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Publication years (Num. hits)
1984-2006 (19) 2007-2008 (17) 2009-2011 (18) 2012-2017 (16) 2018-2022 (15) 2023-2024 (4)
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article(31) inproceedings(58)
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Found 89 publication records. Showing 89 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
58Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee Security refresh: prevent malicious wear-out and increase durability for phase-change memory with dynamically randomized address mapping. Search on Bibsonomy ISCA The full citation details ... 2010 DBLP  DOI  BibTeX  RDF dynamic address remapping, security, phase change memory, wear leveling
44Bianca Schroeder, Garth A. Gibson Understanding disk failure rates: What does an MTTF of 1, 000, 000 hours mean to you? Search on Bibsonomy ACM Trans. Storage The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Hard drive replacements, annual failure rates, annual replacement rates, datasheet MTTF, failure correlation, hard drive failure, infant mortality, storage reliability, time between failure, wear-out, MTTF
35Dongyoung Seo, Dongkun Shin WAM: Wear wear-out-aware memory management for SCRAM-based low power mobile systems. Search on Bibsonomy IEEE Trans. Consumer Electron. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
31Kazuyuki Suzuki, Mesbahul Alam, Takuji Yoshikawa, Wataru Yamamoto Two Methods for Estimating Product Lifetimes from only Warranty Claims Data. Search on Bibsonomy SSIRI The full citation details ... 2008 DBLP  DOI  BibTeX  RDF random failure, wear-out failure, usage time distribution, censoring distribution, Reliability
31John Y. Oliver, Rajeevan Amirtharajah, Venkatesh Akella, Frederic T. Chong Credit-based dynamic reliability management using online wearout detection. Search on Bibsonomy Conf. Computing Frontiers The full citation details ... 2008 DBLP  DOI  BibTeX  RDF wear-out, reliability
29Fan Yang, Chengqi Xiao, Jun Li 0062, Zhibing Sha, Zhigang Cai, Jianwei Liao 0001 Out-of-channel data placement for balancing wear-out and I/O workloads in RAID-enabled SSDs. Search on Bibsonomy DATE The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
25Andrea Marongiu, Andrea Acquaviva, Luca Benini OpenMP Support for NBTI-Induced Aging Tolerance in MPSoCs. Search on Bibsonomy SSS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
25Jin Sun 0006, Avinash Karanth Kodi, Ahmed Louri, Janet Meiling Wang NBTI aware workload balancing in multi-core systems. Search on Bibsonomy ISQED The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
25Abhishek Pillai, Wei Zhang 0002, Dimitrios Kagaris Detecting VLIW Hard Errors Cost-Effectively through a Software-Based Approach. Search on Bibsonomy AINA Workshops (1) The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
25Dennis Sylvester, David T. Blaauw, Eric Karl ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF unpredictable silicon, runtime self-diagnosis, adaptivity, architecture, process variations, self-healing, ElastIC, technology scaling
25Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers The Case for Lifetime Reliability-Aware Microprocessors. Search on Bibsonomy ISCA The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
23Stuart E. Schechter, Gabriel H. Loh, Karin Strauss, Doug Burger Use ECP, not ECC, for hard failures in resistive memories. Search on Bibsonomy ISCA The full citation details ... 2010 DBLP  DOI  BibTeX  RDF hard failures, resistive memories, memory, error correction, phase change memory
23Ohhoon Kwon, Jaewoo Lee, Kern Koh EF-Greedy: A Novel Garbage Collection Policy for Flash Memory Based Embedded Systems. Search on Bibsonomy International Conference on Computational Science (4) The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Embedded systems, Garbage collection, Flash memory
23Ohhoon Kwon, Yeonseung Ryu, Kern Koh An Efficient Garbage Collection Policy for Flash Memory Based Swap Systems. Search on Bibsonomy ICCSA (1) The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Swap systems, Garbage collection, Flash memory
22Yingzhou Peng, Haoran Wang, Huai Wang A Method for Separation of Power Semiconductor Packaging-Related Wear-Out Mechanisms Under Converter Operation. Search on Bibsonomy IEEE Trans. Ind. Electron. The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
22Isabel Martón, Ana Isabel Sánchez, Sofía Carlos, Rubén Mullor, Sebastián Martorell Prognosis of wear-out effect on of safety equipment reliability for nuclear power plants long-term safe operation. Search on Bibsonomy Reliab. Eng. Syst. Saf. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22María Dolores Berrade, E. Calvo, Francisco Germán Badía Maintenance of systems with critical components. Prevention of early failures and wear-out. Search on Bibsonomy Comput. Ind. Eng. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
22Jegadeeshwaran Rakkiyannan, Lakshmipathi Jakkamputi, Mohanraj Thangamuthu, Abhishek D. Patange, Sakthivel Gnanasekaran Development of Online Tool Wear-Out Detection System Using Silver-Polyester Thick Film Sensor for Low-Duty Cycle Machining Operations. Search on Bibsonomy Sensors The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Alexander Teverovsky Infant Mortality and Wear-Out Failures in Polymer and MnO2 Tantalum Capacitors. Search on Bibsonomy IRPS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
22Ana Cláudia Souza Vidal de Negreiros, Isis Didier Lins, Márcio José das Chagas Moura, Enrique López Droguett Reliability data analysis of systems in the wear-out phase using a (corrected) q-Exponential likelihood. Search on Bibsonomy Reliab. Eng. Syst. Saf. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Flavia Dalia Frumosu, Georg Ørnskov Rønsch, Murat Kulahci Mould wear-out prediction in the plastic injection moulding industry: a case study. Search on Bibsonomy Int. J. Comput. Integr. Manuf. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Chang Liu 0010, Eric Schneider, Hans-Joachim Wunderlich Using Programmable Delay Monitors for Wear-Out and Early Life Failure Prediction. Search on Bibsonomy DATE The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
22Yanfeng Shen, Andrii Chub, Huai Wang, Dmitri Vinnikov, Elizaveta Liivik, Frede Blaabjerg Wear-Out Failure Analysis of an Impedance-Source PV Microinverter Based on System-Level Electrothermal Modeling. Search on Bibsonomy IEEE Trans. Ind. Electron. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Takatoshi Sugiyama, Toru Ogura, Takakazu Sugiyama Estimation of the threshold parameter of a wear-out failure period in the case of a three-parameter Weibull distribution. Search on Bibsonomy Int. J. Knowl. Eng. Soft Data Paradigms The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Ting-Yi Wu, Lav R. Varshney, Vincent Y. F. Tan On the Throughput of Channels That Wear Out. Search on Bibsonomy IEEE Trans. Commun. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Nikos Foutris, Christos Kotselidis, Mikel Luján Simulating Wear-out Effects of Asymmetric Multicores at the Architecture Level. Search on Bibsonomy DFT The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
22Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. Search on Bibsonomy IET Circuits Devices Syst. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Michal Baszynski, P. Rydygier, Mariusz Wojcik Experimental studies of: Laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Chang Liu 0010, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. Search on Bibsonomy ATS The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Elizaveta Liivik, Andrii Chub, Ariya Sangwongwanich, Yanfeng Shen, Dmitri Vinnikov, Frede Blaabjerg Wear-Out Failure Analysis of Solar Optiverter Operating with 60- and 72-Cell Si Crystalline PV Modules. Search on Bibsonomy IECON The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun 0001, Sheldon X.-D. Tan Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires. Search on Bibsonomy SMACD The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Patrick Cronin, Chengmo Yang, Yongpan Liu A collaborative defense against wear out attacks in non-volatile processors. Search on Bibsonomy DAC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
22Graeme Jenkinson It's Better to Rust Than Wear Out. Search on Bibsonomy login Usenix Mag. The full citation details ... 2017 DBLP  BibTeX  RDF
22Haiyu Mao, Xian Zhang 0001, Guangyu Sun 0003, Jiwu Shu Protect non-volatile memory from wear-out attack based on timing difference of row buffer hit/miss. Search on Bibsonomy DATE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Xiaojian Liu, Chenrui Wu, Lemiao Qiu, Yang Wang, Shuyou Zhang 0001 A geometric errors analysis method integrated clamping error and wear out error over working space. Search on Bibsonomy CASE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
22Yohwan Choi, Hongseok Kim Optimal scheduling of energy storage system for self-sustainable base station operation considering battery wear-out cost. Search on Bibsonomy ICUFN The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. Search on Bibsonomy ESSCIRC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Fabian Paschke, Christian Bayer 0002, Olaf Enge-Rosenblatt A generic approach for detection of wear-out situations in machine subsystems. Search on Bibsonomy ETFA The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
22Alf Inge Wang The wear out effect of a game-based student response system. Search on Bibsonomy Comput. Educ. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
22Laurent Doyen 0002 Semi-parametric estimation of Brown-Proschan preventive maintenance effects and intrinsic wear-out. Search on Bibsonomy Comput. Stat. Data Anal. The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
22Huang-Chen Lee, Yu-Chang Chang, Yen-Shuo Huang A Reliable Wireless Sensor System for Monitoring Mechanical Wear-Out of Parts. Search on Bibsonomy IEEE Trans. Instrum. Meas. The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
22Caio Hoffman, Luiz Ramos, Rodolfo Azevedo, Guido Araujo Wear-out analysis of Error Correction Techniques in Phase-Change Memory. Search on Bibsonomy DATE The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
22Hyungjun Kim, Arseniy Vitkovskiy, Paul V. Gratz, Vassos Soteriou Use it or lose it: wear-out and lifetime in future chip multiprocessors. Search on Bibsonomy MICRO The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
22Parthasarathy M. B. Rao, Abdulazim Amouri, Saman Kiamehr, Mehdi Baradaran Tahoori Altering LUT configuration for wear-out mitigation of FPGA-mapped designs. Search on Bibsonomy FPL The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
22Angel Cuadras, Victoria-Julia Ovejas, Marcos Quilez Entropy as a wear out indicator: The resistor example. Search on Bibsonomy SSD The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
22Laurent Doyen 0002 Reliability analysis and joint assessment of Brown-Proschan preventive maintenance efficiency and intrinsic wear-out. Search on Bibsonomy Comput. Stat. Data Anal. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
22Matthew Beckler, R. D. (Shawn) Blanton On-chip diagnosis for early-life and wear-out failures. Search on Bibsonomy ITC The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
22Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out. Search on Bibsonomy IEEE Micro The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
22Urban Ingelsson, Shih-Yen Chang, Erik Larsson Measurement point selection for in-operation wear-out monitoring. Search on Bibsonomy DDECS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
22Yangyang Pan, Guiqiang Dong, Tong Zhang 0002 Exploiting Memory Device Wear-Out Dynamics to Improve NAND Flash Memory System Performance. Search on Bibsonomy FAST The full citation details ... 2011 DBLP  BibTeX  RDF
22Qi Wu 0006, Guiqiang Dong, Tong Zhang 0002 Exploiting Heat-Accelerated Flash Memory Wear-Out Recovery to Enable Self-Healing SSDs. Search on Bibsonomy HotStorage The full citation details ... 2011 DBLP  BibTeX  RDF
22Jayakrishnan V. Iyer, Heeyeol Yu, Hogil Kim, Eun Jung Kim 0001, Ki Hwan Yum, Pyeong Soo Mah Assuring K-coverage in the presence of mobility and wear-out failures in wireless sensor networks. Search on Bibsonomy Int. J. Sens. Networks The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
22Shin Yoo, Mark Harman, Shmuel Ur Measuring and Improving Latency to Avoid Test Suite Wear Out. Search on Bibsonomy ICST Workshops The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
22P. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
22T. Pompl, A. Kerber, M. Röhner, Martin Kerber Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
22Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. Search on Bibsonomy ETS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
22Ketut Buda Artana, Kenji Ishida Spreadsheet modeling of optimal maintenance schedule for components in wear-out phase. Search on Bibsonomy Reliab. Eng. Syst. Saf. The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
22Frederic Monsieur, E. Vincent, G. Pananakakis, Gérard Ghibaudo Wear-out, breakdown occurrence and failure detection in 18-25 Å ultrathin oxides. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
22S. Bruyère, David Roy 0001, E. Robilliart, E. Vincent, Gérard Ghibaudo Body effect induced wear-out acceleration in ultra-thin oxides. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
22Gwan S. Choi, Ravishankar K. Iyer Wear-Out Simulation Environment for VLSI Designs. Search on Bibsonomy FTCS The full citation details ... 1993 DBLP  DOI  BibTeX  RDF
22S. Zacks Estimating the Shift to Wear-Out of Systems Having Exponential-Weibull Life Distributions. Search on Bibsonomy Oper. Res. The full citation details ... 1984 DBLP  DOI  BibTeX  RDF
14Joe Sullivan, Conor Ryan A Destructive Evolutionary Algorithm Process. Search on Bibsonomy FBIT The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
14Cecilia Metra, Martin Omaña 0001, Daniele Rossi 0001, José Manuel Cazeaux, T. M. Mak Path (Min) Delay Faults and Their Impact on Self-Checking Circuits' Operation. Search on Bibsonomy IOLTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
12Mehmet Basoglu, Michael Orshansky, Mattan Erez NBTI-aware DVFS: a new approach to saving energy and increasing processor lifetime. Search on Bibsonomy ISLPED The full citation details ... 2010 DBLP  DOI  BibTeX  RDF wearout, energy efficiency, process variation, DVFS, NBTI
12Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson Energy-efficient redundant execution for chip multiprocessors. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2010 DBLP  DOI  BibTeX  RDF redundant execution, microarchitecture, transient faults, permanent faults
12Mahesh Balakrishnan 0001, Asim Kadav, Vijayan Prabhakaran, Dahlia Malkhi Differential RAID: rethinking RAID for SSD reliability. Search on Bibsonomy EuroSys The full citation details ... 2010 DBLP  DOI  BibTeX  RDF RAID, flash, SSD
12David Roberts, Taeho Kgil, Trevor N. Mudge Integrating NAND flash devices onto servers. Search on Bibsonomy Commun. ACM The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
12Ulya R. Karpuzcu, Brian Greskamp, Josep Torrellas The BubbleWrap many-core: popping cores for sequential acceleration. Search on Bibsonomy MICRO The full citation details ... 2009 DBLP  DOI  BibTeX  RDF power wall, process scaling, processor aging, voltage scaling
12Diogo José Costa Alves, Edna Barros A logic built-in self-test architecture that reuses manufacturing compressed scan test patterns. Search on Bibsonomy SBCCI The full citation details ... 2009 DBLP  DOI  BibTeX  RDF LBIST, compressed test patterns, test, SoC, self-test
12Henning Klein, Jörg Keller 0001 Storage architecture with integrity, redundancy and encryption. Search on Bibsonomy IPDPS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
12Joseph Hassoun Resiliency in Elemental Computing. Search on Bibsonomy ARC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
12Joe Kelly, Dean Nicholson, Edwin Lowery, Victor Grothen Light-Enhanced FET Switch Improves ATE RF Power Settling. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF FET, RF switch, power settling, HVM, high-volume manufacturing, ATE, test time, settling time
12Ajit Ashok Shenvi Design for six sigma: software product quality. Search on Bibsonomy ISEC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF CTQs, DFSS, black belt, cost of non-quality, risk-benefit, voice of customer, FMEA
12Xin Fu, Tao Li 0006, José A. B. Fortes NBTI tolerant microarchitecture design in the presence of process variation. Search on Bibsonomy MICRO The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
12Marcus Furuholmen, Kyrre Glette, Jim Tørresen, Mats Høvin Indirect Online Evolution - A Conceptual Framework for Adaptation in Industrial Robotic Systems. Search on Bibsonomy ICES The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
12Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. Search on Bibsonomy VLSI Design The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
12Kypros Constantinides, Stephen Plaza, Jason A. Blome, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Bin Zhang 0011, Michael Orshansky Architecting a reliable CMP switch architecture. Search on Bibsonomy ACM Trans. Archit. Code Optim. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF CMP switch, reliability, defect-tolerance
12Philip M. Wells, Koushik Chakraborty, Gurindar S. Sohi Adapting to Intermittent Faults in Future Multicore Systems. Search on Bibsonomy PACT The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
12Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kypros Constantinides, Valeria Bertacco, Todd M. Austin Low-cost protection for SER upsets and silicon defects. Search on Bibsonomy DATE The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
12Joe Sullivan, Conor Ryan A destructive evolutionary process: a pilot implementation. Search on Bibsonomy GECCO The full citation details ... 2007 DBLP  DOI  BibTeX  RDF silicon design, reliability, experimentation, flash memory
12Mohammed G. Khatib, Berend-Jan van der Zwaag, Pieter H. Hartel, Gerard J. M. Smit Interposing Flash between Disk and DRAM to Save Energy for Streaming Workloads. Search on Bibsonomy ESTIMedia The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
12Kypros Constantinides, Stephen Plaza, Jason A. Blome, Bin Zhang 0011, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Michael Orshansky BulletProof: a defect-tolerant CMP switch architecture. Search on Bibsonomy HPCA The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
12Paul L. Master Reconfigurable Hardware and Software Architectural Constructs for the Enablement of Resilient Computing Systems. Search on Bibsonomy ASAP The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
12Qin Xin 0005, Thomas J. E. Schwarz, Ethan L. Miller Disk Infant Mortality in Large Storage Systems. Search on Bibsonomy MASCOTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
12Yi Zou, Krishnendu Chakrabarty Fault-Tolerant Self-organization in Sensor Networks. Search on Bibsonomy DCOSS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
12Chandu Visweswariah Statistical analysis and design: from picoseconds to probabilities. Search on Bibsonomy SBCCI The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
12Alenka Brezavscek, Alenka Hudoklin Joint optimization of block-replacement and periodic-review spare-provisioning policy. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
12Peter May, Keith Mander, Jon Timmis Software Vaccination: An Artificial Immune System Approach to Mutation Testing. Search on Bibsonomy ICARIS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
12Ralph H. J. M. Otten, Raul Camposano, Patrick Groeneveld Design Automation for Deepsubmicron: Present and Future. Search on Bibsonomy DATE The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
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