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Searching for phrase level-testable (changed automatically) with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1996 (1) 2003 (1)
Publication types (Num. hits)
article(1) inproceedings(1)
Venues (Conferences, Journals, ...)
J. Electron. Test.(1) VTS(1)
Authors
Antonis M. Paschalis(1) Dimitris Gizopoulos(1) John P. Hayes(1) Mihalis Psarakis(1) R. D. (Shawn) Blanton(1) Yervant Zorian(1)
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Found 2 publication records. Showing 2 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
49R. D. (Shawn) Blanton, John P. Hayes Design of a fast, easily testable ALU. Search on Bibsonomy VTS The full citation details ... 1996 DBLP  DOI  BibTeX  RDF ALU, adder design, L-testable design, level-testable, carry-lookahead addition, fault diagnosis, logic testing, integrated circuit testing, automatic testing, digital arithmetic, integrated circuit design, adders, logic arrays, test patterns, area overhead, functional faults, carry logic, arithmetic-logic unit, 8 bit
18Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian Easily Testable Cellular Carry Lookahead Adders. Search on Bibsonomy J. Electron. Test. The full citation details ... 2003 DBLP  DOI  BibTeX  RDF cellular carry lookahead adders, linear-testability, design-for-testability, cell fault model
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