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Searching for wafermap with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1999-2023 (7)
Publication types (Num. hits)
article(1) inproceedings(6)
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Found 7 publication records. Showing 7 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
36Rajaa Alqudah, Amjed A. Al-Mousa, Yazan Abu Hashyeh, Omar Z. Alzaibaq A systemic comparison between using augmented data and synthetic data as means of enhancing wafermap defect classification. Search on Bibsonomy Comput. Ind. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
36Hamidreza Mahyar, Peter Tulala, Elahe Ghalebi, Radu Grosu DeepWafer: A Generative Wafermap Model with Deep Adversarial Networks. Search on Bibsonomy ICMLA The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
36Peter Yi-Yu Liao, Katherine Shu-Min Li, Leon Li-Yang Chen, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng, Nova Cheng-Yen Tsai, Leon Chou WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques. Search on Bibsonomy ITC The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
36Katherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques. Search on Bibsonomy ETS The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
36Peter Tulala, Hamidreza Mahyar, Elahe Ghalebi K., Radu Grosu Unsupervised Wafermap Patterns Clustering via Variational Autoencoders. Search on Bibsonomy IJCNN The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
36Emilio Miguelañez Martín, Ali M. S. Zalzala, Paul Tabor DIWA: device independent wafermap analysis. Search on Bibsonomy IEEE Congress on Evolutionary Computation The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
36Frederic Duvivier Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production. Search on Bibsonomy DFT The full citation details ... 1999 DBLP  DOI  BibTeX  RDF wafermap, spatial signature, automated data collection, yield
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