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Searching for phrase linear-testability (changed automatically) with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1989 (1) 1995 (1) 1997 (1) 2000 (1) 2003 (1)
Publication types (Num. hits)
article(3) inproceedings(2)
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The graphs summarize 18 occurrences of 15 keywords

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Found 5 publication records. Showing 5 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
75Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian Easily Testable Cellular Carry Lookahead Adders. Search on Bibsonomy J. Electron. Test. The full citation details ... 2003 DBLP  DOI  BibTeX  RDF cellular carry lookahead adders, linear-testability, design-for-testability, cell fault model
34Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis Robust Sequential Fault Testing of Iterative Logic Arrays. Search on Bibsonomy VTS The full citation details ... 1997 DBLP  DOI  BibTeX  RDF Sequential Faults, Linear-testability, Fault Modeling, Automatic Test Generation, C-testability, Iterative Logic Arrays
34Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis Testing combinational iterative logic arrays for realistic faults. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF combinational iterative logic arrays, realistic faults, two-dimensional logic arrays, one-dimensional logic arrays, n-pattern tests, linear-testability, efficient test set, ILA, VLSI, fault diagnosis, logic testing, integrated circuit testing, combinational circuits, cellular arrays, logic arrays, C-testability, cell fault model
17Fabrizio Lombardi, Donatella Sciuto Linear testability conditions for two-dimensional arrays. Search on Bibsonomy Microprocess. Microprogramming The full citation details ... 1989 DBLP  DOI  BibTeX  RDF
17Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic Arrays. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2000 DBLP  DOI  BibTeX  RDF Sequential fault modeling, test pattern generation, robust testing, iterative logic arrays
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