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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 1037 occurrences of 704 keywords
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Results
Found 4784 publication records. Showing 4784 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
76 | Christophe Lécuyer, David C. Brock |
Biographies. |
IEEE Ann. Hist. Comput. |
2006 |
DBLP DOI BibTeX RDF |
Gordon Moore, semiconductor industry, silicon technology, silicon device manufacture, Fairchild Semiconductor, Shockley Semiconductor, microprocessor, integrated circuit, DRAM, personal computer, chemistry, Moore's law, Intel |
65 | Jay Vleeschhouwer, Warren East, Michael J. Fister, Aart J. de Geus, Walden C. Rhines, Jackson Hu, Rick Cassidy |
Differentiate and deliver: leveraging your partners. |
DAC |
2005 |
DBLP DOI BibTeX RDF |
EDS, semiconductor fabrication, supplier-customer relationships, intellectual property, processors |
57 | Boris Troyanovsky, Zhiping Yu, Lydia So, Robert W. Dutton |
Relaxation-based harmonic balance technique for semiconductor device simulation. |
ICCAD |
1995 |
DBLP DOI BibTeX RDF |
semiconductor device simulation, nonlinear relaxation, PISCES, RF amplifiers, harmonic distortion, intermodulation distortion, microwave semiconductor devices, nonlinear frequency-domain simulation, Harmonic balance |
48 | Giovanni Stracquadanio, Concetta Drago, Vittorio Romano, Giuseppe Nicosia |
Multi-objective optimization of doping profile in semiconductor design. |
GECCO |
2010 |
DBLP DOI BibTeX RDF |
semiconductor design, multi-objective optimization, electronic design automation |
46 | Fumio Suzuki, Hisao Koizumi, M. Hiramine, K. Yamamoto, Hiroto Yasuura, K. Okino |
A HW/SW co-design environment for multi-media equipments development using inverse problem. |
CODES |
1997 |
DBLP DOI BibTeX RDF |
audio circuitry, conceptual stage, development cycle reduction, hardware/software codesign environment, human recognition characteristics, human sensibilities, multimedia equipment development, netlist generation, repeated results comparison, semiconductor circuits, semiconductor production, signal reproduction, system response, television receiver, evaluation, perception, multimedia communication, inverse problem, cost estimates, performance estimates, optimization method, filter design, numerical models, susceptibility, playback |
46 | Chen-Fu Chien, Yun-Ju Chen, Jin-Tang Peng |
Demand forecast of semiconductor products based on technology diffusion. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
41 | Dug Hee Moon, Kyeong Wook Shin, Chul Soon Park, Dong Soo Kim |
A manufacturing system simulation of semiconductor packaging substrate. |
SpringSim |
2009 |
DBLP BibTeX RDF |
lead frame, manufacturing system design, packaging substrate, discrete event simulation, semiconductor |
41 | Zheng-Cai Cao, Fei Qiao, Qidi Wu |
Ga based approach for optimized scheduling in a semiconductor wafer fabrication. |
GEC Summit |
2009 |
DBLP DOI BibTeX RDF |
semiconductor wafer fabrication, genetic algorithm, scheduling |
41 | Malcolm Yoke Hean Low, Kong Wei Lye, Peter Lendermann, Stephen John Turner, Reman Tat Wee Chim, Surya Hadisaputra Leo |
An agent-based approach for managing symbiotic simulation of semiconductor assembly and test operation. |
AAMAS Industrial Applications |
2005 |
DBLP DOI BibTeX RDF |
agent-supported simulation, symbiotic simulation, semiconductor manufacturing |
41 | Paul B. Chou, A. Ravishankar Rao, Martin C. Sturzenbecker, Frederick Y. Wu, Virginia H. Brecher |
Automatic defect classification for semiconductor manufacturing. |
Mach. Vis. Appl. |
1997 |
DBLP DOI BibTeX RDF |
Classification, Machine vision, Process control, Defects, Semiconductor manufacturing |
39 | Vincenza Carchiolo, Sebastiano D'Ambra, Alessandro Longheu, Michele Malgeri |
Issues in object orienting the ST Microelectronics manufacturing model. |
APSEC |
2000 |
DBLP DOI BibTeX RDF |
semiconductor device manufacture, ST Microelectronics manufacturing model, structured production model, semiconductor device manufacturing, production flow, finite state machines, finite state machine, inheritance, inheritance, object-oriented methods, manufacturing systems, computer integrated manufacturing, object-oriented approach |
39 | Horng-Ren Tsai, Toly Chen |
Self-adaptive Agent-Based Dynamic Scheduling for a Semiconductor Manufacturing Factory. |
SAB |
2008 |
DBLP DOI BibTeX RDF |
|
39 | Yiming Li 0005, Cheng-Kai Chen |
A Distributed Simulation-Based Computational Intelligence Algorithm for Nanoscale Semiconductor Device Inverse Problem. |
ISPA Workshops |
2006 |
DBLP DOI BibTeX RDF |
|
39 | MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung |
ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. |
IEEE Trans. Syst. Man Cybern. Part A |
2004 |
DBLP DOI BibTeX RDF |
|
39 | Brian Donnellan |
Knowledge Management in the Semiconductor Industry: Dispatches from the Front Line. |
PAKM |
2004 |
DBLP DOI BibTeX RDF |
Knowledge Management, Innovation, Knowledge Management Systems, New Product Development |
39 | T. Manago |
Spin Detection and Injection Using Ferromagnetic Metal and Semiconductor Hybrid Structure. |
ICMENS |
2003 |
DBLP DOI BibTeX RDF |
|
39 | Santanu Das |
Trends in Communication Technology and its Impact on Semiconductor. |
VLSI Design |
2000 |
DBLP DOI BibTeX RDF |
|
37 | Huy Nguyen Anh Pham, Arthur M. D. Shr, Peter P. Chen |
An Integer Linear Programming Approach for Dedicated Machine Constraint. |
ACIS-ICIS |
2008 |
DBLP DOI BibTeX RDF |
Dedicated Machine Constraint, Photolithography, Integer Linear Programming, Semiconductor Manufacturing |
37 | Robert Madge |
New test paradigms for yield and manufacturability. |
IEEE Des. Test Comput. |
2005 |
DBLP DOI BibTeX RDF |
nanometer-era semiconductor, test paradigm, yield and manufacturability |
37 | Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang |
Fault Pattern Oriented Defect Diagnosis for Memories. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
failure analysis (FA), fault pattern, memory diagnostics, memory testing, bitmap, semiconductor memory |
36 | Chin Soon Chong, Appa Iyer Sivakumar, Robert K. L. Gay |
Semiconductor manufacturing: design, development and application of an object oriented simulation toolkit for real-time semiconductor manufacturing scheduling. |
WSC |
2002 |
DBLP DOI BibTeX RDF |
|
36 | Chad D. DeJong, Seth A. Fischbein |
Semiconductor manufacturing material handling systems: integrating dynamic fab capacity and automation models for 300mm semiconductor manufacturing. |
WSC |
2000 |
DBLP DOI BibTeX RDF |
|
35 | Serge N. Demidenko, Victor Lai |
Industry-Academia Collaboration in Undergraduate Test Engineering Unit Development. |
DELTA |
2006 |
DBLP DOI BibTeX RDF |
|
34 | Xinliang Zhang, Jing Xu, Jianji Dong, Dexiu Huang |
All-Optical Logic Gates Based on Semiconductor Optical Amplifiers and Tunable Filters. |
OSC |
2009 |
DBLP DOI BibTeX RDF |
all-optical logic gates, semiconductor optical amplifiers (SOAs), delay interferometer, bandpass filter |
34 | YuanLin Wen, Sheng-Luen Chung, Li-Der Jeng, MuDer Jeng |
Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines. |
KES (2) |
2007 |
DBLP DOI BibTeX RDF |
Petri Nets, Fault diagnosis, Semiconductor Manufacturing |
34 | Shu-Hsing Chung, I-Ping Chung, Amy Hsin-I Lee |
Collaborative Production-Distribution Planning for Semiconductor Production Turnkey Service. |
ICCSA (1) |
2007 |
DBLP DOI BibTeX RDF |
SPTS, TPP, Network Transformation, Semiconductor Manufacturing |
34 | Maria Spyropoulou, Konstantinos Yiannopoulos, Stelios Sygletos, Kyriakos Vlachos, Ioannis Tomkos |
160 Gbps Simulation of a Quantum Dot Semiconductor Optical Amplifier Based Optical Buffer. |
ONDM |
2007 |
DBLP DOI BibTeX RDF |
Quantum Dot Semiconductor Optical Amplifiers, Programmable Delays, Optical packet switching, Optical buffers, Wavelength Converters |
34 | N. G. Shankar, Z. W. Zhong |
Improved segmentation of semiconductor defects using area sieves. |
Mach. Vis. Appl. |
2006 |
DBLP DOI BibTeX RDF |
Area sieve, Discrete wavelet transform, Machine vision, Inspection, Semiconductor |
34 | Josep Prat, Cristina Arellano, Victor Polo 0001, Carlos Bock |
Optical Network Unit Based on a Bidirectional Reflective Semiconductor Optical Amplifier. |
OpNeTec |
2004 |
DBLP DOI BibTeX RDF |
Fiber-to-the-home, Optical modulation, Optical signal detection, Reflective semiconductor optical amplifier, Access networks |
34 | Jin-Fu Li 0001, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow |
A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
built-in redundancy-analysis, built-in self-test, memory testing, semiconductor memory, built-in self-repair |
32 | Jonathan P. Bowen, Tim Bergin, Christopher H. Sterling |
Reviews. |
IEEE Ann. Hist. Comput. |
2006 |
DBLP DOI BibTeX RDF |
Halley's Comet, Work Projects Administration, time line, origins of the Internet, Silicon Valley, General Electric, Litton Industries, Shockley Semiconductor, Fairchild Semiconductor, human computers |
32 | G. Hari Rama Krishna, Amit K. Aditya, Nirmal B. Chakrabarti, Swapna Banerjee |
Analysis of temperature dependence of Si-Ge HBT. |
VLSI Design |
1995 |
DBLP DOI BibTeX RDF |
semiconductor materials, heterojunction bipolar transistors, Ge-Si alloys, heterojunction bipolar transistors, Ge mole-fraction, two dimensional device simulator, BISOF, current gain, graded HBT, 200 to 300 K, simulation, finite element method, finite element analysis, FEM, temperature dependence, SiGe, thermal analysis, semiconductor device models |
32 | Glenn Healey, Raghava Kondepudy |
Radiometric CCD camera calibration and noise estimation. |
IEEE Trans. Pattern Anal. Mach. Intell. |
1994 |
DBLP DOI BibTeX RDF |
semiconductor device noise, radiometric CCD camera calibration, primary cue, material reflectance, digitized pixel values, sensor noise, scene variation, camera characterization, fixed pattern nonuniformity, spatial variation, dark current, computer vision, edge detection, edge detection, reflectivity, parameter estimation, calibration, shape from shading, video cameras, video cameras, scene description, visual processes, CCD image sensors, noise estimation, semiconductor device models, radiometry |
32 | Jiancheng Guan, Nan Ma |
A bibliometric study of China's semiconductor literature compared with other major asian countries. |
Scientometrics |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Yaw-Jen Chang, Yuan Kang, Chin-Liang Hsu, Chi-Tim Chang, Tat Yan Chan |
Virtual Metrology Technique for Semiconductor Manufacturing. |
IJCNN |
2006 |
DBLP DOI BibTeX RDF |
|
32 | Clemens Heitzinger, Alireza Sheikholeslami, Jong Mun Park, Siegfried Selberherr |
A method for generating structurally aligned grids for semiconductor device simulation. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2005 |
DBLP DOI BibTeX RDF |
|
32 | José A. Ramírez-Hernández, Heshan Li, Emmanuel Fernandez, Charles R. McLean, Swee Leong |
A framework for standard modular simulation in semiconductor wafer fabrication systems. |
WSC |
2005 |
DBLP DOI BibTeX RDF |
|
32 | Hideki Hasegawa, Seiya Kasai |
III-V Compound Semiconductor Nanotechnology for Smart Systems. |
ICMENS |
2005 |
DBLP DOI BibTeX RDF |
|
32 | Dimitrios Ntalaperas, K. Theodoropoulos, Athanasios K. Tsakalidis, Nikos Konofaos |
A Quantum Computer Architecture Based on Semiconductor Recombination Statistics. |
Panhellenic Conference on Informatics |
2005 |
DBLP DOI BibTeX RDF |
|
32 | Li Li 0008, Fei Qiao, Hua Jiang, Qidi Wu |
The research on dispatching rule for improving on-time delivery for semiconductor wafer fab. |
ICARCV |
2004 |
DBLP DOI BibTeX RDF |
|
32 | Ming-Yueh Tsay, Hong Xu, Chia-wen Wu |
Author co-citation analysis of semiconductor literature. |
Scientometrics |
2003 |
DBLP DOI BibTeX RDF |
|
32 | Ming-Yueh Tsay, Hong Xu, Chia-wen Wu |
Journal co-citation analysis of semiconductor literature. |
Scientometrics |
2003 |
DBLP DOI BibTeX RDF |
|
32 | Shan-Ping Chin, Ching-Yuan Wu |
A new grid-generation method for 2-D simulation of devices with nonplanar semiconductor surface. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1993 |
DBLP DOI BibTeX RDF |
|
32 | Mark R. Simpson |
PRIDE: an integrated design environment for semiconductor device simulation. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1991 |
DBLP DOI BibTeX RDF |
|
30 | |
Inventions: A Result of Risk-Taking, Diversity, and Holistic Thinking - An interview with Bernard S. Meyerson, IBM Fellow, Vice President, and Chief Technologist of IBM's System Technology Group. |
IEEE Des. Test Comput. |
2005 |
DBLP DOI BibTeX RDF |
silicon germanium, semiconductor |
30 | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. |
VTS |
1997 |
DBLP DOI BibTeX RDF |
semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing |
29 | Amit K. Gupta II, Appa Iyer Sivakumar |
Semiconductor manufacturing: simulation based multiobjective schedule optimization in semiconductor manufacturing. |
WSC |
2002 |
DBLP DOI BibTeX RDF |
|
29 | Scott J. Mason, John W. Fowler |
Semiconductor manufacturing scheduling: maximizing delivery performance in semiconductor wafer fabrication facilities. |
WSC |
2000 |
DBLP DOI BibTeX RDF |
|
28 | Seung Soo Han, Dong Sun Seo, Sang Jeen Hong |
Modeling and Characterization of Plasma Processes Using Modular Neural Network. |
ISNN (2) |
2006 |
DBLP DOI BibTeX RDF |
|
28 | Jae Won Lee, Sung Hwa Jung, Sung Chang Park, Young Joong Lee, Young Chul Jang |
System based SQA and implementation of SPI for successful projects. |
IRI |
2005 |
DBLP DOI BibTeX RDF |
|
27 | David A. Laws |
A Company of Legend: The Legacy of Fairchild Semiconductor. |
IEEE Ann. Hist. Comput. |
2010 |
DBLP DOI BibTeX RDF |
Fairchild, Hoerni, Moore, Noyce, Silicon Valley, integrated circuit, Planar, Microelectronics, Semiconductor |
27 | Gerhard Klimeck, Mathieu Luisier |
Atomistic Modeling of Realistically Extended Semiconductor Devices with NEMO and OMEN. |
Comput. Sci. Eng. |
2010 |
DBLP DOI BibTeX RDF |
atomistic modeling and simulation, nanoscale semiconductor devices, parallel computing, computer-aided design, high-performance computing, nanotechnology, Nanoelectronics |
27 | Kais A. Al-Naimee, Sora F. Abdalah, Marzena Ciszak, Riccardo Meucci, Fortunato Tito Arecchi, Francesco Marino |
Incomplete Homoclinic Scenarios in Semiconductor Devices with Optoelectronic Feedback: Generation and Synchronization. |
COMPENG |
2010 |
DBLP DOI BibTeX RDF |
Homoclinic chaos, semiconductor devices |
27 | Shu-Hsing Chung, I. P. Chung, Y. T. Tai, Y. M. Chu |
The Design of Outsourcing Planning for Semiconductor Backend Turnkey Service. |
NCM (2) |
2008 |
DBLP DOI BibTeX RDF |
Semiconductor backend turnkey service (SBTS), wafer fabrication, outsourcing |
27 | Richard J. Blaikie, Maan M. Alkaisi, Steven M. Durbin, David R. S. Cumming |
Teaching Integrated Circuit and Semiconductor Device Design in New Zealand: The University of Canterbury Approach. |
DELTA |
2002 |
DBLP DOI BibTeX RDF |
Semiconductor Devices, Education, Integrated Circuit |
27 | Mike Gardner, Jack Bieker |
Data mining solves tough semiconductor manufacturing problems. |
KDD |
2000 |
DBLP DOI BibTeX RDF |
manufacturing optimization, semiconductor yield enhancement, data mining, neural networks, machine learning, pattern recognition, self organizing maps, rule induction |
27 | R. K. Coomer, Ivan G. Graham |
Massively Parallel Methods for Semiconductor Device Modelling. |
Computing |
1996 |
DBLP DOI BibTeX RDF |
Semiconductor device, drift-diffusion equations, Gummel's method, domain decomposition massively parallel, finite element methods, Schur complement, preconditioned conjugate gradient methods |
27 | Pinaki Mazumder, Janak H. Patel |
Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories. |
IEEE Trans. Computers |
1989 |
DBLP DOI BibTeX RDF |
semiconductor random-access memories, design-for-testability approach, MOS integrated circuits, reliability, integrated circuit testing, linear complexity, MOS, random-access storage, integrated memory circuits, pattern-sensitive faults, design strategy, parallel testing |
27 | Carl-Erik W. Sundberg |
Erasure and Error Decoding for Semiconductor Memories. |
IEEE Trans. Computers |
1978 |
DBLP DOI BibTeX RDF |
Erasure and error decoding, erasure correcting code, error correcting code, fault-tolerant system, Hamming code, semiconductor memory |
25 | Antun Domic |
Design or manufacturing: which will be best for the future of the semiconductor roadmap? |
ISPD |
2008 |
DBLP DOI BibTeX RDF |
|
25 | I-Hsuan Hong, Hsi-Mei Hsu, Yi-Mu Wu, Chun-Shao Yeh |
Pricing decision and lead time setting in a duopoly semiconductor industry. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Horst Zisgen, Ingo Meents, Benjamin R. Wheeler, Thomas Hanschke |
A queueing network based system to model capacity and cycle time for semiconductor fabrication. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Chen-Fu Chien, Wen-Chih Chen, Shao-Chung Hsu |
An indirect workforce (re)allocation model for semiconductor manufacturing. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Andreas Klemmt, Sven Horn, Gerald Weigert, Thomas Hielscher |
Simulations-based and solver-based optimization approaches for batch processes in semiconductor manufacturing. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Appa Iyer Sivakumar, Chao Qi, Andy Darwin Kasan Hidayat |
Experimental study on variations of WIPLOAD Control in semiconductor wafer fabrication environment. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | An-Guo Chao, S. T. Tseng, David Shan-Hill Wong, Shi-Shang Jang, Shui-Pin Lee |
Systematic applications of multivariate analysis to monitoring of equipment health in semiconductor manufacturing. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Chen-Fu Chien, Stéphane Dauzère-Pérès, Hans Ehm, John W. Fowler, Zhibin Jiang, Shekar Krishnaswamy, Lars Mönch, Reha Uzsoy |
Modeling and analysis of semiconductor manufacturing in a shrinking world: Challenges and successes. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Carl Johnzen, Philippe Vialletelle, Stéphane Dauzère-Pérès, Claude Yugma, Alexandre Derreumaux |
Impact of qualification management on scheduling in semiconductor manufacturing. |
WSC |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Michael M. Mielke, Gerard A. Alphonse, Peter J. Delfyett |
Multiwavelength modelocked semiconductor lasers for photonic access network applications. |
IEEE J. Sel. Areas Commun. |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Toly Chen |
A Fuzzy-Neural Approach with BPN Post-classification for Job Completion Time Prediction in a Semiconductor Fabrication Plant. |
Analysis and Design of Intelligent Systems using Soft Computing Techniques |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Gary W. Godding, Hessam S. Sarjoughian, Karl G. Kempf |
Application of combined discrete-event simulation and optimization models in semiconductor enterprise manufacturing systems. |
WSC |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Huai Zhang, Zhibin Jiang, Chengtao Guo |
Simulation based real-time scheduling method for dispatching and rework control of semiconductor manufacturing system. |
SMC |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Oh-Hyun Kwon |
Perspective of the Future Semiconductor Industry: Challenges and Solutions. |
DAC |
2007 |
DBLP BibTeX RDF |
|
25 | Zhongjie Wang, Xinhua Jiang, Qidi Wu |
Modeling and Real-Time Scheduling of Semiconductor Manufacturing Line Based on Simulation. |
LSMS (1) |
2007 |
DBLP DOI BibTeX RDF |
|
25 | W. Wessner, Johann Cervenka, Clemens Heitzinger, Andreas Hössinger, Siegfried Selberherr |
Anisotropic Mesh Refinement for the Simulation of Three-Dimensional Semiconductor Manufacturing Processes. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2006 |
DBLP DOI BibTeX RDF |
|
25 | Sebastian Werner, Sven Horn, Gerald Weigert, Thomas Jähnig |
Simulation based scheduling system in a semiconductor backend facility. |
WSC |
2006 |
DBLP DOI BibTeX RDF |
|
25 | Kilian Schmidt, Jörg Weigang, Oliver Rose |
Modeling semiconductor tools for small lotsize FAB simulations. |
WSC |
2006 |
DBLP DOI BibTeX RDF |
|
25 | Pei-Chann Chang, Yen-Wen Wang, Chen-Hao Liu |
Combining SOM and GA-CBR for Flow Time Prediction in Semiconductor Manufacturing Factory. |
RSCTC |
2006 |
DBLP DOI BibTeX RDF |
Flow time prediction, Genetic Algorithms, Self-Organizing Map, Case-Based Reasoning |
25 | Eric Liau, Doris Schmitt-Landsiedel |
Computational Intelligence Characterization Method of Semiconductor Device. |
DATE |
2005 |
DBLP DOI BibTeX RDF |
|
25 | Hessam S. Sarjoughian, Dongping Huang, Gary W. Godding, Karl G. Kempf, Wenlin Wang, Daniel E. Rivera, Hans D. Mittelmann |
Hybrid discrete event simulation with model predictive control for semiconductor supply-chain manufacturing. |
WSC |
2005 |
DBLP DOI BibTeX RDF |
|
25 | Vikram Ramamurthi, Michael E. Kuhl, Karl D. Hirschman |
Analysis of production control methods for semiconductor research and development fabs using simulation. |
WSC |
2005 |
DBLP DOI BibTeX RDF |
|
25 | Olaf Schenk, Stefan Röllin, Anshul Gupta |
The effects of unsymmetric matrix permutations and scalings in semiconductor device and circuit simulation. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Jiang Hua, Li Li 0008, Fei Qiao, Qidi Wu |
The new method of dynamic scheduling in semiconductor fabrication line. |
ICARCV |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Huang Dan, Yan Juanwei, Qiao Fei |
Modeling with hierarchical Petri net of semiconductor manufacturing system. |
ICARCV |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Vyacheslav A. Trofimov, Maria M. Loginova |
Comparison of Some Difference Schemes for Problem of Femtosecond Pulse Interaction with Semiconductor in the Case of Nonlinear Mobility Coefficient. |
NAA |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Hermann Gold |
Dynamic optimization of routing in a Semiconductor Manufacturing Plant. |
OR |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Krishna V. Palem |
Energy Aware Algorithm Design via Probabilistic Computing: From Algorithms and Models to Moore?s Law and Novel (Semiconductor) Devices. |
HiPC |
2003 |
DBLP DOI BibTeX RDF |
|
25 | Kazuo Miyashita, Kazuyuki Senoh, Hiroyuki Ozaki, Hirofumi Matsuo |
Factory scheduling and dispatching: constant time interval production planning with application to WIP control in semiconductor fabrication. |
WSC |
2003 |
DBLP DOI BibTeX RDF |
|
25 | Nirmal Govind, David Fronckowiak |
Process equipment modeling: resident-entity based simulation of batch chamber tools in 300mm semiconductor manufacturing. |
WSC |
2003 |
DBLP DOI BibTeX RDF |
|
25 | Lars Mönch, Marcel Stehli |
An Ontology for Production Control of Semiconductor Manufacturing Processes. |
MATES |
2003 |
DBLP DOI BibTeX RDF |
|
25 | Hyun Song Jang, Young Joong Lee, Young Jun Han, Chung Sam Ahn, Joong Min Choi |
Enhanced Approaches of Content Management for the Collaborative Semiconductor Business. |
CW |
2003 |
DBLP DOI BibTeX RDF |
|
25 | William Liu, Tay Jin Chua, J. Larn, Feng-Yu Wang, Tian Xiang Cai, Xiao-Feng Yin |
APS, ERP and MES systems integration for semiconductor backend assembly. |
ICARCV |
2002 |
DBLP DOI BibTeX RDF |
|
25 | Gaofeng Wang, Xiaoning Qi, Zhiping Yu, Robert W. Dutton |
Accurate Model of Metal-Insulator-Semiconductor Interconnects. |
ISQED |
2002 |
DBLP DOI BibTeX RDF |
|
25 | Daniel N. Maynard |
Productivity Optimization Techniques for the Proactive Semiconductor Manufacturer (invited). |
ISQED |
2002 |
DBLP DOI BibTeX RDF |
Modeling, Productivity, Design for Manufacturing (DFM), Characterization, Checking |
25 | Ganesan Umanesan, Eiji Fujiwara |
A Class of Random Multiple Bits in a Byte Error Correcting (S t/b EC)Codes for Semiconductor Memory Systems. |
PRDC |
2002 |
DBLP DOI BibTeX RDF |
|
25 | Scott L. Rosen, Chad A. Geist, Daniel A. Finke, Jyotirmaya Nanda, Russell R. Barton |
Graphical methods for robust design of a semiconductor burn-in process. |
WSC |
2001 |
DBLP DOI BibTeX RDF |
|
25 | Shari Murray, Gerald T. Mackulak, John W. Fowler, Theron Colvin |
A simulation-based cost modeling methodology for evaluation of interbay material handling in a semiconductor wafer fab. |
WSC |
2000 |
DBLP DOI BibTeX RDF |
|
25 | Appa Iyer Sivakumar |
Simulation based cause and effect analysis of cycle time distribution in semiconductor backend. |
WSC |
2000 |
DBLP DOI BibTeX RDF |
|
25 | Igor Paprotny, Juin-Yan Shiau, Yo Huh, Gerald T. Mackulak |
Material handling: simulation based comparison of semiconductor AMHS alternatives: Continuous Flow vs. Overhead Monorail. |
WSC |
2000 |
DBLP DOI BibTeX RDF |
|
25 | Theo A. C. M. Claasen |
The Changing Semiconductor Industry: From Components to Silicon Systems. |
EUROMICRO |
1999 |
DBLP DOI BibTeX RDF |
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