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Publication years (Num. hits)
1983-1992 (16) 1993-1996 (22) 1997-1998 (15) 1999-2001 (17) 2002-2003 (15) 2004-2005 (17) 2006-2007 (26) 2008-2010 (15) 2011-2020 (16) 2021-2024 (13)
Publication types (Num. hits)
article(52) inproceedings(120)
Venues (Conferences, Journals, ...)
VTS(17) ITC(14) DFT(13) J. Electron. Test.(13) DATE(10) IEEE Trans. Comput. Aided Des....(10) Asian Test Symposium(6) VLSI Design(6) DAC(5) IOLTS(4) ATS(3) CoRR(3) DELTA(3) ICCAD(3) IEEE Trans. Computers(3) ISQED(3) More (+10 of total 64)
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The graphs summarize 206 occurrences of 140 keywords

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Found 172 publication records. Showing 172 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
121Michael Nicolaidis Shorts in self-checking circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 1991 DBLP  DOI  BibTeX  RDF strongly fault-secure circuits, transistor faults, error detecting codes, self-checking circuits, totally self-checking circuits
113Kanad Chakraborty, Pinaki Mazumder An efficient, bus-layout based method for early diagnosis of bussed driver shorts in printed circuit boards. Search on Bibsonomy ICCAD The full citation details ... 1996 DBLP  DOI  BibTeX  RDF bus-layout, bussed driver shorts, early diagnosis, field survivability, interconnect shorts, production yield, printed circuit boards, printed circuit testing
112Udo Mahlstedt, Jürgen Alt, Matthias Heinitz CURRENT: a test generation system for IDDQ testing. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF CURRENT test system, test generation system, scan-based circuits, library-based fault modeling strategy, intra-gate shorts, inter-gate shorts, gate-drain shorts, deterministic test generator, test set compaction technique, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault simulator, fault coverage, fault location, CMOS logic circuits, bridging faults, boundary scan testing, I/sub DDQ/ testing, test application time reduction, stuck-on faults, leakage faults
79Xiang Lu, Zhuo Li 0001, Wangqi Qiu, D. M. H. Walker, Weiping Shi A Circuit Level Fault Model for Resistive Shorts of MOS Gate Oxide. Search on Bibsonomy MTV The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
66Naveen Amblee, Tung Bui 0001 The Impact of Additional Electronic Word-of-Mouth on Sales of Digital Micro-products over Time: A Longitudinal Analysis of Amazon Shorts. Search on Bibsonomy HICSS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
66Rosa Rodríguez-Montañés, Joan Figueras Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. Search on Bibsonomy DATE The full citation details ... 1998 DBLP  DOI  BibTeX  RDF IDDQ testability, CMOS, deep-submicron
62Vinay Dabholkar, Sreejit Chakravarty Computing Stress Tests for Gate Oxide Shorts. Search on Bibsonomy VLSI Design The full citation details ... 1998 DBLP  DOI  BibTeX  RDF burn-in, stress tests, gate oxide shorts
62Peter Dahlgren, Peter Lidén A fault model for switch-level simulation of gate-to-drain shorts. Search on Bibsonomy VTS The full citation details ... 1996 DBLP  DOI  BibTeX  RDF switch-level simulation, gate-to-drain shorts, transistor-level bridging faults, network primitive, electrical-level analysis, algorithm, fault diagnosis, fault model, iteration, integrated circuit modelling, subnetworks
61Walter W. Weber, Adit D. Singh An experimental evaluation of the differential BICS for IDDQ testing. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF differential BICS, CMOS test chips, inter-layer shorts, intra-layer shorts, fault diagnosis, integrated circuit testing, fault coverage, CMOS integrated circuits, opens, built-in current sensor, IC testing, I/sub DDQ/ testing, electric current measurement, electric sensing devices
52Bram Kruseman, Stefan van den Oetelaar Detection of Resistive Shorts in Deep Sub-micron Technologies. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
52José T. de Sousa, Peter Y. K. Cheung Diagnosis of Boards for Realistic Interconnect Shorts. Search on Bibsonomy J. Electron. Test. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF interconnect diagnosis, board testing, board diagnosis
52José T. de Sousa, Peter Y. K. Cheung Improved diagnosis of realistic interconnect shorts. Search on Bibsonomy ED&TC The full citation details ... 1997 DBLP  DOI  BibTeX  RDF
52Joel W. Gannett SHORTFINDER: a graphical CAD tool for locating net-to-net shorts in VLSI chip layouts. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1990 DBLP  DOI  BibTeX  RDF
52M. Sytrzycki Modeling of gate oxide shorts in MOS transistors. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1989 DBLP  DOI  BibTeX  RDF
49Prajit T. Rajendran, Kevin Creusy, Vivien Garnes Shorts on the Rise: Assessing the Effects of YouTube Shorts on Long-Form Video Content. Search on Bibsonomy CoRR The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
48Hong Hao, Edward J. McCluskey Analysis of Gate Oxide Shorts in CMOS Circuits. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 1993 DBLP  DOI  BibTeX  RDF resistance dependence, voltage dependence, pattern dependence, logic gate operation, p-channel transistors, n-channel transistors, CMOS integrated circuits, integrated logic circuits, CMOS circuits, logic gates, defect models, temperature dependence, gate oxide shorts, semiconductor device models
41Tobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters Test quality analysis and improvement for an embedded asynchronous FIFO. Search on Bibsonomy DATE The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
41Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura Current Testable Design of Resistor String DACs. Search on Bibsonomy DELTA The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
41Joachim Sudbrock, Jaan Raik, Raimund Ubar, Wieslaw Kuzmicz, Witold A. Pleskacz Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. Search on Bibsonomy DSD The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
41David C. Keezer, K. E. Newman, John S. Davis Improved sensitivity for parallel test of substrate interconnections. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
38Jonathan T.-Y. Chang, Edward J. McCluskey Detecting resistive shorts for CMOS domino circuits. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
38Jaume Segura 0001, Carol de Benito, Antonio Rubio 0001, Charles F. Hawkins A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors. Search on Bibsonomy J. Electron. Test. The full citation details ... 1996 DBLP  DOI  BibTeX  RDF fault modeling, physical defects, gate oxide short
37Jian Liu, Rafic Z. Makki Power supply current detectability of SRAM defects. Search on Bibsonomy Asian Test Symposium The full citation details ... 1995 DBLP  DOI  BibTeX  RDF short-circuit currents, fault currents, power supply circuits, power supply current detectability, SRAM defects, SRAM cell, power supply current, I/sub DDQ/, quiescent power supply current, i/sub DDT/, transient power supply current, shorts, disturb-type pattern sensitivity, total current leakage, SRAM size, current detectability, large circuit effects, simulation, fault diagnosis, leakage currents, transients, SRAM chips, open defects, electric current measurement, physical defect
27Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor Test-Pattern Grading and Pattern Selection for Small-Delay Defects. Search on Bibsonomy VTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Small-delay defects, pattern grading, pattern selection, ATPG
27José Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura 0001 Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs. Search on Bibsonomy DATE The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
27Olivier Rizzo, Hanno Melzner Concurrent Wire Spreading, Widening, and Filling. Search on Bibsonomy DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
27Bram Kruseman, Stefan van den Oetelaar, Josep Rius 0001 Comparison of IDDQ Testing and Very-Low Voltage Testing. Search on Bibsonomy ITC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
27Bin Liu, Fabrizio Lombardi, Wei-Kang Huang Testing programmable interconnect systems: an algorithmic approach. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF programmable circuits, interconnected systems, programmable interconnect systems testing, algorithmic approach, programmable wiring networks, comprehensive fault model, network faults, open faults, switch faults, stuck-off faults, programming faults, minimal configuration number, node-disjoint path-sets, network adjacencies, post-processing algorithm, fault diagnosis, graphs, interconnections, fault detection, fault coverage, circuit analysis computing, stuck-at faults, switching, bridge faults, automatic test software, circuit testing, figure of merit, programming phases, stuck-on faults, short circuits
27Thomas W. Williams, Stephen K. Sunter How Should Fault Coverage Be Defined? Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
27Evanthia Papadopoulou, D. T. Lee Critical area computation via Voronoi diagrams. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
27Eugeni Isern 0001, Miquel Roca 0001, Jaume Segura 0001 Analyzing the Need for ATPG Targeting GOS Defects. Search on Bibsonomy VTS The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
27Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi Structural diagnosis of interconnects by coloring. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 1998 DBLP  DOI  BibTeX  RDF interconnect, diagnosis, graph coloring, syndrome, balanced code
27Evanthia Papadopoulou, D. T. Lee Critical area computation - a new approach. Search on Bibsonomy ISPD The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
27Yuejian Wu, Sanjay Gupta Built-In Self-Test for Multi-Port RAMs. Search on Bibsonomy Asian Test Symposium The full citation details ... 1997 DBLP  DOI  BibTeX  RDF Random Access Memory (RAM) test, multi-port RAM test, Built-In Self-Test (BIST)
27Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò Fault simulation of unconventional faults in CMOS circuits. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1991 DBLP  DOI  BibTeX  RDF
27T. Ghewala CrossCheck: A Cell Based VLSI Testability Solution. Search on Bibsonomy DAC The full citation details ... 1989 DBLP  DOI  BibTeX  RDF
25Chihyun Cho, Jae-Yong Kwon, Tae-Weon Kang, Hyunji Koo, Woohyun Chung Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty. Search on Bibsonomy IEEE Access The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
25Caroline Violot, Tugrulcan Elmas, Igor Bilogrevic, Mathias Humbert Shorts vs. Regular Videos on YouTube: A Comparative Analysis of User Engagement and Content Creation Trends. Search on Bibsonomy CoRR The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
25Rahul Kapoor, Nelishia Pillay A genetic programming approach to the automated design of CNN models for image classification and video shorts creation. Search on Bibsonomy Genet. Program. Evolvable Mach. The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
25Yi Yang, Hao Feng, Yiming Cheng, Zhu Han 0001 Emotion-Aware Scene Adaptation: A Bandwidth-Efficient Approach for Generating Animated Shorts. Search on Bibsonomy Sensors The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
25Caroline Violot, Tugrulcan Elmas, Igor Bilogrevic, Mathias Humbert Shorts vs. Regular Videos on YouTube: A Comparative Analysis of User Engagement and Content Creation Trends. Search on Bibsonomy WebSci The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
25Kurtis Ashcroft, Tony Robinson, Joan Condell, Victoria Penpraze, Andrew White, Stephen P. Bird An Investigation of Surface EMG Shorts-Derived Training Load during Treadmill Running. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
25Yue Cheng, Rodolphe Bailly, Bhushan Borotikar, Claire Scavinner-Dorval, Benjamin Fouquet, Douraied Ben Salem, Sylvain Brochard, François Rousseau 0002 Morphological analysis of ankle shorts bones of children with cerebral palsy: a comparative study. Search on Bibsonomy Medical Imaging: Image Processing The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
25Wyatt Olson, Freesoul El Shabazz-Thompson, Melanie Wells, Janey Yee, Julia R. Saimo, Bill Xiong, Brock Craft, Audrey Desjardins Exposing Tensions in Documentary Filmmaking for Design Research: The Inner Ear Shorts. Search on Bibsonomy Conference on Designing Interactive Systems (Companion Volume) The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
25Khadijeh Mohammad Naser, Sherin Alamassi, Zuhrieh A. Shanaa, Maryam Abualrish, Emad M. Alghazo, Eman Ali Zaitoun, Enas Said Abulibdeh, Azhar Shater Enhancing Postgraduate Learning Achievement: A Microlearning Approach with Reels and Shorts. Search on Bibsonomy SNAMS The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
25Natarajan Shanmugam, Srinivasan Gopal, Balasubramanian Madanmohan, S. P. Balaji, Rajesh Rajamani Diagnosis of Inter-Turn Shorts of Loaded Transformer Under Various Load Currents and Power Factors; Impulse Voltage-Based Frequency Response Approach. Search on Bibsonomy IEEE Access The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
25David Saucier, Samaneh Davarzani, Reuben F. Burch V., Harish Chander, Lesley Strawderman, Charles E. Freeman, Logan Ogden, Adam Petway, Aaron Duvall, Collin Crane, Anthony Piroli External Load and Muscle Activation Monitoring of NCAA Division I Basketball Team Using Smart Compression Shorts. Search on Bibsonomy Sensors The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
25Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. Search on Bibsonomy VTS The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
25Dániel Marx Four Shorts Stories on Surprising Algorithmic Uses of Treewidth. Search on Bibsonomy Treewidth, Kernels, and Algorithms The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
25Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. Search on Bibsonomy ITC The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
25Suman Kalyan Maity, Anshit E. Chaudhary, Animesh Mukherjee 0001 "Woman-Metal-White vs Man-Dress-Shorts": Combining Social, Temporal and Image Signals to Understand Popularity of Pinterest Fashion Boards. Search on Bibsonomy ICWSM The full citation details ... 2019 DBLP  BibTeX  RDF
25Suman Kalyan Maity, Anshit E. Chaudhary, Animesh Mukherjee 0001 "Woman-Metal-White vs Man-Dress-Shorts": Combining Social, Temporal and Image Signals to Understand Popularity of Pinterest Fashion Boards. Search on Bibsonomy CoRR The full citation details ... 2018 DBLP  BibTeX  RDF
25Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas A Time-Optimized Scheme Towards Analysis of Channel-Shorts in on-Chip Networks. Search on Bibsonomy J. Electron. Test. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
25Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas Charka: A reliability-aware test scheme for diagnosis of channel shorts beyond mesh NoCs. Search on Bibsonomy DATE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
25Jeff Chamberlain, Ben Dai, Kevin Vander Jagt, Ben Deda, Hunter Grant, Mike Hardison, David Stephens Blizzard Entertainment presents: the making of the "Overwatch Animated Shorts". Search on Bibsonomy SIGGRAPH Production Sessions The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
25Sivakumar Nadarajan, Sanjib Kumar Panda, Bicky Bhangu, Amit Kumar Gupta Online Model-Based Condition Monitoring for Brushless Wound-Field Synchronous Generator to Detect and Diagnose Stator Windings Turn-to-Turn Shorts Using Extended Kalman Filter. Search on Bibsonomy IEEE Trans. Ind. Electron. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
25Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks. Search on Bibsonomy MASCOTS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
25Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and Diagnosing Interconnect Shorts in On-chip Networks. Search on Bibsonomy HPCC/SmartCity/DSS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
25Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
25Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas, Bhargab B. Bhattacharya A topology-agnostic test model for link shorts in on-chip networks. Search on Bibsonomy SMC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
25Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas An on-line test solution for addressing interconnect shorts in on-chip networks. Search on Bibsonomy IOLTS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
25Alyssa Hyduk, Adam Worrall "Shorts last sunday, snow pants today": Delving into the information values of immigrant and expatriate users of twitter. Search on Bibsonomy ASIST The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
25Libor Pína, Jan Vobecký High-power silicon P-i-N diode with cathode shorts: The impact of electron irradiation. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
25Marianne Winslett Dennis Shasha speaks out: on how puzzles helped his career, what drives him to write, how we can help biologists, the principles underlying database tuning, why he wears shorts all year, and more. Search on Bibsonomy SIGMOD Rec. The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
25Isaac Kerlow Storytelling for computer-animated shorts. Search on Bibsonomy SIGGRAPH ASIA (Courses) The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
25C. J. Clark, Dave Dubberke, Kenneth P. Parker, Bill Tuthill Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
25Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu An Algorithm for Diagnosing Transistor Shorts Using Gate-level Simulation. Search on Bibsonomy IPSJ Trans. Syst. LSI Des. Methodol. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
25Marcos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski Diagnosis of interconnect shorts in mesh NoCs. Search on Bibsonomy NOCS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
25Fong-Yuan Chang, Ren-Song Tsay, Wai-Kei Mak How to consider shorts and guarantee yield rate improvement for redundant wire insertion. Search on Bibsonomy ICCAD The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
25Pablo Maqueda, Josep Rius 0001 Analysis of the extra delay on interconnects caused by resistive opens and shorts. Search on Bibsonomy IOLTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
25Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools. Search on Bibsonomy IEICE Trans. Inf. Syst. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
25Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
25Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator. Search on Bibsonomy ATS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
25Naveen Amblee, Tung X. Bui The Impact of Electronic-Word-of-Mouth on Digital Microproducts: An Empirical Investigation of Amazon Shorts. Search on Bibsonomy ECIS The full citation details ... 2007 DBLP  BibTeX  RDF
25Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Yuzo Takamatsu Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation. Search on Bibsonomy VLSI Design The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
25Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Sin-ya Kobayashi, Yuzo Takamatsu Diagnosis of Transistor Shorts in Logic Test Environment. Search on Bibsonomy ATS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
25Haixia Gao, Yintang Yang, Xiaohua Ma, Gang Dong Testing for Resistive Shorts in FPGA Interconnects. Search on Bibsonomy ISQED The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
25Masahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada A test circuit for pin shorts generating oscillation in CMOS logic circuits. Search on Bibsonomy Syst. Comput. Jpn. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
25Zaid Al-Ars, Ad J. van de Goor Static and dynamic behavior of memory cell array opens and shorts in embedded DRAMs. Search on Bibsonomy DATE The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
25Erik H. Ingermann, James F. Frenzel Behavior of a radiation-immune CMOS logic family under resistive shorts. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 1996 DBLP  DOI  BibTeX  RDF
25Pranab K. Nag, Wojciech Maly Hierarchical extraction of critical area for shorts in very large ICs. Search on Bibsonomy DFT The full citation details ... 1995 DBLP  DOI  BibTeX  RDF
25Richard McGowen, F. Joel Ferguson A Study of Undetectable Non-Feedback Shorts for the Purpose of Physical-DFT. Search on Bibsonomy EDAC-ETC-EUROASIC The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
25C.-J. Chen, Samiha Mourad Gate-to-channel shorts in BiCMOS logic gates. Search on Bibsonomy VTS The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
25Richard McGowen, F. Joel Ferguson Eliminating undetectable shorts between horizontal wires during channel routing. Search on Bibsonomy VTS The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
25Brian Chess, Anthony Freitas, F. Joel Ferguson, Tracy Larrabee Testing CMOS Logic Gates for Realistic Shorts. Search on Bibsonomy ITC The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
25Warren H. Debany Jr. Coverage of Node Shorts Using Internal Access and Equivalence Classes. Search on Bibsonomy VLSI Design The full citation details ... 1993 DBLP  DOI  BibTeX  RDF
25Warren H. Debany Jr. Measuring the coverage of node shorts by internal access methods. Search on Bibsonomy VTS The full citation details ... 1991 DBLP  DOI  BibTeX  RDF
25Hong Hao, Edward J. McCluskey "Resistive Shorts" Within CMOS Gates. Search on Bibsonomy ITC The full citation details ... 1991 DBLP  DOI  BibTeX  RDF
25Jerry M. Soden, Charles F. Hawkins Test Considerations for Gate Oxide Shorts in CMOS ICs. Search on Bibsonomy IEEE Des. Test The full citation details ... 1986 DBLP  DOI  BibTeX  RDF
25Jerry M. Soden, Charles F. Hawkins Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. Search on Bibsonomy ITC The full citation details ... 1986 DBLP  BibTeX  RDF
25Jerry M. Soden, Charles F. Hawkins Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. Search on Bibsonomy ITC The full citation details ... 1985 DBLP  BibTeX  RDF
25John M. Acken Testing for bridging faults (shorts) in CMOS circuits. Search on Bibsonomy DAC The full citation details ... 1983 DBLP  BibTeX  RDF
24Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle Transient power supply current monitoring - A new test method for CMOS VLSI circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 1995 DBLP  DOI  BibTeX  RDF Design for current-testability, drain/source opens, floating gates, shorts, transient power supply current
24Steven D. McEuen Reliability benefits of IDDQ. Search on Bibsonomy J. Electron. Test. The full citation details ... 1992 DBLP  DOI  BibTeX  RDF reliability, I DDQ, Gate oxide shorts
24Jaume A. Segura 0001, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio Quiescent current analysis and experimentation of defective CMOS circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 1992 DBLP  DOI  BibTeX  RDF Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts
14Qiang Xu 0001, Yubin Zhang, Krishnendu Chakrabarty SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF Core-based system-on-chip, test scheduling, test-access mechanism (TAM), interconnect testing
14Allen Sayegh, Peter Mabardi, David Register, Daniel Spann, Jonathan Lu, Amanda Parkes, S. Adrian Massey III Home, work, (play). Search on Bibsonomy CHI Extended Abstracts The full citation details ... 2009 DBLP  DOI  BibTeX  RDF hyper-reality, integration, gesture, spatial, augmented
14Pallav Gupta, Rui Zhang, Niraj K. Jha Automatic Test Generation for Combinational Threshold Logic Networks. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
14Khadidja Saidi, Youcef Remram, Mokhtar Attari Conception of an ultrasonic system for assistance to the diagnosis of the osteoporosis. Search on Bibsonomy EIT The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
14Jie Zhang 0007, Nishant Patil, Subhasish Mitra Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
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