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Searching for depowering with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1995 (1)
Publication types (Num. hits)
inproceedings(1)
Venues (Conferences, Journals, ...)
VTS(1)
Authors
Joan Figueras(1) Josep Rius 0001(1)
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Found 1 publication records. Showing 1 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
83Josep Rius 0001, Joan Figueras Detecting IDDQ defective CMOS circuits by depowering. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF I/sub DDQ/ defective CMOS circuits, depowering, fault detection capabilities, quiescent state, logic valves, discharge current, power supply line disconnection, logic testing, integrated circuit testing, fault location, CMOS logic circuits, capacitance
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