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Publications at "ITC-Asia"( http://dblp.L3S.de/Venues/ITC-Asia )

URL (DBLP): http://dblp.uni-trier.de/db/conf/itc-asia

Publication years (Num. hits)
2017 (31) 2018 (27) 2019 (30) 2020 (27) 2021 (25) 2022 (18) 2023 (28)
Publication types (Num. hits)
inproceedings(179) proceedings(7)
Venues (Conferences, Journals, ...)
ITC-Asia(186)
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Found 186 publication records. Showing 186 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Mohd Amiruddin Zainol, Sompon Khamron, Ng Gua Bin Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Lee Harrison, Wu Yang Scalable hierarchical DFT technologies for AI, SOC and multi-die : Tutorial 1. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1David C. Keezer, Dany Minier, Hongjie Li Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz Test. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Janet Olson Test industry challenges and solutions as observed by the leading physical implementation solution provider : Invited Talk 2. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Hao Cheng, Chi-Jhe Li, Hung-Lin Chen, Jiun-Lang Huang BDD-Based Self-Test Program Generation for Processor Cores. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Xuejian Li, Zhengguang Zhu Software Defect Detection Based on Feature Fusion and Alias Analysis. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Xin Dong Integrated Progressive Built-In Self-Repair (IPBISR) Techniques for NAND Flash Memory. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Hao-Chiao Hong, Chien-Hung Chen, Yu-Wun Chen Parametric Faults in Computing-in-Memory Applications of a 4kb Read-Decoupled 8T SRAM Array in 40nm CMOS. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Shogo Tokai, Daichi Akamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Yi-Hsuan Lee, Wei-Hao Chen, Shi-Yu Huang Self-Sufficient Clock Jitter Measurement Methodology Using Dithering-Based Calibration. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Shintaro Yamamichi Technology for The Future of Computing : Keynote 2. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Liang Hong, Ge Zhu, Jing Zhou, Xuefei Li, Ziyi Chen, Wei Hu 0008 Hunting for Hardware Trojan in Gate Netlist: A Stacking Ensemble Learning Perspective. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1 IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023 Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Anwesh Kumar Samal, Sandeep Kumar, Atin Mukherjee 0001 Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Erik Jan Marinissen Moore Meets Murphy : Invited Talk 1. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Yasumitsu Orii Semiconductor Packaging Revolution in the Era of Chiplets : Keynote 1. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Ayano Takaya, Michihiro Shintani Feasibility Study of Incremental Neural Network Based Test Escape Detection by Introducing Transfer Learning Technique. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Kentaroh Katoh, Shuhei Yamamoto, Zheming Zhao, Yujie Zhao, Shogo Katayama, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi 0001, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Yuki Yamanaka, Masayuki Arai, Yoshikazu Nagamura, Satoshi Fukumoto Toward Improvement and Evaluation of Reconstruction Capability of CapsNet-Based Wafer Map Defect Pattern Classifier. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Wei-Ji Chao, Tong-Yu Hsieh Cost-Effective Error-Mitigation for High Memory Error Rate of DNN: A Case Study on YOLOv4. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Yervant Zorian Silicon Lifecycle Management: Trends, Challenges and Solutions : Tutorial 2. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Meng-Shan Wu, Yen-Lin Chua, Jin-Fu Li 0001, Yun-Ting Chuan, Shih-Hsu Huang Fault-Aware ECC Scheme for Enhancing the Read Reliability of STT-MRAMs. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Chen-Lin Tsai, Shi-Yu Huang Trustworthy Lifetime Prediction by Aging History Analysis and Multi-Level Stress Test. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Aibin Yan, Fan Xia, Tianming Ni, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen A Low Overhead and Double-Node-Upset Self-Recoverable Latch. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Bin Zhang, Ye Cai, Zhiheng He, Sen Liang, Wei He Structured DFT Development Approach for Chisel-Based High Performance RISC-V Processors. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency. Search on Bibsonomy ITC-Asia The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
1Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui Structured Test Development Approach for Computation-in-Memory Architectures. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Leon Brackmann, Atousa Jafari, Christopher Bengel, Mahta Mayahinia, Rainer Waser, Dirk J. Wouters, Stephan Menzel, Mehdi B. Tahoori A failure analysis framework of ReRAM In-Memory Logic operations. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Duo-Yao Kang, Shiou-Ning Lin, Kuen-Jong Lee Diagnosing Transition Delay Faults under Scan-Based Logic Array. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Aibin Yan, Shukai Song, Jixiang Zhang 0007, Jie Cui 0004, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard 0001 Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Shian-Yu Lin, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao Weak Die Screening by Feature Prioritized Random Forest for Improving Semiconductor Quality and Reliability. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Aobo Cui, Dongrong Zhang, Qiang Ren, Donglin Su A Novel Dual Logic Locking Method to Prevent Counterfeit IP/IC. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Jiun-Cheng Tsai, Aaron C.-W. Liang, Charles H.-P. Wen Timing-Critical Path Analysis in Circuit Designs Considering Aging with Signal Probability. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Juan-David Guerrero-Balaguera, Luigi Galasso, Robert Limas Sierra, Ernesto Sánchez 0001, Matteo Sonza Reorda Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Yi-Ying Chen, Soon-Jyh Chang A Physically Unclonable Function Embedded in a SAR ADC. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Yu-Cheng Yang, Jin-Fu Li 0001 Fault Modeling and Testing of RRAM-based Computing-In Memories. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang Wafer Map Pattern Analytics Driven By Natural Language Queries. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1 IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022 Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Hideyuki Ichihara, Naruki Itoh, Tomoo Inoue An Improvement of the No-Reference Test Scheme Based on False Edge Detection for Image Processing Application. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase Fault Resilience Techniques for Flash Memory of DNN Accelerators. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Jin-Fu Li 0001 Testing and Reliability of Computing-In Memories: Solutions and Challenges. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1Jia-Ruei Liang, Ya-Ni Hsieh, Jiun-Lang Huang Test Response Compaction for Software-Based Self-Test. Search on Bibsonomy ITC-Asia The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
1John Z.-L. Tang, Dave Y.-W. Lin, Ralf E.-H. Yee, Charles H.-P. Wen AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Han Yang, Zeyu Zhao, Zhikuang Cai An optimized DFT technology based on machine learning. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Shuo Cai, Caicai Xie, Yan Wen, Weizheng Wang A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Design. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Mitsuo Matsumoto, Masayuki Kawabata, Yukio Kawanabe High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signals. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Tuanhui Xu, Junlin Huang, Mingen Bu, Zhe Jiang An SRAM Test Quality Improvement Method For Automotive chips. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng Integrated Scratch Marker for Wafer Defect Diagnosis. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Kai-Hsun Chen, Bo-Yi Yang, Jia-Ruei Liang, Hung-Lin Chen, Jiun-Lang Huang Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Yu Huang, Haitao Fu, Bin Deng, Edward Seng, Marc Hutner, Jean-Francois Cote, Geir Eide The Advancement of 1149.10. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Arjun Chaudhuri, Krishnendu Chakrabarty Testing and Fault-Localization Solutions for Monolithic 3D ICs*. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Yi-Zhan Hsieh, Hsiao-Yin Tseng, I-Wei Chiu, James Chien-Mo Li Fault Modeling and Testing of Spiking Neural Network Chips. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Yu Huang 0005, Wu-Tung Cheng, Ruifeng Guo, Sameer Chillarige Diagnosis and Yield Learning. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Yi-Hsuan Lee, Shi-Yu Huang Rigorous Test Flow for PLL to Identify Weak Devices. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Yu Huang 0005, David Francis, Yervant Zorian, Nilanjan Mukherjee 0001 Automotive Test and Reliability. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Chenwei Liu, Jie Ou Use Machine Learning Based Smart Sampling to Improve System Level Testing Efficiency. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Zhen Wang, Guofa Zhang, Jing Ye 0001, Jianhui Jiang Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Xiaoze Lin, Liyang Lai, Huawei Li 0001 Scalable Parallel Static Learning. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1 IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021 Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Chang Hao, Zhengfeng Huang, Tianming Ni Kelvin Bridge Structure Based TSV Test for Weak Faults. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Chen-Lin Tsai, Wei-Hao Chen, Shi-Yu Huang A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock Signal. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Qidong Wang, Aijiao Cui, Gang Qu 0001 Identification of Counter Registers through Full Scan Chain. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Cheng-Di Tsai, Hsiao-Wen Fu, Ting-Yu Chen, Tsung-Chu Huang TAIWAN Online: Test AI with AN Codes Online for Automotive Chips. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Aibin Yan, Zijie Zhai, Lele Wang 0011, Jixiang Zhang 0007, Ningning Cui, Tianming Ni, Xiaoqing Wen Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Wei Hu 0008, Jing Tan, Lingjuan Wu, Yu Tai, Liang Hong Developing Formal Models for Measuring Fault Effects Using Functional EDA Tools. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Xiaole Cui, Yongliang Chen, Wenqiang Ye, Xiaoxin Cui The ANN Based Modeling Attack and Security Enhancement of the Double-layer PUF. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Huaguo Liang, Danqing Li, Zhao Yang, Tianming Ni, Zhengfeng Huang, Cuiyun Jiang A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. Search on Bibsonomy ITC-Asia The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
1Leonidas Lavdas, M. Tanjidur Rahman, Mark M. Tehranipoor, Navid Asadizanjani On Optical Attacks Making Logic Obfuscation Fragile. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Shyue-Kung Lu, Zeng-Long Tsai, Chun-Lung Hsu, Chi-Tien Sun ECC Caching Techniques for Protecting NAND Flash Memories. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Chenlei Fang, Qicheng Huang, R. D. Shawn Blanton Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Zhengda Dou, Aibin Yan, Jun Zhou 0016, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Tong-Yu Hsieh, Chen-Chia Chung, Jun-Tsung Wu On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame Insertion. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Mincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen 0053, Min-Jer Wang Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Tong-Yu Hsieh, Yu-Min Chung A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN Noises. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang 0005, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Shi-Xuan Zheng Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Tsung-Fu Hsieh, Jin-Fu Li 0001, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou Refresh Power Reduction of DRAMs in DNN Systems Using Hybrid Voting and ECC Method. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton Diagnosis Outcome Prediction on Limited Data via Transferred Random Forest. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Heng-Yi Lin, Yen-Chun Fang, Shi-Tang Liu, Jia-Xian Chen, Chien-Mo James Li, Eric Jia-Wei Fang Automatic IR-Drop ECO Using Machine Learning. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Ming-Ting Lee, Chen-Hung Wu, Shi-Tang Liu, Cheng-Yun Hsieh, James Chien-Mo Li High Efficiency and Low Overkill Testing for Probabilistic Circuits. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Kuen-Wei Yeh, Jiun-Lang Huang DSSP-ATPG: A Deterministic Search-Space Parallel Test Pattern Generator. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Chung-Huang Yeh, Jwu E. Chen The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1 IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020 Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  BibTeX  RDF
1Po-Ting Lai, Yu-Hao Chiu, Chieh-Wen Lu, Kuang-Hsiang Liu, Tung-Liang Chiu, Wendy Chen Development and Validation of a Novel Reliable Method for Wet Testing on Biochemical Chip. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Chia-Chuan Li, Soon-Jyh Chang Modified BER Test for SAR ADCs. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Liyang Lai, Qiting Zhang, Kun-Han Hans Tsai, Wu-Tung Cheng GPU-based Hybrid Parallel Logic Simulation for Scan Patterns. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Jian-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho Watermarking for Paper-Based Digital Microfluidic Biochips. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang 0001 W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen 0053, Min-Jer Wang A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Chia-Heng Tsai, Chi-Chang Lai, Hao Chen 0053, Min-Jer Wang Novel Circuit Probing for Tiny Inductor. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Kevin Fan Test Challenges of Providing Low Phase Noise Reference Clock Signal with ATE Platform. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Yousuke Miyake, Takaaki Kato, Seiji Kajihara Path Delay Measurement with Correction for Temperature And Voltage Variations. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Yu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao Test Methodology for Defect-based Bridge Faults. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Ayush Jain 0002, Ujjwal Guin A Novel Tampering Attack on AES Cores with Hardware Trojans. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Yan-Shen You, Chih-Yan Liu, Mu-Ting Wu, Po-Wei Chen, James Chien-Mo Li Diagnosis technique for Clustered Multiple Transition Delay Faults. Search on Bibsonomy ITC-Asia The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Yudai Kawano, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara A Static Method for Analyzing Hotspot Distribution on the LSI. Search on Bibsonomy ITC-Asia The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
1Luciano Bonaria, Maurizio Raganato, Giovanni Squillero, Matteo Sonza Reorda Test-Plan Optimization for Flying-Probes In-Circuit Testers. Search on Bibsonomy ITC-Asia The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
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