Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
134 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST. |
J. Electron. Test. |
2002 |
DBLP DOI BibTeX RDF |
test-per-clock schemes, accumulator-based test pattern generators, built-in self-test, linear feedback shift registers, reseeding |
125 | C. V. Krishna, Abhijit Jas, Nur A. Touba |
Achieving high encoding efficiency with partial dynamic LFSR reseeding. |
ACM Trans. Design Autom. Electr. Syst. |
2004 |
DBLP DOI BibTeX RDF |
linear finite shift register, compression, Built-in self-test, reseeding |
117 | Jinkyu Lee 0005, Nur A. Touba |
LFSR-Reseeding Scheme Achieving Low-Power Dissipation During Test. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2007 |
DBLP DOI BibTeX RDF |
|
117 | Ahmad A. Al-Yamani, Edward J. McCluskey |
Built-In Reseeding for Serial Bist. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
|
110 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos |
A highly regular multi-phase reseeding technique for scan-based BIST. |
ACM Great Lakes Symposium on VLSI |
2003 |
DBLP DOI BibTeX RDF |
scan-based schemes, built-in self-test, linear feedback shift registers, reseeding |
102 | Jinkyu Lee 0005, Nur A. Touba |
Low Power Test Data Compression Based on LFSR Reseeding. |
ICCD |
2004 |
DBLP DOI BibTeX RDF |
|
102 | Erik H. Volkerink, Subhasish Mitra |
Efficient Seed Utilization for Reseeding based Compression. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
|
86 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos |
Multiphase BIST: a new reseeding technique for high test-data compression. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2004 |
DBLP DOI BibTeX RDF |
|
71 | Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek |
Deviation-Based LFSR Reseeding for Test-Data Compression. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2009 |
DBLP DOI BibTeX RDF |
|
71 | Chung-Yi Li, Jiung-Sheng Chen, Tsin-Yuan Chang |
A chaos-based pseudo random number generator using timing-based reseeding method. |
ISCAS |
2006 |
DBLP DOI BibTeX RDF |
|
71 | Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota |
Combining dictionary coding and LFSR reseeding for test data compression. |
DAC |
2004 |
DBLP DOI BibTeX RDF |
built-In self test, VLSI test |
71 | C. V. Krishna, Nur A. Touba |
Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
71 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
A New Reseeding Technique for LFSR-Based Test Pattern Generation. |
IOLTW |
2001 |
DBLP DOI BibTeX RDF |
|
63 | Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei |
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. |
IEEE Trans. Computers |
2008 |
DBLP DOI BibTeX RDF |
output compaction, temporal compactor, blocking unknown values, LFSR reseeding, Built-in Self-Test, BIST, test data compression, MISR, response compaction |
55 | Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek |
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
55 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos |
A ROMless LFSR Reseeding Scheme for Scan-based BIST. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
|
55 | Ahmad A. Al-Yamani, Edward J. McCluskey |
Seed encoding with LFSRs and cellular automata. |
DAC |
2003 |
DBLP DOI BibTeX RDF |
built-in self test, VLSI Test, reseeding |
48 | Marie-Lise Flottes, Christian Landrault, A. Petitqueux |
Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
sequential testability, internal state reseeding, observation points, minimum DFT insertion, non-scan approach, fault efficiency, 100 percent, fault diagnosis, logic testing, controllability, controllability, design for testability, logic design, sequential circuits, automatic test pattern generation, ATPG, observability, fault coverage, flip-flops, at-speed testing, benchmark circuits, CPU time, partial reset |
48 | Gerhard Fischer, Raymond McCall, Jonathan L. Ostwald, Brent Reeves, Frank M. Shipman III |
Seeding, evolutionary growth and reseeding: supporting the incremental development of design environments. |
CHI |
1994 |
DBLP DOI BibTeX RDF |
domain-orientation, end-user modifiability, evolution of information spaces, annotation, collaborative design, tacit knowledge, design environments, situated cognition, seeds, reseeding, incremental formalization |
47 | Ahmad A. Al-Yamani, Edward J. McCluskey |
BIST-Guided ATPG. |
ISQED |
2005 |
DBLP DOI BibTeX RDF |
|
40 | Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang |
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
|
40 | Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar |
Hybrid BIST Optimization Using Reseeding and Test Set Compaction. |
DSD |
2007 |
DBLP DOI BibTeX RDF |
|
40 | Snehal Udar, Dimitri Kagaris |
LFSR Reseeding with Irreducible Polynomials. |
IOLTS |
2007 |
DBLP DOI BibTeX RDF |
|
40 | Bin Zhou, Yizheng Ye, Yongsheng Wang |
Simultaneous reduction in test data volume and test time for TRC-reseeding. |
ACM Great Lakes Symposium on VLSI |
2007 |
DBLP DOI BibTeX RDF |
encoded vector, twisted-ring counter, built-in self test |
40 | Hong-Sik Kim, Sungho Kang 0001 |
Increasing encoding efficiency of LFSR reseeding-based test compression. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2006 |
DBLP DOI BibTeX RDF |
|
40 | Stelios Neophytou, Maria K. Michael, Spyros Tragoudas |
Efficient Deterministic Test Generation for BIST Schemes with LFSR Reseeding. |
IOLTS |
2006 |
DBLP DOI BibTeX RDF |
|
40 | Yu-Hsuan Fu, Sying-Jyan Wang |
Test Data Compression with Partial LFSR-Reseeding. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
|
40 | Jiann-Chyi Rau, Ying-Fu Ho, Po-Han Wu |
A novel reseeding mechanism for pseudo-random testing of VLSI circuits. |
ISCAS (3) |
2005 |
DBLP DOI BibTeX RDF |
|
40 | Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos |
Reseeding-Based Test Set Embedding with Reduced Test Sequences. |
ISQED |
2005 |
DBLP DOI BibTeX RDF |
|
40 | Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey |
Bist Reseeding with very few Seeds. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
|
40 | Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
40 | Nahmsuk Oh, Rohit Kapur, Thomas W. Williams |
Fast seed computation for reseeding shift register in test pattern compression. |
ICCAD |
2002 |
DBLP DOI BibTeX RDF |
|
40 | Sybille Hellebrand, Huaguo Liang, Hans-Joachim Wunderlich |
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. |
J. Electron. Test. |
2001 |
DBLP DOI BibTeX RDF |
store and generate schemes, BIST, deterministic BIST |
39 | Shivakumar Swaminathan, Krishnendu Chakrabarty |
On Using Twisted-Ring Counters for Test Set Embedding in BIST. |
J. Electron. Test. |
2001 |
DBLP DOI BibTeX RDF |
non-intrusive testing, scalable BIST, test-per-clock, reseeding, deterministic BIST |
39 | Albrecht P. Stroele, Frank Mayer |
Methods to reduce test application time for accumulator-based self-test. |
VTS |
1997 |
DBLP DOI BibTeX RDF |
accumulator-based self-test, test length minimization, simulation-based reseeding method, random pattern testable circuits, reverse order simulation, hard fault detection, optimal input value, test length reductions, data path blocks, BIST scheme, ATALANTA fault simulation, combinatorial circuit testing, built-in self test, fault coverage, embedded processor, test pattern generators, circuit optimization, test application time reduction, forward simulation |
31 | Hong-Sik Kim, Sungho Kang 0001, Michael S. Hsiao |
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. |
J. Electron. Test. |
2008 |
DBLP DOI BibTeX RDF |
Keyword System on a chip, Test compression, Low power testing, Scan testing |
31 | Richard Putman |
Using reiterative LFSR based X-masking to increase output compression in presence of unknowns. |
ACM Great Lakes Symposium on VLSI |
2008 |
DBLP DOI BibTeX RDF |
reiterative, x-masking, compression, LFSR |
31 | Salvador Manich, Lucas Garcia-Deiros, Joan Figueras |
Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Kedarnath J. Balakrishnan |
Efficient Scan-Based BIST Using Multiple LFSRs and Dictionary Coding. |
VLSI Design |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Salvador Manich, L. GarcÃa, Luz Balado, Emili Lupon, Josep Rius 0001, Rosa RodrÃguez-Montañés, Joan Figueras |
BIST Technique by Equally Spaced Test Vector Sequences. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
31 | Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard 0001, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira 0001, Marcelino B. Santos |
Low Power BIST by Filtering Non-Detecting Vectors. |
J. Electron. Test. |
2000 |
DBLP DOI BibTeX RDF |
low power BIST, low energy consumption, LFSR, gated clock |
24 | Chen Wang, Weikang Qian |
Linear Feedback Shift Register Reseeding for Stochastic Circuit Repairing and Minimization. |
ASP-DAC |
2022 |
DBLP DOI BibTeX RDF |
|
24 | Ian von Hegner |
A trampoline effect occurring in the stages of planetary reseeding. |
Biosyst. |
2021 |
DBLP DOI BibTeX RDF |
|
24 | Xiaorong Lv, Xiao Wang, Zhiwei Tian, Lihua Zhang |
Design of Automatic Reseeding System of Air suction Precision Metering Seeding Device for corn. |
Mechatron. Syst. Control. |
2020 |
DBLP DOI BibTeX RDF |
|
24 | Xiaodan Wu, Haibo Li, Xiaohui Xu, Huafeng Wei |
CT lesion recognition algorithm based on improved particle reseeding method. |
Pattern Recognit. Lett. |
2019 |
DBLP DOI BibTeX RDF |
|
24 | Jen-Cheng Ying, Wang-Dauh Tseng, Wen-Jiin Tsai |
Asymmetry dual-LFSR reseeding for low power BIST. |
Integr. |
2018 |
DBLP DOI BibTeX RDF |
|
24 | Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang |
LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs. |
J. Electron. Test. |
2018 |
DBLP DOI BibTeX RDF |
|
24 | Justin Sunu, Blake Hunter, Allon G. Percus |
Unsupervised vehicle recognition using incremental reseeding of acoustic signatures. |
CoRR |
2018 |
DBLP BibTeX RDF |
|
24 | Justin Sunu, Allon G. Percus, Blake Hunter |
Unsupervised Vehicle Recognition Using Incremental Reseeding of Acoustic Signatures. |
ISMIS |
2018 |
DBLP DOI BibTeX RDF |
|
24 | Jen-Cheng Ying, Wang-Dauh Tseng, Wen-Jiin Tsai |
Bipolar Dual-LFSR Reseeding for Low-Power Testing. |
DSC |
2018 |
DBLP DOI BibTeX RDF |
|
24 | Dong Xiang, Xiaoqing Wen, Laung-Terng Wang |
Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding. |
IEEE Trans. Very Large Scale Integr. Syst. |
2017 |
DBLP DOI BibTeX RDF |
|
24 | Elaheh Sadredini, Mohammadreza Najafi, Mahmood Fathy, Zainalabedin Navabi |
BILBO-friendly Hybrid BIST Architecture with Asymmetric Polynomial Reseeding. |
CoRR |
2017 |
DBLP BibTeX RDF |
|
24 | Tian Chen, Dandan Shen, Xin Yi, Huaguo Liang, Xiaoqing Wen, Wei Wang 0310 |
Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures. |
IEICE Trans. Inf. Syst. |
2016 |
DBLP DOI BibTeX RDF |
|
24 | Shuai Chen, Bing Li |
A Dynamic Reseeding DRBG Based on SRAM PUFs. |
CyberC |
2016 |
DBLP DOI BibTeX RDF |
|
24 | Ki-Hong Kim, Min-cheol Gwak, Jack J. Yoh |
An Enhanced Particle Reseeding Algorithm for the Hybrid Particle Level Set Method in Compressible Flows. |
J. Sci. Comput. |
2015 |
DBLP DOI BibTeX RDF |
|
24 | Ondrej Novák, Jiri JenÃcek, Martin Rozkovec |
LFSR Reseeding Based Test Compression Respecting Different Controllability of Decompressor Outputs. |
DDECS |
2015 |
DBLP DOI BibTeX RDF |
|
24 | Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty |
Efficient LFSR Reseeding Based on Internal-Response Feedback. |
J. Electron. Test. |
2014 |
DBLP DOI BibTeX RDF |
|
24 | Xavier Bresson, Huiyi Hu, Thomas Laurent 0001, Arthur Szlam, James H. von Brecht |
An Incremental Reseeding Strategy for Clustering. |
CoRR |
2014 |
DBLP BibTeX RDF |
|
24 | Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty |
A New LFSR Reseeding Scheme via Internal Response Feedback. |
Asian Test Symposium |
2013 |
DBLP DOI BibTeX RDF |
|
24 | Peter Wohl, John A. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, Jonathon E. Colburn |
Two-level compression through selective reseeding. |
ITC |
2013 |
DBLP DOI BibTeX RDF |
|
24 | Chung-Yi Li, Yuan-Ho Chen, Tsin-Yuan Chang, Lih-Yuan Deng, Kiwing To |
Period Extension and Randomness Enhancement Using High-Throughput Reseeding-Mixing PRNG. |
IEEE Trans. Very Large Scale Integr. Syst. |
2012 |
DBLP DOI BibTeX RDF |
|
24 | Lung-Jen Lee, Wang-Dauh Tseng, Wen-Ting Yang |
Dual-LFSR Reseeding for Low Power Testing. |
MTV |
2012 |
DBLP DOI BibTeX RDF |
|
24 | Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh |
A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume. |
Asian Test Symposium |
2012 |
DBLP DOI BibTeX RDF |
|
24 | Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram |
A Novel SMT-Based Technique for LFSR Reseeding. |
VLSI Design |
2012 |
DBLP DOI BibTeX RDF |
|
24 | Xrysovalantis Kavousianos, Vasileios Tenentes, Krishnendu Chakrabarty, Emmanouil Kalligeros |
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. |
IEEE Trans. Very Large Scale Integr. Syst. |
2011 |
DBLP DOI BibTeX RDF |
|
24 | Wenfa Zhan, Jun Ma, Shanshan Du, Jun Liu |
A LFSR Reseeding Scheme Based on Division by 2 to the Power of Integer. |
J. Digit. Content Technol. its Appl. |
2010 |
DBLP BibTeX RDF |
|
24 | Piyanart Kongtim, Taweesak Reungpeerakul |
Parallel LFSR Reseeding with Selection Register for Mixed-Mode BIST. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
24 | Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang |
Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2009 |
DBLP DOI BibTeX RDF |
|
24 | Mahmut Yilmaz, Krishnendu Chakrabarty |
Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects. |
DATE |
2009 |
DBLP DOI BibTeX RDF |
|
24 | Hongxia Fang, Krishnendu Chakrabarty, Rubin A. Parekhji |
Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
24 | Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar |
Hybrid BIST optimization using reseeding and test set compaction. |
Microprocess. Microsystems |
2008 |
DBLP DOI BibTeX RDF |
|
24 | Tian Chen, Huaguo Liang, Minsheng Zhang, Wei Wang 0310 |
A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. |
ICYCS |
2008 |
DBLP DOI BibTeX RDF |
|
24 | Artur Jutman, Igor Aleksejev, Jaan Raik, Raimund Ubar |
Reseeding using compaction of pre-generated LFSR sub-sequences. |
ICECS |
2008 |
DBLP DOI BibTeX RDF |
|
24 | Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang |
Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. |
IET Comput. Digit. Tech. |
2007 |
DBLP DOI BibTeX RDF |
|
24 | Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar |
A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding. |
ATS |
2007 |
DBLP DOI BibTeX RDF |
|
24 | Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar |
Efficient unknown blocking using LFSR reseeding. |
DATE |
2006 |
DBLP DOI BibTeX RDF |
|
24 | Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey |
Optimized reseeding by seed ordering and encoding. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2005 |
DBLP DOI BibTeX RDF |
|
24 | Youhua Shi, Zhe Zhang, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki |
A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation. |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. |
2003 |
DBLP BibTeX RDF |
|
24 | Nan-Cheng Li, Sying-Jyan Wang |
A Reseeding Technique for LFSR-Based BIST Applications. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
Reseedling, LFST, BIST, Test Pattern Generator, Pseudo-Random Testing |
24 | Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Hans-Joachim Wunderlich |
On applying the set covering model to reseeding. |
DATE |
2001 |
DBLP DOI BibTeX RDF |
|
24 | Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
A novel reseeding technique for accumulator-based test pattern generation. |
ACM Great Lakes Symposium on VLSI |
2001 |
DBLP DOI BibTeX RDF |
|
24 | C. V. Krishna, Abhijit Jas, Nur A. Touba |
Test vector encoding using partial LFSR reseeding. |
ITC |
2001 |
DBLP DOI BibTeX RDF |
|
24 | S. Caceres, J. M. Ruiz, F. A. Trelles, J. A. Domingues, S. de Pablo |
On the Study of a New BIST Technique Using Reseeding of Linear Feedback Shift Register toAccelerate the Test. |
LATW |
2000 |
DBLP BibTeX RDF |
|
24 | Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang |
A mixed mode BIST scheme based on reseeding of folding counters. |
ITC |
2000 |
DBLP DOI BibTeX RDF |
|
24 | Gerhard Fischer |
Seeding, Evolutionary Growth and Reseeding: Constructing, Capturing and Evolving Knowledge in Domain-Oriented Design Environments. |
Autom. Softw. Eng. |
1998 |
DBLP DOI BibTeX RDF |
|
24 | Pieter M. Trouborst |
LFSR Reseeding as a Component of Board Level BIST. |
ITC |
1996 |
DBLP DOI BibTeX RDF |
|
24 | Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois |
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. |
IEEE Trans. Computers |
1995 |
DBLP DOI BibTeX RDF |
|
24 | Gerhard Fischer, Raymond McCall, Jonathan L. Ostwald, Brent Reeves, Frank M. Shipman III |
Seeding, evolutionary growth and reseeding: supporting the incremental development of design environments. |
CHI Conference Companion |
1994 |
DBLP DOI BibTeX RDF |
|
24 | Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski |
Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. |
ITC |
1992 |
DBLP DOI BibTeX RDF |
|
23 | Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang 0001 |
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. |
J. Electron. Test. |
2008 |
DBLP DOI BibTeX RDF |
Built-in self-test, Power consumption, Linear feedback shift register, Reseeding |
23 | Gerhard Fischer |
Meta-design: Expanding Boundaries and Redistributing Control in Design. |
INTERACT (1) |
2007 |
DBLP DOI BibTeX RDF |
socio-technical environments, seeding / evolutionary growth / reseeding model, Web2Gether, Memory Aiding Prompting System (MAPS), application areas for meta-design, socially responsible design, design, control, design methodologies, boundaries, meta-design |
23 | Yunwen Ye, Gerhard Fischer |
Reuse-Conducive Development Environments. |
Autom. Softw. Eng. |
2005 |
DBLP DOI BibTeX RDF |
reuse-conducive environments, high-functionality applications, relevance to the task-at-hand, modification model, centralized and decentralized development of reuse repositories, evolutionary growth, reseeding model, CodeBroker, personalization, software reuse, location, comprehension, latent semantic analysis, information delivery, seeding |
23 | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
An Efficient Seeds Selection Method for LFSR-Based Test-per-Clock BIST. |
ISQED |
2002 |
DBLP DOI BibTeX RDF |
Test-per-Clock Schemes, Reseeding Techniques, Built-In Self-Test, Linear Feedback Shift Registers, Test Pattern Generation |
23 | Abhijit Jas, Bahram Pouya, Nur A. Touba |
Virtual Scan Chains: A Means for Reducing Scan Length in Cores. |
VTS |
2000 |
DBLP DOI BibTeX RDF |
Compression/Decompression, Virtual Scan, Built-In Self-Test, Mapping, Design-for-Testability, LFSR, System Integrator, Integrated Circuits, Integrated Circuits, Scan Chains, Embedded Cores, Digital Testing, Reseeding |
23 | Janusz Rajski, Jerzy Tyszer, Nadime Zacharia |
Test Data Decompression for Multiple Scan Designs with Boundary Scan. |
IEEE Trans. Computers |
1998 |
DBLP DOI BibTeX RDF |
reseeding of LFSRs, multiple scan chains, test data decompression, built-in self-test, design for testability, Boundary scan, scan-based designs |
16 | Seongmoon Wang, Wenlong Wei |
An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2008 |
DBLP DOI BibTeX RDF |
|
16 | Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros |
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
16 | Lei Li 0036, Zhanglei Wang, Krishnendu Chakrabarty |
Scan-BIST based on cluster analysis and the encoding of repeating sequences. |
ACM Trans. Design Autom. Electr. Syst. |
2007 |
DBLP DOI BibTeX RDF |
clustering test data volume, Built-in self-test (BIST), test compression |
16 | Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar |
Unknown blocking scheme for low control data volume and high observability. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
|
16 | Gert Jervan, Helena Kruus, Elmet Orasson, Raimund Ubar |
Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems. |
SIES |
2007 |
DBLP DOI BibTeX RDF |
|