|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
|
|
Results
Found 68 publication records. Showing 68 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Joshua Immanuel, Spencer K. Millican |
Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion.  |
NATW  |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Konstantinos Poulos, Themistoklis Haniotakis |
A Built In Test circuit for waveform classification at high frequencies. |
NATW |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Stewart E. Rauch, Dongho Lee, Alexey Vert, Roy Gupta |
Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. |
NATW |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min |
Self-heating characterization and its applications in technology development. |
NATW |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | |
29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020 |
NATW |
2020 |
DBLP BibTeX RDF |
|
| 1 | Naznin Akter, Mustafa Karabiyik, Michael S. Shur, John Suarez, Nezih Pala |
AI Powered THz VLSI Testing Technology. |
NATW |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Stephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome |
Passive Intermodulation (PIM) Test and Measurement. |
NATW |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Marcia Golmohamadi, Ryan Jurasek, Wolfgang Hokenmaier, Donald Labrecque, Ruoyu Zhi, Bret Dale, Nibir Islam, Dave Kinney, Angela Johnson |
Verification and Testing Considerations of an In-Memory AI Chip. |
NATW |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Yiming Wen, Weize Yu |
Convolutional Neural Networks (CNNs)-Assisted Voltage Regulation: A New Power Delivery Scheme. |
NATW |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | |
28th IEEE North Atlantic Test Workshop, NATW 2019, Burlington, VT, USA, May 13-15, 2019 |
NATW |
2019 |
DBLP BibTeX RDF |
|
| 1 | Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal |
Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. |
NATW |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Eric Hunt-Schroeder, Darren Anand, Edward Hwang, Aaron Cummings, Matthew Deming, Michael Roberge, Michael Ziegerhofer |
Behavioral Modeling of a Charge Trap Transistor One Time Programmable Memory. |
NATW |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Uma Srinivasan 0002, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert |
Case Study of Advanced Diagnostic Techniques for Multi Port Register File. |
NATW |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Mark Fosberry, Ben McMahon |
Matlab JTAG AXI Master opens new dimensions for development and testability. |
NATW |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Weize Yu, Yiming Wen |
Malicious Attacks on Physical Unclonable Function Sensors of Internet of Things. |
NATW |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard |
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Hui Jiang, Fanchen Zhang, Yi Sun, Jennifer Dworak |
One more time! Increasing fault detection with scan shift capture. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Imtiaz Ahmed, Subhash Baraiya, Rahul Singhal |
Case study on low pin count testing of industry transceiver chip. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei Jiang 0017, Guoan Wang |
A simplified on-chip calibration method for branch-line coupler. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Timothy M. Platt, Chen Liu 0001 |
Reducing test time with FPGA accelerators using OpenCL. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Mehmet Ince, Ender Yilmaz, Sule Ozev |
Enabling fast process variation and fault simulation through macromodelling of analog components. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ryan Pennucci, Ryan Jurasek, Wolfgang Hokenmaier, Lester Patrick, Jacob Bucci, Donald Labrecque, David Kinney |
An analysis of an inexpensive memory test solution. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | |
27th IEEE North Atlantic Test Workshop, NATW 2018, Essex, VT, USA, May 7-9, 2018 |
NATW |
2018 |
DBLP BibTeX RDF |
|
| 1 | Michael S. Shur, John Suarez |
Nanoscale silicon mosfet response to THz radiation for testing VLSI. |
NATW |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Saurabh Gupta 0005, Jennifer Dworak, Daniel Engels, Al Crouch |
Mitigating simple power analysis attacks on LSIB key logic. |
NATW |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Konstantinos Poulos, Jayasurya Kuchi, Themistoklis Haniotakis |
An enhanced approach to reduce test application time through limited shift operations in scan chains. |
NATW |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | |
2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017 |
NATW |
2017 |
DBLP BibTeX RDF |
|
| 1 | Yu Huang |
Case study of bandwidth management in SoC testing. |
NATW |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Pavithra Ramesh, Vinay C. Patil, Sandip Kundu |
Peer pressure on identity: On requirements for disambiguating PUFs in noisy environment. |
NATW |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch |
Detecting a trojan die in 3D stacked integrated circuits. |
NATW |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Amirhossein Shahshahani, Andrey Tolstikhin, Zeljko Zilic |
Enabling Debug in IoT Wireless Development and Deployment with Security Considerations. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Hari Chauhan, Vladimir Kvartenko, Marvin Onabajo |
A Tuning Technique for Temperature and Process Variation Compensation of Power Amplifiers with Digital Predistortion. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter |
Using Existing Reconfigurable Logic in 3D Die Stacks for Test. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Joseph Nguyen, David Turgis, David Bonciani, Brice Lhomme, Yann Carminati, Olivier Callen, Guillaume Guirleo, Lorenzo Ciampolini, Gérard Ghibaudo |
RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Md. Nazmul Islam, Sandip Kundu |
Modeling Residual Life of an IC Considering Multiple Aging Mechanisms. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Malinky Ghosh, Kelly A. Ockunzzi |
Automated and Reusable IP Functional Test Rule Development across Multiple IP Instances within and across Asic Designs. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Yongsuk Choi, Yong-Bin Kim, In-Seok Jung |
A 100MS/s 10-bit Split-SAR ADC with Capacitor Mismatch Compensation Using Built-In Calibration. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiao Liu, Changkai Yu, Yu Qi, Yu Huang, James Fu |
Case Study of Testing a SoC Design with Mixed EDT Channel Sharing and Channel Broadcasting. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Chen Zhang, Gyunam Jeon, Yongsuk Choi, Yong-Bin Kim, Kyung Ki Kim |
An Area Efficient 4Gb/s Half-Rate 3-Tap DFE with Current-Integrating Summer for Data Correction. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Muralidharan Venkatasubramanian, Vishwani D. Agrawal |
Failures Guide Probabilistic Search for a Hard-to-Find Test. |
NATW |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | |
25th IEEE North Atlantic Test Workshop, NATW 2016, Providence, RI, USA, May 9-11, 2016 |
NATW |
2016 |
DBLP BibTeX RDF |
|
| 1 | Amin Vali, Nicola Nicolici |
Satisfiability-Based Analysis of Failing Traces during Post-silicon Debug. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Rawad N. Al-Haddad, Rashad S. Oreifej, Ramtin Zand, Abdel Ejnioui, Ronald F. DeMara |
Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Huiting Zhang, Vishwani D. Agrawal |
SoC TAM Design to Minimize Test Application Time. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramesh C. Tekumalla |
Clock Domain Imbalances and Their Impact on Test Architecture. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohamed Hanafy 0001, Hazem Said, Ayman M. Wahba |
Complete Properties Extraction from Simulation Traces for Assertions Auto-generation. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Jennifer Dworak, Ping Gui, Qutaiba Khasawneh |
An Industrial Case Study: PaRent (Parallel & Concurrent) Testing for Complex Mixed-Signal Devices. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Guoliang Li 0004, Jun Qian, Qinfu Yang, Yuan Zuo, Rui Li 0084, Yu Huang 0005, Mark Kassab, Janusz Rajski |
Hybrid Hierarchical and Modular Tests for SoC Designs. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | |
24th IEEE North Atlantic Test Workshop, NATW 2015, Johnson City, NY, USA, May 11-13, 2015 |
NATW |
2015 |
DBLP BibTeX RDF |
|
| 1 | Sameer Chillarige, S. Virdi, Anil Malik, Krishna Chakravadhanula, Vivek Chickermane, Joe Swenton, G. Vandling |
A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Baohu Li, Vishwani D. Agrawal |
Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Swati Chakraborty, Duncan M. Hank Walker |
At-Speed Path Delay Test. |
NATW |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Fanchen Zhang, Micah Thornton, Jennifer Dworak |
When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Surbhi Bansal, Aviansh Mendhalkar, Ramesh C. Tekumalla |
On Handling Memory Scan Chains. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Sindhu Gunasekar, Vishwani D. Agrawal |
Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Grace Tang |
Power System Fault Modeling/Simulation Protective Relay Testing and Simulation. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Yukun Gao, Tengteng Zhang, Swati Chakraborty, D. M. H. Walker |
Delay Test of Embedded Memories. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi |
A Comprehensive Evaluation of Functional Programs for Power-Aware Test. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Pascal Nsame, Guy Bois, Yvon Savaria |
Design and Test of Adaptive Computing Fabrics for Scalable and High-Efficiency Cognitive SoC Applications. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Konstantin Shibin, Sergei Devadze, Artur Jutman |
Asynchronous Fault Detection in IEEE P1687 Instrument Network. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramesh C. Tekumalla, Prakash Krishnamoorthy |
Local Repair Signature Handling for Repairable Memories. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | |
IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014 |
NATW |
2014 |
DBLP BibTeX RDF |
|
| 1 | Tengteng Zhang, Yukun Gao, D. M. H. Walker |
Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Md. Tauhidur Rahman 0001, Domenic Forte, Quihang Shi, Gustavo K. Contreras, Mohammad Tehranipoor |
CSST: An Efficient Secure Split-Test for Preventing IC Piracy. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu Huang 0005, Mark Kassab, Jay Jahangiri, Janusz Rajski, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung |
Test Compression Improvement with EDT Channel Sharing in SoC Designs. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Tommy Lam |
Innovative Antenna Chamber Characterization. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Muralidharan Venkatasubramanian, Vishwani D. Agrawal |
A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramesh C. Tekumalla, Prakash Krishnamoorthy |
On-chip Clock Testing and Frequency Measurement. |
NATW |
2014 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #68 of 68 (100 per page; Change: )
|
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")
data released under the ODC-BY 1.0 license