|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 12 occurrences of 12 keywords
|
|
|
Results
Found 1 publication records. Showing 1 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
36 | S. Lavabre, Yves Bertrand, Michel Renovell, Christian Landrault |
Test configurations to enhance the testability of sequential circuits. |
Asian Test Symposium |
1995 |
DBLP DOI BibTeX RDF |
shift operation, scan register, test operation, modified flip-flops, ISCAS89 benchmarks, multiconfiguration, triconfiguration, dynamic generation, logic testing, controllability, design for testability, design for testability, sequential circuits, sequential circuits, observability, observability, DFT, fault coverage, flip-flops, minimisation, scan designs, test application time, test vector |
Displaying result #1 - #1 of 1 (100 per page; Change: )
|
|