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Found 6351 publication records. Showing 6351 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Katsuyoshi Miura, Atsuki Seko, Koji Nakamae |
Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope.  |
Microelectron. Reliab.  |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ke Zhao, Nanxi Li, Boan Pan, Ting Li 0012 |
Performance assessment of the NIRS-based medical system of evaluating therapeutic effect. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Victor M. Goncalves Martins, Paulo Ricardo Cechelero Villa, Rodrigo Travessini, Marcelo Daniel Berejuck, Eduardo Augusto Bezerra |
A dynamic partial reconfiguration design flow for permanent faults mitigation in FPGAs. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Fabio Ricco Galluzzo, A. Scuto, Cosimo Gerardi, A. Battaglia, Andrea Canino, Salvatore Lombardo |
Performance increase of tandem amorphous/microcrystalline Si PV devices under variable illumination and temperature conditions. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ke Li, Lingyu Wang, Jingjing Wu, Qiuju Zhang, Guanglan Liao, Lei Su 0002 |
Using GA-SVM for defect inspection of flip chips based on vibration signals. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | B. Sivasankari, Ahilan Appathurai, R. Jothin, A. Jasmine Gnana Malar |
Reliable N sleep shuffled phase damping design for ground bouncing noise mitigation. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Kosala Yapabandara, Vahid Mirkhani, Shiqiang Wang, Min P. Khanal, Sunil Uprety, Tamara Isaacs-Smith, Michael C. Hamilton, Minseo Park |
Proton-induced displacement damage in ZnO thin film transistors: Impact of damage location. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | P. Vigneshwara Raja, Neti V. L. Narasimha Murty |
Thermal annealing studies in epitaxial 4H-SiC Schottky barrier diodes over wide temperature range. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Oriol Avino-Salvado, Hervé Morel, Cyril Buttay, Denis Labrousse, Stéphane Lefebvre |
Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Michel Piton, Bertrand Chauchat, Jean-François Serviere |
Implementation of direct Chip junction temperature measurement in high power IGBT module in operation - Railway traction converter. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Chin-Li Kao, Tei-Chen Chen |
Ball impact responses of Sn-1Ag-0.5Cu solder joints at different temperatures and surface finishes. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | S. Nilamani, P. Chitra, V. N. Ramakrishnan |
Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | R. C. de Barros, E. M. S. Brito, Giovani G. Rodrigues, Victor Flores Mendes, Allan Fagner Cupertino, Heverton Augusto Pereira |
Lifetime evaluation of a multifunctional PV single-phase inverter during harmonic current compensation. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohamed Ali Belaïd |
Performance analysis of S-parameter in N-MOSFET devices after thermal accelerated tests. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Piotr Zachariasz, Agata Skwarek, Balázs Illés, Jan Zukrowski, Tamás Hurtony, Krzysztof Witek |
Mössbauer studies of β → α phase transition in Sn-rich solder alloys. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Hajime Sasaki, Takayuki Hisaka, Kaoru Kadoiwa, Tomoki Oku, Shinobu Onoda, Takeshi Ohshima, Eiji Taguchi, Hidehiro Yasuda |
Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Manuel Peña-Fernandez, Almudena Lindoso, Luis Entrena, Mario García-Valderas, S. Philippe, Yolanda Morilla, Pedro Martín-Holgado |
PTM-based hybrid error-detection architecture for ARM microprocessors. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Brice Rogié, Lorenzo Codecasa, Eric Monier-Vinard, Valentin Bissuel, Najib Laraqi, Olivier Daniel, Dario D'Amore, Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi |
Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Gaudenzio Meneghesso, Matteo Meneghini, Carlo De Santi, Maria Ruzzarin, Enrico Zanoni |
Positive and negative threshold voltage instabilities in GaN-based transistors. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | O. Dixon-Luinenburg, J. Fine |
In-situ transistor reliability measurements through nanoprobing. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Xi Jiang 0005, Jun Wang 0054, Jiwu Lu, Jianjun Chen, Xin Yang, Zongjian Li, Chunming Tu, Zheng John Shen |
Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Philip Y. Chung, Suresh K. Sitaraman |
Random vibration analysis of 3-Arc-Fan compliant interconnects. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan |
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic |
NBTI and irradiation related degradation mechanisms in power VDMOS transistors. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhihong Wu, Su Xiezu, Zhu Yuan |
IGBT junction and coolant temperature estimation by thermal model. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Bernhard Czerny, Golta Khatibi |
Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | F. Saghaeian, J. Keckes, K. A. Schreiber, T. Mittereder |
Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Siyu Sun, Qiang Guo, Hongtao Chen, Mingyu Li, Chunqing Wang |
Solderless bonding with nanoporous copper as interlayer for high-temperature applications. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Lorenzo Codecasa, Robin Bornoff, James Dyson, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi |
Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Dongshin Kim 0004, Ju-Hwan Choi, Nochang Park, Sung-Il Chan, Yongchae Jeong |
Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiuyang Shan, Yun Chen |
Experimental and modeling study on viscosity of encapsulant for electronic packaging. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg |
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ana Cóbreces, Alberto Regadío, Jesús Tabero, Pedro Reviriego, Alfonso Sánchez-Macián, Juan Antonio Maestro |
Seu and Sefi error detection and correction on a ddr3 memory system. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ambika Prasad Shah, Nandakishor Yadav, Ankur Beohar, Santosh Kumar Vishvakarma |
An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jingge Hu, Meng Huang 0001, Yi Liu, Xiaoming Zha |
Transient junction temperature estimation of IGBT using improved thermal model. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jianfei Wu, Wei Zhu, Binhong Li, Yafei Li, Hongyi Wang 0003, Mengjun Wang |
Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Bing Gao, Fan Yang 0045, Minyou Chen, Yigao Chen, Wei Lai, Chao Liu |
Thermal lifetime estimation method of IGBT module considering solder fatigue damage feedback loop. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Krzysztof Górecki, Przemyslaw Ptak |
New dynamic electro-thermo-optical model of power LEDs. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | D. Hachem, David Trémouilles, Frederic Morancho, Gaëtan Toulon |
A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Alberto Rodriguez-Fernandez, J. Muñoz-Gorriz, Jordi Suñé, Enrique Miranda 0002 |
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhihua Wang 0004, Qiong Wu, Xiongjian Zhang, Xinlei Wen, Yongbo Zhang, Chengrui Liu, Huimin Fu 0001 |
A generalized degradation model based on Gaussian process. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Tomoyuki Mannen, Keiji Wada |
Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Vamsi Putcha, Erik Bury, Marko Simicic, Adrian Vaisman Chasin, Dimitri Linten, Bertrand Parvais, Francky Catthoor, Gerhard Rzepa, Michael Waltl, Tibor Grasser |
A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Eduardo Nogueira, Juan Sancho Gil, José-Luis Sánchez-Bote |
Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Thiago Hanna Both, Gabriela Firpo Furtado, Gilson Inácio Wirth |
Modeling and simulation of the charge trapping component of BTI and RTS. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Th. Stiasny, Olivier Quittard, Daniel Waltisberg, U. Meier |
Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Davide Cornigli, Susanna Reggiani, Antonio Gnudi, Elena Gnani, Giorgio Baccarani, Davide Fabiani, D. Varghese, Enis Tuncer, S. Krishnan, Luu Nguyen |
Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Guillermo Royo, Carlos Sánchez-Azqueta, Antonio D. Martínez-Pérez, Concepción Aldea, Santiago Celma |
Fully-differential transimpedance amplifier for reliable wireless communications. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jianfeng Li 0002, Jingru Dai, Christopher Mark Johnson |
Comparison of power cycling reliability of flexible PCB interconnect smaller/thinner and larger/thicker power devices with topside Sn-3.5Ag solder joints. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhen Zhang 0030, Yaoting Xue, Ruiqing Ma, Yongheng Yang |
An easy-implemented confidence filter for signal processing in the complex electromagnetic environment. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaoman Sun, Meng Huang 0001, Yi Liu, Xiaoming Zha |
Investigation of artificial neural network algorithm based IGBT online condition monitoring. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | F. Boige, Frédéric Richardeau, Stéphane Lefebvre, Jean-Marc Blaquière, G. Guibaud, A. Bourennane |
Ensure an original and safe "fail-to-open" mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Sai Tang, Xin Yin, Daming Wang, Chao Zhang, Zhikang Shuai, Xin Yang, Zheng John Shen, Jun Wang 0054 |
Detection and identification of power switch failures for fault-tolerant operation of flying capacitor Buck-boost converters. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Guicui Fu, Yutai Su, Wendi Guo, Bo Wan, Zhongqing Zhang, Ye Wang |
Life prediction methodology of system-in-package based on physics of failure. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | J. B. Libot, Joël Alexis, Olivier Dalverny, L. Arnaud, P. Milesi, F. Dulondel |
Microstructural evolutions of Sn-3.0Ag-0.5Cu solder joints during thermal cycling. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Dan Zhang 0015, Jianguo Jiang |
A reliable speed controller for suppressing low frequency concussion of electric vehicle. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Guoning Xu, Xiaowei Du, Zhaojie Li, Xiaojun Zhang, Minxin Zheng, Ying Miao 0005, Yang Gao, Qianshi Liu |
Reliability design of battery management system for power battery. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Hiroaki Matsumori, Kazuki Urata, Toshihisa Shimizu, Koushi Takano, Hitoshi Ishii |
Capacitor loss analysis method for power electronics converters. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Kazuki Watanabe 0006, Yoshiharu Kariya, Naoyuki Yajima, Kizuku Obinata, Yoshiyuki Hiroshima, Shunichi Kikuchi, Akiko Matsui, Hiroshi Shimizu |
Low-cycle fatigue testing and thermal fatigue life prediction of electroplated copper thin film for through hole via. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jian-Chiun Liou, Cheng-Fu Yang |
Investigation of DNA sequencing droplet trajectory observation and analysis. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Wardhana A. Sasangka, Yu Gao, Chee Lip Gan, Carl V. Thompson |
Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Subramani Manoharan, Chandradip Patel, F. Patrick McCluskey, Michael G. Pecht |
Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Paul Pfäffli, Hiu Yung Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma |
TCAD modeling for reliability. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jinxin Zhang, Qi Guo, Hongxia Guo, Wu Lu, Chaohui He, Xin Wang, Pei Li, Lin Wen |
Investigation of enhanced low dose rate sensitivity in SiGe HBTs by 60Co γ irradiation under different biases. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | A. A. El-Daly, A. A. Ibrahiem |
Influence of rotating magnetic field on solidification microstructure and tensile properties of Sn-Bi lead-free solders. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Shuai Lin, Xiaochun Fang, Fei Lin, Zhongping Yang, Xiaofan Wang 0005 |
Reliability of rail transit traction drive system-A review. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Huakai Shao, Aiping Wu, Yudian Bao, Yue Zhao, Guisheng Zou, Lei Liu |
Thermal reliability investigation of Ag-Sn TLP bonds for high-temperature power electronics application. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yi Chao Low, Pik Kee Tan, Soon Leng Tan, Yuzhe Zhao, Jeffrey Lam |
Solving 28 nm I/O circuit reliability issue due to IC design weakness. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Qiang Guo, Siyu Sun, Zhihao Zhang, Hongtao Chen, Mingyu Li |
Microstructure evolution and mechanical strength evaluation in Ag/Sn/Cu TLP bonding interconnection during aging test. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel M. Fleetwood |
Border traps and bias-temperature instabilities in MOS devices. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Massimo Vanzi, Giovanna Mura, G. Martines |
Further improvements of an extended Hakki-Paoli method. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | László Pohl, Zsolt Kohári, András Poppe |
Vertical natural convection models and their effect on failure analysis in electro-thermal simulation of large-surface OLEDs. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yi Liu, Ping Liu, Huai Wang, Meng Huang 0001, Xiaoming Zha |
Two-thermal-states model predictive control for IGBT in three-phase inverter. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Vincenzo Della Marca, Jérémy Postel-Pellerin, Thibault Kempf, Arnaud Régnier, Philippe Chiquet, Marc Bocquet |
Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Kenneth Chimezie Nwanoro, Hua Lu 0003, Chunyan Yin, Chris Bailey 0001 |
An analysis of the reliability and design optimization of aluminium ribbon bonds in power electronics modules using computer simulation method. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ibrahim Khalilullah, Talukder Reza, Liangbiao Chen, Mark D. Placette, A. K. M. Monayem H. Mazumder, Jiang Zhou, Jiajie Fan, Cheng Qian 0003, Guoqi Zhang, Xuejun Fan |
In-situ characterization of moisture absorption and hygroscopic swelling of silicone/phosphor composite film and epoxy mold compound in LED packaging. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Shipeng Yi, Zhengwei Du |
The influence of microwave pulse repetition frequency on the thermal burnout effect of a PIN diode limiting-amplifying system. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jinsong Yu, Weiqi Tang, Diyin Tang, Jingjing Liu |
A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Sean P. Ogden, Yueming Xu, Kong Boon Yeap, Tian Shen, Toh-Ming Lu, Joel L. Plawsky |
Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Asit Kumar Gain, Liangchi Zhang |
Growth nature of in-situ Cu6Sn5-phase and their influence on creep and damping characteristics of Sn-Cu material under high-temperature and humidity. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Chunlei Wu |
Electrically induced physical damage (EIPD) cases study: From electrical overstress (EOS) to product defects. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Wolfgang Granig, Lisa-Marie Faller, Hubert Zangl |
Sensor system optimization to meet reliability targets. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Junyeap Kim, Hanbin Yoo, Heesung Lee, Seong Kwang Kim, Sungju Choi, Sung-Jin Choi, Dae Hwan Kim, Dong Myong Kim |
Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Devyani Patra, Ahmed Kamal Reza, Mohammad Khaled Hassan, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy 0001, Yu Cao 0001 |
Adaptive accelerated aging for 28 nm HKMG technology. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos |
A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli |
Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ji Shu, Shunliang Wang, Tianqi Liu, Ning Jiao, Yanbo Wang |
A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Shunqiang Xu, Hongyi Wang 0003, Jianfei Wu, Liming Zheng, Jietao Diao |
A new multitime programmable non-volatile memory cell using high voltage NMOS. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Fei Mei, Liu Ning, Miao Huiyu, Pan Yi, Haoyuan Sha, Jianyong Zheng |
On-line fault diagnosis model for locomotive traction inverter based on wavelet transform and support vector machine. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Yazdan Mehr, M. R. Toroghinejad, F. Karimzadeh, W. D. van Driel, G. Q. Zhang |
A review on discoloration and high accelerated testing of optical materials in LED based-products. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Tao Zheng, Meng Huang 0001, Yi Liu, Xiaoming Zha |
Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyun-Woong Park, Sang-Jun Lee, Dong-Chul Cho, Sang-Hoon Lee, Jae-Kyun Kim, Jun-Hee Lee, Sang-Kyo Jung, Hong-Sik Nam, Patrick Hsu, Shin Low, Sung-Hwan Lim |
Behavior of Au and Pd and the effects of these metals on IMCs in Pd-Au-coated copper wire. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Mingyao Ma, Rui Wang, Fei Li, Jianing Wang, Shuying Yang |
A fault-tolerant control strategy for switched reluctance motor drive for electric vehicles under short-fault condition. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ivo Vogt, Tomonori Nakamura, B. Motamedi, Christian Boit |
Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Mengtian Bao, Ying Wang 0041, Xingji Li, Chaoming Liu, Cheng-Hao Yu, Fei Cao |
Simulation study of single event effects in the SiC LDMOS with a step compound drift region. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Chanyang Choe, Seungjun Noh, Chuantong Chen, Dongjin Kim 0002, Katsuaki Suganuma |
Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Matthias Kampmann, Sybille Hellebrand |
Design for Small Delay Test - A Simulation Study. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Norbert Druml, Christoph Ehrenhöfer, Walter Bell, Christian Gailer, Hannes Plank, Thomas Herndl, Gerald Holweg |
A fast and flexible HW/SW co-processing framework for Time-of-Flight 3D imaging. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Josef Lutz, Jörg Franke |
Reliability and reliability investigation of wide-bandgap power devices. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Lisa Mitterhuber, Stefan Defregger, Julien Magnien, Jördis Rosc, René Hammer, Lena Goullon, Matthias Hutter, Franz Schrank, Stefan Hörth, Elke Kraker |
Thermal transient measurement and modelling of a power cycled flip-chip LED module. |
Microelectron. Reliab. |
2018 |
DBLP DOI BibTeX RDF |
|
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