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Results
Found 186 publication records. Showing 186 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Mohd Amiruddin Zainol, Sompon Khamron, Ng Gua Bin |
Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Lee Harrison, Wu Yang |
Scalable hierarchical DFT technologies for AI, SOC and multi-die : Tutorial 1. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | David C. Keezer, Dany Minier, Hongjie Li |
Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz Test. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Janet Olson |
Test industry challenges and solutions as observed by the leading physical implementation solution provider : Invited Talk 2. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Hao Cheng, Chi-Jhe Li, Hung-Lin Chen, Jiun-Lang Huang |
BDD-Based Self-Test Program Generation for Processor Cores. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Xuejian Li, Zhengguang Zhu |
Software Defect Detection Based on Feature Fusion and Alias Analysis. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Shyue-Kung Lu, Xin Dong |
Integrated Progressive Built-In Self-Repair (IPBISR) Techniques for NAND Flash Memory. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Hao-Chiao Hong, Chien-Hung Chen, Yu-Wun Chen |
Parametric Faults in Computing-in-Memory Applications of a 4kb Read-Decoupled 8T SRAM Array in 40nm CMOS. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Shogo Tokai, Daichi Akamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume |
On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen |
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yi-Hsuan Lee, Wei-Hao Chen, Shi-Yu Huang |
Self-Sufficient Clock Jitter Measurement Methodology Using Dithering-Based Calibration. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Shintaro Yamamichi |
Technology for The Future of Computing : Keynote 2. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Liang Hong, Ge Zhu, Jing Zhou, Xuefei Li, Ziyi Chen, Wei Hu 0008 |
Hunting for Hardware Trojan in Gate Netlist: A Stacking Ensemble Learning Perspective. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023 |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen |
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Anwesh Kumar Samal, Sandeep Kumar, Atin Mukherjee 0001 |
Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Erik Jan Marinissen |
Moore Meets Murphy : Invited Talk 1. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yasumitsu Orii |
Semiconductor Packaging Revolution in the Era of Chiplets : Keynote 1. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Ayano Takaya, Michihiro Shintani |
Feasibility Study of Incremental Neural Network Based Test Escape Detection by Introducing Transfer Learning Technique. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Kentaroh Katoh, Shuhei Yamamoto, Zheming Zhao, Yujie Zhao, Shogo Katayama, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi 0001, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa |
A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yuki Yamanaka, Masayuki Arai, Yoshikazu Nagamura, Satoshi Fukumoto |
Toward Improvement and Evaluation of Reconstruction Capability of CapsNet-Based Wafer Map Defect Pattern Classifier. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Wei-Ji Chao, Tong-Yu Hsieh |
Cost-Effective Error-Mitigation for High Memory Error Rate of DNN: A Case Study on YOLOv4. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yervant Zorian |
Silicon Lifecycle Management: Trends, Challenges and Solutions : Tutorial 2. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Meng-Shan Wu, Yen-Lin Chua, Jin-Fu Li 0001, Yun-Ting Chuan, Shih-Hsu Huang |
Fault-Aware ECC Scheme for Enhancing the Read Reliability of STT-MRAMs. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Chen-Lin Tsai, Shi-Yu Huang |
Trustworthy Lifetime Prediction by Aging History Analysis and Multi-Level Stress Test. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Aibin Yan, Fan Xia, Tianming Ni, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen |
A Low Overhead and Double-Node-Upset Self-Recoverable Latch. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Bin Zhang, Ye Cai, Zhiheng He, Sen Liang, Wei He |
Structured DFT Development Approach for Chisel-Based High Performance RISC-V Processors. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen |
Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency. |
ITC-Asia |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
Structured Test Development Approach for Computation-in-Memory Architectures. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Leon Brackmann, Atousa Jafari, Christopher Bengel, Mahta Mayahinia, Rainer Waser, Dirk J. Wouters, Stephan Menzel, Mehdi B. Tahoori |
A failure analysis framework of ReRAM In-Memory Logic operations. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Duo-Yao Kang, Shiou-Ning Lin, Kuen-Jong Lee |
Diagnosing Transition Delay Faults under Scan-Based Logic Array. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Aibin Yan, Shukai Song, Jixiang Zhang 0007, Jie Cui 0004, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard 0001 |
Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Shian-Yu Lin, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao |
Weak Die Screening by Feature Prioritized Random Forest for Improving Semiconductor Quality and Reliability. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Aobo Cui, Dongrong Zhang, Qiang Ren, Donglin Su |
A Novel Dual Logic Locking Method to Prevent Counterfeit IP/IC. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara |
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Jiun-Cheng Tsai, Aaron C.-W. Liang, Charles H.-P. Wen |
Timing-Critical Path Analysis in Circuit Designs Considering Aging with Signal Probability. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Juan-David Guerrero-Balaguera, Luigi Galasso, Robert Limas Sierra, Ernesto Sánchez 0001, Matteo Sonza Reorda |
Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Yi-Ying Chen, Soon-Jyh Chang |
A Physically Unclonable Function Embedded in a SAR ADC. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Yu-Cheng Yang, Jin-Fu Li 0001 |
Fault Modeling and Testing of RRAM-based Computing-In Memories. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao |
A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang |
Wafer Map Pattern Analytics Driven By Natural Language Queries. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022 |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Hideyuki Ichihara, Naruki Itoh, Tomoo Inoue |
An Improvement of the No-Reference Test Scheme Based on False Edge Detection for Image Processing Application. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase |
Fault Resilience Techniques for Flash Memory of DNN Accelerators. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Jin-Fu Li 0001 |
Testing and Reliability of Computing-In Memories: Solutions and Challenges. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Jia-Ruei Liang, Ya-Ni Hsieh, Jiun-Lang Huang |
Test Response Compaction for Software-Based Self-Test. |
ITC-Asia |
2022 |
DBLP DOI BibTeX RDF |
|
1 | John Z.-L. Tang, Dave Y.-W. Lin, Ralf E.-H. Yee, Charles H.-P. Wen |
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Han Yang, Zeyu Zhao, Zhikuang Cai |
An optimized DFT technology based on machine learning. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Shuo Cai, Caicai Xie, Yan Wen, Weizheng Wang |
A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Design. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Mitsuo Matsumoto, Masayuki Kawabata, Yukio Kawanabe |
High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signals. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Tuanhui Xu, Junlin Huang, Mingen Bu, Zhe Jiang |
An SRAM Test Quality Improvement Method For Automotive chips. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng |
Integrated Scratch Marker for Wafer Defect Diagnosis. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Kai-Hsun Chen, Bo-Yi Yang, Jia-Ruei Liang, Hung-Lin Chen, Jiun-Lang Huang |
Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yu Huang, Haitao Fu, Bin Deng, Edward Seng, Marc Hutner, Jean-Francois Cote, Geir Eide |
The Advancement of 1149.10. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Arjun Chaudhuri, Krishnendu Chakrabarty |
Testing and Fault-Localization Solutions for Monolithic 3D ICs*. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yi-Zhan Hsieh, Hsiao-Yin Tseng, I-Wei Chiu, James Chien-Mo Li |
Fault Modeling and Testing of Spiking Neural Network Chips. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yu Huang 0005, Wu-Tung Cheng, Ruifeng Guo, Sameer Chillarige |
Diagnosis and Yield Learning. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yi-Hsuan Lee, Shi-Yu Huang |
Rigorous Test Flow for PLL to Identify Weak Devices. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yu Huang 0005, David Francis, Yervant Zorian, Nilanjan Mukherjee 0001 |
Automotive Test and Reliability. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Chenwei Liu, Jie Ou |
Use Machine Learning Based Smart Sampling to Improve System Level Testing Efficiency. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Zhen Wang, Guofa Zhang, Jing Ye 0001, Jianhui Jiang |
Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Xiaoze Lin, Liyang Lai, Huawei Li 0001 |
Scalable Parallel Static Learning. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021 |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Chang Hao, Zhengfeng Huang, Tianming Ni |
Kelvin Bridge Structure Based TSV Test for Weak Faults. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Chen-Lin Tsai, Wei-Hao Chen, Shi-Yu Huang |
A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock Signal. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Qidong Wang, Aijiao Cui, Gang Qu 0001 |
Identification of Counter Registers through Full Scan Chain. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Cheng-Di Tsai, Hsiao-Wen Fu, Ting-Yu Chen, Tsung-Chu Huang |
TAIWAN Online: Test AI with AN Codes Online for Automotive Chips. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Aibin Yan, Zijie Zhai, Lele Wang 0011, Jixiang Zhang 0007, Ningning Cui, Tianming Ni, Xiaoqing Wen |
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Wei Hu 0008, Jing Tan, Lingjuan Wu, Yu Tai, Liang Hong |
Developing Formal Models for Measuring Fault Effects Using Functional EDA Tools. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Xiaole Cui, Yongliang Chen, Wenqiang Ye, Xiaoxin Cui |
The ANN Based Modeling Attack and Security Enhancement of the Double-layer PUF. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Huaguo Liang, Danqing Li, Zhao Yang, Tianming Ni, Zhengfeng Huang, Cuiyun Jiang |
A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Leonidas Lavdas, M. Tanjidur Rahman, Mark M. Tehranipoor, Navid Asadizanjani |
On Optical Attacks Making Logic Obfuscation Fragile. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Shyue-Kung Lu, Zeng-Long Tsai, Chun-Lung Hsu, Chi-Tien Sun |
ECC Caching Techniques for Protecting NAND Flash Memories. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chenlei Fang, Qicheng Huang, R. D. Shawn Blanton |
Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Zhengda Dou, Aibin Yan, Jun Zhou 0016, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen |
Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Tong-Yu Hsieh, Chen-Chia Chung, Jun-Tsung Wu |
On Enhancing Error-Tolerability of Videos via Re-Encoding with Adaptive I-Frame Insertion. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Mincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen 0053, Min-Jer Wang |
Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Tong-Yu Hsieh, Yu-Min Chung |
A Self-Detection and Self-Repair Methodology for Reliable Speech Recognition Considering AWGN Noises. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang 0005, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Shi-Xuan Zheng |
Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Tsung-Fu Hsieh, Jin-Fu Li 0001, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou |
Refresh Power Reduction of DRAMs in DNN Systems Using Hybrid Voting and ECC Method. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton |
Diagnosis Outcome Prediction on Limited Data via Transferred Random Forest. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
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1 | Heng-Yi Lin, Yen-Chun Fang, Shi-Tang Liu, Jia-Xian Chen, Chien-Mo James Li, Eric Jia-Wei Fang |
Automatic IR-Drop ECO Using Machine Learning. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Ming-Ting Lee, Chen-Hung Wu, Shi-Tang Liu, Cheng-Yun Hsieh, James Chien-Mo Li |
High Efficiency and Low Overkill Testing for Probabilistic Circuits. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Kuen-Wei Yeh, Jiun-Lang Huang |
DSSP-ATPG: A Deterministic Search-Space Parallel Test Pattern Generator. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chung-Huang Yeh, Jwu E. Chen |
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020 |
ITC-Asia |
2020 |
DBLP BibTeX RDF |
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1 | Po-Ting Lai, Yu-Hao Chiu, Chieh-Wen Lu, Kuang-Hsiang Liu, Tung-Liang Chiu, Wendy Chen |
Development and Validation of a Novel Reliable Method for Wet Testing on Biochemical Chip. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chia-Chuan Li, Soon-Jyh Chang |
Modified BER Test for SAR ADCs. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Liyang Lai, Qiting Zhang, Kun-Han Hans Tsai, Wu-Tung Cheng |
GPU-based Hybrid Parallel Logic Simulation for Scan Patterns. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Jian-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho |
Watermarking for Paper-Based Digital Microfluidic Biochips. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang 0001 |
W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen 0053, Min-Jer Wang |
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chia-Heng Tsai, Chi-Chang Lai, Hao Chen 0053, Min-Jer Wang |
Novel Circuit Probing for Tiny Inductor. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Kevin Fan |
Test Challenges of Providing Low Phase Noise Reference Clock Signal with ATE Platform. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Yousuke Miyake, Takaaki Kato, Seiji Kajihara |
Path Delay Measurement with Correction for Temperature And Voltage Variations. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
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1 | Yu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao |
Test Methodology for Defect-based Bridge Faults. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Ayush Jain 0002, Ujjwal Guin |
A Novel Tampering Attack on AES Cores with Hardware Trojans. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Yan-Shen You, Chih-Yan Liu, Mu-Ting Wu, Po-Wei Chen, James Chien-Mo Li |
Diagnosis technique for Clustered Multiple Transition Delay Faults. |
ITC-Asia |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Kohei Miyase, Yudai Kawano, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara |
A Static Method for Analyzing Hotspot Distribution on the LSI. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
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1 | Luciano Bonaria, Maurizio Raganato, Giovanni Squillero, Matteo Sonza Reorda |
Test-Plan Optimization for Flying-Probes In-Circuit Testers. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
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