|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 53 occurrences of 38 keywords
|
|
|
Results
Found 227 publication records. Showing 226 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
152 | Ji Hwan Cha |
On optimal burn-in procedures - a generalized model. |
IEEE Trans. Reliab. |
2005 |
DBLP DOI BibTeX RDF |
|
111 | Shey-Huei Sheu, Yu-Hung Chien |
Minimizing cost-functions related to both burn-in and field-operation under a generalized model. |
IEEE Trans. Reliab. |
2004 |
DBLP DOI BibTeX RDF |
|
101 | Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko |
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
|
98 | Kyungmee O. Kim, W. Kuo |
Some considerations on system burn-in. |
IEEE Trans. Reliab. |
2005 |
DBLP DOI BibTeX RDF |
|
98 | Thomas S. Barnett, Adit D. Singh |
Relating Yield Models to Burn-In Fall-Out in Time. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
87 | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel |
Cyclic stress tests for full scan circuits. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
cyclic stress tests, fully testable unpackaged dies, burn-in process, cyclic input sequences, stress related problems, ISCAS89 benchmark circuits, monitored burn-in problems, IC reliability, VLSI, VLSI, logic testing, integrated circuit testing, CMOS, CMOS logic circuits, boundary scan testing, MCMs, integrated circuit reliability, full scan circuits |
84 | Chin-Long Wey, Meng-Yao Liu |
Burn-In Stress Test of Analog CMOS ICs. |
Asian Test Symposium |
2004 |
DBLP DOI BibTeX RDF |
|
84 | Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins |
Burn-in Temperature Projections for Deep Sub-micron Technologies. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
81 | Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
wafer-level, pattern ordering, burn-in |
81 | Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev |
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. |
ISQED |
2005 |
DBLP DOI BibTeX RDF |
Electrostatic discharge (ESD), electrical overstress (EOS), LVTSCR, latch-up, burn-in |
74 | Mesut Meterelliyoz, Kaushik Roy 0001 |
Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations. |
ASP-DAC |
2009 |
DBLP DOI BibTeX RDF |
|
67 | Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko |
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. |
IEEE Des. Test Comput. |
2006 |
DBLP DOI BibTeX RDF |
burn-in reduction, voltage stress, Weibull analysis, integral circuit testing |
57 | Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz |
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
57 | Ji Hwan Cha |
An extended model for optimal burn-in procedures. |
IEEE Trans. Reliab. |
2006 |
DBLP DOI BibTeX RDF |
|
57 | Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi |
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. |
DFT |
2002 |
DBLP DOI BibTeX RDF |
|
57 | Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
CMOS IC reliability indicators and burn-in economics. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
54 | Vivek De |
Leakage-tolerant design techniques for high performance processors. |
ISPD |
2002 |
DBLP DOI BibTeX RDF |
|
50 | Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko |
Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. |
DELTA |
2008 |
DBLP DOI BibTeX RDF |
wafer testing, reliability, integrated circuits, burn-in, yield modelling |
50 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. |
DFT |
2001 |
DBLP DOI BibTeX RDF |
infant mortality, negative binomial distribution, clustering, reliability, redundancy, yield, defects, defect tolerance, burn-in |
44 | Sagar S. Sabade, D. M. H. Walker |
Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
44 | Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch |
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
44 | Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy |
Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
44 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
|
37 | Larry Gilg |
Known Good Die. |
J. Electron. Test. |
1997 |
DBLP DOI BibTeX RDF |
known good die, KGD, chip scale (size) package, multi-chip module (MCM), wafer probe, membrane probe card, buckling beam probe card, KGD carrier, CSP, burn-in |
30 | Shaomin Wu, Min Xie 0001 |
Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In. |
IEEE Trans. Reliab. |
2007 |
DBLP DOI BibTeX RDF |
|
30 | Xiaotie Deng, Haodi Feng, Guojun Li, Benyun Shi |
A PTAS for Semiconductor Burn-in Scheduling. |
J. Comb. Optim. |
2005 |
DBLP DOI BibTeX RDF |
geometric rounding, time stretching, approximation algorithm, batch processing, release date |
30 | Pei-Chann Chang, Yun-Shiow Chen, Hui-Mei Wang |
Dynamic Scheduling Problem of Batch Processing Machine in Semiconductor Burn-in Operations. |
ICCSA (4) |
2005 |
DBLP DOI BibTeX RDF |
|
30 | Atsumu Iseno, Yukihiro Iguchi |
A Method for Storing Fail Bit Maps in Burn-in Memory Testers. |
DELTA |
2002 |
DBLP DOI BibTeX RDF |
|
30 | Kuo-Chan Huang, Chung-Len Lee 0001, Jwu E. Chen |
Maximization of power dissipation under random excitation for burn-in testing. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
27 | Diana El Rabih, Nihal Pekergin |
Statistical Model Checking Using Perfect Simulation. |
ATVA |
2009 |
DBLP DOI BibTeX RDF |
|
27 | Jaydeep P. Kulkarni, Kaushik Roy 0001 |
A High Performance, Scalable Multiplexed Keeper Technique. |
ISQED |
2007 |
DBLP DOI BibTeX RDF |
|
27 | Eric F. Weglarz, Kewal K. Saluja, T. M. Mak |
Testing of Hard Faults in Simultaneous Multithreaded Processors. |
IOLTS |
2004 |
DBLP DOI BibTeX RDF |
|
27 | Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba |
Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. |
ACM Great Lakes Symposium on VLSI |
2004 |
DBLP DOI BibTeX RDF |
IC reliability |
27 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Extending integrated-circuit yield-models to estimate early-life reliability. |
IEEE Trans. Reliab. |
2003 |
DBLP DOI BibTeX RDF |
|
27 | Mary Kathryn Cowles |
MCMC Sampler Convergence Rates for Hierarchical Normal Linear Models: A Simulation Approach. |
Stat. Comput. |
2002 |
DBLP DOI BibTeX RDF |
agricultural field trials, total variation distance, Bayesian models, Gibbs sampler |
27 | Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang |
A Programmable BIST Core for Embedded DRAM. |
IEEE Des. Test Comput. |
1999 |
DBLP DOI BibTeX RDF |
|
23 | Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner |
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
Gate Stress Test, Gate Oxide Reliability, Low Side Switch, Burn-In |
23 | Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang |
A Prevenient Voltage Stress Test Method for High Density Memory. |
DELTA |
2008 |
DBLP DOI BibTeX RDF |
voltage stress test, acceleration factor, burn-in test, junction temperature, constant voltage stress, voltage ramp stress, reliability |
23 | Kwang-Ting (Tim) Cheng |
Dealing with early life failures. |
IEEE Des. Test Comput. |
2006 |
DBLP DOI BibTeX RDF |
latent defects, embedded systems, technology scaling, IDDQ, burn-in |
23 | Phil Nigh |
Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. |
IEEE Des. Test Comput. |
2006 |
DBLP DOI BibTeX RDF |
latent defects, reliability defects, latent-defect screening, defect acceleration, DPPM, burn-in |
23 | John M. Carulli Jr., Thomas J. Anderson |
The Impact of Multiple Failure Modes on Estimating Product Field Reliability. |
IEEE Des. Test Comput. |
2006 |
DBLP DOI BibTeX RDF |
early failure rate, DPPM, reliability, burn-in |
23 | Vinay Dabholkar, Sreejit Chakravarty |
Computing Stress Tests for Gate Oxide Shorts. |
VLSI Design |
1998 |
DBLP DOI BibTeX RDF |
burn-in, stress tests, gate oxide shorts |
17 | Yuanbo Li, Chu Kin Chan, Chun Yip Yau, Wai Leong Ng, Henry Lam |
Burn-in selection in simulating stationary time series. |
Comput. Stat. Data Anal. |
2024 |
DBLP DOI BibTeX RDF |
|
17 | Qinqin Xu, Yuanguo Zhu |
Reliability Optimization of Uncertain Random Systems Combined With Burn-In and Preventive Maintenance. |
IEEE Trans. Reliab. |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli |
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. |
IEEE Access |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli |
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. |
IEEE Trans. Computers |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Xiang Ji, Gen Li |
Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time. |
CoRR |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker 0001, Matteo Sonza Reorda |
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. |
ETS |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Xiang Ji, Gen Li |
Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time. |
NeurIPS |
2023 |
DBLP BibTeX RDF |
|
17 | Tsuneo Kagawa, Masaya Ikemoto, Satoshi Ohtake |
A robust method of IC seating inspection in burn-in sockets using Hough transform. |
ICCE-TW |
2022 |
DBLP DOI BibTeX RDF |
|
17 | Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. |
ETS |
2022 |
DBLP DOI BibTeX RDF |
|
17 | Hong-Kyu Shin, Hea-Bin Yang, Seung-Jin Baek, Sung-Jea Ko |
A luminance control method for OLED burn-in prevention using user information. |
ICCE |
2022 |
DBLP DOI BibTeX RDF |
|
17 | Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara |
A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement. |
IEEE J. Solid State Circuits |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Jeon-Young Kang, Jared Aldstadt |
Using Multiple Scale Space-Time Patterns to Determine the Number of Replicates and Burn-In Periods in Spatially Explicit Agent-Based Modeling of Vector-Borne Disease Transmission. |
ISPRS Int. J. Geo Inf. |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Daniel Kurz, Horst Lewitschnig, Jürgen Pilz |
Flexible time reduction method for burn-in of high-quality products. |
Qual. Reliab. Eng. Int. |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Yue Shi 0004, Yisha Xiang, Ying Liao, Zhicheng Zhu, Yili Hong 0001 |
Optimal burn-in policies for multiple dependent degradation processes. |
IISE Trans. |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Seong-Chel Park, Kwan-Ho Park, Joon-Hyuk Chang |
Luminance-Degradation Compensation Based on Multistream Self-Attention to Address Thin-Film Transistor-Organic Light Emitting Diode Burn-In. |
Sensors |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Yuan Chen 0005, Tao Yuan, Suk Joo Bae, Yue Kuo |
Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing. |
Comput. Ind. Eng. |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara |
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In. |
ISSCC |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli |
Innovative methods for Burn-In related Stress Metrics Computation. |
DTIS |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Zhen Chen, Ershun Pan, Tangbin Xia, Yanting Li |
Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors. |
Reliab. Eng. Syst. Saf. |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Jeffrey Zhang 0008, Antai Xu, Daniel Gitlin, Desmond Yeo |
Dynamic vs Static Burn-in for 16nm Production. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Kunyang Liu, Hongliang Pu, Hirofumi Shinohara |
A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in. |
CICC |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Chen He, Yanyao Yu |
Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In. |
ITC |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Xiaopeng Li, Zixian Liu, Yukun Wang, Mei Li |
Optimal burn-in strategy for two-dimensional warranted products considering preventive maintenance. |
Int. J. Prod. Res. |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Yi Lyu, Yun Zhang 0001, Kairui Chen, Ci Chen, Xianxian Zeng |
Optimal Multi-Objective Burn-In Policy Based on Time-Transformed Wiener Degradation Process. |
IEEE Access |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Yi Lyu, Junyan Gao, Ci Chen, Yijie Jiang, Huachuan Li, Kairui Chen, Yun Zhang 0001 |
Optimal Burn-in Strategy for High Reliable Products Using Convolutional Neural Network. |
IEEE Access |
2019 |
DBLP DOI BibTeX RDF |
|
17 | F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi |
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. |
DDECS |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Chen He |
Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers. |
ITC |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Nasim Imtiaz Khan, Anirudh Iyengar, Swaroop Ghosh |
Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM. |
IEEE Trans. Very Large Scale Integr. Syst. |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Goutam Paul 0001, Souvik Ray |
Analysis of burn-in period for RC4 state transition. |
Cryptogr. Commun. |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini |
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. |
J. Electron. Test. |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez 0001, Federico Venini |
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. |
J. Low Power Electron. |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Elizabeth Hunter, Brian Mac Namee, John D. Kelleher |
Using a Socioeconomic Segregation Burn-in Model to Initialise an Agent-Based Model for Infectious Diseases. |
J. Artif. Soc. Soc. Simul. |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez 0001, Federico Venini |
An Optimized Test During Burn-In for Automotive SoC. |
IEEE Des. Test |
2018 |
DBLP DOI BibTeX RDF |
|
17 | M.-H. Kim, S.-H. Chae, J.-S. Kim |
A Burn-in Potential Region Detection Method for the OLED panel displays. |
ISM |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Alex Kuefler, Mykel J. Kochenderfer |
Burn-In Demonstrations for Multi-Modal Imitation Learning. |
AAMAS |
2018 |
DBLP BibTeX RDF |
|
17 | Yihai He, Linbo Wang, Yi Wei, Zhenzhen He |
Optimisation of burn-in time considering the hidden loss of quality deviations in the manufacturing process. |
Int. J. Prod. Res. |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Danilo M. S. Ribeiro, Paulo R. Aguiar, Luiz F. G. Fabiano, Doriana D'Addona, Fabricio Guimaraes Baptista, Eduardo C. Bianchi |
Spectra Measurements Using Piezoelectric Diaphragms to Detect Burn in Grinding Process. |
IEEE Trans. Instrum. Meas. |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Alex Kuefler, Mykel J. Kochenderfer |
Burn-In Demonstrations for Multi-Modal Imitation Learning. |
CoRR |
2017 |
DBLP BibTeX RDF |
|
17 | Goutam Paul 0001, Souvik Ray |
Analysis of Burn-in period for RC4 State Transition. |
IACR Cryptol. ePrint Arch. |
2017 |
DBLP BibTeX RDF |
|
17 | Sakchai Muangsrinoon, Poonpong Boonbrahm |
Burn in Zone: Real time Heart Rate monitoring for physical activity. |
JCSSE |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Nasim Imtiaz Khan, Anirudh Srikant Iyengar, Swaroop Ghosh |
Novel magnetic burn-in for retention testing of STTRAM. |
DATE |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez 0001, C. M. Villa, Federico Venini |
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. |
DATE |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola |
Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. |
I2MTC |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu |
A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF. |
ISCAS |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez 0001, Federico Venini, Davide Appello |
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. |
LATS |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Yong-Goo Shin, Dae-Hong Lee, Mun-Cheon Kang, Jeisung Lee, Sung-Jea Ko |
A novel burn-in potential region detection method using image processing technique. |
ICCE |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Yisha Xiang, David W. Coit, Zhicheng Zhu |
A Multi-objective Joint Burn-in and Imperfect Condition-based Maintenance Model for Degradation-based Heterogeneous Populations. |
Qual. Reliab. Eng. Int. |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Qingqing Zhai, Zhi-Sheng Ye 0001, Jun Yang 0018, Yu Zhao 0003 |
Measurement errors in degradation-based burn-in. |
Reliab. Eng. Syst. Saf. |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Tao Yuan, Suk Joo Bae, Xiaoyan Zhu 0002 |
A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns. |
Reliab. Eng. Syst. Saf. |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Ji Hwan Cha, Gianpaolo Pulcini |
Optimal burn-in procedure for mixed populations based on the device degradation process history. |
Eur. J. Oper. Res. |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Nima Aghaee, Zebo Peng, Petru Eles |
Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs. |
IEEE Trans. Very Large Scale Integr. Syst. |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Zuolin Cheng, Xiaole Cui, Xiaoxin Cui, Chung Len Lee 0001 |
Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure. |
IET Comput. Digit. Tech. |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski |
Implications of Burn-In Stress on NBTI Degradation. |
CoRR |
2015 |
DBLP BibTeX RDF |
|
17 | Daniel Kurz, Horst Lewitschnig, Jürgen Pilz |
An advanced area scaling approach for semiconductor burn-in. |
Microelectron. Reliab. |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Zhisheng Ye 0001, Loon-Ching Tang, Min Xie 0001 |
Bi-objective burn-in modeling and optimization. |
Ann. Oper. Res. |
2014 |
DBLP DOI BibTeX RDF |
|
17 | Nima Aghaee, Zebo Peng, Petru Eles |
An efficient temperature-gradient based burn-in technique for 3D stacked ICs. |
DATE |
2014 |
DBLP DOI BibTeX RDF |
|
17 | Kenneth M. Zick, Sen Li, Matthew French |
High-precision self-characterization for the LUT burn-in information leakage threat. |
FPL |
2014 |
DBLP DOI BibTeX RDF |
|
17 | Ji Hwan Cha, Maxim Finkelstein |
Results for Burn-in of Systems Under External Shocks. |
IEEE Trans. Reliab. |
2013 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #100 of 226 (100 per page; Change: ) Pages: [ 1][ 2][ 3][ >>] |
|