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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 10 occurrences of 8 keywords
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Results
Found 12 publication records. Showing 12 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
120 | Sandra Levasseur, Frederic Duvivier |
Application of a yield model merging critical areas and defectivity to industrial products. |
DFT |
1997 |
DBLP DOI BibTeX RDF |
industrial products, survey sampling based estimation tool, fabrication process, SGS-Thomson Crolles plant, multiple products, process versions, 0.5 micron, robustness, defectivity, EYES, critical areas, yield model, integrated circuit yield |
84 | Kamal Rajkanan |
Yield Analysis Methodology for Low Defectivity Wafer Fabs. |
MTDT |
2000 |
DBLP DOI BibTeX RDF |
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59 | Sandrine Barberan, Frederic Duvivier |
Management of Critical Areas and Defectivity Data for Yield Trend Modeling. |
DFT |
1998 |
DBLP DOI BibTeX RDF |
critical areas, defect analysis, yield modeling |
34 | Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza |
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
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34 | Wei-Che Wang, Yair Yona, Suhas N. Diggavi, Puneet Gupta 0001 |
LEDPUF: Stability-guaranteed physical unclonable functions through locally enhanced defectivity. |
HOST |
2016 |
DBLP DOI BibTeX RDF |
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34 | Paolo Buttà, Nicola Guglielmi, Manuela Manetta, Silvia Noschese |
Differential Equations for Real-Structured Defectivity Measures. |
SIAM J. Matrix Anal. Appl. |
2015 |
DBLP DOI BibTeX RDF |
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34 | Dan X. Houston, Douglas Buettner, Myron Hecht |
Defectivity profiling with dynamic COQUALMO: An explication and product quality retrospective. |
J. Softw. Evol. Process. |
2012 |
DBLP DOI BibTeX RDF |
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34 | Hirotachi Abo |
On non-defectivity of certain Segre-Veronese varieties. |
J. Symb. Comput. |
2010 |
DBLP DOI BibTeX RDF |
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34 | Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas |
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. |
Microelectron. Reliab. |
2008 |
DBLP DOI BibTeX RDF |
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25 | Dan X. Houston, Douglas Buettner, Myron Hecht |
Dynamic COQUALMO: Defect Profiling over Development Cycles. |
ICSP |
2009 |
DBLP DOI BibTeX RDF |
Defect profile, defect introduction and removal, COQUALMO |
25 | Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee |
Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. |
VLSI Design |
2008 |
DBLP DOI BibTeX RDF |
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25 | Robert Madge |
New Test Paradigms for Yield and Manufacturability. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
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