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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 30 occurrences of 22 keywords
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Results
Found 17 publication records. Showing 17 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
57 | Albrecht P. Stroele |
Test response compaction using arithmetic functions. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
arithmetic functions, combinational faults, underflow, feed back, logic testing, built-in self test, digital arithmetic, test pattern generation, adders, circuits, registers, aliasing probability, overflow, subtracters, test response compaction, arithmetic logic units |
42 | Nikos Temenos, Paul P. Sotiriadis |
Nonscaling Adders and Subtracters for Stochastic Computing Using Markov Chains. |
IEEE Trans. Very Large Scale Integr. Syst. |
2021 |
DBLP DOI BibTeX RDF |
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42 | Ankita Nandi, Chandan Kumar Jha 0001, Joycee Mekie |
Tunable Inexact Subtracters for Division in Image Processing Applications. |
MWSCAS |
2020 |
DBLP DOI BibTeX RDF |
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42 | Yuko Hara, Hiroyuki Tomiyama, Shinya Honda, Hiroaki Takada, Katsuya Ishii |
Behavioral Synthesis of Double-Precision Floating-Point Adders with Function-Level Transformations: A Case Study. |
ICESS |
2007 |
DBLP DOI BibTeX RDF |
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42 | Oscar Gustafsson, Kenny Johansson, Håkan Johansson, Lars Wanhammar |
Implementation of Polyphase Decomposed FIR Filters for Interpolation and Decimation Using Multiple Constant Multiplication Techniques. |
APCCAS |
2006 |
DBLP DOI BibTeX RDF |
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42 | Trevor W. Fox, Laurence E. Turner |
The design of peak constrained least squares FIR filters with low complexity finite precision coefficients. |
ISCAS (2) |
2001 |
DBLP DOI BibTeX RDF |
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42 | Albrecht P. Stroele |
BIST Pattern Generators Using Addition and Subtraction Operations. |
J. Electron. Test. |
1997 |
DBLP DOI BibTeX RDF |
built-in self-test, adder, accumulator, pattern generator, subtracter |
21 | Oscar Gustafsson |
A Difference Based Adder Graph Heuristic for Multiple Constant Multiplication Problems. |
ISCAS |
2007 |
DBLP DOI BibTeX RDF |
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21 | A. Prasad Vinod 0001, Edmund Ming-Kit Lai |
Low power and high-speed implementation of fir filters for software defined radio receivers. |
IEEE Trans. Wirel. Commun. |
2006 |
DBLP DOI BibTeX RDF |
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21 | Håkan Johansson, Oscar Gustafsson, J. Johansson, Lars Wanhammar |
Adjustable Fractional-Delay FIR Filters Using the Farrow Structure and Multirate Techniques. |
APCCAS |
2006 |
DBLP DOI BibTeX RDF |
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21 | Keisuke Korekado, Takashi Morie, Osamu Nomura, Hiroshi Ando, Teppei Nakano, Masakazu Matsugu, Atsushi Iwata |
A Convolutional Neural Network VLSI for Image Recognition Using Merged/Mixed Analog-Digital Architecture. |
KES |
2003 |
DBLP DOI BibTeX RDF |
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21 | Mitsuru Yamada, Akinori Nishihara |
A high-speed FIR digital filter with CSD coefficients implemented on FPGA. |
ASP-DAC |
2001 |
DBLP DOI BibTeX RDF |
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21 | Dimitris Bakalis, Dimitris Nikolos, Haridimos T. Vergos, Xrysovalantis Kavousianos |
On Accumulator-Based Bit-Serial Test Response Compaction Schemes. |
ISQED |
2001 |
DBLP DOI BibTeX RDF |
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21 | Albrecht P. Stroele |
Synthesis for Arithmetic Built-In Self-Tes. |
VTS |
2000 |
DBLP DOI BibTeX RDF |
test configuration, built-in self-test, high-level synthesis, synthesis for testability, Accumulator |
21 | Yamin Li, Wanming Chu |
Implementation of single precision floating point square root on FPGAs. |
FCCM |
1997 |
DBLP DOI BibTeX RDF |
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21 | Albrecht P. Stroele |
Arithmetic Pattern Generators for Built-In Self-Test. |
ICCD |
1996 |
DBLP DOI BibTeX RDF |
Arithmetic functions, built-in self-test, design for testability, pattern generator |
21 | Mehdi Ehsanian, Bozena Kaminska, Karim Arabi |
A new digital test approach for analog-to-digital converter testing. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
digital test approach, analog/digital converter testing, BIST circuitry, offset error, gain error, DNL, INL, area overhead reduction, medium resolution ADC, high resolution pipelined ADC, A/D converter testing, differential nonlinearity, integral nonlinearity, 1.5 micron, VLSI, built-in self test, built-in self-test, integrated circuit testing, CMOS integrated circuits, CMOS technology, analogue-digital conversion |
Displaying result #1 - #17 of 17 (100 per page; Change: )
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