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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 36 occurrences of 31 keywords
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Results
Found 19 publication records. Showing 19 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
40 | Jian Zhao, Hossam S. Hassanein, Jieyi Wu, Junzhou Luo |
Congestion-Aware Multicast Routing for Supporting QoS over the Internet. |
ISCC |
2003 |
DBLP DOI BibTeX RDF |
cycle breaking, multicast tree construction, Open Shortest Path First (OSPF), Leaky Bucket (LB), Quality of Service (QoS), Multicast routing, network congestion, Weighted Fair Queuing (WFQ) |
40 | Kwang-Ting Cheng |
Partial scan designs without using a separate scan clock. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
flip-flop selection method, flip-flop test generation method, scan registers ordering, scan-shifting concept, test vector compaction, delay fault detection, cycle breaking, logic testing, delays, timing, design for testability, logic design, automatic testing, DFT, fault coverage, flip-flops, circuit optimisation, boundary scan testing, scan chain, combinatorial optimization problem, test generation algorithm, partial scan designs, system clock |
34 | Lev B. Levitin, Mark G. Karpovsky, Mehmet Mustafa |
Deadlock prevention by turn prohibition in interconnection networks. |
IPDPS |
2009 |
DBLP DOI BibTeX RDF |
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30 | Jian Zhao, Hossam S. Hassanein, Jieyi Wu, Junzhou Luo |
CRMA: A Cycle-breaking Multicast Routing Algorithm for Supporting QoS over the Internet. |
HICSS |
2003 |
DBLP DOI BibTeX RDF |
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29 | Sujit Dey, Srimat T. Chakradhar |
Design of testable sequential circuits by repositioning flip-flops. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
cycle-breaking, flip-flop minimization, sequential redundancy, design for testability, sequential circuits, retiming, partial scan, strongly connected components, redundant fault |
19 | Brian A. Malloy, Peter J. Clarke, Errol L. Lloyd |
A Parameterized Cost Model to Order Classes for Class-based Testing of C++ Applications. |
ISSRE |
2003 |
DBLP DOI BibTeX RDF |
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18 | Thomas Eiter, Markus Hecher, Rafael Kiesel |
Treewidth-Aware Cycle Breaking for Algebraic Answer Set Counting. |
KR |
2021 |
DBLP DOI BibTeX RDF |
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18 | Vladimir Sudakov, Alexey Kurennykh |
Cycle-Breaking Approach to Reduce Inconsistency in Pairwise Comparisons. |
CSOC (1) |
2020 |
DBLP DOI BibTeX RDF |
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18 | Álvaro Barbero Jiménez, José R. Dorronsoro |
Cycle-breaking acceleration for support vector regression. |
Neurocomputing |
2011 |
DBLP DOI BibTeX RDF |
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18 | Álvaro Barbero Jiménez, Jorge López Lázaro, José R. Dorronsoro |
Cycle-breaking acceleration of SVM training. |
Neurocomputing |
2009 |
DBLP DOI BibTeX RDF |
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18 | Lev B. Levitin, Mark G. Karpovsky, Mehmet Mustafa, Lev Zakrevski |
A New Algorithm for Finding Minimal Cycle-Breaking Sets of Turns in a Graph. |
J. Graph Algorithms Appl. |
2006 |
DBLP DOI BibTeX RDF |
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18 | Francesco De Pellegrini, David Starobinski, Mark G. Karpovsky, Lev B. Levitin |
Scalable Cycle-Breaking Algorithms for Gigabit Ethernet Backbones. |
INFOCOM |
2004 |
DBLP DOI BibTeX RDF |
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18 | Tatiana Orenstein, Zvi Kohavi, Irith Pomeranz |
An optimal algorithm for cycle breaking in directed graphs. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
weighted feedback vertex set, graph partition, partial scan, graph reduction, feedback vertex set |
15 | Ruiming Chen, Hai Zhou 0001 |
Statistical timing verification for transparently latched circuits. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2006 |
DBLP DOI BibTeX RDF |
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11 | Benjamin G. Jackson, Srinivas Aluru, Patrick S. Schnable |
Consensus Genetic Maps: A Graph Theoretic Approach. |
CSB |
2005 |
DBLP DOI BibTeX RDF |
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11 | Dong Xiang, Janak H. Patel |
Partial Scan Design Based on Circuit State Information and Functional Analysis. |
IEEE Trans. Computers |
2004 |
DBLP DOI BibTeX RDF |
Valid state, invalid state, testability improvement potential, conflict, testability measure, partial scan design |
11 | Dong Xiang, Yi Xu |
A Multiple Phase Partial Scan Design Method. |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
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11 | Kee Sup Kim, Charles R. Kime |
Partial scan flip-flop selection by use of empirical testability. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
scan flip-flop selection, serial scan, design for testability, testability, partial scan |
11 | Kwang-Ting Cheng |
Transition fault testing for sequential circuits. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1993 |
DBLP DOI BibTeX RDF |
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