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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 97 occurrences of 83 keywords
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Results
Found 1675 publication records. Showing 1675 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
141 | K. J. Stanley, Timothy D. Stanley, José Maia |
Wafer fabrication: realizing 300mm fab productivity improvements through integrated metrology. |
WSC |
2002 |
DBLP DOI BibTeX RDF |
|
94 | Yaw-Jen Chang, Yuan Kang, Chin-Liang Hsu, Chi-Tim Chang, Tat Yan Chan |
Virtual Metrology Technique for Semiconductor Manufacturing. |
IJCNN |
2006 |
DBLP DOI BibTeX RDF |
|
76 | Fabricio Fishkel, Anath Fischer, Sigal Ar |
Verification of Engineering Models Based on Bipartite Graph Matching for Inspection Applications. |
GMP |
2006 |
DBLP DOI BibTeX RDF |
Computational metrology, Reverse engineering, Metrology, Mesh processing, Bipartite graph matching |
69 | José Otero, Luciano Sánchez, Jesús Alcalá-Fdez |
Fuzzy-genetic optimization of the parameters of a low cost system for the optical measurement of several dimensions of vehicles. |
Soft Comput. |
2008 |
DBLP DOI BibTeX RDF |
Fuzzy uncertainty, Genetic algorithms, Stereoscopic vision, Metrology, Random sets |
63 | Xiaoming Deng 0001, Fuchao Wu, Yihong Wu 0002, Fuqing Duan |
Visual metrology with uncalibrated radial distorted images. |
ICPR |
2008 |
DBLP DOI BibTeX RDF |
|
63 | Seong-ho Kang, Mitchell W. Pryor, Delbert Tesar |
Kinematic Model and Metrology System for Modular Robot Calibration. |
ICRA |
2004 |
DBLP DOI BibTeX RDF |
|
63 | Yue-Tsang Chen, Chauchin Su |
Analog Module Metrology Using MNABST-1 P1149.4 Test Chip. |
Asian Test Symposium |
1998 |
DBLP DOI BibTeX RDF |
|
54 | Christoph Heinzl, Johann Kastner, M. Eduard Gröller |
Surface Extraction from Multi-Material Components for Metrology using Dual Energy CT. |
IEEE Trans. Vis. Comput. Graph. |
2007 |
DBLP DOI BibTeX RDF |
DECT image fusion, local surface extraction, Dual Energy CT, dimensional measurement, variance comparison, metrology |
47 | Dongtai Liang, Xuanyin Wang |
Planar Visual Metrology using Partition-based Camera Calibration. |
RAM |
2008 |
DBLP DOI BibTeX RDF |
|
47 | Fan-Tien Cheng, Yeh-Tung Chen, Yu-Chuan Su, Deng-Lin Zeng |
Method for Evaluating Reliance Level of a Virtual Metrology System. |
ICRA |
2007 |
DBLP DOI BibTeX RDF |
|
47 | Scott C.-H. Huang, Shamila Makki, Niki Pissinou |
Accusation Resolution Using Security Metrology. |
WASA |
2006 |
DBLP DOI BibTeX RDF |
|
47 | Enrico S. Canuto, Fabio Musso |
Embedded Model Control: Application to Interferometric Metrology Lines. |
ETFA |
2006 |
DBLP DOI BibTeX RDF |
|
47 | Alain Abran, Asma Sellami, Witold Suryn |
Metrology, Measurement and Metrics in Software Engineering. |
IEEE METRICS |
2003 |
DBLP DOI BibTeX RDF |
|
47 | B. Muralikrishnan, Kayvan Najarian, J. Raja |
Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. |
ICPR (1) |
2002 |
DBLP DOI BibTeX RDF |
|
47 | Robert Wright II, Marlin Shopbell, Kristin Rust, Silpa Sigireddy |
Wafer fabrication: effects of metrology load port buffering in automated 300mm factories. |
WSC |
2002 |
DBLP DOI BibTeX RDF |
|
39 | Feng Guo 0006, Rama Chellappa |
Video Metrology Using a Single Camera. |
IEEE Trans. Pattern Anal. Mach. Intell. |
2010 |
DBLP DOI BibTeX RDF |
Video metrology, mensuration, rectification |
39 | Yisong Chen, Horace Ho-Shing Ip |
Single view metrology of wide-angle lens images. |
Vis. Comput. |
2006 |
DBLP DOI BibTeX RDF |
Lens distortion correction, Euclidean measurement, Single view metrology, Error analysis |
39 | Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen |
Analog signal metrology for mixed signal ICs. |
Asian Test Symposium |
1997 |
DBLP DOI BibTeX RDF |
Analog signal metrology, multiple period low-rate sampled waveform, high-rate sampled waveform, DSP based testing, on-chip ADC, 20 MHz, mixed analogue-digital integrated circuits, Signal reconstruction, mixed signal IC |
39 | Heikki Ailisto |
CAD and Vision in Rangefinder-based Dimensional Metrology. |
3DIM |
1997 |
DBLP DOI BibTeX RDF |
rangefinder-based dimensional metrology, automated 3D measurement, measurement planning, measurement execution, graphical measurement planning tool, automatic optical measurement systems, sensory feedback, performance criteria, CAD, CAD, vision |
33 | Alessandro Schiavi, Fabrizio Mazzoleni, Alessio Facello, Andrea Prato |
Metrology for next generation "Phygital Sensors". |
MetroInd4.0&IoT |
2023 |
DBLP DOI BibTeX RDF |
|
33 | Tamador Salih Saeed |
Metrology for All: Women in Metrology (WIM): 2022 First Forum. |
IEEE Instrum. Meas. Mag. |
2022 |
DBLP DOI BibTeX RDF |
|
33 | Giada Luppino, Lisa Bosisio, Chiara Conese, Davide Maria Fabris, Marco Tarabini |
Metrology of a Monocular Vision System for Markers Localization and Tracking. |
MetroInd4.0& IoT |
2022 |
DBLP DOI BibTeX RDF |
|
33 | Wiebke Heeren, Bernd Müller, Gianfranco Miele, Tuukka Mustapää, Daniel Hutzschenreuter, Clifford Brown, Oksana Baer |
SmartCom - Key Findings for Digitalisation in Metrology. |
MetroInd4.0&IoT |
2021 |
DBLP DOI BibTeX RDF |
|
33 | Maximilian Gruber, Sascha Eichstädt, Julia Neumann, Adrian Paschke |
Semantic Information in Sensor Networks: How to Combine Existing Ontologies, Vocabularies and Data Schemes to Fit a Metrology Use Case. |
MetroInd4.0&IoT |
2020 |
DBLP DOI BibTeX RDF |
|
33 | Mark Kuster |
A Measurement Information Infrastructure's Benefits for Industrial Metrology and IoT. |
MetroInd4.0&IoT |
2020 |
DBLP DOI BibTeX RDF |
|
33 | Roberto Benitez, Roberto Benitez Jr., Cesar Ramirez, Jose A. Vazquez |
Sensors calibration for Metrology 4.0. |
MetroInd4.0&IoT |
2019 |
DBLP DOI BibTeX RDF |
|
33 | Richard Davis 0001 |
Why the Mohs scale remains relevant for metrology [Basic Metrology]. |
IEEE Instrum. Meas. Mag. |
2018 |
DBLP DOI BibTeX RDF |
|
33 | Richard Davis 0001 |
The center of a souffle-metrology in the kitchen [Basic metrology]. |
IEEE Instrum. Meas. Mag. |
2018 |
DBLP DOI BibTeX RDF |
|
33 | Henry Swofford, Ted Vosk |
Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles. |
IEEE Instrum. Meas. Mag. |
2017 |
DBLP DOI BibTeX RDF |
|
33 | Annarita Lazzari, Jean-Michel Pou, Christopher DuBois, Laurent Leblond |
Smart metrology: the importance of metrology of decisions in the big data era. |
IEEE Instrum. Meas. Mag. |
2017 |
DBLP DOI BibTeX RDF |
|
33 | Bryan P. Kibble |
Everyday instruments from basic metrology [Basic Metrology]. |
IEEE Instrum. Meas. Mag. |
2015 |
DBLP DOI BibTeX RDF |
|
33 | Alessandro Ferrero, Veronica Scotti |
The story of the right measurement that caused injustice and the wrong measurement that did justice; How to explain the importance of metrology to lawyers and judges [Legal Metrology]. |
IEEE Instrum. Meas. Mag. |
2015 |
DBLP DOI BibTeX RDF |
|
33 | Dongil Kim, Pilsung Kang 0001, Seung-kyung Lee, Seokho Kang 0001, Seungyong Doh, Sungzoon Cho |
Improvement of virtual metrology performance by removing metrology noises in a training dataset. |
Pattern Anal. Appl. |
2015 |
DBLP DOI BibTeX RDF |
|
33 | Thiago de Castro Martins, Marcos de Sales Guerra Tsuzuki, Rogerio Y. Takimoto, Ahmad Barari, Giulliano B. Gallo, Marcos A. A. Garcia, Hamilton Tiba |
Algorithmic iterative sampling in coordinate metrology plan for coordinate metrology using dynamic uncertainty analysis. |
INDIN |
2014 |
DBLP DOI BibTeX RDF |
|
33 | Chun Hung Cheng, Dehong Huo, Xi Zhang, Wei Dai 0005, Paul G. Maropoulos |
Large Volume Metrology Process Model: Measurability Analysis with Integration of Metrology Classification Model and Feature-Based Selection Model. |
DET |
2009 |
DBLP DOI BibTeX RDF |
|
33 | Anath Fischer, Raffaello Levi |
Special Issue on Reverse Engineering and Computational Metrology: Part 2 - Computational Metrology Strategies and Methods. |
J. Comput. Inf. Sci. Eng. |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Tung-Ho Lin, Fan-Tien Cheng, Aeo-Juo Ye, Wei-Ming Wu, Min-Hsiung Hung |
A novel key-variable sifting algorithm for virtual metrology. |
ICRA |
2008 |
DBLP DOI BibTeX RDF |
|
32 | Yu-Chuan Su, Wen-Huang Tsai, Fan-Tien Cheng, Wei-Ming Wu |
Development of a dual-stage virtual metrology architecture for TFT-LCD manufacturing. |
ICRA |
2008 |
DBLP DOI BibTeX RDF |
|
32 | P. Ravindran, Nicola J. Ferrier, S. M. Park, P. F. Nealey |
Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures. |
ICIP (4) |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Bojian Liang, Zezhi Chen, Nick E. Pears |
Uncalibrated Two-View Metrology. |
ICPR (1) |
2004 |
DBLP DOI BibTeX RDF |
|
32 | Mohammad Saadatseresht, Farhad Samadzadegan, Ali Azizi |
ANN-Based Visibility Prediction for Camera Placement in Vision Metrology. |
CRV |
2004 |
DBLP DOI BibTeX RDF |
|
32 | Guanghui Wang 0001, Yihong Wu 0002, Zhanyi Hu |
A Novel Approach for Single View Based Plane Metrology. |
ICPR (2) |
2002 |
DBLP DOI BibTeX RDF |
|
32 | Antonio Criminisi |
Single-View Metrology: Algorithms and Applications. |
DAGM-Symposium |
2002 |
DBLP DOI BibTeX RDF |
|
32 | Chauchin Su, Yue-Tsang Chen, Chung-Len Lee 0001 |
Analog Metrology and Stimulus Selection in a Noisy Environment. |
Asian Test Symposium |
1999 |
DBLP DOI BibTeX RDF |
Mixed Signal and Analog Test |
32 | Ian D. Reid 0001, Andrew Zisserman |
Goal-directed Video Metrology. |
ECCV (2) |
1996 |
DBLP DOI BibTeX RDF |
|
31 | Alan M. Lytle, Kamel S. Saidi |
NIST research in autonomous construction. |
Auton. Robots |
2007 |
DBLP DOI BibTeX RDF |
Construction visualization, Robotic crane, Indoor positioning and tracking, Parallel kinematic machine, 3D imaging, Construction automation |
31 | Andrea Bondavalli, Andrea Ceccarelli, Lorenzo Falai, Michele Vadursi |
Foundations of Measurement Theory Applied to the Evaluation of Dependability Attributes. |
DSN |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Duane S. Boning, Karthik Balakrishnan, Hong Cai, Nigel Drego, Ali Farahanchi, Karen Gettings, Daihyun Lim, Ajay Somani, Hayden Taylor, Daniel Truque, Xiaolin Xie |
Variation. |
ISQED |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Erik Novak, Der-Shen Wan, Paul Unruh, Joanna Schmit |
Dynamic MEMS Measurement Using a Strobed Interferometric System with Combined Coherence Sensing and Phase Information. |
ICMENS |
2003 |
DBLP DOI BibTeX RDF |
|
22 | José R. Villar 0001, Adolfo Otero, José Otero, Luciano Sánchez |
Taximeter verification with GPS and soft computing techniques. |
Soft Comput. |
2010 |
DBLP DOI BibTeX RDF |
Vague data, Fuzzy fitness function, Genetic algorithms, GPS, Fuzzy systems, Metrology |
22 | Jeff Klingner |
The pupillometric precision of a remote video eye tracker. |
ETRA |
2010 |
DBLP DOI BibTeX RDF |
pupillometry, eye tracking, metrology, pupil |
22 | Tong Tu, Wooi-Boon Goh |
Using CCD Moiré Pattern Analysis to Implement Pressure-Sensitive Touch Surfaces. |
CAIP |
2009 |
DBLP DOI BibTeX RDF |
Moiré patterns, Image-based metrology, Surface deformation analysis, Human computer interface, Vision-based interface |
22 | Prosenjit Bose, Pat Morin |
Testing the Quality of Manufactured Disks and Balls. |
Algorithmica |
2004 |
DBLP DOI BibTeX RDF |
Tolerancing metrology, Guaranteed quality, Testing, Sampling, Quality assurance, Roundness, Disks, Spheres, Cylinders |
22 | Sotiris Malassiotis, Michael G. Strintzis |
Stereo vision system for precision dimensional inspection of 3D holes. |
Mach. Vis. Appl. |
2003 |
DBLP DOI BibTeX RDF |
Knowledge-based vision, Stereoscopic matching, Metallic surfaces, Inspection, Metrology |
22 | John Horst, Thomas R. Kramer, Keith Stouffer, Joseph Falco, Hui-Min Huang, Frederick M. Proctor, Albert Wavering |
Distributed Testing of an Equipment-Level Interface Specification. |
Symposium on Object-Oriented Real-Time Distributed Computing |
2002 |
DBLP DOI BibTeX RDF |
coordinate measuring machine, real-time systems, object-oriented, conformance test, test suite, distributed testing, interface specifications, metrology, validation test |
22 | Derek C. Stanford, Adrian E. Raftery |
Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise. |
IEEE Trans. Pattern Anal. Mach. Intell. |
2000 |
DBLP DOI BibTeX RDF |
CEM algorithm, spatial point process, visual defect metrology, EM algorithm, smoothing, Hough transform, model-based clustering, earthquake, BIC, Bayes factor |
22 | Olivier Devillers, Franco P. Preparata |
Evaluating the cylindricity of a nominally cylindrical point set. |
SODA |
2000 |
DBLP BibTeX RDF |
cylindricity, minimum cyclinder, zone cylinder, roundness, metrology |
22 | Wen-Jean Hsueh, Erik K. Antonsson |
Automatic high-resolution optoelectronic photogrammetric 3D surface geometry acquisition system. |
Mach. Vis. Appl. |
1997 |
DBLP DOI BibTeX RDF |
Range-finding, Triangulation, Active vision, Photogrammetry, Metrology |
22 | Lawrence O'Gorman |
Subpixel Precision of Straight-Edged Shapes for Registration and Measurement. |
IEEE Trans. Pattern Anal. Mach. Intell. |
1996 |
DBLP DOI BibTeX RDF |
fiducial marks, subpixel precision, image processing, Registration, machine vision, precision, metrology |
22 | Aldo Cumani, Antonio Guiducci |
Geometric camery calibration: the virtual camera approach. |
Mach. Vis. Appl. |
1995 |
DBLP DOI BibTeX RDF |
Computer vision, Camera calibration, Metrology, Lens distortion |
22 | M. Y. Amirat, Jean Pontnau, Francis Artigue |
A three-dimensional measurement system for robot applications. |
J. Intell. Robotic Syst. |
1994 |
DBLP DOI BibTeX RDF |
Robot calibration, vision sensor, 3D dynamic metrology, noncontacting sensor, Euler angles, external position sensor |
16 | Yifan Xie, Tianhui Wang, Young-Seon Jeong 0001, Ali Tosyali, Myong K. Jeong |
True sparse PCA for reducing the number of essential sensors in virtual metrology. |
Int. J. Prod. Res. |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Philipp Euringer, Gerald Hechenblaikner, Francis Soualle, Walter Fichter |
Performance Analysis of Sequential Carrier- and Code-Tracking Receivers in the Context of High-Precision Spaceborne Metrology Systems. |
IEEE Trans. Instrum. Meas. |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Wenwen Tian, Jiong Zhang, Fei Zhao, Gedong Jiang, Xuesong Mei, Guangde Chen, Hao Wang 0048 |
A Novel Fuzzy Echo State Broad Learning System for Surface Roughness Virtual Metrology. |
IEEE Trans. Ind. Informatics |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Mark O. Neisser, Ndubuisi G. Orji, Harry J. Levinson, Umberto Celano, James R. Moyne, Supika Mashiro, Dan Wilcox, Slava Libman |
How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning. |
Computer |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Pavol Kajánek, Alojz Kopácik, Peter Kyrinovic, Ján Erdélyi, Marián Marcis, Marek Frastia |
Metrology of Short-Length Measurers - Development of a Comparator for the Calibration of Measurers Based on Image Processing and Interferometric Measurements. |
Sensors |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Clayton Forssén, Isak Silander, Johan Zakrisson, Eynas Amer, Dávid Szabó, Thomas Bock, André Kussike, Tom Rubin, Domenico Mari, Stefano Pasqualin, Zaccaria Silvestri, Djilali Bentouati, Ove Axner, Martin Zelan |
Demonstration of a Transportable Fabry-Pérot Refractometer by a Ring-Type Comparison of Dead-Weight Pressure Balances at Four European National Metrology Institutes. |
Sensors |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Andrey Tsapalov, Konstantin Kovler |
Metrology for Indoor Radon Measurements and Requirements for Different Types of Devices. |
Sensors |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Kartikay Tehlan, Michele Bissolo, Riccardo Silvioli, Johannes Oberreuter, Andreas Stier, Nassir Navab, Thomas Wendler 0001 |
Magnetisation Reconstruction for Quantum Metrology. |
Bildverarbeitung für die Medizin |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Kunal Sinha, Rajas Dalvi, M. Girish Chandra, Sourav Chatterjee |
MetQuan - A Comprehensive Toolkit for Variational Quantum Sensing and Metrology. |
COMSNETS |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Yongjiang Huang, Xixiang Liu, Qiantong Shao, Zixuan Wang |
Virtual Metrology Filter-Based Algorithms for Estimating Constant Ocean Current Velocity. |
Remote. Sens. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Janusz Kaczmarek, Massimo Ortolano, Oliver Power, Jan Kucera 0001, Luca Callegaro, Vincenzo D'Elia, Martina Marzano, Robert Walsh, Miroslaw Koziol, Ryszard Rybski |
Virtual Training Laboratory for Primary Impedance Metrology. |
IEEE Trans. Instrum. Meas. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Simone Donadello, Elio K. Bertacco, Davide Calonico, Cecilia Clivati |
Embedded Digital Phase Noise Analyzer for Optical Frequency Metrology. |
IEEE Trans. Instrum. Meas. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Atasi Chatterjee, Mattias Kruskopf, Martin Götz, Yefei Yin, Eckart Pesel, Pierre Gournay, Benjamin Rolland, Jan Kucera 0001, Stephan Bauer, Klaus Pierz, Bernhard Schumacher, Hansjörg Scherer |
Performance and Stability Assessment of Graphene-Based Quantum Hall Devices for Resistance Metrology. |
IEEE Trans. Instrum. Meas. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Muhammad Azwan Ibrahim, Faizan Qamar, Zarina Shukur, Nasharuddin Zainal, Nazri Marzuki, Maria Ulfah Siregar |
Formalizing Attack Tree on Security Object for MySANi in Legal Metrology. |
Syst. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Daniel Gauder, Johannes Gölz, Niels Jung, Gisela Lanza |
Development of an adaptive quality control loop in micro-production using machine learning, analytical gear simulation, and inline focus variation metrology for zero defect manufacturing. |
Comput. Ind. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Dong-Joon Lim, Sangjin Kim, Uijong Hwang, Sanghun Jeong, Dongwook Kim, Yeolib Kim |
Development of a virtual metrology system for smart manufacturing: A case study of spandex fiber production. |
Comput. Ind. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | David Macii |
Basics of Industrial Metrology. |
IEEE Instrum. Meas. Mag. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Akshay Agarwal, Minxu Peng, Vivek K. Goyal |
Continuous-Time Modeling and Analysis of Particle Beam Metrology. |
IEEE J. Sel. Areas Inf. Theory |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Jia-Xuan Liu, Jing Yang, Hai-Long Shi, Sixia Yu |
Optimal Local Measurements in Many-body Quantum Metrology. |
CoRR |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Jing Yang |
Theory of Compression Channels for Post-selected Metrology. |
CoRR |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray 0002, Sandip Halder |
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. |
CoRR |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Angzhi Fan, Yu Huang 0017, Fei Xu, Sthitie Bom |
Soft Sensing Regression Model: from Sensor to Wafer Metrology Forecasting. |
CoRR |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Donatien Koulla Moulla, Ernest Mnkandla, Alain Abran |
Evaluation of IoT Measurement Solutions from a Metrology Perspective. |
Comput. Syst. Sci. Eng. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Mankei Tsang |
Operational meanings of a generalized conditional expectation in quantum metrology. |
Quantum |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Masahito Hayashi, Yingkai Ouyang |
Tight Cramér-Rao type bounds for multiparameter quantum metrology through conic programming. |
Quantum |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Anna A. Dedkova, Igor V. Florinsky |
Geomorphometry and microelectronic metrology: Converged realms. |
Trans. GIS |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Naoki Takegawa, Noriyuki Furuichi |
Traceability Management System Using Blockchain Technology and Cost Estimation in the Metrology Field. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Angzhi Fan, Yu Huang 0017, Fei Xu, Sthitie Bom |
Soft-Sensing Regression Model: From Sensor to Wafer Metrology Forecasting. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Michael Fahrbach, Min Xu, Wilson Ombati Nyang'au, Oleg Domanov, Christian H. Schwalb, Zhi Li, Christian Kuhlmann 0003, Uwe Brand, Erwin Peiner |
Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Patrick Frank |
LiG Metrology, Correlated Error, and the Integrity of the Global Surface Air-Temperature Record. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Jie Wang 0042, Richard Chang 0002, Ziyuan Zhao, Ramanpreet Singh Pahwa |
Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Carl Johan G. Nielsen, André Preumont |
Adaptive Petal Reflector: In-Lab Software Configurable Optical Testing System Metrology and Modal Wavefront Reconstruction. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Yonggang Yan, Zhengxing Wu, Jianjun Cui, Kai Chen, Yanhong Tang, Ning Yang |
Calibration Model Optimization for Strain Metrology of Equal Strength Beams Using Deflection Measurements. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Damir Malnar, Miroslav Vrankic |
Optimising Time-Frequency Distributions: A Surface Metrology Approach. |
Sensors |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Chen-Fu Chien 0001, Tran Hong Van Nguyen, Yi-Chiu Li, Ying-Jen Chen |
Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study. |
Comput. Ind. Eng. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Chia-Yu Hsu, Yi-Wei Lu |
Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention. |
Comput. Ind. Eng. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Richard Chang 0002, Wang Jie, Namrata Thakur, Ramanpreet Singh Pahwa |
AI-based 3D Metrology and Defect Detection of HBMs in XRM Scans. |
World Sci. Annu. Rev. Artif. Intell. |
2023 |
DBLP DOI BibTeX RDF |
|
16 | |
2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2023, Brescia, Italy, June 6-8, 2023 |
MetroInd4.0&IoT |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Marko Esche, Levin Ho, Martin Nischwitz, Reinhard Meyer |
Risk-Based Continuous Quality Control for Software in Legal Metrology. |
FedCSIS |
2023 |
DBLP DOI BibTeX RDF |
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