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Publication years (Num. hits)
1986-1997 (15) 1998-2001 (18) 2002-2003 (19) 2004 (15) 2005 (27) 2006-2007 (26) 2008 (24) 2009-2011 (17) 2012-2015 (17) 2016-2018 (17) 2019-2021 (21) 2022-2024 (15)
Publication types (Num. hits)
article(93) inproceedings(138)
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The graphs summarize 84 occurrences of 76 keywords

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Found 231 publication records. Showing 231 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
92Andrew B. Kahng, Ion I. Mandoiu, Xu Xu 0001, Alexander Zelikovsky Enhanced Design Flow and Optimizations for Multiproject Wafers. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
77Sampath Rangarajan, Donald S. Fussell, Miroslaw Malek Built-In Testing of Integrated Circuit Wafers. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 1990 DBLP  DOI  BibTeX  RDF integrated circuit wafers, silicon wafers, VLSI, integrated circuit testing, automatic testing, built-in testing, production testing
64Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan A nondestructive automated defect detection system for silicon carbide wafers. Search on Bibsonomy Mach. Vis. Appl. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
50Chien-Chang Chen, Wai-Kei Mak A multi-technology-process reticle floorplanner and wafer dicing planner for multi-project wafers. Search on Bibsonomy ASP-DAC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
50Meng-Chiou Wu, Rung-Bin Lin A Comparative Study on Dicing of Multiple Project Wafers. Search on Bibsonomy ISVLSI The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
50Meng-Chiou Wu, Rung-Bin Lin Reticle floorplanning of flexible chips for multi-project wafers. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2005 DBLP  DOI  BibTeX  RDF mask cost, multi-project wafer, reticle floorplanning, dicing
42Brian Moore 0001, Martin Margala, Christopher J. Backhouse Design of wireless on-wafer submicron characterization system. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
42Sameer T. Shikalgar, David Fronckowiak, Edward A. MacNair Wafer fabrication: 300mm wafer fabrication line simulation model. Search on Bibsonomy WSC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
41Meng-Chiou Wu, Rung-Bin Lin, Shih-Cheng Tsai Chip placement in a reticle for multiple-project wafer fabrication. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Multiple-project wafers (MPW), compatibility graph, reticle floorplanning, shuttle mask, wafer dicing, simulated annealing (SA), set cover, mixed-integer linear programming (MILP), conflict graph, set partition
41Royce L. S. Ching, Evangeline F. Y. Young Shuttle mask floorplanning with modified alpha-restricted grid. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2006 DBLP  DOI  BibTeX  RDF multi-project wafers, reticle design
41Andrew B. Kahng, Ion I. Mandoiu, Qinke Wang, Xu Xu 0001, Alexander Zelikovsky Multi-project reticle floorplanning and wafer dicing. Search on Bibsonomy ISPD The full citation details ... 2004 DBLP  DOI  BibTeX  RDF multi-project wafers, reticle design, wafer dicing
36Martin D. F. Wong Reticle Floorplanning with Guaranteed Yield for Multi-Project Wafers. Search on Bibsonomy ICCD The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
36D. Bhatia Restructuring wafers for maximum yield and some applications of WSI. Search on Bibsonomy SPDP The full citation details ... 1990 DBLP  DOI  BibTeX  RDF
28Jagadish Jampani, Scott J. Mason Column generation heuristics for multiple machine, multiple orders per job scheduling problems. Search on Bibsonomy Ann. Oper. Res. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Column generation, Semiconductor manufacturing, Machine scheduling
28Fehmi Tanrisever, Erhan Kutanoglu Forming and scheduling jobs with capacitated containers in semiconductor manufacturing: Single machine problem. Search on Bibsonomy Ann. Oper. Res. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Job formation, Multi-order jobs, Scheduling, Dynamic programming, Batching
28Chuan-Yu Chang, Hung-Jen Wang, Si-Yan Lin Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection. Search on Bibsonomy IEA/AIE The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
28Emilio Miguelañez Martín, Ali M. S. Zalzala, Paul Buxton Swarm intelligence in automated electrical wafer sort classification. Search on Bibsonomy Congress on Evolutionary Computation The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
28Adit D. Singh T2: Statistical Methods for VLSI Test and Burn-in Optimization. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
28Erik Hertzler, David Van Sickle 300mm time constrained queue loop management. Search on Bibsonomy WSC The full citation details ... 2005 DBLP  BibTeX  RDF
28Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng Using a self-organizing neural network for wafer defect inspection. Search on Bibsonomy SMC (5) The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
28Jun-ho Jeong, Young-suk Sim, Hyonkee Sohn, Eung-sug Lee UV Nanoimprint Lithography Using an Elementwise Embossed Stamp. Search on Bibsonomy ICMENS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
28Syed M. Alam, Donald E. Troxel, Carl V. Thompson A Comprehensive Layout Methodology and Layout-Specific Circuit Analyses for Three-Dimensional Integrated Circuits. Search on Bibsonomy ISQED The full citation details ... 2002 DBLP  DOI  BibTeX  RDF 3D integrated circuit, 3D IC layout, inter-wafer via, reliability CAD tool, FPGA, performance analysis, reliability analysis
28Frederic Duvivier Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production. Search on Bibsonomy DFT The full citation details ... 1999 DBLP  DOI  BibTeX  RDF wafermap, spatial signature, automated data collection, yield
28Frederick L. Taber An introduction to area array probing. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
28M. J. Little, R. David Etchells, Jan Grinberg, S. P. Laub, J. G. Nash, M. W. Yung The 3-D Computer. Search on Bibsonomy J. VLSI Signal Process. The full citation details ... 1990 DBLP  DOI  BibTeX  RDF
28José Pineda de Gyvez, Jochen A. G. Jess On the design and implementation of a wafer yield editor. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1989 DBLP  DOI  BibTeX  RDF
27Fred J. Meyer, Dhiraj K. Pradhan Modeling Defect Spatial Distribution. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 1989 DBLP  DOI  BibTeX  RDF defect spatial distribution modelling, center-satellite model, wafers, redundancy techniques, cluster, VLSI, fault tolerant computing, circuit CAD, fault-tolerant designs, yield models, WSI
22Qingshan Tang, Xinwei Huang, Yongqi Miao, Jiang Huang A robust algorithm for rapid pre-alignment of multiple types and sizes of wafers. Search on Bibsonomy Signal Image Video Process. The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
22Fei Yu, Min Xu, Junhua Wang, Xiangchao Zhang, Xinlan Tang Balancing the Efficiency and Sensitivity of Defect Inspection of Non-Patterned Wafers with TDI-Based Dark-Field Scattering Microscopy. Search on Bibsonomy Sensors The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
22Jun Dong, Chunming Ye Joint optimisation of uncertain distributed manufacturing and preventive maintenance for semiconductor wafers considering multi-energy complementary. Search on Bibsonomy Int. J. Prod. Res. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Qinghua Zhu 0001, GengHong Wang, NaiQi Wu, Yan Qiao, Yan Hou, MengChu Zhou, SiDe Zhao Scheduling Single-Arm Multicluster Tools for Two-Type Wafers With Lower-Bound Cycle Time. Search on Bibsonomy IEEE Trans. Syst. Man Cybern. Syst. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Francisco López de la Rosa, José L. Gómez-Sirvent, Rafael Morales 0001, Roberto Sánchez-Reolid, Antonio Fernández-Caballero 0001 Defect detection and classification on semiconductor wafers using two-stage geometric transformation-based data augmentation and SqueezeNet lightweight convolutional neural network. Search on Bibsonomy Comput. Ind. Eng. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Souvik Ghosh 0001, Quentin Smets, S. Banerjee, Tom Schram, K. Kennes, R. Verheyen, P. Kumar, M.-E. Boulon, Benjamin Groven, H. M. Silva, S. Kundu, Daire Cott, Dennis Lin, P. Favia, T. Nuytten, A. Phommahaxay, Inge Asselberghs, C. De La Rosa, Gouri Sankar Kar, Steven Brems Integration of epitaxial monolayer MX₂ channels on 300mm wafers via Collective-Die-To-Wafer (CoD2W) transfer. Search on Bibsonomy VLSI Technology and Circuits The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22GengHong Wang, Qinghua Zhu 0001, Yan Hou, Yan Qiao, NaiQi Wu, MengChu Zhou Optimally Scheduling Single-Arm Multicluster Tools for Manufacturing Hybrid-Type Wafers. Search on Bibsonomy SMC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Yun Gao, Noah Pestana, Skylar Deckoff-Jones, Jiajiu Zheng, Jordan Goldstein, Andrew M. Netherton, Ren-Jye Shiue, Michael R. Watts, Christopher V. Poulton Passive Integrated Athermal (De)Multiplexers on 300 mm Silicon Photonics Wafers. Search on Bibsonomy OFC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Luigi Fassio, Hoang Hong Hanh, Massimo Alioto A Resistor/Trimming-Less Self-Biased Current Reference Class with Area Down to $3,500\ \mu \mathrm{m}^{2}$, 42.8 pW Power and 10.4% Accuracy across Corner Wafers in 180 nm. Search on Bibsonomy A-SSCC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Hongwei Xu, Wei Qin, Youlong Lv, Jie Zhang 0041 Data-Driven Adaptive Virtual Metrology for Yield Prediction in Multibatch Wafers. Search on Bibsonomy IEEE Trans. Ind. Informatics The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Chen Shang, Kaiyin Feng, Eamonn T. Hughes, Andrew Clark, Mukul Debnath, Rosalyn Koscica, Gerald Leake, Joshua Herman, David Harame, Peter Ludewig, Yating Wan, John E. Bowers 0001 Electrically pumped quantum-dot lasers grown on 300 mm patterned Si photonic wafers. Search on Bibsonomy CoRR The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Sean Hooten, Mudit Jain, Thomas Van Vaerenbergh, Peng Sun, Quentin Wilmart, M. Ashkan Seyedi, Zhihong Huang, Marco Fiorentino, Raymond G. Beausoleil Inverse-Designed Dual Layer c-Si/SiN Vertical Grating Couplers Tested on 300mm Wafers. Search on Bibsonomy OECC/PSC The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Tingting Leng, Jufeng Wang, Chunfeng Liu 0003 Scheduling of single-arm cluster tools mixedly processing two kinds of wafers. Search on Bibsonomy ICNSC The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Ankit Gupta 0010, Adrita Barari, Damini, Keerthi Kiran Jagannathachar, Seungwoo Lee, Janghoon Oh, Jungha Kim, Min-Joo Kim Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering. Search on Bibsonomy VLSID The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Masahide Goto, Yuki Honda, Masakazu Nanba, Yoshinori Iguchi, Takuya Saraya, Masaharu Kobayashi, Eiji Higurashi, Hiroshi Toshiyoshi, Toshiro Hiramoto 3-Layer stacked pixel-parallel CMOS image sensors using hybrid bonding of SOI wafers. Search on Bibsonomy Imaging Sensors and Systems The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Yu-Kun Lin, Bing-Fei Wu Machine Learning-Based Wheel Monitoring for Sapphire Wafers. Search on Bibsonomy IEEE Access The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Hiroaki Kudo, Tetsuya Matsumoto, Kentaro Kutsukake, Noritaka Usami Occurrence Prediction of Dislocation Regions in Photoluminescence Image of Multicrystalline Silicon Wafers Using Transfer Learning of Convolutional Neural Network. Search on Bibsonomy IEICE Trans. Fundam. Electron. Commun. Comput. Sci. The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Yijian Jiang, Haoqi Tan, Yan Zhao Improving Optical and Electrical Properties of GaN Epitaxial Wafers and Enhancing Luminescent Properties of GaN-Based Light-Emitting-Diode with Excimer Laser Irradiation. Search on Bibsonomy Symmetry The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Thomas Olschewski Defect Detection on Semiconductor Wafers by Distribution Analysis. Search on Bibsonomy CoRR The full citation details ... 2021 DBLP  BibTeX  RDF
22Yuanyuan Yan, Qinghua Tao, Huangang Wang, Wenhui Fan Noncyclic Scheduling of Multi-cluster Tools with Multi-type Wafers Based on Pareto Optimization. Search on Bibsonomy ICCAE The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Geert H. van Kollenburg, Mike Holenderski, Patrizia Vasquez, Nirvana Meratnia Predictive discarding of wafers based on power leakage predictions from single layer misalignment data. Search on Bibsonomy ISM The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
22Kenneth M. Jabon, Christopher V. Poulton, Ren-Jye Shiue, Matthew J. Byrd, Zhan Su 0001, Mohammad H. Teimourpour, Scott Breitenstein, Ronald P. Millman, Dogan A. Atlas, Michael R. Watts, Erman Timurdogan Edge-Coupled Active and Passive Wafer-Scale Measurements on 300mm Silicon Photonics Wafers. Search on Bibsonomy OFC The full citation details ... 2021 DBLP  BibTeX  RDF
22Marwa Sayed Salem, Abdullah J. Alzahrani, Rabie A. Ramadan, Adwan Alanazi 0001, Ahmed Shaker, Mohamed Abouelatta, Christian Gontrand, Mohammed Elbanna, Abdelhalim Zekry Physically Based Analytical Model of Heavily Doped Silicon Wafers Based Proposed Solar Cell Microstructure. Search on Bibsonomy IEEE Access The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Rui Wang 0058, Nan Chen 0002 Defect pattern recognition on wafers using convolutional neural networks. Search on Bibsonomy Qual. Reliab. Eng. Int. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Ayumi Onaka-Masada, Takeshi Kadono, Ryosuke Okuyama, Ryo Hirose, Koji Kobayashi, Akihiro Suzuki, Yoshihiro Koga, Kazunari Kurita Reduction of Dark Current in CMOS Image Sensor Pixels Using Hydrocarbon-Molecular-Ion-Implanted Double Epitaxial Si Wafers. Search on Bibsonomy Sensors The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Christopher Hakoda, Eric S. Davis, Cristian Pantea, Vamshi Krishna Chillara Multi-Level Information Storage Using Engineered Electromechanical Resonances of Piezoelectric Wafers: A Concept Piezoelectric Quick Response (PQR) Code. Search on Bibsonomy Sensors The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Liang Zhu, Biao Mei, Weidong Zhu, Wei Li Laser-based Thickness Control in a Double-Side Polishing System for Silicon Wafers. Search on Bibsonomy Sensors The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Zining Wang, Masayoshi Tomizuka Precise 3D Calibration of Wafer Handling Robot by Visual Detection and Tracking of Elliptic-shape Wafers. Search on Bibsonomy ICRA The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Martin Kleindienst, Stefan Koch 0002, Markus Reichhartinger Model-based Temperature Control of a Continuous Flow Heater for Efficient Processing of Silicon Wafers. Search on Bibsonomy CCTA The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Kazunari Kurita, Takeshi Kadono, Satoshi Shigematsu, Ryo Hirose, Ryosuke Okuyama, Ayumi Onaka-Masada, Hidehiko Okuda, Yoshihiro Koga Proximity Gettering Design of Hydrocarbon-Molecular-Ion-Implanted Silicon Wafers Using Dark Current Spectroscopy for CMOS Image Sensors. Search on Bibsonomy Sensors The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Dervis Türkmen, Carina Dettenrieder, Pontus Forsberg, Andreas Mattsson, Fredrik Nikolajeff, Lars Österlund, Mikael Karlsson, Boris Mizaikoff Corrosion Detection by Infrared Attenuated Total Reflection Spectroscopy via Diamond-Like Carbon-Coated Silicon Wafers and Iron-Sensitive Dyes. Search on Bibsonomy Sensors The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Dong Liu 0011, Chek Sing Teo, Wenyu Liang, Kok Kiong Tan Soft-Acting, Noncontact Gripping Method for Ultrathin Wafers Using Distributed Bernoulli Principle. Search on Bibsonomy IEEE Trans Autom. Sci. Eng. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Akihisa Kubota Surface Finishing of Single-Crystal SiC and GaN Wafers Using a Magnetic Tool in H2O2 Solution. Search on Bibsonomy Int. J. Autom. Technol. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Kei Sumita, Jun Takeyasu, Kimihiko Kato, Kasidit Toprasertpong, Mitsuru Takenaka, Shinichi Takagi Fabrication of High Quality InAs-on-Lnsulator Structures by Smart Cut Process with Reuse of InAs Wafers. Search on Bibsonomy 3DIC The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Masahide Goto, Joeri De Vos, Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, Yoshinori Iguchi, Eiji Higurashi, Yuki Honda, Takuya Saraya, Masaharu Kobayashi, Hiroshi Toshiyoshi, Toshiro Hiramoto Triple-Layering Technology for Pixel-Parallel CMOS Image Sensors Developed by Hybrid Bonding of SOI Wafers. Search on Bibsonomy 3DIC The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Erman Timurdogan, Zhan Su 0001, Ren-Jye Shiue, Christopher V. Poulton, Matthew J. Byrd, Simon Xin, Michael R. Watts APSUNY Process Design Kit (PDKv3.0): O, C and L Band Silicon Photonics Component Libraries on 300mm Wafers. Search on Bibsonomy OFC The full citation details ... 2019 DBLP  BibTeX  RDF
22Qiang Huan, Mingtong Chen, Faxin Li A Comparative Study of Three Types Shear Mode Piezoelectric Wafers in Shear Horizontal Wave Generation and Reception. Search on Bibsonomy Sensors The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Corinna Kofler, Robert Muhr, Gunter Spöck Detecting Star Cracks in Topography Images of Specular Back Surfaces of Structured Wafers. Search on Bibsonomy ICMLA The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Junji Senzaki, Shohei Hayashi, Yoshiyuki Yonezawa, Hajime Okumura Challenges to realize highly reliable SiC power devices: From the current status and issues of SiC wafers. Search on Bibsonomy IRPS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Seungchul Lee, Daeyoung Kim Distributed-based Hierarchical Clustering System for Large-scale Semiconductor Wafers. Search on Bibsonomy IEEM The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Yanjun Lu, ChunRong Pan, Yan Qiao, Naiqi Wu, Yufeng Chen 0001 Petri net-based deadlock avoidance for single-arm cluster tools with concurrently processing two-type wafers. Search on Bibsonomy ICNSC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Eiji Higurashi, Ken Okumura, Yutaka Kunimune, Tadatomo Suga, Kei Hagiwara Room-Temperature Bonding of Wafers with Smooth Au Thin Films in Ambient Air Using a Surface-Activated Bonding Method. Search on Bibsonomy IEICE Trans. Electron. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Min-Seok Jang, Sung Woo Ma, Jongsoo Song, Myungmo Sung, Young-Ho Kim Adhesion of NCF to oxidized Si wafers after oxygen plasma treatment. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Jiwon Yang, Seung-kyung Lee, Seokho Kang 0001, Sungzoon Cho, Young-Hak Lee, Hae-Sang Park Ranking process parameter association with low yield wafers using spec-out event network analysis. Search on Bibsonomy Comput. Ind. Eng. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Tom Schram, Quentin Smets, Benjamin Groven, M. H. Heyne, E. Kunnen, A. Thiam, Katia Devriendt, Annelies Delabie, Dennis Lin, M. Lux, Daniele Chiappe, I. Asselberghs, S. Brus, Cedric Huyghebaert, S. Sayan, A. Juncker, Matty Caymax, Iuliana P. Radu WS2 transistors on 300 mm wafers with BEOL compatibility. Search on Bibsonomy ESSDERC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Romain Ritzenthaler, Hans Mertens, An De Keersgieter, Jérôme Mitard, Dan Mocuta, N. Horiguchi Isolation of nanowires made on bulk wafers by ground plane doping. Search on Bibsonomy ESSDERC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Arsham Abedini, Mahdi Ehsanian Defect detection on IC wafers based on neural network. Search on Bibsonomy ICM The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Corinna Kofler, Gunter Spöck, Robert Muhr Classifying defects in topography images of silicon wafers. Search on Bibsonomy WSC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Jipeng Wang, Chunrong Pan, Hesuan Hu, Yuan Zhou 0005 Scheduling of single-arm cluster tools with multi-type wafers and shared PMs. Search on Bibsonomy CASE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Pascual Muñoz Photonic integration in the palm of your hand: Generic technology and multi-project wafers, technical roadblocks, challenges and evolution. Search on Bibsonomy OFC The full citation details ... 2017 DBLP  BibTeX  RDF
22Chunrong Pan, Kun Zhao, Yi-Sheng Huang Schedulability analysis for dual-armed cluster tools with mixed-processing of multi-variety wafers. Search on Bibsonomy ICNSC The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Bahadir Tunaboylu Power Delivery Performance of Probe Test Systems for Semiconductor Wafers. Search on Bibsonomy IEEE Des. Test The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Amarendra Kumar, Kunal Kashyap, Max T. Hou, J. Andrew Yeh Mechanical Strength and Broadband Transparency Improvement of Glass Wafers via Surface Nanostructures. Search on Bibsonomy Sensors The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Luca Pirro, Irina Ionica, Sorin Cristoloveanu, Gérard Ghibaudo Low-frequency noise in bare SOI wafers: Experiments and model. Search on Bibsonomy ESSDERC The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
22Sukeshwar Kannan, Rahul Agarwal, Arnaud Bousquet, Geetha Aluri, Hui-Shan Chang Device performance analysis on 20nm technology thin wafers in a 3D package. Search on Bibsonomy IRPS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
22Qian Zhang, Boquan Li 0004, Zhi-quan Sun, Yu-Jun Li, Chang-yun Pan Solar Wafers Counting Based on Image Texture Feature. Search on Bibsonomy IGTA The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
22Kuldeep Shah, Eli Saber, Kevin Verrier Improved metrology of implant lines on static images of textured silicon wafers using line integral method. Search on Bibsonomy Image Processing: Machine Vision Applications The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
22M. R. Dodge, F. Shadman Computer modeling of surface interactions and contaminant transport in microstructures during the rinsing of patterned semiconductor wafers. Search on Bibsonomy Comput. Chem. Eng. The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
22Aref Bakhtazad, Rayyan Manwar, Sazzadur Chowdhury Cavity formation in bonded silicon wafers using partially cured dry etch bisbenzocyclobutene (BCB). Search on Bibsonomy LASCAS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
22Daivid Fowler, Charles Baudot, Jean-Marc Fedeli, B. Caire, Léopold Virot, A. Leliepvre, G. Grand, A. Myko, Delphine Marris-Morini, Sonia Messaoudene, Aurelie Souhaite, Ségolène Olivier, Philippe Grosse, Guang-Hua Duan, B. Ben Bakir, Frédéric Boeuf, Laurent Vivien, Sylvie Menezo Complete Si-photonics device-library on 300mm wafers. Search on Bibsonomy OFC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
22Harpreet Singh Grover, Francis P. Dawson, Dave M. Camm, Yann Cressault, Markus Lieberer Application of a plasma Arc lamp for thermal processing of semiconductor wafers. Search on Bibsonomy IAS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
22Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Serge N. Demidenko, Chris Chan Defect cluster recognition system for fabricated semiconductor wafers. Search on Bibsonomy Eng. Appl. Artif. Intell. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
22Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. Search on Bibsonomy IEEE Des. Test The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
22Hirokazu Fukidome, Yusuke Kawai, Hiroyuki Handa, Hiroki Hibino, Hidetoshi Miyashita, Masato Kotsugi, Takuo Ohkochi, Myung-Ho Jung, Tetsuya Suemitsu, Toyohiko Kinoshita, Taiichi Otsuji, Maki Suemitsu Site-Selective Epitaxy of Graphene on Si Wafers. Search on Bibsonomy Proc. IEEE The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
22Stefan Mitterhofer, Jakob D. Pühringer, Viktor Schlosser An acoustic set up for the vibration analysis of silicon wafers. Search on Bibsonomy IECON The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
22He-Yau Kang, Amy H. I. Lee, Chun-Mei Lai An integrated replenishment model with quantity discounts, reentry and downward substitution for control wafers. Search on Bibsonomy J. Intell. Manuf. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
22W. Heo, Nae-Eung Lee Effect of additive N2 and Ar gases on surface smoothening and fracture strength of Si wafers during high-speed chemical dry thinning. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
22Philippe Gaubert, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi The role of the temperature on the scattering mechanisms limiting the electron mobility in metal-oxide-semiconductor field-effect-transistors fabricated on (110) silicon-oriented wafers. Search on Bibsonomy ESSDERC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
22Bong-Jin Yum, Jae Hoon Koo, Seong-Jun Kim Analysis of defective patterns on wafers in semiconductor manufacturing: A bibliographical review. Search on Bibsonomy CASE The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
22Gloria Rodríguez-Verján, Eric Tartiere, Jacques Pinaton, Stéphane Dauzère-Pérès, Alexis Thieullen Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing. Search on Bibsonomy CASE The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
22Prem Pal, Kazuo Sato, Hirotaka Hida MEMS components with perfectly protected edges and corners in Si{110} wafers. Search on Bibsonomy MHS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
22Ozren Gamulin, Maja Balarin, Mile Ivanda, Marin Kosovic, Vedran Derek, Lara Mikac, Kristina Serec, Kresimir Furic, Dubravka Krilov Micro and nano structure of electrochemically etched silicon epitaxial wafers. Search on Bibsonomy MIPRO The full citation details ... 2011 DBLP  BibTeX  RDF
22Jian-Yang Lin, Pai-Yu Chang KOH anisotropic etching of Si wafers for LED electrode arrays. Search on Bibsonomy NEMS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
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