17Nima Aghaee, Zebo Peng, Petru Eles An efficient temperature-gradient based burn-in technique for 3D stacked ICs. Search on Bibsonomy DATE The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
17Kenneth M. Zick, Sen Li, Matthew French High-precision self-characterization for the LUT burn-in information leakage threat. Search on Bibsonomy FPL The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
17Ji Hwan Cha, Maxim Finkelstein Results for Burn-in of Systems Under External Shocks. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
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