| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Richa Sharma, G. K. Sharma 0001, Manisha Pattanaik, V. S. S. Prashant |
Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model.  |
J. Electron. Test.  |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Kunwer Mrityunjay Singh, Jatindra Kumar Deka, Santosh Biswas |
Incomplete Testing of SOC. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre |
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Jake Elliot, Jason Brown |
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Journal of Electronic Testing: Theory and Applications New Editors - 2023. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Pradeep Kumar Biswal |
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | J. Paul Rajasingh, P. Senthil Kumar 0005, S. Srinivasan |
Efficient Fault Detection by Test Case Prioritization via Test Case Selection. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos |
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Asma Iqbal, Syed Affan Daimi, Kamsali Manjunatha Chari |
Performance Efficient and Fault Tolerant Approximate Adder. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ling Zhang |
Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
2022 Reviewers. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Chung-Huang Yeh, Jwu E. Chen |
Multiple Retest Systems for Screening High-Quality Chips. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Joseph Herbert Mitchell-Moreno, Guillermo Espinosa Flores-Verdad |
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen |
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | R. Saravana Ram, M. Lordwin Cecil Prabhaker |
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Shouhong Chen, Tao Wang, Zhentao Huang, Xingna Hou |
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Yingchun Xiao, Feng Zhu 0013, Shengxian Zhuang, Yang Yang |
Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Tapobrata Dhar, Ranit Das, Chandan Giri, Surajit Kumar Roy |
Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vinod S. Chippalkatti, Rajashekhar C. Biradar, Venkatesh Shenoy, P. Udayakumar |
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee |
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Benedikt Jooß, Dieter Schramm |
Modular Test Kit - A Modular Approach for Efficient and Function-Oriented Testing. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Zeinab Asghari, Bahman Arasteh, Abbas Koochari |
Effective Software Mutation-Test Using Program Instructions Classification. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Sourav Ghosh, Surajit Kumar Roy, Chandan Giri |
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Bahman Arasteh, Farhad Soleimanian Gharehchopogh, Peri Gunes, Farzad Kiani, Mahsa Torkamanian-Afshar |
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
2022 JETTA-TTTC Best Paper Award. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He, Donghui Guo |
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou |
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Wenjing Tang, Jing Su, Yuchan Gao |
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001 |
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury |
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Karine Coulié, Hassen Aziza, Wenceslas Rahajandraibe |
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Raghavendra Kumar Sakali, Sk. Noor Mahammad |
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas |
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Bahareh Asadi, Syed Maqsood Zia, Hamza Mohammed Ridha Al-Khafaji, Asghar Mohamadian |
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Shyue-Kung Lu, Zeng-Long Tsai |
E3C Techniques for Protecting NAND Flash Memories. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vijaypal Singh Rathor, Deepak Singh, Simranjit Singh 0002, Mohit Sajwan |
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ahmad Menbari, Hadi Jahanirad |
A Tunable Concurrent BIST Design Based on Reconfigurable LFSR. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Priyajit Bhattacharya, Rahul Bhattacharya, Himasree Deka |
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Tianyi Shao, Bohua Wei, Yu Ou, Yongzhuang Wei, Xiaonian Wu |
New Second-order Threshold Implementation of Sm4 Block Cipher. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhengfeng Huang, Hao Wang 0169, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan |
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar |
A Survey of PCB Defect Detection Algorithms. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich |
Identifying Resistive Open Defects in Embedded Cells under Variations. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Naveenkumar R, N. M. Sivamangai, Napolean A, S. Sridevi Sathya Priya, S. V. Ashika |
Design of INV/BUFF Logic Locking For Enhancing the Hardware Security. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhenyu Zhao, Xin Chen, Yufan Lu |
Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection. |
J. Electron. Test. |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Shuo Cai, Binyong He, Sicheng Wu, Jin Wang 0001, Weizheng Wang, Fei Yu 0009 |
An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, Derek Ajesam Asoh, Adelaïde Nicole Kengnou Telem, René Kuaté-Fochie, Godpromesse Kenné |
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Ishak Parlar, Mehmet Nuri Almali |
Experimental and Simulation Results of Wien Bridge Oscillator Circuıt Realized wıth Op-Amp Designed Using a Memristor. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Yadi Zhong, Ayush Jain 0002, M. Tanjidur Rahman, Navid Asadizanjani, Jiafeng Xie, Ujjwal Guin |
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Sushil Doranga, Jenny Zhou, Ram Poudel |
Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | |
2021 JETTA-TTTC Best Paper Award. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhi-Wei Lai, Po-Hua Huang, Kuen-Jong Lee |
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Neha Pannu, Neelam Rup Prakash, Jasbir Kaur |
Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Dengli Bu, Junjie Yan, Pengjie Tang, Haohao Yuan |
Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Bahman Arasteh, Parisa Imanzadeh, Keyvan Arasteh, Farhad Soleimanian Gharehchopogh, Bagher Zarei |
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | S. S. Vinod Chandra, S. Saju Sankar, Hareendran S. Anand |
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | S. Deepanjali, Sk. Noor Mahammad |
Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Shravani Chandaka, Balaji Narayanam |
Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Naveenkumar R, N. M. Sivamangai, Napolean A, S. Sridevi Sathya Priya |
Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Kamran Zahid |
The Detection of Malicious Modifications in the FPGA. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Wendong Wang, Adit D. Singh, Ujjwal Guin |
A Systematic Bit Selection Method for Robust SRAM PUFs. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | D. Tilak Raju, Y. Srinivasa Rao |
Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance Application. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Brett Sparkman, Scott C. Smith, Jia Di |
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Richa Sharma, G. K. Sharma 0001, Manisha Pattanaik |
A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection Systems. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001 |
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Stefano Di Carlo |
Test Technology Newsletter. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Ishak Parlar, Mehmet Nuri Almali |
Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp Model. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi 0001, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa |
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | |
2021 Reviewers. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Yang Sun, Spencer K. Millican |
Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Naveenkumar R, N. M. Sivamangai, Napolean A, G. Akashraj Nissi |
Hardware Obfuscation for IP Protection of DSP Applications. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Janani Varun, R. A. Karthika |
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohammed Moness, Lamya Gaber, Aziza I. Hussein, Hanafy M. Ali |
Automated Design Error Debugging of Digital VLSI Circuits. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang 0169, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang |
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal |
Editorial. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | N. Siva Balan, B. S. Murugan |
Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Ahmad Menbari, Hadi Jahanirad |
A Low-cost BIST Design Supporting Offline and Online Tests. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu 0005, Yanjun Li, Chong Hu |
Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | E. Jagadeeswara Rao, K. Tarakeswara Rao, K. Sudha Ramya, D. Ajaykumar, R. Trinadh |
Efficient Design of Rounding-Based Approximate Multiplier Using Modified Karatsuba Algorithm. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Dev Narayan Yadav, Phrangboklang Lyngton Thangkhiew, Kamalika Datta, Sandip Chakraborty, Rolf Drechsler, Indranil Sengupta 0001 |
FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Syed Usman Amin, Muhammad Aaquib Shahbaz, Syed Arsalan Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Zain Hussain Warsi, Naveed 0001 |
Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | |
Test Technology Newsletter. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Chinthalgiri Jyothi, Saranya Karunamurthi, Bhaskara Rao Jammu 0001, Sreehari Veeramachaneni, Sk. Noor Mahammad |
A New Approximate 4-2 Compressor using Merged Sum and Carry. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Trevor Kroeger, Wei Cheng 0003, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi |
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs. |
J. Electron. Test. |
2022 |
DBLP DOI BibTeX RDF |
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