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Publication years (Num. hits)
1992-2000 (21) 2001-2003 (24) 2004-2006 (22) 2007-2008 (23) 2009-2014 (15) 2015-2022 (15)
Publication types (Num. hits)
article(45) inproceedings(75)
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The graphs summarize 125 occurrences of 77 keywords

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Found 120 publication records. Showing 120 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
134Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST. Search on Bibsonomy J. Electron. Test. The full citation details ... 2002 DBLP  DOI  BibTeX  RDF test-per-clock schemes, accumulator-based test pattern generators, built-in self-test, linear feedback shift registers, reseeding
125C. V. Krishna, Abhijit Jas, Nur A. Touba Achieving high encoding efficiency with partial dynamic LFSR reseeding. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF linear finite shift register, compression, Built-in self-test, reseeding
117Jinkyu Lee 0005, Nur A. Touba LFSR-Reseeding Scheme Achieving Low-Power Dissipation During Test. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
117Ahmad A. Al-Yamani, Edward J. McCluskey Built-In Reseeding for Serial Bist. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
110Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos A highly regular multi-phase reseeding technique for scan-based BIST. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2003 DBLP  DOI  BibTeX  RDF scan-based schemes, built-in self-test, linear feedback shift registers, reseeding
102Jinkyu Lee 0005, Nur A. Touba Low Power Test Data Compression Based on LFSR Reseeding. Search on Bibsonomy ICCD The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
102Erik H. Volkerink, Subhasish Mitra Efficient Seed Utilization for Reseeding based Compression. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
86Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos Multiphase BIST: a new reseeding technique for high test-data compression. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
71Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek Deviation-Based LFSR Reseeding for Test-Data Compression. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
71Chung-Yi Li, Jiung-Sheng Chen, Tsin-Yuan Chang A chaos-based pseudo random number generator using timing-based reseeding method. Search on Bibsonomy ISCAS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
71Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota Combining dictionary coding and LFSR reseeding for test data compression. Search on Bibsonomy DAC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF built-In self test, VLSI test
71C. V. Krishna, Nur A. Touba Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression. Search on Bibsonomy ITC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
71Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos A New Reseeding Technique for LFSR-Based Test Pattern Generation. Search on Bibsonomy IOLTW The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
63Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2008 DBLP  DOI  BibTeX  RDF output compaction, temporal compactor, blocking unknown values, LFSR reseeding, Built-in Self-Test, BIST, test data compression, MISR, response compaction
55Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. Search on Bibsonomy ETS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
55Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos A ROMless LFSR Reseeding Scheme for Scan-based BIST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
55Ahmad A. Al-Yamani, Edward J. McCluskey Seed encoding with LFSRs and cellular automata. Search on Bibsonomy DAC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF built-in self test, VLSI Test, reseeding
48Marie-Lise Flottes, Christian Landrault, A. Petitqueux Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF sequential testability, internal state reseeding, observation points, minimum DFT insertion, non-scan approach, fault efficiency, 100 percent, fault diagnosis, logic testing, controllability, controllability, design for testability, logic design, sequential circuits, automatic test pattern generation, ATPG, observability, fault coverage, flip-flops, at-speed testing, benchmark circuits, CPU time, partial reset
48Gerhard Fischer, Raymond McCall, Jonathan L. Ostwald, Brent Reeves, Frank M. Shipman III Seeding, evolutionary growth and reseeding: supporting the incremental development of design environments. Search on Bibsonomy CHI The full citation details ... 1994 DBLP  DOI  BibTeX  RDF domain-orientation, end-user modifiability, evolution of information spaces, annotation, collaborative design, tacit knowledge, design environments, situated cognition, seeds, reseeding, incremental formalization
47Ahmad A. Al-Yamani, Edward J. McCluskey BIST-Guided ATPG. Search on Bibsonomy ISQED The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
40Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. Search on Bibsonomy DATE The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
40Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar Hybrid BIST Optimization Using Reseeding and Test Set Compaction. Search on Bibsonomy DSD The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
40Snehal Udar, Dimitri Kagaris LFSR Reseeding with Irreducible Polynomials. Search on Bibsonomy IOLTS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
40Bin Zhou, Yizheng Ye, Yongsheng Wang Simultaneous reduction in test data volume and test time for TRC-reseeding. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2007 DBLP  DOI  BibTeX  RDF encoded vector, twisted-ring counter, built-in self test
40Hong-Sik Kim, Sungho Kang 0001 Increasing encoding efficiency of LFSR reseeding-based test compression. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
40Stelios Neophytou, Maria K. Michael, Spyros Tragoudas Efficient Deterministic Test Generation for BIST Schemes with LFSR Reseeding. Search on Bibsonomy IOLTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
40Yu-Hsuan Fu, Sying-Jyan Wang Test Data Compression with Partial LFSR-Reseeding. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
40Jiann-Chyi Rau, Ying-Fu Ho, Po-Han Wu A novel reseeding mechanism for pseudo-random testing of VLSI circuits. Search on Bibsonomy ISCAS (3) The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
40Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos Reseeding-Based Test Set Embedding with Reduced Test Sequences. Search on Bibsonomy ISQED The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
40Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey Bist Reseeding with very few Seeds. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
40Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
40Nahmsuk Oh, Rohit Kapur, Thomas W. Williams Fast seed computation for reseeding shift register in test pattern compression. Search on Bibsonomy ICCAD The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
40Sybille Hellebrand, Huaguo Liang, Hans-Joachim Wunderlich A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. Search on Bibsonomy J. Electron. Test. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF store and generate schemes, BIST, deterministic BIST
39Shivakumar Swaminathan, Krishnendu Chakrabarty On Using Twisted-Ring Counters for Test Set Embedding in BIST. Search on Bibsonomy J. Electron. Test. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF non-intrusive testing, scalable BIST, test-per-clock, reseeding, deterministic BIST
39Albrecht P. Stroele, Frank Mayer Methods to reduce test application time for accumulator-based self-test. Search on Bibsonomy VTS The full citation details ... 1997 DBLP  DOI  BibTeX  RDF accumulator-based self-test, test length minimization, simulation-based reseeding method, random pattern testable circuits, reverse order simulation, hard fault detection, optimal input value, test length reductions, data path blocks, BIST scheme, ATALANTA fault simulation, combinatorial circuit testing, built-in self test, fault coverage, embedded processor, test pattern generators, circuit optimization, test application time reduction, forward simulation
31Hong-Sik Kim, Sungho Kang 0001, Michael S. Hsiao A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. Search on Bibsonomy J. Electron. Test. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Keyword System on a chip, Test compression, Low power testing, Scan testing
31Richard Putman Using reiterative LFSR based X-masking to increase output compression in presence of unknowns. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2008 DBLP  DOI  BibTeX  RDF reiterative, x-masking, compression, LFSR
31Salvador Manich, Lucas Garcia-Deiros, Joan Figueras Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
31Kedarnath J. Balakrishnan Efficient Scan-Based BIST Using Multiple LFSRs and Dictionary Coding. Search on Bibsonomy VLSI Design The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
31Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius 0001, Rosa Rodríguez-Montañés, Joan Figueras BIST Technique by Equally Spaced Test Vector Sequences. Search on Bibsonomy VTS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
31Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard 0001, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira 0001, Marcelino B. Santos Low Power BIST by Filtering Non-Detecting Vectors. Search on Bibsonomy J. Electron. Test. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF low power BIST, low energy consumption, LFSR, gated clock
24Chen Wang, Weikang Qian Linear Feedback Shift Register Reseeding for Stochastic Circuit Repairing and Minimization. Search on Bibsonomy ASP-DAC The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
24Ian von Hegner A trampoline effect occurring in the stages of planetary reseeding. Search on Bibsonomy Biosyst. The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
24Xiaorong Lv, Xiao Wang, Zhiwei Tian, Lihua Zhang Design of Automatic Reseeding System of Air suction Precision Metering Seeding Device for corn. Search on Bibsonomy Mechatron. Syst. Control. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
24Xiaodan Wu, Haibo Li, Xiaohui Xu, Huafeng Wei CT lesion recognition algorithm based on improved particle reseeding method. Search on Bibsonomy Pattern Recognit. Lett. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
24Jen-Cheng Ying, Wang-Dauh Tseng, Wen-Jiin Tsai Asymmetry dual-LFSR reseeding for low power BIST. Search on Bibsonomy Integr. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
24Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs. Search on Bibsonomy J. Electron. Test. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
24Justin Sunu, Blake Hunter, Allon G. Percus Unsupervised vehicle recognition using incremental reseeding of acoustic signatures. Search on Bibsonomy CoRR The full citation details ... 2018 DBLP  BibTeX  RDF
24Justin Sunu, Allon G. Percus, Blake Hunter Unsupervised Vehicle Recognition Using Incremental Reseeding of Acoustic Signatures. Search on Bibsonomy ISMIS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
24Jen-Cheng Ying, Wang-Dauh Tseng, Wen-Jiin Tsai Bipolar Dual-LFSR Reseeding for Low-Power Testing. Search on Bibsonomy DSC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
24Dong Xiang, Xiaoqing Wen, Laung-Terng Wang Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
24Elaheh Sadredini, Mohammadreza Najafi, Mahmood Fathy, Zainalabedin Navabi BILBO-friendly Hybrid BIST Architecture with Asymmetric Polynomial Reseeding. Search on Bibsonomy CoRR The full citation details ... 2017 DBLP  BibTeX  RDF
24Tian Chen, Dandan Shen, Xin Yi, Huaguo Liang, Xiaoqing Wen, Wei Wang 0310 Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures. Search on Bibsonomy IEICE Trans. Inf. Syst. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
24Shuai Chen, Bing Li A Dynamic Reseeding DRBG Based on SRAM PUFs. Search on Bibsonomy CyberC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
24Ki-Hong Kim, Min-cheol Gwak, Jack J. Yoh An Enhanced Particle Reseeding Algorithm for the Hybrid Particle Level Set Method in Compressible Flows. Search on Bibsonomy J. Sci. Comput. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
24Ondrej Novák, Jiri Jenícek, Martin Rozkovec LFSR Reseeding Based Test Compression Respecting Different Controllability of Decompressor Outputs. Search on Bibsonomy DDECS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
24Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty Efficient LFSR Reseeding Based on Internal-Response Feedback. Search on Bibsonomy J. Electron. Test. The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
24Xavier Bresson, Huiyi Hu, Thomas Laurent 0001, Arthur Szlam, James H. von Brecht An Incremental Reseeding Strategy for Clustering. Search on Bibsonomy CoRR The full citation details ... 2014 DBLP  BibTeX  RDF
24Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty A New LFSR Reseeding Scheme via Internal Response Feedback. Search on Bibsonomy Asian Test Symposium The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
24Peter Wohl, John A. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, Jonathon E. Colburn Two-level compression through selective reseeding. Search on Bibsonomy ITC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
24Chung-Yi Li, Yuan-Ho Chen, Tsin-Yuan Chang, Lih-Yuan Deng, Kiwing To Period Extension and Randomness Enhancement Using High-Throughput Reseeding-Mixing PRNG. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
24Lung-Jen Lee, Wang-Dauh Tseng, Wen-Ting Yang Dual-LFSR Reseeding for Low Power Testing. Search on Bibsonomy MTV The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
24Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume. Search on Bibsonomy Asian Test Symposium The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
24Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram A Novel SMT-Based Technique for LFSR Reseeding. Search on Bibsonomy VLSI Design The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
24Xrysovalantis Kavousianos, Vasileios Tenentes, Krishnendu Chakrabarty, Emmanouil Kalligeros Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
24Wenfa Zhan, Jun Ma, Shanshan Du, Jun Liu A LFSR Reseeding Scheme Based on Division by 2 to the Power of Integer. Search on Bibsonomy J. Digit. Content Technol. its Appl. The full citation details ... 2010 DBLP  BibTeX  RDF
24Piyanart Kongtim, Taweesak Reungpeerakul Parallel LFSR Reseeding with Selection Register for Mixed-Mode BIST. Search on Bibsonomy Asian Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
24Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
24Mahmut Yilmaz, Krishnendu Chakrabarty Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects. Search on Bibsonomy DATE The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
24Hongxia Fang, Krishnendu Chakrabarty, Rubin A. Parekhji Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage. Search on Bibsonomy Asian Test Symposium The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
24Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar Hybrid BIST optimization using reseeding and test set compaction. Search on Bibsonomy Microprocess. Microsystems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
24Tian Chen, Huaguo Liang, Minsheng Zhang, Wei Wang 0310 A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. Search on Bibsonomy ICYCS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
24Artur Jutman, Igor Aleksejev, Jaan Raik, Raimund Ubar Reseeding using compaction of pre-generated LFSR sub-sequences. Search on Bibsonomy ICECS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
24Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. Search on Bibsonomy IET Comput. Digit. Tech. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
24Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding. Search on Bibsonomy ATS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
24Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar Efficient unknown blocking using LFSR reseeding. Search on Bibsonomy DATE The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
24Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey Optimized reseeding by seed ordering and encoding. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
24Youhua Shi, Zhe Zhang, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation. Search on Bibsonomy IEICE Trans. Fundam. Electron. Commun. Comput. Sci. The full citation details ... 2003 DBLP  BibTeX  RDF
24Nan-Cheng Li, Sying-Jyan Wang A Reseeding Technique for LFSR-Based BIST Applications. Search on Bibsonomy Asian Test Symposium The full citation details ... 2002 DBLP  DOI  BibTeX  RDF Reseedling, LFST, BIST, Test Pattern Generator, Pseudo-Random Testing
24Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Hans-Joachim Wunderlich On applying the set covering model to reseeding. Search on Bibsonomy DATE The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
24Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos A novel reseeding technique for accumulator-based test pattern generation. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
24C. V. Krishna, Abhijit Jas, Nur A. Touba Test vector encoding using partial LFSR reseeding. Search on Bibsonomy ITC The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
24S. Caceres, J. M. Ruiz, F. A. Trelles, J. A. Domingues, S. de Pablo On the Study of a New BIST Technique Using Reseeding of Linear Feedback Shift Register toAccelerate the Test. Search on Bibsonomy LATW The full citation details ... 2000 DBLP  BibTeX  RDF
24Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang A mixed mode BIST scheme based on reseeding of folding counters. Search on Bibsonomy ITC The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
24Gerhard Fischer Seeding, Evolutionary Growth and Reseeding: Constructing, Capturing and Evolving Knowledge in Domain-Oriented Design Environments. Search on Bibsonomy Autom. Softw. Eng. The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
24Pieter M. Trouborst LFSR Reseeding as a Component of Board Level BIST. Search on Bibsonomy ITC The full citation details ... 1996 DBLP  DOI  BibTeX  RDF
24Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 1995 DBLP  DOI  BibTeX  RDF
24Gerhard Fischer, Raymond McCall, Jonathan L. Ostwald, Brent Reeves, Frank M. Shipman III Seeding, evolutionary growth and reseeding: supporting the incremental development of design environments. Search on Bibsonomy CHI Conference Companion The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
24Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. Search on Bibsonomy ITC The full citation details ... 1992 DBLP  DOI  BibTeX  RDF
23Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang 0001 An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. Search on Bibsonomy J. Electron. Test. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Built-in self-test, Power consumption, Linear feedback shift register, Reseeding
23Gerhard Fischer Meta-design: Expanding Boundaries and Redistributing Control in Design. Search on Bibsonomy INTERACT (1) The full citation details ... 2007 DBLP  DOI  BibTeX  RDF socio-technical environments, seeding / evolutionary growth / reseeding model, Web2Gether, Memory Aiding Prompting System (MAPS), application areas for meta-design, socially responsible design, design, control, design methodologies, boundaries, meta-design
23Yunwen Ye, Gerhard Fischer Reuse-Conducive Development Environments. Search on Bibsonomy Autom. Softw. Eng. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF reuse-conducive environments, high-functionality applications, relevance to the task-at-hand, modification model, centralized and decentralized development of reuse repositories, evolutionary growth, reseeding model, CodeBroker, personalization, software reuse, location, comprehension, latent semantic analysis, information delivery, seeding
23Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos An Efficient Seeds Selection Method for LFSR-Based Test-per-Clock BIST. Search on Bibsonomy ISQED The full citation details ... 2002 DBLP  DOI  BibTeX  RDF Test-per-Clock Schemes, Reseeding Techniques, Built-In Self-Test, Linear Feedback Shift Registers, Test Pattern Generation
23Abhijit Jas, Bahram Pouya, Nur A. Touba Virtual Scan Chains: A Means for Reducing Scan Length in Cores. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF Compression/Decompression, Virtual Scan, Built-In Self-Test, Mapping, Design-for-Testability, LFSR, System Integrator, Integrated Circuits, Integrated Circuits, Scan Chains, Embedded Cores, Digital Testing, Reseeding
23Janusz Rajski, Jerzy Tyszer, Nadime Zacharia Test Data Decompression for Multiple Scan Designs with Boundary Scan. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 1998 DBLP  DOI  BibTeX  RDF reseeding of LFSRs, multiple scan chains, test data decompression, built-in self-test, design for testability, Boundary scan, scan-based designs
16Seongmoon Wang, Wenlong Wei An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
16Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
16Lei Li 0036, Zhanglei Wang, Krishnendu Chakrabarty Scan-BIST based on cluster analysis and the encoding of repeating sequences. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF clustering test data volume, Built-in self-test (BIST), test compression
16Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar Unknown blocking scheme for low control data volume and high observability. Search on Bibsonomy DATE The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
16Gert Jervan, Helena Kruus, Elmet Orasson, Raimund Ubar Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems. Search on Bibsonomy SIES The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
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