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Found 1201 publication records. Showing 1201 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi |
A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs.  |
IRPS  |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Jiyoung Yoon, Bumgi Lee, Jaehee Song, Bokyoung Kang, Sangho Lee, Doh-Soon Kwak, Heonsang Lim, Ilsang Park, Jonghoon Kim, Sangwoo Pae |
Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | M. Y. Li, J. P. Lee, C. H. Liu, J. C. Guo, Steve S. Chung |
A World First QLC RRAM: Highly Reliable Resistive-Gate Flash with Record 108 Endurance and Excellent Retention. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Ryan Lu, Yao-Chun Chuang, Jyun-Lin Wu, Jun He |
Reliability Challenges from 2.5D to 3DIC in Advanced Package Development. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Xinyi Zhang, Kewei Wang, Fang Wang, Jiangjiang Li, Zhicheng Wu, Duoli Li, Bo Li, Jianhui Bu, Zhengsheng Han |
Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | N. Said, Kathia Harrouche, Farid Medjdoub, Nathalie Labat, Jean-Guy Tartarin, Nathalie Malbert |
Thermal and statistical analysis of various AlN/GaN HEMT geometries for millimeter Wave applications. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | L. Cattaneo, Matteo Baldo, Nicola Lepri, Flavio Sancandi, Massimo Borghi, Elisa Petroni, A. Serafini, Roberto Annunziata, Andrea Redaelli, Daniele Ielmini |
Enhancing reliability of a strong physical unclonable function (PUF) solution based on virgin-state phase change memory (PCM). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Chao-Yang Ke, Yu-Chia Tsui, Bing-Yue Tsui, Ming-Dou Ker |
Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Kang Yang, Suhui Yang, Yan Ouyang, Shengwei Yang, Kun Han, Yi He |
Stress Migration of Aluminum Backside Interconnect in Xtacking®. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Hossein Sarbishaei, Vladislav A. Vashchenko |
ESD Avalanche Diodes Degradation in EOS Regime. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Simon Van Beek, Kaiming Cai, Kaiquan Fan, Giacomo Talmelli, Anna Trovato, Nico Jossart, Siddharth Rao, Adrian Vaisman Chasin, Sebastien Couet |
MTJ degradation in multi-pillar SOT-MRAM with selective writing. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Peter Moens, F. Geenen, L. De Schepper, JF Cano, J. Lettens, S. Maslougkas, J. Franchi, Martin Domeij |
The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Rachael J. Parker, Jyothi Bhaskarr Velamala, Kuan-Yueh James Shen, David Johnston, Yao-Feng Chang, Stephen M. Ramey, Siang-jhih Sean Wu, Padma Penmatsa |
A Physical Unclonable Function Leveraging Hot Carrier Injection Aging. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Pradeep Lall, Ved Soni, Guneet Sethi, Kok Yiang |
Estimation of SOH Degradation of Coin Cells Subjected to Accelerated Life Cycling with Randomized Cycling Depths and C-Rates. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Rajarshi Roy Chaudhuri, Vipin Joshi, Amratansh Gupta, Tanmay Joshi, Rasik Rashid Malik, Mehak Ashraf Mir, Sayak Dutta Gupta, Mayank Shrivastava |
Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Jason Jopling |
Risk Management Informed by an Uncertain Bathtub Curve (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Patrick Fiorenza, Francesco Cordiano, Mario Santo Alessandrino, Alfio Russo, Edoardo Zanetti, Mario Saggio, C. Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte |
Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Rakesh Ranjan, Pavitra Ramadevi Perepa, Ki-Don Lee, Hokyung Park, Peter Kim, Ganesh Chakravarthy Yerubandi, Jon Haefner, Caleb Dongkyun Kwon, Minjung Jin, Wenhao Zhou, Hyewon Shim, Shin-Young Chung |
Impact of Barrier Metal Thickness on SRAM Reliability. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Milan Pesic, Bastien Beltrando, Tommaso Rollo, Cristian Zambelli, Andrea Padovani, Rino Micheloni, Rita Maji, Lisa Enman, Mark Saly, Yang Ho Bae, Jung Bae Kim, Dong Kil Yim, Luca Larcher |
Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Huimei Zhou, Miaomiao Wang 0006, Nicolas Loubet, Andrew Gaul, Yasir Sulehria |
Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | R. Green, A. Lelis, D. Urciuoli, E. Schroen, D. Habersat |
Dynamic On-State Resistance in SiC MOSFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | P. Srinivasan 0002, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik |
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | William Vandendaele, Camille Leurquin, R. Lavieville, Marie-Anne Jaud, Abygaël Viey, Romain Gwoziecki, B. Mohamad, E. Nowak, A. Constant, Ferdinando Iucolano |
Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Rasik Rashid Malik, Vipin Joshi, Rajarshi Roy Chaudhuri, Mehak Ashraf Mir, Zubear Khan, Avinas N. Shaji, Madhura Bhattacharya, Anup T. Vitthal, Mayank Shrivastava |
Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae |
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | J. Tan, J. H. Lim, Jae Hyun Kwon, Vinayak Bharat Naik, Nagarajan Raghavan, Kin Leong Pey |
Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Takamasa Hamai, Kunifumi Suzuki, Reika Ichihara, Yusuke Higashi, Yoko Yoshimura, Kiwamu Sakuma, Kensuke Ota, Kota Takahashi, Kazuhiro Matsuo, Shosuke Fujii, Masumi Saitoh |
Novel Operation Scheme for Suppressing Disturb in HfO2-based FeFET Considering Charge- Trapping-Coupled Polarization Dynamics. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Weiman Yan, Ernest Wu, Alexander G. Schwing, Elyse Rosenbaum |
Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Hyeongseok Oh, Myungsun Chun, Jiwon Lee, Shi-Jie Wen, Nick Yu, Byung-Gun Park, Sanghyeon Baeg |
Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Joycelyn Hai, Florian Cacho, X. Federspiel, Tidjani Garba-Seybou, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould |
Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Jatin, M. Monishmurali, Mayank Shrivastava |
Multi-finger turn-on: A potential cause of premature failure in Drain Extended HV Nanosheet Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Xinyi Xu, Hongchao Zhang, Chuanpeng Jiang, Jinhao Li, Shiyang Lu, Yunpeng Li, Honglei Du, Xueying Zhang, Zhaohao Wang, Kaihua Cao, Weisheng Zhao, Shuqin Lyu, Hao Xu, Bonian Jiang, Le Wang, Bowen Man, Cong Zhang, Dandan Li, Shuhui Li, Xiaofei Fan, Gefei Wang, Hong-xi Liu |
Full reliability characterization of three-terminal SOT-MTJ devices and corresponding arrays. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Y. L. Yang, P. C. Tsao, C. W. Lin, Ross Lee, Olivia Ni, T. T. Chen, Y. J. Ting, C. T. Lai, Jason Yeh, Arnold Yang, Wayne Huang 0003, Peng Chen, Charly Tsai, Ryan Yang, Y. S. Huang, B. C. Hsu, M. Z. Lee, T. H. Lee, Michael Huang, Coming Chen, Liham Chu, H. W. Kao, N. S. Tsai |
Performing Machine Learning Based Outlier Detection for Automotive Grade Products. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Yuchong Wang, Siyuan Chen, Fanyu Liu, Bo Li 0051, Jiangjiang Li, Yang Huang, Tiexin Zhang, Xu Zhang, Zhengsheng Han, Tianchun Ye 0001, Jing Wan |
The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Marek Skowronski |
Material instabilities in the TaOx-based resistive switching devices (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Christian Schwabe, Xing Liu, Tobias N. Wassermann, Paul Salmen, Thomas Basler |
SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Elena Mengotti, Enea Bianda, David Baumann, Gerd Schlottig, Francisco Canales |
Industrial approach to the chip and package reliability of SiC MOSFETs (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Emmanuel Bender, Joseph B. Bernstein, Duane S. Boning |
The Effects of Process Variations and BTI in Packaged FinFET Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Yue Xi, Xinyi Li, Junhao Chen, Ruofei Hu, Qingtian Zhang, Zhixing Jiang, Feng Xu, Jianshi Tang |
Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | S. Q. Zhang, Y. S. Sun, D. Gao, H. Jiang, Z. Q. Yu, H. Zheng, J. L. Huang |
Investigation of Channel Dimension Dependence of BTI Degradation and Variation in Planar HKMG MOSFET. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Simon Thomann, Albi Mema, Kai Ni 0004, Hussam Amrouch |
Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | In-Hwan Ji, Anoop Mathew, Jae-Hyung Park, Neal Oldham, Matthew McCain, Shadi Sabri, Edward Van Brunt, Brett Hull, Daniel J. Lichtenwalner, Donald A. Gajewski, John W. Palmour |
High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum |
Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | SungMan Rhee, Hyunjin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shin-Young Chung |
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Balaji Narasimham, H. Luk, C. Paone, A-R. Montoya, T. Riehle, Mike Smith, Liming Tsau |
Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Ansh, Mayank Shrivastava |
Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken |
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Yueying Liu, John Wood, Zongyang Hu, Satyaki Ganguly, Jeremy Fisher, Mike Watts, Scott T. Sheppard, Donald A. Gajewski, Basim Noori |
GaN HEMTs Design and Modeling for 5G. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | X. Federspiel, A. Griffon, M. Barlas, P. Lamontagne |
Effect of Frequency on Reliability Of High-K MIM Capacitors. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | K. Joshi, D. Nminibapiel, M. Ghoneim, D. Ali, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey |
A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao |
A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Mathieu Sicre, X. Federspiel, Bastien Mamdy, David Roy 0001, Françis Calmon |
Characterization and modeling of DCR and DCR drift variability in SPADs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Sungmock Ha, S. Lee, G. H. Bae, D. S. Lee, S. H. Kim, B. W. Woo, N.-H. Lee, Y. S. Lee, S. Pae |
Reliability Characterization of HBM featuring $\text{HK}+\text{MG}$ Logic Chip with Multi-stacked DRAMs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | L. Panarella, Ben Kaczer, Quentin Smets, Devin Verreck, Tom Schram, Daire Cott, Dennis Lin, Stanislav Tyaginov, I. Asselberghs, Cesar J. Lockhart de la Rosa, Gouri Sankar Kar, Valeri Afanas'ev |
Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang |
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Colin Landon, Lei Jiang, Daniel Pantuso, Inanc Meric, Kam Komeyli, Jeffrey Hicks, Daniel Schroeder |
Localized thermal effects in Gate-all-around devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Tiang Teck Tan, Yu-Yun Wang, Joel Tan, Tian-Li Wu, Nagarajan Raghavan, Kin Leong Pey |
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Meindert Lunenborg, Tomasz Brozek, Laura Lorenzi, Christoph Dolainsky, Violet Liu, Xiaoyi Feng |
Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Kazutoshi Kobayashi, Tomoharu Kishita, Hiroki Nakano, Jun Furuta, Mitsuhiko Igarashi, Shigetaka Kumashiro, Michitarou Yabuuchi, Hironori Sakamoto |
Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Yusuf Cinar, Junghoon Kim, Eunho Oh, Sungki Lee, Changsik Kwon, Jonggyu Park |
Analysis of SSD Acoustic Noise Generation Mechanism depending on NAND operation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Hyewon Seo, Taiuk Rim, Eunsun Lee, Sekyoung Jang, Kyosuk Chae, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee |
Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Aarti Rathi, Abhisek Dixit, Naga Satish, P. Srinivasan 0002, Fernando Guarin |
Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Christian Bogner, Christian Schlünder, Michael Waltl, Hans Reisinger, Tibor Grasser |
Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Yiming Qu, Chu Yan, Xinwei Yu, Yaru Ding, Yi Zhao |
GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Zijian Zhang, Q. Li, Zuoyuan Dong, Wanting Wang, S. T. Lai, Xin Yang, Fang Liang, Chaolun Wang, C. Luo, Liangjian Lyu, Z. Li, J. M. Xu, Xing Wu 0005 |
Microscopic Characterization of Failure Mechanisms in Long-Term Implanted Microwire Neural Electrodes. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Longda Zhou, Jie Li, Zheng Qiao, Pengpeng Ren, Zixuan Sun, Jianping Wang, Blacksmith Wu, Zhigang Ji, Runsheng Wang, Kanyu Cao, Ru Huang |
Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji |
Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Lucas Reganaz, Damien Deleruyelle, Quentin Rafhay, Joel Minguet Lopez, Niccolo Castellani, Jean-François Nodin, Alessandro Bricalli, Giuseppe Piccolboni, Gabriel Molas, François Andrieu |
Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Youqi Ding, O. Varela Pedreira, Melina Lofrano, Houman Zahedmanesh, T. Chavez, Hosain Farr, Ingrid De Wolf, Kris Croes |
Thermomigration-induced void formation in Cu-interconnects - Assessment of main physical parameters. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Emre Armagan, A. Saha, K. C. Liu, B. Gebrehiwot, M. Cartas, A. Das, T. Rawlings, P. Raghavan |
Knowledge Based Qualification for Thermal Interface Material Reliability. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Rupali Verma, Utpreksh Patbhaje, Jeevesh Kumar, Anand Kumar Rai, Mayank Shrivastava |
OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli |
TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Shengnan Zhu, Limeng Shi, Michael Jin, Jiashu Qian, Monikuntala Bhattacharya, Hema Lata Rao Maddi, Marvin H. White, Anant K. Agarwal, Tianshi Liu, Atsushi Shimbori, Chingchi Chen |
Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Mattia Giulianini, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni |
Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Harumi Seki, Reika Ichihara, Yusuke Higashi, Yasushi Nakasaki, Masumi Saitoh, Masamichi Suzuki |
Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Beatrice Carbone, Mario Santo Alessandrino, Alfio Russo, Elisa Vitanza, Filippo Giannazzo, Patrick Fiorenza, Fabrizio Roccaforte |
Carrot-like crystalline defects on the 4H-SiC powerMOSFET yield and reliability. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Aakanksha Mishra, Boeila Sampath Kumar, M. Monishmurali, Shaik Ahamed Suzaad, Shubham Kumar, Kiran Pote Sanjay, Amit Kumar Singh, Ankur Gupta, Mayank Shrivastava |
Extremely Large Breakdown to Snapback Voltage Offset $(\mathrm{V}_{\mathrm{t}1} > > \mathrm{V}_{\text{BD}})$: Another Way to Improve ESD Resilience of LDMOS Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Camille Leurquin, William Vandendaele, Romain Gwoziecki, B. Mohamad, G. Despesse, Ferdinando Iucolano, Roberto Modica, A. Constant |
Drain voltage impact on charge redistribution in GaN-on-Si E-mode MOSc-HEMTs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Omkar Phadke, Khandker Akif Aabrar, Yuan-chun Luo, Sharadindu Gopal Kirtania, Asif Islam Khan, Suman Datta, Shimeng Yu |
Low-Frequency Noise Characteristics of Ferroelectric Field-Effect Transistors. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Jian-Hsing Lee, Gong-Kai Lin, Chun-Chih Chen, Li-Fan Chen, Chien-Wei Wang, Shao-Chang Huang, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Ke-Horng Chen |
A Concise Electrothermal Model to Characterize the Thermal Safe-Operating Area of Power Transistor. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Taiuk Rim, Kyosuk Che, Sehyun Kwon, Jin-Seong Lee, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee |
Enhanced DRAM Single Bit Characteristics from Process Control of Chlorine. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Laurent Grenouillet, Justine Barbot, J. Laguerre, Simon Martin 0006, Catherine Carabasse, M. Louro, Messaoud Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, Thomas Magis, Carine Jahan, François Andrieu, Jean Coignus |
Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Kavita Vishwakarma, Rishabh Kishore, Suman Gora, Mandeep Jangra, Arnab Datta |
Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ken Takeuchi |
Neuromorphic Computation-in-Memory System (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Tetsuo Narita, Daigo Kikuta, Kenji Ito, Tomoyuki Shoji, Tomohiko Mori, Satoshi Yamaguchi, Yasuji Kimoto, Kazuyoshi Tomita, Masakazu Kanechika, Takeshi Kondo, Tsutomu Uesugi, Jun Kojima, Jun Suda, Yoshitaka Nagasato, Satoshi Ikeda, Hiroki Watanabe, Masayoshi Kosaki, Tohru Oka |
Reliability issues of gate oxides and $p-n$ junctions for vertical GaN metal-oxide-semiconductor field-effect transistors (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Javier Diaz-Fortuny, Dishant Sangani, Pablo Saraza-Canflanca, Erik Bury, Robin Degraeve, Ben Kaczer |
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Jeevesh Kumar, Hemanjaneyulu Kuruva, Harsha B. Variar, Utpreksh Patbhaje, Mayank Shrivastava |
Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ri-an Zhao, Matthew Koskinen, Yang Liu, Xinggong Wan |
Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | J. H. Lee, B. W. Woo, Y. M. Lee, N. H. Lee, S. H. Lee, Y. S. Lee, H. S. Kim, S. Pae |
Reliability Improvement with Optimized BEOL Process in Advanced DRAM. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Awang Ma, Bin Gao 0006, Xing Mou, Peng Yao, Yiwei Du, Jianshi Tang, He Qian, Huaqiang Wu |
Thermal Induced Retention Degradation of RRAM-based Neuromorphic Computing Chips. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Dora A. Chaparro-Ortiz, Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Guevara, P. Srinivasan 0002, Fernando Guarin |
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | D. Wieland, S. Ofner, M. Stabentheiner, B. Butej, Christian Koller, J. Sun, Andrea Minetto, K. Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier |
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Shotaro Sugitani, Ryuichi Nakajima, Keita Yoshida, Jun Furuta, Kazutoshi Kobayashi |
Radiation Hardened Flip-Flops with low Area, Delay and Power Overheads in a 65 nm bulk process. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Kin P. Cheung |
V-Ramp test and gate oxide screening under the "lucky" defect model. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Martin M. Frank, Ning Li, Malte J. Rasch, Shubham Jain, Ching-Tzu Chen, Ramachandran Muralidhar, Jin-Ping Han, Vijay Narayanan, Timothy Philip, Kevin Brew, Andrew Simon, Iqbal Saraf, Nicole Saulnier, Irem Boybat, Stanislaw Wozniak, Abu Sebastian, Pritish Narayanan, Charles Mackin, An Chen, Hsinyu Tsai, Geoffrey W. Burr |
Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vipin Joshi, Sayak Dutta Gupta, Rajarshi Roy Chaudhuri, Mayank Shrivastava |
Unique Dependence of the Breakdown Behavior of Normally-OFF Cascode AlGaN/GaN HEMTs on Carrier Transport Through the Carbon-Doped GaN Buffer. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Hideo Sato, H. M. Shin, H. Jung, S. W. Lee, H. Bae, H. Kwon, K. H. Ryu, W. C. Lim, Y. S. Han, J. H. Jeong, J. M. Lee, D. S. Kim, K. Lee, J. H. Lee, J. H. Park, Y. J. Song, Y. Ji, B. I. Seo, J. W. Kim, H. H. Kim |
Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Manuel Fregolent, Alberto Marcuzzi, Carlo De Santi, Eldad Bahat-Treidel, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini |
Trapping in $\text{Al}_{2}\mathrm{O}_{3}/\text{GaN}$ MOScaps investigated by fast capacitive techniques. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Kazusa Takami, Yuibi Gomi, Shin-ichiro Abe, Wang Liao, Seiya Manabe, Tetsuro Matsumoto, Masanori Hashimoto |
Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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| 1 | Subrat Mishra, Sankatali Venkateswarlu, Bjorn Vermeersch, Moritz Brunion, Melina Lofrano, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Gaspard Hiblot, Geert Van der Plas, Pieter Weckx, Geert Hellings, James Myers, Francky Catthoor, Julien Ryckaert |
Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
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