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Searching for defectivity with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1997-2022 (12)
Publication types (Num. hits)
article(4) inproceedings(8)
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Found 12 publication records. Showing 12 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
120Sandra Levasseur, Frederic Duvivier Application of a yield model merging critical areas and defectivity to industrial products. Search on Bibsonomy DFT The full citation details ... 1997 DBLP  DOI  BibTeX  RDF industrial products, survey sampling based estimation tool, fabrication process, SGS-Thomson Crolles plant, multiple products, process versions, 0.5 micron, robustness, defectivity, EYES, critical areas, yield model, integrated circuit yield
84Kamal Rajkanan Yield Analysis Methodology for Low Defectivity Wafer Fabs. Search on Bibsonomy MTDT The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
59Sandrine Barberan, Frederic Duvivier Management of Critical Areas and Defectivity Data for Yield Trend Modeling. Search on Bibsonomy DFT The full citation details ... 1998 DBLP  DOI  BibTeX  RDF critical areas, defect analysis, yield modeling
34Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer. Search on Bibsonomy IRPS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
34Wei-Che Wang, Yair Yona, Suhas N. Diggavi, Puneet Gupta 0001 LEDPUF: Stability-guaranteed physical unclonable functions through locally enhanced defectivity. Search on Bibsonomy HOST The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
34Paolo Buttà, Nicola Guglielmi, Manuela Manetta, Silvia Noschese Differential Equations for Real-Structured Defectivity Measures. Search on Bibsonomy SIAM J. Matrix Anal. Appl. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
34Dan X. Houston, Douglas Buettner, Myron Hecht Defectivity profiling with dynamic COQUALMO: An explication and product quality retrospective. Search on Bibsonomy J. Softw. Evol. Process. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
34Hirotachi Abo On non-defectivity of certain Segre-Veronese varieties. Search on Bibsonomy J. Symb. Comput. The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
34Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
25Dan X. Houston, Douglas Buettner, Myron Hecht Dynamic COQUALMO: Defect Profiling over Development Cycles. Search on Bibsonomy ICSP The full citation details ... 2009 DBLP  DOI  BibTeX  RDF Defect profile, defect introduction and removal, COQUALMO
25Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. Search on Bibsonomy VLSI Design The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
25Robert Madge New Test Paradigms for Yield and Manufacturability. Search on Bibsonomy ITC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
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