Search results for "opens"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
88	Antonio Zenteno, Víctor H. Champac	Resistive Opens in a Class of CMOS Latches: Analysis and DFT.	VTS	2001	DBLP DOI BibTeX RDF
74	Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac	A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Interconnection opens, Boolean testing, Favorable logic conditions, Test generation methodology, Coupling capacitances
74	Antonio Zenteno, Víctor H. Champac, Joan Figueras	Detectability Conditions of Full Opens in the Interconnections.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	logic testing, IDDQ testing, opens, defect modeling
60	Sreejit Chakravarty	On the capability of delay tests to detect bridges and opens.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	defective IC, faulty dynamic logic behavior, transition tests, simulation, integrated circuit testing, delay tests, bridges, opens, at-speed testing, path delay tests
60	Haluk Konuk	Fault simulation of interconnect opens in digital CMOS circuits.	ICCAD	1997	DBLP DOI BibTeX RDF	fault simulation, opens, breaks
59	Sudhakar M. Reddy, Irith Pomeranz, Chen Liu	On tests to detect via opens in digital CMOS circuits.	DAC	2008	DBLP DOI BibTeX RDF	constrained stuck-at tests, test generation, DFT, open defects
46	Arun Krishnamachary, Jacob A. Abraham	Test generation for resistive opens in CMOS.	ACM Great Lakes Symposium on VLSI	2002	DBLP DOI BibTeX RDF	resistive opens, delay testing, defect detection
46	Víctor H. Champac, José Castillejos, Joan Figueras	IDDQ Testing of Opens in CMOS SRAMs.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	data retention faults, memory testing, opens, IDDQ
46	Haluk Konuk, F. Joel Ferguson	An unexpected factor in testing for CMOS opens: the die surface.	VTS	1996	DBLP DOI BibTeX RDF	surface phenomena, electric charge, CMOS opens, die surface, RC interconnect, HSPICE simulations, trapped charge, floating gates, VLSI, integrated circuit testing, CMOS integrated circuits, integrated circuit modelling, circuit model
45	Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey	Testing for resistive opens and stuck opens.	ITC	2001	DBLP DOI BibTeX RDF
43	Víctor H. Champac, Antonio Zenteno	Detectability Conditions for Interconnection Open Defect.	VTS	2000	DBLP DOI BibTeX RDF
37	Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng	Automatic Test Pattern Generation for Interconnect Open Defects.	VTS	2008	DBLP DOI BibTeX RDF	Interconnect opens, Open-via defects, ATPG
37	Walter W. Weber, Adit D. Singh	An experimental evaluation of the differential BICS for IDDQ testing.	VTS	1995	DBLP DOI BibTeX RDF	differential BICS, CMOS test chips, inter-layer shorts, intra-layer shorts, fault diagnosis, integrated circuit testing, fault coverage, CMOS integrated circuits, opens, built-in current sensor, IC testing, I/sub DDQ/ testing, electric current measurement, electric sensing devices
37	Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor	Opens and Delay Faults in CMOS RAM Address Decoders.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	address decoder delay faults, addressing methods, BIST, DFT, Memory testing, open defects
37	Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac	Test of Interconnection Opens Considering Coupling Signals.	DFT	2005	DBLP DOI BibTeX RDF
37	Chien-Mo James Li, Edward J. McCluskey	Diagnosis of Tunneling Opens.	VTS	2001	DBLP DOI BibTeX RDF
37	Haluk Konuk, F. Joel Ferguson	Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1998	DBLP DOI BibTeX RDF
36	Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura	Current Testable Design of Resistor String DACs.	DELTA	2006	DBLP DOI BibTeX RDF
30	Matthias Klaus, Ad J. van de Goor	Tests for Resistive and Capacitive Defects in Address Decoders.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF	address decoders, test conditions, Defects, opens, dynamic faults, capacitive coupling
30	Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi	Low-cost DC built-in self-test of linear analog circuits using checksums.	VLSI Design	1996	DBLP DOI BibTeX RDF	DC built-in self-test, catastrophic failures, line opens, DC transfer function, on-chip fault detection, BIST circuitry, fault diagnosis, built-in self test, integrated circuit testing, transfer functions, analogue integrated circuits, checksums, linear analog circuits, matrix representations, fault classes
30	Philipp V. Panitz, Markus Olbrich, Erich Barke, Markus Bühler, Jürgen Koehl	Considering possible opens in non-tree topology wire delay calculation.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	non-tree topologies, yield, static timing analysis, delay analysis
30	Antonio Zenteno Ramírez, Guillermo Espinosa, Víctor H. Champac	Design-for-Test Techniques for Opens in Undetected Branches in CMOS Latches and Flip-Flops.	IEEE Trans. Very Large Scale Integr. Syst.	2007	DBLP DOI BibTeX RDF
30	Sreejit Chakravarty, Ankur Jain	Fault Models for Speed Failures Caused by Bridges and Opens.	VTS	2002	DBLP DOI BibTeX RDF
30	Witold A. Pleskacz, Charles H. Ouyang, Wojciech Maly	A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1999	DBLP DOI BibTeX RDF
29	Dirk K. de Vries, Paul L. C. Simon	Calibration of Open Interconnect Yield Models.	DFT	2003	DBLP DOI BibTeX RDF
23	Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001	A Simulator of Small-Delay Faults Caused by Resistive-Open Defects.	ETS	2008	DBLP DOI BibTeX RDF	Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation
23	Ugur Çilingiroglu	Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	in-circuit testing, opens testing, Hall sensors
23	Ali Chehab, Saurabh Patel, Rafic Z. Makki	Scaling of iDDT Test Methods for Random Logic Circuits.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	dynamic power supply current, design for current testability, resistive opens, resistive bridges, very deep sub-micron technologies, VDSM, fault simulation
23	Baosheng Wang, Yuejian Wu, Josh Yang, André Ivanov, Yervant Zorian	SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms.	VTS	2005	DBLP DOI BibTeX RDF	Data Retention Faults, Zero-time DRF Testing, Opens, Embedded SRAMs
23	Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle	Transient power supply current monitoring - A new test method for CMOS VLSI circuits.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	Design for current-testability, drain/source opens, floating gates, shorts, transient power supply current
23	Jaume A. Segura 0001, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio	Quiescent current analysis and experimentation of defective CMOS circuits.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts
23	Dong Xu	ChatGPT opens a new door for bioinformatics.	Quant. Biol.	2023	DBLP DOI BibTeX RDF
23	Yuepeng Wu, Hongxiang Guo, Bowen Zhang, Ran Tao, Yi Guo, Tian Zhang, Jifang Qiu, Jian Wu	Calculating with Phase Opens up the High-Precision and High-Reconfigurability Integrated Photonic Computing.	OFC	2023	DBLP DOI BibTeX RDF
23	José Antonio Barbero-Aparicio, Santiago Cuesta-López, César Ignacio García-Osorio, Javier Pérez-Rodríguez, Nicolás García-Pedrajas	Nonlinear physics opens a new paradigm for accurate transcription start site prediction.	BMC Bioinform.	2022	DBLP DOI BibTeX RDF
23	Vinicius Gonçalves Maltarollo, Ekaterina Shevchenko, Igor Daniel de Miranda Lima, Elio A. Cino, Glaucio Monteiro Ferreira, Antti Poso, Thales Kronenberger	Do Go Chasing Waterfalls: Enoyl Reductase (FabI) in Complex with Inhibitors Stabilizes the Tetrameric Structure and Opens Water Channels.	J. Chem. Inf. Model.	2022	DBLP DOI BibTeX RDF
23	Ildikó Vancsa	The Four Opens: Open Source Beyond the Code.	Computer	2022	DBLP DOI BibTeX RDF
23	Arled Papa, Jörg von Mankowski, Hansini Vijayaraghavan, Babak Mafakheri, Leonardo Goratti, Wolfgang Kellerer	6G opens up a New Era for Aeronautical Communication and Services.	CoRR	2022	DBLP DOI BibTeX RDF
23	Fariha Tasmin Jaigirdar, Carsten Rudolph, Rayhan Rashed, Md. Nahiyan Uddin, Chris Bain, A. B. M. Alim Al Islam	NOTE: Unavoidable Service to Unnoticeable Risks: A Study on How Healthcare Record Management Opens the Doors of Unnoticeable Vulnerabilities for Rohingya Refugees.	COMPASS	2022	DBLP DOI BibTeX RDF
23	Leon Biscornet, Christophe Révillion, Sylvaine Jégo, Erwan Lagadec, Yann Gomard, Gildas Le Minter, Gérard Rocamora, Vanina Guernier-Cambert, Julien Mélade, Koussay Dellagi, Pablo Tortosa, Vincent Herbreteau	Predicting the Presence of Leptospires in Rodents from Environmental Indicators Opens Up Opportunities for Environmental Monitoring of Human Leptospirosis.	Remote. Sens.	2021	DBLP DOI BibTeX RDF
23	Effrosyni Doutsi, Marc Antonini, Panagiotis Tsakalides	Neuronal Communication Process Opens New Directions in Image and Video Compression Systems.	ERCIM News	2021	DBLP BibTeX RDF
23	Barry Hoberman, Jean-Pierre Nozieres	SOT-MRAM - Third generation MRAM memory opens new opportunities : Hot Chips Conference August 2021.	HCS	2021	DBLP DOI BibTeX RDF
23	Hanne Scheers, Tinne De Laet	Interactive and Explainable Advising Dashboard Opens the Black Box of Student Success Prediction.	EC-TEL	2021	DBLP DOI BibTeX RDF
23	Niranjan Kumar Ray, Kamalakanta Mahapatra	New IEEE Consumer Technology Society Chapter Opens in Odisha, India.	IEEE Consumer Electron. Mag.	2020	DBLP DOI BibTeX RDF
23	Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee	SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts.	ITC	2020	DBLP DOI BibTeX RDF
23	Mark Fosberry, Ben McMahon	Matlab JTAG AXI Master opens new dimensions for development and testability.	NATW	2019	DBLP DOI BibTeX RDF
23	Jeffrey Stuecheli, William J. Starke, John D. Irish, L. Baba Arimilli, Daniel M. Dreps, Bart Blaner, Curt Wollbrink, Brian Allison	IBM POWER9 opens up a new era of acceleration enablement: OpenCAPI.	IBM J. Res. Dev.	2018	DBLP DOI BibTeX RDF
23	Sibendu Som, Yuanjiang Pei	HPC Opens a New Frontier in Fuel-Engine Research.	Comput. Sci. Eng.	2018	DBLP DOI BibTeX RDF
23	Ahmed Shihab Albahri, A. A. Zaidan 0001, Osamah Shihab Albahri, B. B. Zaidan, M. A. Alsalem 0001	Real-Time Fault-Tolerant mHealth System: Comprehensive Review of Healthcare Services, Opens Issues, Challenges and Methodological Aspects.	J. Medical Syst.	2018	DBLP DOI BibTeX RDF
23	John Edwards 0001	Signal Processing Opens the Internet of Things to a New World of Possibilities: Research Leads to New Internet of Things Technologies and Applications [Special Reports].	IEEE Signal Process. Mag.	2018	DBLP DOI BibTeX RDF
23	Tan Li, Hosung Lee, GeunYong Bak, Sanghyeon Baeg	Failure signature analysis of power-opens in DDR3 SDRAMs.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
23	Niyati Chhaya, Kokil Jaidka, Rahul Wadbude	Predicting Email Opens with Domain-Sensitive Affect Detection.	CICLing (2)	2018	DBLP DOI BibTeX RDF
23	Konstantin Thierbach, Pierre-Louis Bazin, Walter de Back, Filippos Gavriilidis, Evgeniya Kirilina, Carsten Jäger, Markus Morawski, Stefan Geyer, Nikolaus Weiskopf, Nico Scherf	Combining Deep Learning and Active Contours Opens The Way to Robust, Automated Analysis of Brain Cytoarchitectonics.	MLMI@MICCAI	2018	DBLP DOI BibTeX RDF
23	Harvey Glickenstein	Rio Opens Tram Line for Olympics [Transportation Systems].	IEEE Veh. Technol. Mag.	2016	DBLP DOI BibTeX RDF
23	Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee	Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits.	ATS	2016	DBLP DOI BibTeX RDF
23	Andrea Cavallo, Ovidiu V. Lungu, Cristina Becchio, Caterina Ansuini, Aldo Rustichini, Luciano Fadiga	When gaze opens the channel for communication: Integrative role of IFG and MPFC.	NeuroImage	2015	DBLP DOI BibTeX RDF
23	Arif Raza, Luiz Fernando Capretz	Addressing User Requirements in Opens Source Software: The Role of Online Forums.	CoRR	2015	DBLP BibTeX RDF
23	Sampsa Hyysalo, Mikael Johnson	The user as relational entity: Options that deeper insight into user representations opens for human-centered design.	Inf. Technol. People	2015	DBLP DOI BibTeX RDF
23	John Edwards 0001	Signal Processing Opens New Views on Imaging [Special Reports].	IEEE Signal Process. Mag.	2015	DBLP DOI BibTeX RDF
23	Adit D. Singh	Scan based two-pattern tests: should they target opens instead of TDFs?	LATS	2015	DBLP DOI BibTeX RDF
23	Chao Han, Adit D. Singh	Testing cross wire opens within complex gates.	VTS	2015	DBLP DOI BibTeX RDF
23	Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus	A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays.	Microprocess. Microsystems	2014	DBLP DOI BibTeX RDF
23	Richard Van Noorden	Elsevier opens its papers to text-mining.	Nat.	2014	DBLP DOI BibTeX RDF
23	Raju Balakrishnan, Rajesh Parekh	Learning to predict subject-line opens for large-scale email marketing.	IEEE BigData	2014	DBLP DOI BibTeX RDF
23	Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac	Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies.	LATW	2014	DBLP DOI BibTeX RDF
23	Francesco Ciraulo	Regular opens in constructive topology and a representation theorem for overlap algebras.	Ann. Pure Appl. Log.	2013	DBLP DOI BibTeX RDF
23	Jan Gaudestad, Vladimir Talanov, M. Marchetti	Opens localization on silicon level in a Chip Scale Package using space domain reflectometry.	Microelectron. Reliab.	2013	DBLP DOI BibTeX RDF
23	David A. Cartes, Joe H. Chow, Dan McCaugherty, Steven E. Widergren, Ganesh Kumar Venayagamoorthy	The IEEE Computer Society Smart Grid Vision Project opens opportunites for computational intelligence.	EAIS	2013	DBLP DOI BibTeX RDF
23	Jan Gaudestad, Vladimir Talanov, Po Chih Huang	Space Domain Reflectometry for opens detection location in microbumps.	Microelectron. Reliab.	2012	DBLP DOI BibTeX RDF
23	Kim Sneppen, Ian B. Dodd	A Simple Histone Code Opens Many Paths to Epigenetics.	PLoS Comput. Biol.	2012	DBLP DOI BibTeX RDF
23	Jesús Moreno, Víctor H. Champac, Michel Renovell	Low voltage testing for interconnect opens under process variations.	LATW	2012	DBLP DOI BibTeX RDF
23	Robert Bogue	Imaging technology opens up new robotic applications.	Ind. Robot	2011	DBLP DOI BibTeX RDF
23	Evanthia Papadopoulou	Net-Aware Critical Area Extraction for Opens in VLSI Circuits Via Higher-Order Voronoi Diagrams.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2011	DBLP DOI BibTeX RDF
23	Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková	Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies.	DDECS	2011	DBLP DOI BibTeX RDF
23	Athanasios Fevgas, Panagiota E. Tsompanopoulou, Panayiotis Bozanis	iMuse Mobile Tour: A personalized multimedia museum guide opens to groups.	ISCC	2011	DBLP DOI BibTeX RDF
23	Seongmoon Wang	An efficient method to screen resistive opens under presence of process variation.	VTS	2011	DBLP DOI BibTeX RDF
23	Rajeev D. S. Raizada, Nikolaus Kriegeskorte	Pattern-information fMRI: New questions which it opens up and challenges which face it.	Int. J. Imaging Syst. Technol.	2010	DBLP DOI BibTeX RDF
23	Jose Luis Garcia-Gervacio, Víctor H. Champac	Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs.	ETS	2010	DBLP DOI BibTeX RDF
23	Josep Rius 0001	A method for detecting resistive opens in buses.	IOLTS	2010	DBLP DOI BibTeX RDF
23	Gary G. Yen	When one door closes, another door opens... [Editor's Remarks].	IEEE Comput. Intell. Mag.	2009	DBLP DOI BibTeX RDF
23	Johannes Karlsson, Adi Anani, Haibo Li 0001	Enabling Real-Time Video Services over Ad-Hoc Networks Opens the Gates for E-learning in Areas Lacking Infrastructure.	Int. J. Interact. Mob. Technol.	2009	DBLP DOI BibTeX RDF
23	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras	Delay caused by resistive opens in interconnecting lines.	Integr.	2009	DBLP DOI BibTeX RDF
23	Stéphane Grumbach	Sino-French IT Lab in Beijing Opens to European Institutions.	ERCIM News	2009	DBLP BibTeX RDF
23	Michele Favalli, Cecilia Metra	Testing Resistive Opens and Bridging Faults Through Pulse Propagation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2009	DBLP DOI BibTeX RDF
23	Michael J. Marcus	Wireless innovation and spectrum policy: FCC opens a new inquiry [Spectrum Policy and Regulatory Issues].	IEEE Wirel. Commun.	2009	DBLP DOI BibTeX RDF
23	Michael J. Marcus	Wireless innovation and spectrum policy: the fcc opens a new inquiry.	IEEE Wirel. Commun.	2009	DBLP DOI BibTeX RDF
23	Jose Luis Garcia-Gervacio, Víctor H. Champac	Detectability analysis of small delays due to resistive opens considering process variations.	IOLTS	2009	DBLP DOI BibTeX RDF
23	Pablo Maqueda, Josep Rius 0001	Analysis of the extra delay on interconnects caused by resistive opens and shorts.	IOLTS	2009	DBLP DOI BibTeX RDF
23	Chwee Liong Tee, Tzyy Haw Tan, Chin Chuan Ng	Augmenting board test coverage with new intel powered opens boundary scan instruction.	ITC	2009	DBLP DOI BibTeX RDF
23	G. Anyfandi, Vasileios Laopodis, Vasilis Koulaidis, Nicolas Apostolopoulos, V. De Semir, D. Markovitsi, X. Tsilibaris	Laboratory Door Opens to Non-formal Learning Communities. Science Centres as Mediators.	Knowledge Construction in E-learning Context	2008	DBLP BibTeX RDF
23	Xijiang Lin, Janusz Rajski	Test Generation for Interconnect Opens.	ITC	2008	DBLP DOI BibTeX RDF
23	Jose M. M. Ferreira, Ana C. Leão	Remote Access to Expensive SDRAM Test Equipment: Qimonda Opens the Shop-floor to Test Course Students.	Int. J. Online Eng.	2007	DBLP BibTeX RDF
23	Harvey Glickenstein	First portion of the Chicago's Circle Line opens [Transportation Systems].	IEEE Veh. Technol. Mag.	2006	DBLP DOI BibTeX RDF
23	Gang Chen 0011, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker 0001	A unified fault model and test generation procedure for interconnect opens and bridges.	ETS	2005	DBLP DOI BibTeX RDF
23	Víctor H. Champac, Antonio Zenteno, José L. Garcia	Testing of resistive opens in CMOS latches and flip-flops.	ETS	2005	DBLP DOI BibTeX RDF
23	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras	Defective behaviours of resistive opens in interconnect lines.	ETS	2005	DBLP DOI BibTeX RDF
23	Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars	Tests for address decoder delay faults in RAMs due to inter-gate opens.	ETS	2004	DBLP DOI BibTeX RDF
23	Shalini Ghosh, F. Joel Ferguson	Estimating detection probability of interconnect opens using stuck-at tests.	ACM Great Lakes Symposium on VLSI	2004	DBLP DOI BibTeX RDF	break fault, interconnect open, stuck-at test
23	Zhuo Li 0001, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. H. Walker	A Circuit Level Fault Model for Resistive Opens and Bridges.	VTS	2003	DBLP DOI BibTeX RDF
23	Bob Forbes	The 5th Factor: Behavior Profiling Opens New Possibilities for Web Access Control.	Inf. Secur. J. A Glob. Perspect.	2002	DBLP DOI BibTeX RDF
23	Sue A. Olson	Emboss opens up sequence analysis.	Briefings Bioinform.	2002	DBLP DOI BibTeX RDF