Results
Found 15 publication records. Showing 15 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
52 | Ad J. van de Goor, Ivo Schanstra |
Address and Data Scrambling: Causes and Impact on Memory Tests. |
DELTA |
2002 |
DBLP DOI BibTeX RDF |
Address-scrambling, data-scrambling, fault models, memory tests, data backgrounds |
34 | Ad J. van de Goor, Said Hamdioui, Rob Wadsworth |
Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
address directions, peripheral circuit faults, fault coverage, March tests, data-backgrounds |
25 | Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor |
Memory Fault Modeling Trends: A Case Study. |
J. Electron. Test. |
2004 |
DBLP DOI BibTeX RDF |
static faults, fault models, fault coverage, memory tests, dynamic faults, data backgrounds |
25 | Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor |
Effects of Bit Line Coupling on the Faulty Behavior of DRAMs. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
bit line coupling, DRAMs, Spice simulation, data backgrounds, faulty behavior |
25 | Ad J. van de Goor, Issam B. S. Tlili |
A Systematic Method for Modifying March Tests for Bit-Oriented Memories into Tests for Word-Oriented Memories. |
IEEE Trans. Computers |
2003 |
DBLP DOI BibTeX RDF |
Bit-oriented memories, word-oriented memories, fault models, march tests, data backgrounds |
25 | Said Hamdioui, Ad J. van de Goor, Mike Rodgers |
Detecting Intra-Word Faults in Word-Oriented Memories. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
Bit-oriented/word-oriented memories, fault models, memory tests, data backgrounds |
25 | Ad J. van de Goor, Magdy S. Abadir, Alan Carlin |
Minimal Test for Coupling Faults in Word-Oriented Memories. |
DATE |
2002 |
DBLP DOI BibTeX RDF |
State coupling faults, word-oriented memories, tests, data backgrounds, m-out-of-n codes |
25 | Ad J. van de Goor, Issam B. S. Tlili |
March Tests for Word-Oriented Memories. |
DATE |
1998 |
DBLP DOI BibTeX RDF |
Bit-oriented memories, word-oriented memories, fault models, memory tests, march tests, data backgrounds |
11 | Koichi Kise, Yasuo Miki, Keinosuke Matsumoto |
Backgrounds as Information Carriers for Printed Documents. |
ICPR |
2000 |
DBLP DOI BibTeX RDF |
|
9 | Ioannis Voyiatzis |
An ALU-Based BIST Scheme for Word-Organized RAMs. |
IEEE Trans. Computers |
2008 |
DBLP DOI BibTeX RDF |
Memory control and access, Reliability, Test generation, Built-In Tests, Testing and Fault-Tolerance, Semiconductor Memories |
9 | Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
A Transparent based Programmable Memory BIST. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
9 | Ivo Schanstra, Ad J. van de Goor |
Consequences of RAM Bitline Twisting for Test Coverage. |
DATE |
2003 |
DBLP DOI BibTeX RDF |
|
9 | Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar 0002, Richard Lee, John Bell, Lisa Curhan |
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
9 | Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu |
Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2002 |
DBLP DOI BibTeX RDF |
|
9 | Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu |
Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
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